TW218858B - - Google Patents
Info
- Publication number
- TW218858B TW218858B TW080108285A TW80108285A TW218858B TW 218858 B TW218858 B TW 218858B TW 080108285 A TW080108285 A TW 080108285A TW 80108285 A TW80108285 A TW 80108285A TW 218858 B TW218858 B TW 218858B
- Authority
- TW
- Taiwan
Links
Classifications
-
- C—CHEMISTRY; METALLURGY
- C08—ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
- C08G—MACROMOLECULAR COMPOUNDS OBTAINED OTHERWISE THAN BY REACTIONS ONLY INVOLVING UNSATURATED CARBON-TO-CARBON BONDS
- C08G77/00—Macromolecular compounds obtained by reactions forming a linkage containing silicon with or without sulfur, nitrogen, oxygen or carbon in the main chain of the macromolecule
- C08G77/04—Polysiloxanes
- C08G77/32—Post-polymerisation treatment
- C08G77/36—Fractionation
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02104—Forming layers
- H01L21/02107—Forming insulating materials on a substrate
- H01L21/02109—Forming insulating materials on a substrate characterised by the type of layer, e.g. type of material, porous/non-porous, pre-cursors, mixtures or laminates
- H01L21/02112—Forming insulating materials on a substrate characterised by the type of layer, e.g. type of material, porous/non-porous, pre-cursors, mixtures or laminates characterised by the material of the layer
- H01L21/02123—Forming insulating materials on a substrate characterised by the type of layer, e.g. type of material, porous/non-porous, pre-cursors, mixtures or laminates characterised by the material of the layer the material containing silicon
- H01L21/02126—Forming insulating materials on a substrate characterised by the type of layer, e.g. type of material, porous/non-porous, pre-cursors, mixtures or laminates characterised by the material of the layer the material containing silicon the material containing Si, O, and at least one of H, N, C, F, or other non-metal elements, e.g. SiOC, SiOC:H or SiONC
- H01L21/02134—Forming insulating materials on a substrate characterised by the type of layer, e.g. type of material, porous/non-porous, pre-cursors, mixtures or laminates characterised by the material of the layer the material containing silicon the material containing Si, O, and at least one of H, N, C, F, or other non-metal elements, e.g. SiOC, SiOC:H or SiONC the material comprising hydrogen silsesquioxane, e.g. HSQ
-
- C—CHEMISTRY; METALLURGY
- C04—CEMENTS; CONCRETE; ARTIFICIAL STONE; CERAMICS; REFRACTORIES
- C04B—LIME, MAGNESIA; SLAG; CEMENTS; COMPOSITIONS THEREOF, e.g. MORTARS, CONCRETE OR LIKE BUILDING MATERIALS; ARTIFICIAL STONE; CERAMICS; REFRACTORIES; TREATMENT OF NATURAL STONE
- C04B41/00—After-treatment of mortars, concrete, artificial stone or ceramics; Treatment of natural stone
- C04B41/45—Coating or impregnating, e.g. injection in masonry, partial coating of green or fired ceramics, organic coating compositions for adhering together two concrete elements
- C04B41/4505—Coating or impregnating, e.g. injection in masonry, partial coating of green or fired ceramics, organic coating compositions for adhering together two concrete elements characterised by the method of application
- C04B41/455—Coating or impregnating, e.g. injection in masonry, partial coating of green or fired ceramics, organic coating compositions for adhering together two concrete elements characterised by the method of application the coating or impregnating process including a chemical conversion or reaction
- C04B41/4554—Coating or impregnating, e.g. injection in masonry, partial coating of green or fired ceramics, organic coating compositions for adhering together two concrete elements characterised by the method of application the coating or impregnating process including a chemical conversion or reaction the coating or impregnating material being an organic or organo-metallic precursor of an inorganic material
