TW201838004A - 加工方法 - Google Patents

加工方法 Download PDF

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TW201838004A
TW201838004A TW107107586A TW107107586A TW201838004A TW 201838004 A TW201838004 A TW 201838004A TW 107107586 A TW107107586 A TW 107107586A TW 107107586 A TW107107586 A TW 107107586A TW 201838004 A TW201838004 A TW 201838004A
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竹之內研二
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日商迪思科股份有限公司
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    • BPERFORMING OPERATIONS; TRANSPORTING
    • B28WORKING CEMENT, CLAY, OR STONE
    • B28DWORKING STONE OR STONE-LIKE MATERIALS
    • B28D5/00Fine working of gems, jewels, crystals, e.g. of semiconductor material; apparatus or devices therefor
    • B28D5/02Fine working of gems, jewels, crystals, e.g. of semiconductor material; apparatus or devices therefor by rotary tools, e.g. drills
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Abstract

[課題]提供一種加工方法,該加工方法對在切斷預定線上重疊而形成有包含金屬之積層體的板狀的被加工物進行加工之時,可維持加工的品質並且提高加工的速度。 [解決手段]是對在背面側形成有包含金屬之積層體的板狀的被加工物進行加工的加工方法,包含以下步驟:保持步驟,以保持台保持被加工物的正面側,以使積層體露出;切割步驟,在實施保持步驟後,以切割刀沿著切斷預定線切割被加工物,而形成將積層體斷開的切割溝;以及雷射加工步驟,在實施切割步驟後,沿著切割溝照射雷射光束,在切割步驟中,是一邊對被加工物供給包含有機酸及氧化劑的切割液一邊進行切割。

Description

加工方法
發明領域 本發明是有關於一種加工方法,是用於對在切斷預定線上重疊而形成有包含金屬之積層體的板狀的被加工物進行加工。
發明背景 在以行動電話及個人電腦為代表的電子機器中,具備有電子電路等的器件之器件晶片已成為必要的構成要素。器件晶片是藉由例如以複數條切斷預定線(切割道)將晶圓的正面加以區劃,並在各區域形成器件後,沿著此切斷預定線將晶圓切斷而獲得,其中該晶圓是以矽等半導體材料所形成。
近年來,在如上述的晶圓的切斷預定線上,大多配置有稱為TEG (測試元件群, Test Elements Group)的評價用元件,該評價用元件是用於評價器件的電氣特性(參照例如專利文獻1、2等)。藉由將TEG配置於切斷預定線上,可以將器件晶片的獲取數量確保在最大限度,並且可以和晶圓的切斷同時地去除評價後的不需要之TEG。 先前技術文獻 專利文獻
專利文獻1:日本專利特開平6-349926號公報 專利文獻2:日本專利特開2005-21940號公報
發明概要 發明欲解決之課題 然而,若欲以切割刀對TEG之類的包含金屬之積層體進行切割、去除時,在切割包含於積層體的金屬之時會變得容易產生延伸、稱為毛邊的突起,其中該切割刀是將磨粒分散於結合材而構成。又,若由切割刀進行的加工的速度變高而使發熱量增加時,毛邊也會容易變大。因此,在此方法中,必須將加工的速度抑制得較低,以免加工之品質降低。
本發明是有鑒於所述問題點而作成的發明,其目的在於提供一種加工方法,該加工方法對在切斷預定線上重疊而形成有包含金屬之積層體的板狀的被加工物進行加工之時,可維持加工的品質並且提高加工的速度。 用以解決課題之手段
根據本發明之一態樣,可提供一種加工方法,是對在背面側形成有包含金屬之積層體的板狀的被加工物進行加工,該加工方法具備以下步驟: 保持步驟,以保持台保持被加工物的正面側,以使該積層體露出; 切割步驟,在實施該保持步驟後,以切割刀沿著切斷預定線切割被加工物,而形成將該積層體斷開的切割溝;以及 雷射加工步驟,在實施該切割步驟後,沿著該切割溝照射雷射光束, 在該切割步驟中,是一邊對被加工物供給包含有機酸及氧化劑的切割液一邊進行切割。
