TW202124761A - 成膜方法及成膜裝置 - Google Patents
成膜方法及成膜裝置 Download PDFInfo
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- TW202124761A TW202124761A TW109138560A TW109138560A TW202124761A TW 202124761 A TW202124761 A TW 202124761A TW 109138560 A TW109138560 A TW 109138560A TW 109138560 A TW109138560 A TW 109138560A TW 202124761 A TW202124761 A TW 202124761A
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- gas
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- 238000000034 method Methods 0.000 title claims abstract description 144
- 230000015572 biosynthetic process Effects 0.000 title claims abstract description 21
- 239000007789 gas Substances 0.000 claims abstract description 117
- 238000006243 chemical reaction Methods 0.000 claims abstract description 85
- 239000012495 reaction gas Substances 0.000 claims abstract description 60
- 239000002994 raw material Substances 0.000 claims abstract description 51
- 238000009616 inductively coupled plasma Methods 0.000 claims abstract description 6
- 230000004913 activation Effects 0.000 claims description 16
- 229910052751 metal Inorganic materials 0.000 claims description 4
- 239000002184 metal Substances 0.000 claims description 4
- 238000005121 nitriding Methods 0.000 claims description 4
- 230000001590 oxidative effect Effects 0.000 claims description 3
- 239000011148 porous material Substances 0.000 claims description 2
- 238000007599 discharging Methods 0.000 abstract 2
- 238000000231 atomic layer deposition Methods 0.000 description 71
- 238000005229 chemical vapour deposition Methods 0.000 description 55
- GIRKRMUMWJFNRI-UHFFFAOYSA-N tris(dimethylamino)silicon Chemical compound CN(C)[Si](N(C)C)N(C)C GIRKRMUMWJFNRI-UHFFFAOYSA-N 0.000 description 11
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N silicon dioxide Inorganic materials O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 7
- 238000011010 flushing procedure Methods 0.000 description 6
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Chemical compound O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 6
- 239000006227 byproduct Substances 0.000 description 5
- 238000010586 diagram Methods 0.000 description 5
- 230000006698 induction Effects 0.000 description 5
- 239000011261 inert gas Substances 0.000 description 5
- 239000002245 particle Substances 0.000 description 5
- 229910052814 silicon oxide Inorganic materials 0.000 description 5
- XKRFYHLGVUSROY-UHFFFAOYSA-N Argon Chemical compound [Ar] XKRFYHLGVUSROY-UHFFFAOYSA-N 0.000 description 4
- 229910004298 SiO 2 Inorganic materials 0.000 description 3
- CBENFWSGALASAD-UHFFFAOYSA-N Ozone Chemical compound [O-][O+]=O CBENFWSGALASAD-UHFFFAOYSA-N 0.000 description 2
- 229910052786 argon Inorganic materials 0.000 description 2
- 125000002887 hydroxy group Chemical group [H]O* 0.000 description 2
- 125000002524 organometallic group Chemical group 0.000 description 2
- 238000010926 purge Methods 0.000 description 2
- 239000010453 quartz Substances 0.000 description 2
- 229920006395 saturated elastomer Polymers 0.000 description 2
- 238000001179 sorption measurement Methods 0.000 description 2
- 229910018072 Al 2 O 3 Inorganic materials 0.000 description 1
- OKTJSMMVPCPJKN-UHFFFAOYSA-N Carbon Chemical compound [C] OKTJSMMVPCPJKN-UHFFFAOYSA-N 0.000 description 1
- ATJFFYVFTNAWJD-UHFFFAOYSA-N Tin Chemical compound [Sn] ATJFFYVFTNAWJD-UHFFFAOYSA-N 0.000 description 1
- 230000004888 barrier function Effects 0.000 description 1
- 229910052799 carbon Inorganic materials 0.000 description 1
- 239000012159 carrier gas Substances 0.000 description 1
- 239000000470 constituent Substances 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 229910044991 metal oxide Inorganic materials 0.000 description 1
- 150000004706 metal oxides Chemical class 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 150000004767 nitrides Chemical class 0.000 description 1
- TWNQGVIAIRXVLR-UHFFFAOYSA-N oxo(oxoalumanyloxy)alumane Chemical compound O=[Al]O[Al]=O TWNQGVIAIRXVLR-UHFFFAOYSA-N 0.000 description 1
- 239000000376 reactant Substances 0.000 description 1
- MNWRORMXBIWXCI-UHFFFAOYSA-N tetrakis(dimethylamido)titanium Chemical compound CN(C)[Ti](N(C)C)(N(C)C)N(C)C MNWRORMXBIWXCI-UHFFFAOYSA-N 0.000 description 1