-
- C—CHEMISTRY; METALLURGY
- C08—ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
- C08G—MACROMOLECULAR COMPOUNDS OBTAINED OTHERWISE THAN BY REACTIONS ONLY INVOLVING UNSATURATED CARBON-TO-CARBON BONDS
- C08G77/00—Macromolecular compounds obtained by reactions forming a linkage containing silicon with or without sulfur, nitrogen, oxygen or carbon in the main chain of the macromolecule
- C08G77/04—Polysiloxanes
- C08G77/12—Polysiloxanes containing silicon bound to hydrogen
-
- C—CHEMISTRY; METALLURGY
- C09—DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
- C09D—COATING COMPOSITIONS, e.g. PAINTS, VARNISHES OR LACQUERS; FILLING PASTES; CHEMICAL PAINT OR INK REMOVERS; INKS; CORRECTING FLUIDS; WOODSTAINS; PASTES OR SOLIDS FOR COLOURING OR PRINTING; USE OF MATERIALS THEREFOR
- C09D183/00—Coating compositions based on macromolecular compounds obtained by reactions forming in the main chain of the macromolecule a linkage containing silicon, with or without sulfur, nitrogen, oxygen, or carbon only; Coating compositions based on derivatives of such polymers
- C09D183/04—Polysiloxanes
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/48—Manufacture or treatment of parts, e.g. containers, prior to assembly of the devices, using processes not provided for in a single one of the groups H01L21/18 - H01L21/326 or H10D48/04 - H10D48/07
- H01L21/4803—Insulating or insulated parts, e.g. mountings, containers, diamond heatsinks
- H01L21/481—Insulating layers on insulating parts, with or without metallisation
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02104—Forming layers
- H01L21/02107—Forming insulating materials on a substrate
- H01L21/02225—Forming insulating materials on a substrate characterised by the process for the formation of the insulating layer
- H01L21/0226—Forming insulating materials on a substrate characterised by the process for the formation of the insulating layer formation by a deposition process
- H01L21/02282—Forming insulating materials on a substrate characterised by the process for the formation of the insulating layer formation by a deposition process liquid deposition, e.g. spin-coating, sol-gel techniques, spray coating
Landscapes
- Chemical & Material Sciences (AREA)
- Engineering & Computer Science (AREA)
- Organic Chemistry (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Materials Engineering (AREA)
- Ceramic Engineering (AREA)
- Power Engineering (AREA)
- Polymers & Plastics (AREA)
- Medicinal Chemistry (AREA)
- Health & Medical Sciences (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Life Sciences & Earth Sciences (AREA)
- Wood Science & Technology (AREA)
- Inorganic Chemistry (AREA)
- Structural Engineering (AREA)
- Paints Or Removers (AREA)
- Silicon Polymers (AREA)
- Formation Of Insulating Films (AREA)
- Ceramic Products (AREA)
- Compositions Of Macromolecular Compounds (AREA)
- Coating Of Shaped Articles Made Of Macromolecular Substances (AREA)
- Catalysts (AREA)
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US07/618,865 US5063267A (en) | 1990-11-28 | 1990-11-28 | Hydrogen silsesquioxane resin fractions and their use as coating materials |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| TW218858B true TW218858B (OSRAM) | 1994-01-11 |
Family
ID=24479445
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| TW080108285A TW218858B (OSRAM) | 1990-11-28 | 1991-10-21 |
Country Status (8)
| Country | Link |
|---|---|
| US (1) | US5063267A (OSRAM) |