於上述之本發明的一態樣中,在該雷射加工步驟中,亦可照射對被加工物具有吸收性之波長的雷射光束來沿著該切斷預定線將被加工物於厚度方向上切斷。
又,於上述之本發明的一態樣中,在該雷射加工步驟中,亦可照射對被加工物具有穿透性之波長的雷射光束,以於被加工物形成沿著該切割溝的改質層,且該態樣更具備分割步驟,該分割步驟是在實施該雷射加工步驟後,沿著該改質層分割被加工物。
又,於上述之本發明的一態樣中,在該雷射加工步驟中,亦可將雷射光束照射在被加工物的該背面,且該態樣更具備片材貼附步驟,該片材貼附步驟是於實施該雷射加工步驟前,將片材貼附於被加工物的該正面。 發明效果
在本發明之一態樣的加工方法中,因為是在形成將包含金屬之積層體斷開的切割溝之時,供給包含有機酸與氧化劑的切割液,所以可以一邊利用有機酸與氧化劑將金屬改質而降低其延展性一邊進行切割。藉此,即使提高加工的速度仍然可以抑制毛邊的產生。亦即,可維持加工的品質並且提高加工的速度。
用以實施發明之形態 參照附圖,說明本發明的一個態樣的實施形態。本實施形態的加工方法是用於對在背面側形成有包含金屬之積層體的板狀的被加工物進行加工之方法,該加工方法包含:片材貼附步驟(參照圖1(B))、第1保持步驟(參照圖2(A))、切割步驟(參照圖2(B)) 、第2保持步驟(參照圖3(A))、以及雷射加工步驟(參照圖3(B))。
在片材貼附步驟中,是將片材(保護構件)黏貼於在背面側具有積層體的被加工物的正面。在第1保持步驟中,是以切割裝置的工作夾台(第1保持台)保持被加工物的正面側,以使積層體露出。於切割步驟中,是一邊供給包含有機酸與氧化劑的切割液一邊沿著切斷預定線切割被加工物,而形成將積層體斷開的切割溝。
在第2保持步驟中,是以雷射加工裝置的工作夾台(第2保持台)保持被加工物的正面側。在雷射加工步驟中,是從被加工物的背面側照射雷射光束來沿著切斷預定線將被加工物切斷。以下,詳細說明本實施形態的加工方法。
圖1(A)是示意地顯示以本實施形態之加工方法所加工之被加工物11的構成例之立體圖。如圖1(A)所示,本實施形態的被加工物11是採用矽(Si)等半導體材料來形成為圓盤狀的晶圓,並將其正面11a側區分成中央的器件區域、與包圍器件區域的外周剩餘區域。
器件區域是以排列成格子狀之切斷預定線(切割道,Street)13進一步區劃為複數個區域,且於各區域中形成有IC(積體電路,Integrated Circuit)等器件15。又,於被加工物11的背面11b側設有包含金屬之積層體17。此積層體17是以例如鈦(Ti)、鎳(Ni)、金(Au)等所形成之厚度為數μm左右的多層金屬膜,並作為電極等而發揮功能。此積層體17也形成在與切斷預定線13重疊的區域。
再者,在本實施形態中,雖然是以矽等半導體材料所形成之圓盤狀的晶圓作為被加工物11,但是對被加工物11之材質、形狀、構造、大小等並未限制。同樣地,對器件15或積層體17的種類、數量、形狀、構造、大小、配置等也未限制。例如,也可以將沿著切斷預定線13形成有作為電極而發揮功能的積層體17的封裝基板等,作為被加工物11來使用。
在本實施形態的加工方法中,首先是進行片材貼附步驟,其是將片材(保護構件)黏貼於上述之被加工物11的正面11a。圖1(B)是用於說明片材貼附步驟的立體圖。如圖1(B)所示,於片材貼附步驟中,是將直徑比被加工物11更大的樹脂製的片材(保護構件)21黏貼於被加工物11的正面11a側。又,將環狀的框架23固定於片材21的外周部分。
藉此,被加工物11是透過片材21而被環狀的框架23所支撐。又,在本實施形態中,雖然是說明關於對透過片材21而被支撐於環狀的框架23的狀態之被加工物11進行加工的例子,但也可以不使用片材21或框架23而對被加工物11進行加工。在此情況下,可省略片材貼附步驟。又,亦可將與被加工物11同等的晶圓或其他的基板等作為保護構件來黏貼於被加工物11,以取代樹脂製的片材21。
於片材貼附步驟後是進行第1保持步驟,該第1保持步驟是以切割裝置的工作夾台(第1保持台)保持被加工物11。圖2(A)是用於說明第1保持步驟的局部截面側視圖。第1保持步驟是使用例如圖2(A)所示的切割裝置2來進行。切割裝置2具備有用於吸引、保持被加工物11之工作夾台(第1保持台)4。
工作夾台4是與馬達等的旋轉驅動源(圖未示)相連結,並繞著與鉛直方向大致平行的旋轉軸旋轉。又,在工作夾台4的下方設置有加工進給機構(圖未示),工作夾台4是藉由此加工進給機構而朝加工進給方向(第1水平方向)移動。
工作夾台4的上表面的一部分是形成為用於吸引、保持被加工物11(片材21)的保持面4a。保持面4a是透過形成在工作夾台4的內部的吸引路(圖未示)等而連接到吸引源(圖未示)。藉由吸引源的負壓作用在保持面4a,可將被加工物11吸引、保持於工作夾台4。於該工作夾台4的周圍設有用於固定環狀的框架23的複數個夾具6。
