TW201430927A - Die ejecting apparatus - Google Patents

Die ejecting apparatus Download PDF

Info

Publication number
TW201430927A
TW201430927A TW102135626A TW102135626A TW201430927A TW 201430927 A TW201430927 A TW 201430927A TW 102135626 A TW102135626 A TW 102135626A TW 102135626 A TW102135626 A TW 102135626A TW 201430927 A TW201430927 A TW 201430927A
Authority
TW
Taiwan
Prior art keywords
bracket
die
unit
exit
chuck
Prior art date
Application number
TW102135626A
Other languages
Chinese (zh)
Other versions
TWI521586B (en
Inventor
Ho-Cheon Bang
Hee-Cheol Lee
Sok-Taek Lim
Hyun-Ok Choi
Original Assignee
Semes Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Semes Co Ltd filed Critical Semes Co Ltd
Publication of TW201430927A publication Critical patent/TW201430927A/en
Application granted granted Critical
Publication of TWI521586B publication Critical patent/TWI521586B/en

Links

Abstract

Provided is a die ejecting apparatus. The apparatus includes a stage configured to support a dicing tape on which a plurality of dies is attached; a die ejector comprising an ejecting unit disposed under the stage and configured to selectively pushing up one of the dies upwardly, a body comprising a driving unit configured to vertically move the ejecting unit, and a holder, in which the ejecting unit is built, the holder having an open bottom to allow a top of the body to be inserted thereinto; a holder containing unit disposed on one side of the stage, in which holders with a plurality of ejecting units built-in, respectively, are contained; and a holder transfer unit configured to transfer the holders between the die ejector and the holder containing unit to replace the holder by one of the holders contained in the holder containing unit.

Description

晶粒退出裝置 Die exit device

本發明之實施例係有關於一種晶粒退出裝置,特別係有關於在一半導體製造程序中,自一矽晶圓分離包括半導體裝置之晶粒而將晶粒黏於一基體之一種晶粒退出裝置。 Embodiments of the present invention relate to a die exit device, and more particularly to a die exiting a die including a die of a semiconductor device from a wafer in a semiconductor fabrication process to adhere the die to a substrate. Device.

通常,半導體裝置可形成於一半導體矽晶圓(wafer)上,藉由重複執行一連串的半導體製造程序而作為半導體基體。如上所述之半導體裝置形成方式可經由切割程序而分離,且可經由黏接程序而黏至基體上。 Generally, a semiconductor device can be formed on a semiconductor wafer by repeating a series of semiconductor fabrication processes as a semiconductor substrate. The semiconductor device forming manner as described above can be separated by a cutting process and can be adhered to the substrate via a bonding process.

用以執行晶粒附著程序之裝置可包括用以夾取之夾取(pickup)模組、將矽晶圓(wafer)上之晶粒(die)分離而成為包括半導體裝置之晶粒以及將夾取之晶粒放置於基體上之附著模組。夾取模組可包括用以支撐矽晶圓環(wafer ring)至矽晶圓附著之地方之基座單元、用以垂直移動以選擇性地自由基座單元所支撐之矽晶圓分離一晶粒以及用以自矽晶圓夾取晶粒以及將晶粒附著至基體之夾取模組。 The apparatus for performing a die attach process may include a pickup module for clamping, separating a die on a wafer into a die including a semiconductor device, and clamping the die The attached module is placed on the substrate. The clamping module may include a base unit for supporting a wafer ring to a place where the wafer is attached, and a vertical separation for selectively moving the wafer to be supported by the base unit. The granules and the gripping module for picking up the dies from the wafer and attaching the dies to the substrate.

通常,晶粒退出裝置包括用以垂直抬起晶粒以便將晶粒自切割帶(dicing tape)分離之退出單元、支撐退出單元之支架、垂直移動退出單元之驅動單元以及支撐驅動單元知本體。如上所述之晶粒退出裝置揭露於韓國專利登記號10-0975500以及韓國專利公開號10-2009-0108447。 Generally, the die exit device includes an exit unit for vertically lifting the die to separate the die from the dicing tape, a support for supporting the exit unit, a drive unit for vertically moving the exit unit, and a support drive unit body. The die exit device as described above is disclosed in Korean Patent Registration No. 10-090750 and Korean Patent Publication No. 10-2009-0108447.