| EP (1) | EP0493879B1 (OSRAM) |
| JP (1) | JPH04275337A (OSRAM) |
| KR (1) | KR960007346B1 (OSRAM) |
| CA (1) | CA2055306C (OSRAM) |
| DE (1) | DE69100590T2 (OSRAM) |
| ES (1) | ES2047987T3 (OSRAM) |
| TW (1) | TW218858B (OSRAM) |
Families Citing this family (92)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5116637A (en) * | 1990-06-04 | 1992-05-26 | Dow Corning Corporation | Amine catalysts for the low temperature conversion of silica precursors to silica |
| JP2844896B2 (ja) * | 1990-10-17 | 1999-01-13 | 信越化学工業株式会社 | 耐熱性絶縁塗料 |
| US5445894A (en) * | 1991-04-22 | 1995-08-29 | Dow Corning Corporation | Ceramic coatings |
| US5436029A (en) * | 1992-07-13 | 1995-07-25 | Dow Corning Corporation | Curing silicon hydride containing materials by exposure to nitrous oxide |
| CA2100277A1 (en) * | 1992-07-20 | 1994-01-21 | Loren Andrew Haluska | Sealing porous electronic substrates |
| US5310583A (en) * | 1992-11-02 | 1994-05-10 | Dow Corning Corporation | Vapor phase deposition of hydrogen silsesquioxane resin in the presence of nitrous oxide |
| JP3153367B2 (ja) * | 1992-11-24 | 2001-04-09 | ダウ・コ−ニング・コ−ポレ−ション | ポリハイドロジェンシルセスキオキサンの分子量分別方法 |
| US5387480A (en) * | 1993-03-08 | 1995-02-07 | Dow Corning Corporation | High dielectric constant coatings |
| US5492958A (en) * | 1993-03-08 | 1996-02-20 | Dow Corning Corporation | Metal containing ceramic coatings |
| TW492989B (en) * | 1993-03-19 | 2002-07-01 | Dow Corning | Stabilization of hydrogen silsesquioxane resin solutions |
| US5320868A (en) * | 1993-09-13 | 1994-06-14 | Dow Corning Corporation | Method of forming SI-O containing coatings |
| US5441765A (en) * | 1993-09-22 | 1995-08-15 | Dow Corning Corporation | Method of forming Si-O containing coatings |
| KR100361043B1 (ko) * | 1993-12-27 | 2003-04-10 | 가와사키 마이크로 엘렉트로닉스 가부시키가이샤 | 반도체장치의절연막및절연막형성용도포액및절연막의제조방법 |
| US5456952A (en) * | 1994-05-17 | 1995-10-10 | Lsi Logic Corporation | Process of curing hydrogen silsesquioxane coating to form silicon oxide layer |
| MX9504934A (es) * | 1994-12-12 | 1997-01-31 | Morton Int Inc | Revestimientos en polvo de pelicula delgada lisa. |
| US5501875A (en) | 1994-12-27 | 1996-03-26 | Dow Corning Corporation | Metal coated silica precursor powders |
| JPH08245792A (ja) * | 1995-03-10 | 1996-09-24 | Mitsubishi Electric Corp | シリコーンラダーポリマー、シリコーンラダープレポリマーおよびそれらの製造方法 |
| US5618878A (en) * | 1995-04-07 | 1997-04-08 | Dow Corning Corporation | Hydrogen silsesquioxane resin coating composition |
| US5635240A (en) * | 1995-06-19 | 1997-06-03 | Dow Corning Corporation | Electronic coating materials using mixed polymers |
| US5985229A (en) * | 1995-09-21 | 1999-11-16 | Toagosei Co., Ltd. | Solid silica derivative and process for producing the same |
| US5609925A (en) | 1995-12-04 | 1997-03-11 | Dow Corning Corporation | Curing hydrogen silsesquioxane resin with an electron beam |
| US5766522A (en) * | 1996-07-19 | 1998-06-16 | Morton International, Inc. | Continuous processing of powder coating compositions |
| US6075074A (en) | 1996-07-19 | 2000-06-13 | Morton International, Inc. | Continuous processing of powder coating compositions |
| US6583187B1 (en) | 1996-07-19 | 2003-06-24 | Andrew T. Daly | Continuous processing of powder coating compositions |
| US6114414A (en) * | 1996-07-19 | 2000-09-05 | Morton International, Inc. | Continuous processing of powder coating compositions |
| US5807611A (en) * | 1996-10-04 | 1998-09-15 | Dow Corning Corporation | Electronic coatings |
| US5776235A (en) * | 1996-10-04 | 1998-07-07 | Dow Corning Corporation | Thick opaque ceramic coatings |
| US5711987A (en) * | 1996-10-04 | 1998-01-27 | Dow Corning Corporation | Electronic coatings |