在第1保持步驟中,首先是使黏貼於被加工物11的正面11a側的片材21接觸於工作夾台4的保持面4a,並使吸引源的負壓作用。並一併利用夾具6來固定框架23。藉此,被加工物11是在背面11b側的積層體17朝上方露出的狀態下被保持。
於第1保持步驟後進行切割步驟,該切割步驟是形成將積層體17斷開的切割溝。圖2(B)是用於說明切割步驟的局部截面側視圖。切割步驟是繼續使用切割裝置2來進行。如圖2(B)所示,切割裝置2更具備有配置於工作夾台4的上方的切割單元8。
切割單元8具備有主軸(圖未示),該主軸是成為相對於加工進給方向大致垂直的旋轉軸。在主軸的一端側,裝設有環狀的切割刀10,該環狀的切割刀10是將磨粒分散於結合材而構成。在主軸的另一端側,連結有馬達等的旋轉驅動源(圖未示),且裝設在主軸的一端側的切割刀10,是藉由從該旋轉驅動源所傳來的力而旋轉。
又,主軸是被移動機構(圖未示)所支撐。切割刀10是藉由此移動機構而朝垂直於加工進給方向的分度進給方向(第2水平方向)、以及鉛直方向移動。於切割刀10的側邊,是將一對噴嘴12配置成包夾切割刀10。噴嘴12是構成為可以對切割刀10或被加工物11供給切割液14。
在切割步驟中,首先是使工作夾台4旋轉,並將成為對象之切斷預定線13的伸長的方向對準於切割裝置2之加工進給方向。又,使工作夾台4及切割單元8相對地移動,而將切割刀10的位置於成為對象之切斷預定線13的延長線上對準。然後,使切割刀10的下端移動至比積層體17的下表面更低的位置。再者,藉由使用例如對紅外線具有靈敏度的相機等,可以從背面11b側確認切斷預定線13的位置。
之後,一邊旋轉切割刀10一邊使工作夾台4朝加工進給方向移動。並一併從噴嘴12對切割刀10及被加工物11供給包含有機酸與氧化劑的切割液14。藉此,使切割刀10沿著對象的切斷預定線13切入,而可以在被加工物11的背面11b側形成將積層體17斷開的切割溝19a。
如本實施形態,藉由於切割液14中包含有機酸,可以將積層體17中的金屬改質,而抑制其延展性。又,藉由於切割液14中包含氧化劑,積層體17中的金屬的表面即變得容易氧化。其結果,可充份地降低積層體17中的金屬的延展性,而提高加工性。
作為包含於切割液14中的有機酸,可採用例如,分子內具有至少1個羧基和至少1個胺基的化合物。此時,胺基中之至少1個宜為2級或3級的胺基。又,作為有機酸而使用之化合物宜具有取代基。
可以作為有機酸而使用之胺基酸,可列舉出甘胺酸、二羥乙基甘胺酸、甘胺醯甘胺酸、羥乙基甘胺酸、N-甲基甘胺酸、β-丙胺酸、L-丙胺酸、L-2-胺基丁酸、L-正纈胺酸、L-纈胺酸、L-白胺酸、L-正白胺酸、L-別異白胺酸、L-異白胺酸、L-苯丙胺酸、L-脯胺酸、肌胺酸、L-鳥胺酸、L-離胺酸、牛磺酸、L-絲胺酸、L-蘇胺酸、L-別蘇胺酸、L-高絲胺酸、L-甲狀腺素、L-酪胺酸、3,5-二碘-L-酪胺酸、β-(3,4-二羥基苯基)-L-丙胺酸、4-羥基-L-脯胺酸、L-半胱胺酸、L-甲硫胺酸、L-乙硫胺酸、L-羊毛硫胺酸、L-胱硫醚、L-胱胺酸、L-氧化半胱胺酸、L-麩胺酸、L-天冬胺酸、S-(羧甲基)-L-半胱胺酸、4-胺基丁酸、L-天冬醯胺酸、L-麩醯胺酸、氮絲胺酸、L-刀豆胺酸、L-瓜胺酸、L-精胺酸、δ-羥基-L-離胺酸、肌酸、L-犬尿胺酸、L-組胺酸、1-甲基-L-組胺酸、3-甲基-L-組胺酸、L-色胺酸、放線菌黴素C1、麥角硫鹼(ergothioneine)、蜂毒明肽(apamin)、第一型血管收縮素(angiotensin I)、第二型血管收縮素(angiotensin II)及抗痛素(antipain)等。其中,尤以甘胺酸、L-丙胺酸、L-脯胺酸、L-組胺酸、L-離胺酸、以及二羥乙基甘胺酸為較佳。
又,可以作為有機酸而使用的胺基多元酸(amino polyacid),可列舉出亞胺二乙酸、氮基三乙酸、二乙三胺五乙酸、乙二胺四乙酸、羥乙基亞胺二乙酸、氮基三亞甲基膦酸(nitrilotris(methylene)phosphonic acid)、乙二胺-N,N,N',N'-四亞甲基磺酸、1,2-二胺丙烷四乙酸、二醇醚二胺四乙酸、反式環己烷二胺四乙酸、乙二胺鄰羥基苯基乙酸、乙二胺二琥珀酸(SS體)、β-丙胺酸二乙酸、N-(2-羧酸根合乙基)-L-天冬胺酸、N,N'-雙(2-羥基芐基)乙二胺N,N'-二乙酸等。
此外,可以作為有機酸而使用之羧酸,可列舉出甲酸、乙醇酸、丙酸、乙酸、丁酸、戊酸、己酸、草酸、丙二酸、戊二酸、己二酸、蘋果酸、琥珀酸、庚二酸、氫硫乙酸、乙醛酸、氯乙酸、丙酮酸、乙醯乙酸、戊二酸等之飽和羧酸,或丙烯酸、甲基丙烯酸、巴豆酸、反丁烯二酸、順丁烯二酸、中康酸、檸康酸、烏頭酸等之不飽和羧酸、安息香酸類、甲苯甲酸、鄰苯二甲酸類、萘甲酸類、焦蜜石酸、以及萘二甲酸等之環狀不飽和羧酸等。
作為包含於切割液14中的氧化劑,可以使用例如,過氧化氫、過氧化物、硝酸鹽、碘酸鹽、過碘酸鹽、次氯酸鹽、亞氯酸鹽、氯酸鹽、過氯酸鹽、過硫酸鹽、重鉻酸鹽、過錳酸鹽、鈰酸鹽、釩酸鹽、臭氧水及銀(II)鹽、鐵(III)鹽、或其有機錯鹽等。