另一方面,當交換退出單元以及支架以對應晶粒之大小時,因為相當大量的時間用以對齊旋轉角度以及退出單元與支架之中心,使用晶粒退出裝置之晶粒附著設備的使用率將顯著地降低。 On the other hand, when exchanging the exit unit and the bracket to correspond to the size of the die, since a considerable amount of time is used to align the angle of rotation and exit the center of the unit and the bracket, the use of the die attach device using the die exit device will Significantly lower.

本發明之一實施例提供晶粒退出裝置,能夠非常簡單地交換晶粒退出單元以及支架。 One embodiment of the present invention provides a die exit device that is capable of very simple exchange of die exit units and brackets.

根據本發明之一實施例,一種晶粒退出裝置包括:一基座,用以支撐附著複數晶粒之一切割帶;一晶粒退出器,包括放置於上述基座下且用以選擇性地將上述晶粒之一者向上推之一退出單元、包括用以垂直移動上述退出單元之一本體以及一第一支架,其中上述退出單元內建於上述第一支架且上述第一支架具有一下開口以允許上述本體之一頂端插入;一支架承載單元,放置於上述基座之一邊,上述支架承載單元內建複數第二支架以及複數退出單元;以及一支架傳送單元,用以傳送介於上述晶粒退出器以及上述支架承載單元間之上述第二支架,而以上述支架承載單元內之上述第二支架之一者更換上述第一支架。 According to an embodiment of the present invention, a die exit device includes: a pedestal for supporting a dicing tape attached to a plurality of dies; and a die ejector disposed under the pedestal for selectively Pushing one of the above-mentioned dies up one of the exiting units, including a body for vertically moving the ejecting unit and a first bracket, wherein the ejecting unit is built in the first bracket and the first bracket has a lower opening To allow insertion of one of the top ends of the body; a bracket carrying unit disposed on one side of the base, the bracket carrying unit having a plurality of second brackets and a plurality of exit units; and a bracket transport unit for transporting the crystal And replacing the second bracket between the granular ejector and the bracket carrying unit, and replacing the first bracket with one of the second brackets in the bracket carrying unit.

根據本發明之一實施例,其中上述支架承載單元包括:一底座面板,具有一圓盤形;複數支架承載部件,以沿著一圓周方向安置於上述底座面板上,以分別承載上述第二支架;以及一旋轉驅動器,用以旋轉上述底座面板。 According to an embodiment of the present invention, the bracket carrying unit comprises: a base panel having a disc shape; and a plurality of bracket carrying members disposed on the base panel along a circumferential direction to respectively carry the second bracket And a rotary drive for rotating the base panel.

根據本發明之一實施例,其中上述支架承載單元放置於承載複數矽晶圓之一卡夾的對面,上述基座放置於上述 支架承載單元以及上述卡夾之間。 According to an embodiment of the present invention, the bracket carrying unit is placed on the opposite side of a card holder carrying a plurality of wafers, and the base is placed on the above A bracket carrying unit and the above clip.

根據本發明之一實施例,其中上述支架傳送單元包括:一支架抓取器,用以抓取上述第一支架之一外部表面;一傳送部件,用以水平地或垂直地傳送上述支架抓取器,其中上述支架抓取器與上述傳送部件以及自上述卡夾退出以及傳送上述矽晶圓之一者至上述基座上之一夾取器耦接在一起。 According to an embodiment of the present invention, the bracket transport unit includes: a bracket grabber for grasping an outer surface of one of the first brackets; and a transmitting member for transmitting the bracket grab horizontally or vertically And the above-mentioned bracket grabber is coupled with the above-mentioned transporting member and one of the clips that are ejected from the clip and transporting one of the tantalum wafers to one of the grippers on the base.

根據本發明之一實施例,其中用以與上述支架抓取器耦接之一溝槽係形成於上述支架之上述外表面。 According to an embodiment of the invention, a groove for coupling with the bracket grabber is formed on the outer surface of the bracket.