| US20100273011A1 (en) * | 1996-12-20 | 2010-10-28 | Bianxiao Zhong | Silicone Composition, Silicone Adhesive, Coated and Laminated Substrates |
| DE19654488A1 (de) * | 1996-12-27 | 1998-07-02 | Sueddeutsche Kalkstickstoff | Verfahren zur Fraktionierung viscoser Silicone |
| US5707681A (en) * | 1997-02-07 | 1998-01-13 | Dow Corning Corporation | Method of producing coatings on electronic substrates |
| EP0860462A3 (en) * | 1997-02-24 | 1999-04-21 | Dow Corning Toray Silicone Company Limited | Composition and method for the formation of silica thin films |
| US6218497B1 (en) | 1997-04-21 | 2001-04-17 | Alliedsignal Inc. | Organohydridosiloxane resins with low organic content |
| US6043330A (en) * | 1997-04-21 | 2000-03-28 | Alliedsignal Inc. | Synthesis of siloxane resins |
| US6143855A (en) * | 1997-04-21 | 2000-11-07 | Alliedsignal Inc. | Organohydridosiloxane resins with high organic content |
| US6743856B1 (en) | 1997-04-21 | 2004-06-01 | Honeywell International Inc. | Synthesis of siloxane resins |
| US6015457A (en) * | 1997-04-21 | 2000-01-18 | Alliedsignal Inc. | Stable inorganic polymers |
| TW392288B (en) | 1997-06-06 | 2000-06-01 | Dow Corning | Thermally stable dielectric coatings |
| US5866197A (en) * | 1997-06-06 | 1999-02-02 | Dow Corning Corporation | Method for producing thick crack-free coating from hydrogen silsequioxane resin |
| US6177199B1 (en) | 1999-01-07 | 2001-01-23 | Alliedsignal Inc. | Dielectric films from organohydridosiloxane resins with low organic content |
| US6218020B1 (en) | 1999-01-07 | 2001-04-17 | Alliedsignal Inc. | Dielectric films from organohydridosiloxane resins with high organic content |
| US5906859A (en) * | 1998-07-10 | 1999-05-25 | Dow Corning Corporation | Method for producing low dielectric coatings from hydrogen silsequioxane resin |
| US6340722B1 (en) | 1998-09-04 | 2002-01-22 | The University Of Akron | Polymerization, compatibilized blending, and particle size control of powder coatings in a supercritical fluid |
| DE19848474C1 (de) | 1998-10-21 | 2000-01-13 | Bosch Gmbh Robert | Verfahren und Vorrichtung zur Herstellung keramischer Formkörper mittels Setterplatten und Verendung des Verfahrens zur Herstellung keramischer Mehrschichthybride |
| WO2000077575A1 (en) * | 1999-06-10 | 2000-12-21 | Alliedsignal Inc. | Spin-on-glass anti-reflective coatings for photolithography |
| US6472076B1 (en) | 1999-10-18 | 2002-10-29 | Honeywell International Inc. | Deposition of organosilsesquioxane films |
| US6440550B1 (en) * | 1999-10-18 | 2002-08-27 | Honeywell International Inc. | Deposition of fluorosilsesquioxane films |
| US6572974B1 (en) | 1999-12-06 | 2003-06-03 | The Regents Of The University Of Michigan | Modification of infrared reflectivity using silicon dioxide thin films derived from silsesquioxane resins |
| US6143360A (en) | 1999-12-13 | 2000-11-07 | Dow Corning Corporation | Method for making nanoporous silicone resins from alkylydridosiloxane resins |
| US6558755B2 (en) | 2000-03-20 | 2003-05-06 | Dow Corning Corporation | Plasma curing process for porous silica thin film |
| US6759098B2 (en) | 2000-03-20 | 2004-07-06 | Axcelis Technologies, Inc. | Plasma curing of MSQ-based porous low-k film materials |
| US6576300B1 (en) | 2000-03-20 | 2003-06-10 | Dow Corning Corporation | High modulus, low dielectric constant coatings |
| US6913796B2 (en) * | 2000-03-20 | 2005-07-05 | Axcelis Technologies, Inc. | Plasma curing process for porous low-k materials |
| US7011868B2 (en) * | 2000-03-20 | 2006-03-14 | Axcelis Technologies, Inc. | Fluorine-free plasma curing process for porous low-k materials |