又,亦可在切割液14中混合防蝕劑。藉由混合防蝕劑,可防止被加工物11中所含有之金屬腐蝕(溶出)。作為防蝕劑,較理想的是使用例如,分子內具有3個以上的氮原子,且具有稠環構造之芳香雜環化合物、或分子內具有4個以上的氮原子之芳香雜環化合物。此外,芳環化合物宜包含羧基、磺酸基、羥基、烷氧基。具體而言,宜為四唑衍生物、1,2,3-三唑衍生物、以及1,2,4-三唑衍生物。
可以作為防蝕劑而使用的四唑衍生物,可列舉出在形成四唑環之氮原子上不具有取代基,且在四唑的第5位置上導入以下的基之四唑衍生物:選自於由磺酸基、胺基、胺甲醯基、碳醯胺基、胺磺醯基以及磺醯胺基所構成之群組中的取代基、或是用選自於由羥基、羧基、磺酸基、胺基、胺甲醯基、碳醯胺基、胺磺醯基以及磺醯胺基所構成之群組中的至少1個取代基所取代之烷基。
又,可以作為防蝕劑而使用的1,2,3-三唑衍生物,可列舉出在形成1,2,3-三唑環之氮原子上不具有取代基,且在1,2,3-三唑的第4位置及/或第5位置上導入以下的基之三唑衍生物:選自於由羥基、羧基、磺酸基、胺基、胺甲醯基、碳醯胺基、胺磺醯基以及磺醯胺基所構成之群組中的取代基、或是用選自於由羥基、羧基、磺酸基、胺基、胺甲醯基、碳醯胺基、胺磺醯基以及磺醯胺基所構成之群組中的至少1個取代基所取代的烷基或芳基。
又,可以作為防蝕劑而使用的1,2,4-三唑衍生物,可列舉出在形成1,2,4-三唑環之氮原子上不具有取代基,且在1,2,4-三唑的第2位置及/或第5位置上導入以下的基之三唑衍生物:選自於由磺酸基、胺甲醯基、碳醯胺基、胺磺醯基以及磺醯胺基所構成之群組中的取代基、或是用選自於由羥基、羧基、磺酸基、胺基、胺甲醯基、碳醯胺基、胺磺醯基以及磺醯胺基所構成之群組中的至少1個取代基所取代的烷基或芳基。
當重複上述之工序,而沿著全部的切斷預定線13都形成切割溝19a時,切割步驟即結束。在本實施形態中,因為是一邊對被加工物11供給包含有機酸及氧化劑的切割液14一邊進行切割,所以可一邊將包含於積層體17的金屬改質以降低其延展性,一邊進行切割。藉此,即使提高加工的速度仍然可以抑制毛邊的產生。
於切割步驟後是進行以雷射加工裝置的工作夾台(第2保持台)保持被加工物11的第2保持步驟。圖3(A)是用於說明第2保持步驟的局部截面側視圖。第2保持步驟是採用例如圖3(A)所示的雷射加工裝置22來進行。雷射加工裝置22具備有用於吸引、保持被加工物11的工作夾台(第2保持台)24。
工作夾台24是與馬達等的旋轉驅動源(圖未示)相連結,並繞著與鉛直方向大致平行的旋轉軸旋轉。又,於工作夾台24的下方設置有移動機構(圖未示),工作夾台24是藉由此移動機構而朝加工進給方向(第1水平方向)及分度進給方向(第2水平方向)移動。
工作夾台24的上表面的一部分是形成為用於吸引、保持被加工物11(片材21)的保持面24a。保持面24a是透過形成在工作夾台24的內部的吸引路(圖未示)等而連接到吸引源(圖未示)。藉由使吸引源的負壓作用在保持面24a,可將被加工物11吸引、保持於工作夾台24。於該工作夾台24的周圍設有用於固定環狀的框架23的複數個夾具26。
在第2保持步驟中,首先是使黏貼於被加工物11的正面11a側的片材21接觸於工作夾台24的保持面24a,並使吸引源的負壓作用。並一併利用夾具26來固定框架23。藉此,被加工物11是在背面11b側的積層體17朝上方露出的狀態下被保持。
於第2保持步驟後是進行雷射加工步驟,該雷射加工步驟是從被加工物11的背面11b側照射雷射光束來沿著切斷預定線13將被加工物11切斷。雷射加工步驟是繼續使用雷射加工裝置22來進行。圖3(B)是用於說明雷射加工步驟的局部截面側視圖。如圖3(B)所示,雷射加工裝置22更具備有配置於工作夾台24的上方的雷射照射單元28。
雷射照射單元28會將以雷射振盪器(圖未示)所脈衝振盪產生的雷射光束28a於規定的位置照射、聚光。雷射振盪器是構成為可以脈衝振盪產生被加工物11可吸收之波長(對被加工物11具有吸收性之波長、容易被吸收之波長)的雷射光束28a。
在雷射加工步驟中,首先是使工作夾台24旋轉,並將成為對象的切割溝19a(即切斷預定線13)的伸長方向對準於雷射加工裝置22的加工進給方向。又,使工作夾台24移動,而將雷射照射單元28的位置於成為對象的切割溝19a的延長線上對準。
然後,如圖3(B)所示,一邊從雷射照射單元28朝向被加工物11的背面11b側照射雷射光束28a,一邊使工作夾台24朝加工進給方向移動。在此,是使雷射光束28a聚光於切割溝19a之底、被加工物11的正面11a、內部等。
藉此,可以沿著成為對象的切割溝19a照射雷射光束28a,而形成如將被加工物11於厚度方向上切斷的截口(切口)19b。當重複上述的動作,而例如沿著全部的切割溝19a來形成截口19b,且將被加工物11分割成複數個晶片時,雷射加工步驟即結束。