根據本發明之一實施例,其中上述支架承載部件分別包括:一卡盤,用以插入上述第一支架之上述下開口;以及複數接觸元件,用以自上述卡盤之一邊凸出,且與上述支架之上述下開口之一內表面緊密連接而抓取上述第一支架。 According to an embodiment of the present invention, the bracket bearing member includes: a chuck for inserting the lower opening of the first bracket; and a plurality of contact elements for protruding from one side of the chuck, and One of the inner surfaces of the lower opening of the bracket is tightly coupled to grasp the first bracket.

根據本發明之一實施例,其中上述用以垂直移動之一活塞包括具有一既定梯度之一上邊坡,上述活塞放置於上述卡盤中,以及上述接觸元件分別包括用以與上述支架之上述下開口之上述內表面緊密連接之一外表面以及用以與上述活塞之上述上邊坡緊密連接之一內表面,以及藉由上述活塞之垂直運動與上述第一支架之上述下開口之上述內表面緊密連接。 According to an embodiment of the present invention, wherein the piston for vertically moving comprises an upper slope having a predetermined gradient, the piston is placed in the chuck, and the contact elements respectively comprise the upper portion and the bracket The inner surface of the opening is closely connected to an outer surface and an inner surface for tightly connecting to the upper slope of the piston, and the vertical movement of the piston is close to the inner surface of the lower opening of the first bracket connection.

根據本發明之一實施例,其中上述接觸元件之複數移動路徑係提供於上述卡盤內,上述移動路徑具有由上述卡盤內部至上述卡盤外部逐漸增加之一梯度。 According to an embodiment of the invention, the plurality of moving paths of the contact elements are provided in the chuck, and the moving path has a gradient gradually increasing from the inside of the chuck to the outside of the chuck.

根據本發明之一實施例,其中一永久性磁鐵內建於上述活塞中,因為上述永久性磁鐵的關係,上述接觸元件與上述上邊坡保持緊密接觸。 According to an embodiment of the present invention, a permanent magnet is built in the piston, and the contact member is in close contact with the upper slope due to the relationship of the permanent magnet.