| US6368400B1 (en) * | 2000-07-17 | 2002-04-09 | Honeywell International | Absorbing compounds for spin-on-glass anti-reflective coatings for photolithography |
| JP2001131479A (ja) * | 2000-10-30 | 2001-05-15 | Tokyo Ohka Kogyo Co Ltd | シリカ系被膜形成用塗布液 |
| USH2219H1 (en) * | 2000-10-31 | 2008-07-01 | The United States Of America As Represented By The Secretary Of The Navy | Method for coating small particles |
| US6399210B1 (en) | 2000-11-27 | 2002-06-04 | Dow Corning Corporation | Alkoxyhydridosiloxane resins |
| US6756085B2 (en) * | 2001-09-14 | 2004-06-29 | Axcelis Technologies, Inc. | Ultraviolet curing processes for advanced low-k materials |
| FR2830856B1 (fr) * | 2001-10-15 | 2004-07-30 | Pechiney Aluminium | Precurseur de revetement et procede pour revetir un substrat d'une couche refractaire |
| FR2830857B1 (fr) * | 2001-10-15 | 2004-07-30 | Pechiney Aluminium | Precurseur de revetement et procede pour revetir un substrat d'une couche refractaire |
| US6596821B1 (en) * | 2002-03-05 | 2003-07-22 | Dow Corning Corporation | Hydrosilyation cured silicone resins obtained by fractionation |
| US20070111014A1 (en) * | 2003-08-01 | 2007-05-17 | Dow Corning Corporation | Silicone based dielectric coatings and films for photovoltaic applications |
| US8053159B2 (en) | 2003-11-18 | 2011-11-08 | Honeywell International Inc. | Antireflective coatings for via fill and photolithography applications and methods of preparation thereof |
| KR100534103B1 (ko) * | 2004-01-14 | 2005-12-06 | 삼성전자주식회사 | 초임계 유체를 이용한 미세 전자소자의 제조 방법 |
| JP2008513572A (ja) | 2004-09-17 | 2008-05-01 | ダウ・コーニング・コーポレイション | シロキサン組成物、凝集物、および凝集物の製造方法 |
| CN101048704B (zh) | 2004-11-02 | 2011-04-13 | 陶氏康宁公司 | 抗蚀剂组合物 |
| JP4783117B2 (ja) * | 2005-10-21 | 2011-09-28 | 東レ・ダウコーニング株式会社 | シリカ系ガラス薄層付き無機質基板、その製造方法、コーテイング剤および半導体装置 |
| US8148043B2 (en) * | 2006-06-28 | 2012-04-03 | Dow Corning Corporation | Silsesquioxane resin systems with base additives bearing electron-attracting functionalities |
| KR101216060B1 (ko) | 2006-06-28 | 2012-12-28 | 도쿄 오카 고교 가부시키가이샤 | 전자 유인성 관능 그룹을 갖는 염기 첨가제를 함유한 실세스퀴옥산 수지 시스템 |
| JP5107354B2 (ja) | 2006-08-04 | 2012-12-26 | ダウ・コーニング・コーポレイション | シリコーン樹脂およびシリコーン組成物 |
| JP5091249B2 (ja) * | 2006-12-20 | 2012-12-05 | ダウ・コーニング・コーポレイション | 多層の硬化シリコーン樹脂組成物で被覆またはラミネートされたガラス基板 |
| WO2008079179A1 (en) * | 2006-12-20 | 2008-07-03 | Dow Corning Corporation | Glass substrates coated or laminated with cured silicone resin compositions |
| US8642246B2 (en) | 2007-02-26 | 2014-02-04 | Honeywell International Inc. | Compositions, coatings and films for tri-layer patterning applications and methods of preparation thereof |
| JP2011516626A (ja) * | 2008-03-04 | 2011-05-26 | ダウ・コーニング・コーポレイション | シリコーン組成物、シリコーン接着剤、被覆基板及び積層基板 |
| JP2011518893A (ja) * | 2008-03-04 | 2011-06-30 | ダウ・コーニング・コーポレイション | ボロシロキサン組成物、ボロシロキサン接着剤、塗装基板及び積層基板 |
| US20110045277A1 (en) * | 2008-05-27 | 2011-02-24 | Nathan Greer | Adhesive Tape and Laminated Glass |
| TW201004795A (en) * | 2008-07-31 | 2010-02-01 | Dow Corning | Laminated glass |
| US8557877B2 (en) | 2009-06-10 | 2013-10-15 | Honeywell International Inc. | Anti-reflective coatings for optically transparent substrates |
| JP2014500897A (ja) | 2010-11-09 | 2014-01-16 | ダウ コーニング コーポレーション | 有機リン酸化合物により可塑化されたヒドロシリル化硬化シリコーン樹脂 |
| US8864898B2 (en) | 2011-05-31 | 2014-10-21 | Honeywell International Inc. | Coating formulations for optical elements |
| JP6117210B2 (ja) | 2011-09-20 | 2017-04-19 | ダウ コーニング コーポレーションDow Corning Corporation | イリジウムを含有するヒドロシリル化触媒及びその触媒を含有する組成物 |
| JP6101695B2 (ja) | 2011-09-20 | 2017-03-22 | ダウ コーニング コーポレーションDow Corning Corporation | ニッケル含有ヒドロシリル化触媒及びその触媒を含有する組成物 |