如以上,在本實施形態的加工方法中,因為是在形成將包含金屬的積層體17斷開的切割溝19a之時,供給包含有機酸與氧化劑的切割液14,所以可以一邊利用有機酸與氧化劑將金屬改質而降低其延展性一邊進行切割。藉此,即使提高加工的速度仍然可以抑制毛邊的產生。亦即,可維持加工的品質並且提高加工的速度。
再者,本發明並不因上述實施形態之記載而受到限制,並可作各種變更而實施。例如,在上述實施形態的雷射加工步驟中,雖然是藉由使用被加工物11可吸收之波長的雷射光束28a的燒蝕加工來將被加工物11切斷,但亦可利用其他方法來對被加工物11進行加工。
圖4是用於說明變形例之雷射加工步驟的局部截面側視圖。如圖4所示,變形例的雷射加工步驟是採用與上述實施形態同樣的雷射加工裝置22來進行。然而,變形例的雷射加工步驟的雷射照射單元28是構成為可以將於被加工物11中可穿透之波長(對被加工物11具有穿透性之波長、難以被吸收之波長)的雷射光束28b於規定的位置照射、聚光。
在變形例的雷射加工步驟中,首先是使工作夾台24旋轉,並將成為對象的切割溝19a(即切斷預定線13)的伸長方向對準於雷射加工裝置22的加工進給方向。又,使工作夾台24移動,而將雷射照射單元28的位置於成為對象的切割溝19a的延長線上對準。
然後,如圖5(B)所示,一邊從雷射照射單元28朝向被加工物11的背面11b側照射雷射光束28b,一邊使工作夾台24朝加工進給方向移動。在此,是使雷射光束28b聚光於例如被加工物11的內部。
藉此,沿著成為對象的切割溝19a照射於被加工物11中可穿透之波長的雷射光束28b,而可以藉由多光子吸收將被加工物11的內部改質。其結果,在被加工物11的內部,會沿著切割溝19a而形成成為分割之起點的改質層19c。
當重複上述之動作,而沿著全部的切斷預定線13都形成改質層19c時,變形例的雷射加工步驟即結束。此改質層19c亦可例如以裂隙到達被加工物11之正面11a或切割溝19a之底的條件來形成。又,也可以相對於一條切斷預定線13,在不同深度的位置上重疊而形成複數個改質層19c。
又,於變形例的雷射加工步驟後,宜進一步進行沿著改質層19c分割被加工物11的分割步驟。圖5(A)及圖5(B)是用於說明分割步驟的局部截面側視圖。分割步驟是使用例如圖5(A)及圖5(B)所示的擴張裝置32來進行。如圖5(A)及圖5(B)所示,擴張裝置32具備有用於支撐被加工物11的支撐構造34、及圓筒狀的擴張滾筒36。
支撐構造34包含支撐台38,該支撐台58具有在平面視角下圓形的開口部。在此支撐台38的上表面可載置環狀的框架23。在支撐台38的外周部分,設置有用於固定框架23的複數個夾具40。支撐台38是藉由用於升降支撐構造34的升降機構42而被支撐。
升降機構42具備有被固定在下方的基台(圖未示)的汽缸罩殼44、及插入於汽缸罩殼44的活塞桿46。在活塞桿46的上端部固定有支撐台38。升降機構42是藉由將活塞桿46上下地移動而使支撐構造34升降。
於支撐台38的開口部配置有擴張滾筒36。擴張滾筒36的內徑(直徑)是比被加工物11的直徑更大。另一方面,擴張滾筒36的外徑(直徑)是形成得比環狀的框架23的內徑(直徑)、或支撐台38的開口部的直徑更小。
在分割步驟中,首先是如圖5(A)所示,將支撐台38的上表面的高度對準於擴張滾筒36的上端的高度,並於將框架23載置於支撐台38的上表面後,以夾具40將框架23固定。藉此,擴張滾筒36的上端是在被加工物11與框架23之間接觸於片材21。
接著,以升降機構42使支撐構造34下降,以如圖5(B)所示,使支撐台38的上表面移動到比擴張滾筒36的上端更下方。其結果,擴張滾筒36是相對於支撐台38上升,且片材21會被擴張滾筒36上推而以放射狀的形式被擴張。當擴張片材21時,會讓片材21擴張的方向的力(放射狀的力)作用在被加工物11上。藉此,被加工物11會以改質層19c為起點而分割成複數個晶片。
又,在上述實施形態中,雖然是在第1保持步驟之前進行片材貼附步驟,但是亦可設成例如在第2保持步驟之前(雷射加工步驟之前)進行片材貼附步驟。
又,於上述實施形態及變形例的雷射加工步驟中,雖然是從被加工物11的背面11b側照射雷射光束,但是也可以從被加工物11的正面11a側來照射雷射光束。再者,在這種情況下,由於會成為在第2保持步驟保持被加工物11的背面11b側之情形,所以在第2保持步驟之前宜將正面11a側之片材21剝下,並於背面11b側黏貼另外的片材(保護構件)等。
又,在上述之切割步驟中,雖然是從包夾切割刀10的一對噴嘴12來供給切割液14,但對於用於供給切割液14之噴嘴的態樣並無特別的限制。圖6是顯示用於供給切割液14的另外的態樣的噴嘴的側視圖。如圖6所示,變形例的切割單元8,是除了切割刀10及一對噴嘴12以外,還具有配置在切割刀10的前方(或者後方)的噴嘴(噴淋噴嘴)16。
