TW302483B - The semiconductor memory device - Google Patents
The semiconductor memory device Download PDFInfo
- Publication number
- TW302483B TW302483B TW085105085A TW85105085A TW302483B TW 302483 B TW302483 B TW 302483B TW 085105085 A TW085105085 A TW 085105085A TW 85105085 A TW85105085 A TW 85105085A TW 302483 B TW302483 B TW 302483B
- Authority
- TW
- Taiwan
- Prior art keywords
- memory
- line
- bit line
- potential
- output
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C5/00—Details of stores covered by group G11C11/00
- G11C5/02—Disposition of storage elements, e.g. in the form of a matrix array
- G11C5/025—Geometric lay-out considerations of storage- and peripheral-blocks in a semiconductor storage device
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C7/00—Arrangements for writing information into, or reading information out from, a digital store
- G11C7/12—Bit line control circuits, e.g. drivers, boosters, pull-up circuits, pull-down circuits, precharging circuits, equalising circuits, for bit lines
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C7/00—Arrangements for writing information into, or reading information out from, a digital store
- G11C7/18—Bit line organisation; Bit line lay-out
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C8/00—Arrangements for selecting an address in a digital store
- G11C8/14—Word line organisation; Word line lay-out
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C17/00—Read-only memories programmable only once; Semi-permanent stores, e.g. manually-replaceable information cards
- G11C17/08—Read-only memories programmable only once; Semi-permanent stores, e.g. manually-replaceable information cards using semiconductor devices, e.g. bipolar elements
- G11C17/10—Read-only memories programmable only once; Semi-permanent stores, e.g. manually-replaceable information cards using semiconductor devices, e.g. bipolar elements in which contents are determined during manufacturing by a predetermined arrangement of coupling elements, e.g. mask-programmable ROM
Landscapes
- Engineering & Computer Science (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Read Only Memory (AREA)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP13266695 | 1995-05-02 | ||
JP7420496A JP3726337B2 (ja) | 1995-05-02 | 1996-03-28 | 半導体記憶装置 |
Publications (1)
Publication Number | Publication Date |
---|---|
TW302483B true TW302483B (en) | 1997-04-11 |
Family
ID=26415332
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
TW085105085A TW302483B (en) | 1995-05-02 | 1996-04-29 | The semiconductor memory device |
Country Status (3)
Country | Link |
---|---|
JP (1) | JP3726337B2 (ja) |
KR (1) | KR100200012B1 (ja) |
TW (1) | TW302483B (ja) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE202014106307U1 (de) | 2014-12-30 | 2015-02-25 | E-Lead Electronic Co., Ltd. | Verstärktes Ventil |
Families Citing this family (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP1310963B1 (en) * | 2000-06-29 | 2006-12-27 | Fujitsu Limited | Semiconductor memory device |
JP4684719B2 (ja) * | 2005-04-07 | 2011-05-18 | パナソニック株式会社 | 半導体記憶装置 |
JP5585491B2 (ja) * | 2011-02-23 | 2014-09-10 | 富士通セミコンダクター株式会社 | 半導体メモリおよびシステム |
JP5665789B2 (ja) * | 2012-03-28 | 2015-02-04 | 株式会社東芝 | コンフィギュレーションメモリ |
-
1996
- 1996-03-28 JP JP7420496A patent/JP3726337B2/ja not_active Expired - Fee Related
- 1996-04-29 TW TW085105085A patent/TW302483B/zh not_active IP Right Cessation
- 1996-05-02 KR KR1019960014305A patent/KR100200012B1/ko not_active IP Right Cessation
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE202014106307U1 (de) | 2014-12-30 | 2015-02-25 | E-Lead Electronic Co., Ltd. | Verstärktes Ventil |
Also Published As
Publication number | Publication date |
---|---|
KR100200012B1 (ko) | 1999-06-15 |
JPH0922600A (ja) | 1997-01-21 |
KR960042762A (ko) | 1996-12-21 |
JP3726337B2 (ja) | 2005-12-14 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
JP4250325B2 (ja) | 半導体記憶装置 | |
KR100211482B1 (ko) | 감소 칩 영역을 가진 반도체 메모리 소자 | |
TW408332B (en) | Semiconductor memory and method for controlling programming the same | |
CN104756192B (zh) | 具有节能读取架构的存储器阵列 | |
CN101681669B (zh) | 半共享读出放大器和全局读取线架构 | |
CN102760482A (zh) | 半导体存储器件 | |
JP6502452B1 (ja) | 半導体記憶装置 | |
TWI687932B (zh) | 記憶體單元及記憶體系統 | |
TW302483B (en) | The semiconductor memory device | |
JP2003157682A (ja) | 不揮発性半導体記憶装置 | |
CN108701483A (zh) | 具有泄漏补偿的存储器电路 | |
JP3980731B2 (ja) | 不揮発性半導体記憶装置および読出し方法 | |
US20030095438A1 (en) | Nonvolatile semiconductor memory device having function of determining good sector | |
US5892719A (en) | Redundancy circuit technique applied DRAM of multi-bit I/O having overlaid-DQ bus | |
US8649211B2 (en) | Memory bit redundant vias | |
JPS6059599A (ja) | 不揮発性半導体メモリ | |
JP3162515B2 (ja) | 不揮発性半導体メモリ装置 | |
US7869250B2 (en) | ROM semiconductor integrated circuit device having a plurality of common source lines | |
US10607692B2 (en) | Serializer and memory device including the same | |
JPH03288399A (ja) | 半導体記憶装置 | |
JP2010097653A (ja) | 半導体記憶装置 | |
JP3921718B2 (ja) | 半導体記憶装置 | |
JPH03263693A (ja) | 半導体メモリ装置 | |
KR20010092073A (ko) | 낸드형 플래시 메모리 장치의 검증 읽기 방법 | |
KR102723534B1 (ko) | 불휘발성 메모리 장치, 불휘발성 메모리 장치의 동작 방법, 그리고 불휘발성 메모리 장치를 포함하는 스토리지 장치 |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
MM4A | Annulment or lapse of patent due to non-payment of fees |