| US9480977B2 (en) | 2011-09-20 | 2016-11-01 | Dow Corning Corporation | Ruthenium containing hydrosilylation catalysts and compositions containing the catalysts |
| JP6117233B2 (ja) | 2011-12-01 | 2017-04-19 | ダウ コーニング コーポレーションDow Corning Corporation | ヒドロシリル化反応触媒及び硬化性組成物並びにこれらの調製及び使用方法 |
| US9741918B2 (en) | 2013-10-07 | 2017-08-22 | Hypres, Inc. | Method for increasing the integration level of superconducting electronics circuits, and a resulting circuit |
| US10473822B2 (en) | 2014-04-09 | 2019-11-12 | Dow Silicones Corporation | Optical element |
| TWI664077B (zh) | 2014-04-09 | 2019-07-01 | 美商陶氏有機矽公司 | 疏水物件 |
| US10544329B2 (en) | 2015-04-13 | 2020-01-28 | Honeywell International Inc. | Polysiloxane formulations and coatings for optoelectronic applications |
| CN107709400B (zh) * | 2015-06-17 | 2020-05-12 | 株式会社大赛璐 | 固化性组合物 |
| KR102858984B1 (ko) | 2016-02-19 | 2025-09-12 | 다우 실리콘즈 코포레이션 | 에이징된 중합체 실세스퀴옥산 |
| FI128886B (en) * | 2019-02-25 | 2021-02-26 | Pibond Oy | Functional hydrogen silsesquioxane resins and the use thereof |
Family Cites Families (10)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US3615272A (en) * | 1968-11-04 | 1971-10-26 | Dow Corning | Condensed soluble hydrogensilsesquioxane resin |
| JPS5710627A (en) * | 1980-06-24 | 1982-01-20 | Hitachi Chem Co Ltd | Preparation of polysiloxane with fractionated molecular weight |
| JP2513595B2 (ja) * | 1984-11-28 | 1996-07-03 | 富士通株式会社 | ラダ−型シリコン樹脂の分子量分別法 |
| US4723978A (en) * | 1985-10-31 | 1988-02-09 | International Business Machines Corporation | Method for a plasma-treated polysiloxane coating |
| EP0255226A3 (en) * | 1986-06-26 | 1990-07-11 | Minnesota Mining And Manufacturing Company | Silicone pressure-sensitive adhesive having improved properties |
| EP0255303B1 (en) * | 1986-07-25 | 1989-10-11 | Oki Electric Industry Company, Limited | Negative resist material, method for its manufacture and method for using it |
| US4756977A (en) * | 1986-12-03 | 1988-07-12 | Dow Corning Corporation | Multilayer ceramics from hydrogen silsesquioxane |
| JPH01203013A (ja) * | 1988-02-08 | 1989-08-15 | Fujitsu Ltd | 高分子化合物の分子量分別方法 |
| US4999397A (en) * | 1989-07-28 | 1991-03-12 | Dow Corning Corporation | Metastable silane hydrolyzates and process for their preparation |
| US5010159A (en) * | 1989-09-01 | 1991-04-23 | Dow Corning Corporation | Process for the synthesis of soluble, condensed hydridosilicon resins containing low levels of silanol |
-
1990
- 1990-11-28 US US07/618,865 patent/US5063267A/en not_active Expired - Lifetime
-
1991
- 1991-10-21 TW TW080108285A patent/TW218858B/zh not_active IP Right Cessation
- 1991-11-12 CA CA002055306A patent/CA2055306C/en not_active Expired - Fee Related
- 1991-11-13 DE DE91310448T patent/DE69100590T2/de not_active Expired - Lifetime
- 1991-11-13 ES ES91310448T patent/ES2047987T3/es not_active Expired - Lifetime
- 1991-11-13 EP EP91310448A patent/EP0493879B1/en not_active Expired - Lifetime
- 1991-11-19 JP JP3303095A patent/JPH04275337A/ja active Granted
- 1991-11-26 KR KR1019910021202A patent/KR960007346B1/ko not_active Expired - Lifetime
Also Published As
| Publication number | Publication date |
|---|---|
| CA2055306A1 (en) | 1992-05-29 |
| DE69100590D1 (de) | 1993-12-09 |
| EP0493879B1 (en) | 1993-11-03 |
| KR960007346B1 (ko) | 1996-05-31 |
| JPH0579693B2 (OSRAM) | 1993-11-04 |
| CA2055306C (en) | 1996-06-18 |
| JPH04275337A (ja) | 1992-09-30 |
| US5063267A (en) | 1991-11-05 |
| EP0493879A3 (en) | 1992-09-30 |
| KR920009891A (ko) | 1992-06-25 |
| EP0493879A2 (en) | 1992-07-08 |
| ES2047987T3 (es) | 1994-03-01 |
| DE69100590T2 (de) | 1994-05-11 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| MK4A | Expiration of patent term of an invention patent |