藉由從此噴嘴16供給切割液14,變得容易對切割溝19a供給切割液14,而成為可以更有效地將積層體17中的金屬改質。特別是如圖6所示,當將噴嘴16的噴射口朝向斜下方(例如切割刀10的加工點附近)時,會對切割溝19a供給、充填大量的切割液14,而可以更有效地將積層體17中的金屬改質,因而較理想。又,在圖6中,雖然是將噴嘴16與一對噴嘴12一起使用,但亦可僅單獨使用噴嘴16。
另外,上述實施形態之構造、方法等,只要在不脫離本發明的目的之範圍內,均可適當變更而實施。
11‧‧‧被加工物
11a‧‧‧正面
11b‧‧‧背面
13‧‧‧切斷預定線(切割道)
15‧‧‧器件
17‧‧‧積層體
19a‧‧‧切割溝
19b‧‧‧截口(切口)
19c‧‧‧改質層
21‧‧‧片材(保護構件)
23‧‧‧框架
2‧‧‧切割裝置
4‧‧‧工作夾台(第1保持台)
4a、24a‧‧‧保持面
6、26、40‧‧‧夾具
8‧‧‧切割單元
10‧‧‧切割刀
12‧‧‧噴嘴
14‧‧‧切割液
16‧‧‧噴嘴(噴淋噴嘴)
22‧‧‧雷射加工裝置
24‧‧‧工作夾台(第2保持台)
28‧‧‧雷射照射單元
28a、28b‧‧‧雷射光束
32‧‧‧擴張裝置
34‧‧‧支撐構造
36‧‧‧擴張滾筒
38‧‧‧支撐台
42‧‧‧升降機構
44‧‧‧汽缸罩殼
46‧‧‧活塞桿
圖1(A)是示意地顯示被加工物的構成例之立體圖,圖1(B)是用於說明片材貼附步驟之立體圖。 圖2(A)是用於說明第1保持步驟的局部截面側視圖,圖2(B)是用於說明切割步驟的局部截面側視圖。 圖3(A)是用於說明第2保持步驟的局部截面側視圖,圖3(B)是用於說明雷射加工步驟的局部截面側視圖。 圖4是用於說明變形例之雷射加工步驟的局部截面側視圖。 圖5(A)及圖5(B)是用於說明分割步驟的局部截面側視圖。 圖6是顯示用於供給切割液的另外的態樣之噴嘴的側視圖。

Claims (4)

  1. 一種加工方法,是對在背面側形成有包含金屬之積層體的板狀的被加工物進行加工,該加工方法的特徵在於: 具備以下步驟: 保持步驟,以保持台保持被加工物的正面側,以使該積層體露出; 切割步驟,在實施該保持步驟後,以切割刀沿著切斷預定線切割被加工物,而形成將該積層體斷開的切割溝;以及 雷射加工步驟,在實施該切割步驟後,沿著該切割溝照射雷射光束, 在該切割步驟中,是一邊對被加工物供給包含有機酸及氧化劑的切割液一邊進行切割。
  2. 如請求項1之加工方法,其中在該雷射加工步驟中,是照射對被加工物具有吸收性之波長的雷射光束,來沿著該切斷預定線將被加工物於厚度方向上切斷。
  3. 如請求項1之加工方法,其中在該雷射加工步驟中,是照射對被加工物具有穿透性之波長的雷射光束,而在被加工物形成沿著該切割溝的改質層, 且該加工方法更具備分割步驟,該分割步驟是在實施該雷射加工步驟後,沿著該改質層分割被加工物。
  4. 如請求項1至3中任一項之加工方法,其中在該雷射加工步驟中,是將雷射光束照射在被加工物的該背面, 且該加工方法更具備片材貼附步驟,該片材貼附步驟是在實施該雷射加工步驟前,將片材貼附於被加工物的該正面。
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Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP6821261B2 (ja) * 2017-04-21 2021-01-27 株式会社ディスコ 被加工物の加工方法
DE102019204457B4 (de) * 2019-03-29 2024-01-25 Disco Corporation Substratbearbeitungsverfahren
US20230207392A1 (en) * 2020-09-16 2023-06-29 Rohm Co., Ltd. Method for manufacturing semiconductor device and semiconductor device

Family Cites Families (48)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4207976B2 (ja) * 2006-05-17 2009-01-14 住友電気工業株式会社 化合物半導体基板の表面処理方法、および化合物半導体結晶の製造方法
JPS6349926A (ja) 1986-08-20 1988-03-02 Nec Corp 複数ソ−ト処理の並行実行方式
JPH06349926A (ja) 1993-06-12 1994-12-22 Hitachi Ltd 半導体装置
US5461008A (en) 1994-05-26 1995-10-24 Delco Electronics Corporatinon Method of preventing aluminum bond pad corrosion during dicing of integrated circuit wafers