1‧‧‧裝置 1‧‧‧ device

10‧‧‧矽晶圓 10‧‧‧矽 wafer

12‧‧‧卡夾 12‧‧‧Card holder

20‧‧‧晶粒 20‧‧‧ grain

30‧‧‧矽晶圓環 30‧‧‧矽 wafer ring

32‧‧‧切割帶 32‧‧‧Cut tape

40‧‧‧基座 40‧‧‧Base

42‧‧‧抓取器 42‧‧‧ Grabber

44‧‧‧延伸環 44‧‧‧Extension ring

50‧‧‧夾取裝置 50‧‧‧Clamping device

60‧‧‧夾取器 60‧‧‧Clipper

70‧‧‧導軌 70‧‧‧rails

100‧‧‧晶粒退出裝置 100‧‧‧ die exit device

102‧‧‧晶粒退出器 102‧‧‧ die exitor

110‧‧‧支撐退出單元 110‧‧‧Support exit unit

112‧‧‧氣室 112‧‧‧ air chamber

120‧‧‧支架 120‧‧‧ bracket

122‧‧‧上面板 122‧‧‧Upper panel

122A‧‧‧穿孔 122A‧‧‧Perforation

122B‧‧‧真空孔洞 122B‧‧‧vacuum holes

124‧‧‧外殼 124‧‧‧Shell

126‧‧‧支撐部件 126‧‧‧Support parts

128‧‧‧溝槽 128‧‧‧ trench

129‧‧‧對齊凹口 129‧‧‧ alignment notches

130‧‧‧支撐驅動單元 130‧‧‧Support drive unit

132‧‧‧頭部 132‧‧‧ head

134‧‧‧傳動軸 134‧‧‧ drive shaft

136、186、350‧‧‧永久性磁鐵 136, 186, 350‧‧‧ permanent magnets

140‧‧‧本體 140‧‧‧ Ontology

148‧‧‧定位梢 148‧‧‧ Positioning tips

170‧‧‧第一密封元件 170‧‧‧First sealing element

172‧‧‧第二密封元件 172‧‧‧Second sealing element

180‧‧‧退出裝置 180‧‧‧Exit device

182‧‧‧退出梢 182‧‧‧Exit the tip

184‧‧‧支撐面板 184‧‧‧Support panel

190‧‧‧支架 190‧‧‧ bracket

192‧‧‧上面板 192‧‧‧Upper panel

192A、216‧‧‧穿孔 192A, 216‧‧‧ perforation

194‧‧‧外殼 194‧‧‧ Shell

200‧‧‧支架傳送單元 200‧‧‧Bracket transfer unit

210‧‧‧支架抓取器 210‧‧‧ bracket grabber

212‧‧‧基底區塊 212‧‧‧Base block

214‧‧‧開口 214‧‧‧ openings

220‧‧‧停止區塊 220‧‧‧Stop block

230‧‧‧夾取部件 230‧‧‧Capture parts

232‧‧‧彈簧 232‧‧ ‧ spring

240‧‧‧夾取驅動器 240‧‧‧Clip drive

250‧‧‧夾取區塊 250‧‧‧Catch block

252‧‧‧第一側面 252‧‧‧ first side

254‧‧‧第二側面 254‧‧‧ second side

256‧‧‧孔洞 256‧‧‧ holes

258‧‧‧停止元件 258‧‧‧stop components

260‧‧‧光學感測器 260‧‧‧ optical sensor

270‧‧‧傳送部件 270‧‧‧Transfer parts

280‧‧‧水平傳送部件 280‧‧‧ horizontal transfer parts

290‧‧‧垂直傳送部件 290‧‧‧Vertical transmission parts

300‧‧‧支架承載單元 300‧‧‧ bracket bearing unit

302‧‧‧底座面板 302‧‧‧Base panel

304‧‧‧旋轉驅動器 304‧‧‧Rotary drive

310‧‧‧支架承載部件 310‧‧‧Bear bearing parts

320‧‧‧卡盤 320‧‧‧ chuck

322‧‧‧移動路徑 322‧‧‧Moving path

330‧‧‧驅動接觸元件 330‧‧‧Drive contact elements

340‧‧‧活塞 340‧‧‧Piston

342‧‧‧上邊坡 342‧‧‧Upper slope

360‧‧‧活塞驅動器 360‧‧‧Piston drive

藉由以下的敘述搭配附圖以更進一步地瞭解本發明之實施例,其中:第1圖係顯示根據本發明之一實施例所述之一晶粒退出裝置之示意圖;第2圖係顯示第1圖所示之基座之剖面圖;第3圖係顯示第2圖所示之晶粒退出器之剖面圖;第4、5圖係顯示使用第3圖所示之晶粒退出器之退出晶粒之方法之剖面示意圖;第6圖係顯示第3圖所示之支架以及本體之側面圖;第7圖係顯示第3圖所示之支架以及退出單元之另一實施例之剖面示意圖;第8圖係顯示第1圖所示之支架傳送單元之支架抓取器之透視示意圖;第9圖係顯示第8圖所示之支架抓取器之剖面示意圖;第10圖係顯示第9圖所示之夾取塊以及夾取部件;第11圖係顯示第1圖所示之支架承載單元之放大剖面示意圖;第12、13圖係顯示第11圖所示之支架承載單元之動作之放大剖面示意圖。 The embodiments of the present invention are further understood by the following description in conjunction with the accompanying drawings in which: FIG. 1 is a schematic diagram showing a die exit device according to an embodiment of the present invention; Figure 1 is a cross-sectional view of the susceptor; Figure 3 is a cross-sectional view of the die ejector shown in Figure 2; and Figures 4 and 5 show the exit using the die ejector shown in Figure 3. FIG. 6 is a cross-sectional view showing the stent and the body shown in FIG. 3; and FIG. 7 is a cross-sectional view showing another embodiment of the stent and the exit unit shown in FIG. 3; Figure 8 is a schematic perspective view showing the stent grasper of the stent delivery unit shown in Figure 1; Figure 9 is a schematic sectional view showing the stent grasper shown in Figure 8; The clipping block and the gripping member are shown; Fig. 11 is an enlarged schematic cross-sectional view showing the rack carrying unit shown in Fig. 1; and Figs. 12 and 13 are enlarged views showing the action of the rack carrying unit shown in Fig. 11. Schematic diagram of the section.