- JLTRXTDYQLMHGR-UHFFFAOYSA-N trimethylaluminium Chemical compound C[Al](C)C JLTRXTDYQLMHGR-UHFFFAOYSA-N 0.000 description 1
- 238000011144 upstream manufacturing Methods 0.000 description 1
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- H—ELECTRICITY
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- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J2237/00—Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
- H01J2237/32—Processing objects by plasma generation
- H01J2237/33—Processing objects by plasma generation characterised by the type of processing
- H01J2237/332—Coating
- H01J2237/3321—CVD [Chemical Vapor Deposition]
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- Chemical & Material Sciences (AREA)
- Engineering & Computer Science (AREA)
- Metallurgy (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Materials Engineering (AREA)
- Mechanical Engineering (AREA)
- General Chemical & Material Sciences (AREA)
- Organic Chemistry (AREA)
- Physics & Mathematics (AREA)
- Plasma & Fusion (AREA)
- Inorganic Chemistry (AREA)
- Analytical Chemistry (AREA)
- Electromagnetism (AREA)
- Chemical Vapour Deposition (AREA)
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| JP2019-201441 | 2019-11-06 | ||
| JP2019201441 | 2019-11-06 |
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| TW202124761A true TW202124761A (zh) | 2021-07-01 |
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| EP (1) | EP4056731A4 (https=) |
| JP (1) | JP7112793B2 (https=) |
| KR (1) | KR20220097444A (https=) |
| CN (1) | CN114651087A (https=) |
| TW (1) | TW202124761A (https=) |
| WO (1) | WO2021090794A1 (https=) |
Cited By (1)
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| TWI840927B (zh) * | 2021-08-30 | 2024-05-01 | 日商新烯科技有限公司 | 成膜裝置 |
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| CN113862644A (zh) * | 2021-09-22 | 2021-12-31 | 江苏微导纳米科技股份有限公司 | 镀膜设备 |
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| US6482733B2 (en) | 2000-05-15 | 2002-11-19 | Asm Microchemistry Oy | Protective layers prior to alternating layer deposition |
| CN101657564A (zh) * | 2007-02-12 | 2010-02-24 | 莲花应用技术有限责任公司 | 用原子层沉积制备复合材料 |
| US8017182B2 (en) * | 2007-06-21 | 2011-09-13 | Asm International N.V. | Method for depositing thin films by mixed pulsed CVD and ALD |
| JP5513767B2 (ja) * | 2008-06-25 | 2014-06-04 | 株式会社日立国際電気 | 半導体装置の製造方法、基板処理方法、基板処理装置および半導体装置 |
| JP5801916B2 (ja) | 2008-06-25 | 2015-10-28 | 株式会社日立国際電気 | 半導体装置の製造方法、基板処理方法、および基板処理装置 |
| WO2013046157A1 (en) * | 2011-09-27 | 2013-04-04 | L'air Liquide, Societe Anonyme Pour L'etude Et L'exploitation Des Procedes Georges Claude | Nickel bis diazabutadiene precursors, their synthesis, and their use for nickel containing film depositions |
| EP2628817B1 (en) | 2012-02-15 | 2016-11-02 | IHI Hauzer Techno Coating B.V. | A coated article of martensitic steel and a method of forming a coated article of steel |
| JP2014135311A (ja) | 2013-01-08 | 2014-07-24 | Ps4 Luxco S A R L | 半導体装置 |
| JP2014229680A (ja) * | 2013-05-21 | 2014-12-08 | ピーエスフォー ルクスコ エスエイアールエルPS4 Luxco S.a.r.l. | 半導体装置及びその製造方法 |
| WO2015145486A1 (ja) | 2014-03-28 | 2015-10-01 | 国立大学法人東北大学 | プラズマ処理装置およびプラズマ処理方法 |
| JP6486696B2 (ja) | 2015-01-15 | 2019-03-20 | 国立大学法人山形大学 | 薄膜堆積方法及び薄膜堆積装置 |
| US10573522B2 (en) * | 2016-08-16 | 2020-02-25 | Lam Research Corporation | Method for preventing line bending during metal fill process |
| US10049911B2 (en) * | 2016-09-16 | 2018-08-14 | Lam Research Corporation | Temporally pulsed and kinetically modulated CVD dielectrics for gapfill applications |
| JP6935667B2 (ja) | 2016-10-07 | 2021-09-15 | 東京エレクトロン株式会社 | 成膜方法 |
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2020
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| TWI840927B (zh) * | 2021-08-30 | 2024-05-01 | 日商新烯科技有限公司 | 成膜裝置 |
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| JPWO2021090794A1 (https=) | 2021-05-14 |
| JP7112793B2 (ja) | 2022-08-04 |
| EP4056731A1 (en) | 2022-09-14 |
| WO2021090794A1 (ja) | 2021-05-14 |
| KR20220097444A (ko) | 2022-07-07 |
| EP4056731A4 (en) | 2023-08-30 |
| US20220259732A1 (en) | 2022-08-18 |
| CN114651087A (zh) | 2022-06-21 |
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