JPH0955573A (ja) 1995-08-10 1997-02-25 Disco Abrasive Syst Ltd 樹脂基板の切削方法
US5904548A (en) 1996-11-21 1999-05-18 Texas Instruments Incorporated Trench scribe line for decreased chip spacing
US6310017B1 (en) 1999-02-01 2001-10-30 Ct Associates, Inc. Cleaner composition, method for making and using same
JP3440888B2 (ja) 1999-06-21 2003-08-25 株式会社村田製作所 ダイシングブレード及び電子部品の製造方法
US6280298B1 (en) 1999-11-24 2001-08-28 Intel Corporation Test probe cleaning
US6596562B1 (en) * 2002-01-03 2003-07-22 Intel Corporation Semiconductor wafer singulation method
US6791197B1 (en) 2002-08-26 2004-09-14 Integrated Device Technology, Inc. Reducing layer separation and cracking in semiconductor devices
US7855130B2 (en) 2003-04-21 2010-12-21 International Business Machines Corporation Corrosion inhibitor additives to prevent semiconductor device bond-pad corrosion during wafer dicing operations
US7087452B2 (en) * 2003-04-22 2006-08-08 Intel Corporation Edge arrangements for integrated circuit chips
JP4231349B2 (ja) 2003-07-02 2009-02-25 株式会社ディスコ レーザー加工方法およびレーザー加工装置
US6974726B2 (en) * 2003-12-30 2005-12-13 Intel Corporation Silicon wafer with soluble protective coating
JP2006140341A (ja) * 2004-11-12 2006-06-01 Disco Abrasive Syst Ltd ウエーハの分割方法
JP4751634B2 (ja) 2005-03-31 2011-08-17 富士通セミコンダクター株式会社 半導体装置の製造方法
US7152596B1 (en) 2005-09-15 2006-12-26 You Min Zhang Circular saw blade body
US20080191318A1 (en) 2007-02-09 2008-08-14 Advanced Micro Devices, Inc. Semiconductor device and method of sawing semiconductor device
US8629532B2 (en) * 2007-05-08 2014-01-14 Taiwan Semiconductor Manufacturing Co., Ltd. Semiconductor wafer with assisting dicing structure and dicing method thereof
JP5128897B2 (ja) * 2007-10-23 2013-01-23 株式会社ディスコ ウエーハの分割方法
JP2011020231A (ja) * 2009-07-17 2011-02-03 Disco Abrasive Syst Ltd 切削装置
JP5419596B2 (ja) 2009-09-02 2014-02-19 兼房株式会社 回転工具のための流体供給機構
US8883701B2 (en) * 2010-07-09 2014-11-11 Air Products And Chemicals, Inc. Method for wafer dicing and composition useful thereof
IT1402530B1 (it) 2010-10-25 2013-09-13 St Microelectronics Srl Circuiti integrati con retro-metallizzazione e relativo metodo di produzione.