下文中,本發明之實施例將參考附圖予以詳細說明。然而,本發明並非限定於以下所述之實施例,且可體現於其所衍生之不同形式。以下所提供之實施例允許該領域具有技 能者完全瞭解本發明之範圍而非完美地完成本發明。 Hereinafter, embodiments of the present invention will be described in detail with reference to the accompanying drawings. However, the invention is not limited to the embodiments described below, and may be embodied in different forms derived therefrom. The examples provided below allow the field to be technically The inventors fully understand the scope of the invention and do not complete the invention.

當描述一元件放置於或連接至另一元件或另一層時,元件可直接放置於或直接連接至其他元件或其他複數元件,或其他層可放置於其間。不同地,當描述一元件直接放置於或直接連接至另一元件,沒有其他元件在其之間。不同地,當描述一元件直接放置於或直接連接至另一元件時,沒有其他元件位於其間。描述不同元件、組件、面積、層、及/或部件時,會使用第一、第二、第三及其相類似之用語。然而,元件、組件、面積、層及/或部件並非限制於此。 When an element is referred to or connected to another element or another layer, the element can be placed directly or directly connected to the other element or other element, or other layers can be placed therebetween. Differently, when a component is placed directly or directly connected to another component, no other component is in between. Differently, when an element is placed directly or directly connected to another element, no other element is in between. The first, second, third, and similar terms are used when describing different components, components, areas, layers, and/or components. However, elements, components, areas, layers, and/or components are not limited thereto.

用以描述示範之實施例之以下的技術用語,並非用以限制本發明。此外,若沒有不同的定義,所有包括技術或科學之所有用語具有相同的意義,且可為該領域具有技能者所瞭解。定義於一般字典之用語可理解為與相關領域描述之上下文以及本發明之實施例具有相同之意義。若沒有明確限定,並不會理解為理想或過度外部的直覺。 The following technical terms used to describe the exemplary embodiments are not intended to limit the invention. In addition, all terms, including technology or science, have the same meaning and are understood by those skilled in the art without a different definition. The terms defined in the general dictionary can be understood to have the same meaning as the context of the related art description and the embodiments of the present invention. If it is not clearly defined, it will not be understood as an ideal or excessive external intuition.

本發明之實施例將參考舉例之實施例之示意圖加以說明。據此,舉例來說,圖式之形狀的變形因製造方法而改變,及/或可完全預測可允許的誤差。因此,本發明之實施例並不限定於圖式所示之特定形狀而是包括形狀之變形,以及圖式所示之面積係為示意圖,且其形狀既非描述特定形狀,也不適用以限定本發明之範圍。 The embodiments of the present invention will be described with reference to the schematic drawings of the exemplary embodiments. Accordingly, for example, variations in the shape of the drawings may vary depending on the method of manufacture, and/or the permissible errors may be fully predicted. Therefore, the embodiments of the present invention are not limited to the specific shapes shown in the drawings, but include deformations of the shapes, and the areas shown in the drawings are schematic views, and the shapes thereof are neither described as specific shapes nor limited. The scope of the invention.

第1圖係顯示根據本發明之一實施例所述之晶粒退出裝置100之示意圖,第2圖係顯示第1圖所示之基座40之剖面圖。第3圖係顯示第2圖所示之晶粒退出器102之剖面圖。 1 is a schematic view showing a die exit device 100 according to an embodiment of the present invention, and FIG. 2 is a cross-sectional view showing the susceptor 40 shown in FIG. 1. Fig. 3 is a cross-sectional view showing the die ejector 102 shown in Fig. 2.