JP5480923B2 (ja) 2011-05-13 2014-04-23 シャープ株式会社 半導体モジュールの製造方法及び半導体モジュール
US8557682B2 (en) * 2011-06-15 2013-10-15 Applied Materials, Inc. Multi-layer mask for substrate dicing by laser and plasma etch
US8673741B2 (en) * 2011-06-24 2014-03-18 Electro Scientific Industries, Inc Etching a laser-cut semiconductor before dicing a die attach film (DAF) or other material layer
JP2013161998A (ja) 2012-02-07 2013-08-19 Disco Abrasive Syst Ltd 切削方法
US8952413B2 (en) 2012-03-08 2015-02-10 Micron Technology, Inc. Etched trenches in bond materials for die singulation, and associated systems and methods
US8652940B2 (en) 2012-04-10 2014-02-18 Applied Materials, Inc. Wafer dicing used hybrid multi-step laser scribing process with plasma etch
JP5996260B2 (ja) * 2012-05-09 2016-09-21 株式会社ディスコ 被加工物の分割方法
US8871613B2 (en) * 2012-06-18 2014-10-28 Semiconductor Components Industries, Llc Semiconductor die singulation method
US8859397B2 (en) 2012-07-13 2014-10-14 Applied Materials, Inc. Method of coating water soluble mask for laser scribing and plasma etch
US9085049B2 (en) 2012-11-30 2015-07-21 Taiwan Semiconductor Manufacturing Company, Ltd. Method and system for manufacturing semiconductor device
US8980726B2 (en) * 2013-01-25 2015-03-17 Applied Materials, Inc. Substrate dicing by laser ablation and plasma etch damage removal for ultra-thin wafers
JP6078376B2 (ja) * 2013-02-22 2017-02-08 株式会社ディスコ ウエーハの加工方法
US20150040983A1 (en) * 2013-08-07 2015-02-12 Solarworld Industries America, Inc. Acidic etching process for si wafers
JP6274926B2 (ja) * 2014-03-17 2018-02-07 株式会社ディスコ 切削方法
US9275902B2 (en) * 2014-03-26 2016-03-01 Applied Materials, Inc. Dicing processes for thin wafers with bumps on wafer backside
US9130057B1 (en) * 2014-06-30 2015-09-08 Applied Materials, Inc. Hybrid dicing process using a blade and laser
US9165832B1 (en) * 2014-06-30 2015-10-20 Applied Materials, Inc. Method of die singulation using laser ablation and induction of internal defects with a laser
JP6426407B2 (ja) * 2014-09-03 2018-11-21 株式会社ディスコ ウエーハの加工方法
KR102457313B1 (ko) 2014-09-29 2022-10-20 린텍 가부시키가이샤 반도체 웨이퍼 가공용 시트용 기재, 반도체 웨이퍼 가공용 시트 및 반도체 장치의 제조 방법
JP6545468B2 (ja) 2015-01-16 2019-07-17 ショーダテクトロン株式会社 分割溝形成装置および分割溝形成方法
CN105925984B (zh) * 2016-05-16 2021-03-23 浙江师范大学 一种机械加工用去毛刺液及其制备方法
US10535554B2 (en) 2016-12-14 2020-01-14 Taiwan Semiconductor Manufacturing Co., Ltd. Semiconductor die having edge with multiple gradients and method for forming the same
JP6890885B2 (ja) * 2017-04-04 2021-06-18 株式会社ディスコ 加工方法

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