參考第1至3圖,晶粒退出裝置100可用於將包括半導體元件之晶粒20與矽晶圓10分離之晶粒附著程序,而附著晶粒20至基體。特別的是,矽晶圓10可用以黏於切割帶32上且切割帶32可安置於具有較矽晶圓10之直徑更大之矽晶圓環30。 Referring to Figures 1 through 3, the die exit device 100 can be used to attach a die 20 to a substrate by a die attach process that separates the die 20 of the semiconductor component from the germanium wafer 10. In particular, the tantalum wafer 10 can be used to adhere to the dicing tape 32 and the dicing tape 32 can be disposed on the tantalum wafer ring 30 having a larger diameter than the tantalum wafer 10.

矽晶圓環30可被放置於基座40之抓取器42抓取,而切割帶32之邊緣部分可由放置於基座40上之延伸環44所支撐。抓取器42可垂直移動矽晶圓環30向下以便延伸切割帶32。由於上述事項,介於附著於切割帶32之晶粒20之間隔將會增加。 The crucible wafer ring 30 can be grasped by the gripper 42 placed on the base 40, and the edge portion of the dicing tape 32 can be supported by the extension ring 44 placed on the base 40. The gripper 42 can move the crucible ring 30 downward vertically to extend the cutting strip 32. Due to the above, the spacing between the dies 20 attached to the dicing tape 32 will increase.

晶粒退出裝置100可放置於基座40之下,以選擇性地將晶粒20向上推,以便將晶粒20自切割帶32分離,夾取裝置50可放置於基座40之上,以便夾取由晶粒退出裝置100舉起之晶粒20。 The die exit device 100 can be placed under the susceptor 40 to selectively push the die 20 up to separate the die 20 from the dicing tape 32, and the gripping device 50 can be placed over the pedestal 40 so that The die 20 lifted by the die exit device 100 is gripped.

此外,如第1圖所示,用以執行晶粒附著程序之裝置1包括容納複數矽晶圓10之卡夾12以及用以退出以及自卡夾12傳送矽晶圓10之一者至基座40上之夾取器60。 In addition, as shown in FIG. 1, the apparatus 1 for performing a die attach process includes a clip 12 for accommodating a plurality of wafers 10 and a person for exiting and transferring one of the wafers 10 from the clip 12 to the pedestal The gripper 60 on the 40.

夾取器60可由傳送部件270水平地傳送,而用以引導矽晶圓10由夾取器60傳送之導軌70可放置於卡夾12以及基座40之間。 The gripper 60 can be transported horizontally by the transfer member 270, and the guide rail 70 for guiding the crucible wafer 10 to be transported by the gripper 60 can be placed between the clip 12 and the base 40.

另一方面,並未顯示於圖式中的是,抓取器42可為近似環形之形狀。特別的是,抓取器42可劃分至兩個互相面對面之抓取構件以提供夾取器60一傳送路徑,且夾取器60可經由兩個抓取構件間之間隙傳送。 On the other hand, not shown in the drawings, the gripper 42 may have an approximately circular shape. In particular, the gripper 42 can be divided into two gripping members that face each other to provide a transport path for the gripper 60, and the gripper 60 can be transferred via the gap between the two gripping members.

參考第3圖,晶粒退出裝置100可用以自切割帶32 退出晶粒20。 Referring to FIG. 3, the die exit device 100 can be used to self-cut the tape 32. Exit the die 20.

根據本發明之一實施例,晶粒退出裝置100可包括具有用以將晶粒20向上推至退出單元110之晶粒退出器102、支撐退出單元110之支架120、用以垂直移動退出單元110之驅動單元130以及支撐驅動單元130之本體140。 According to an embodiment of the present invention, the die exit device 100 may include a die exiter 102 for pushing the die 20 up to the exit unit 110, a support 120 supporting the exit unit 110, and a vertical movement exit unit 110. The driving unit 130 and the body 140 supporting the driving unit 130.

用以選擇性地退出晶粒20之一者之退出單元110可將所選之晶粒20向上推。驅動單元130可包括與退出單元110耦接之頭部132以及用以傳送驅動力之驅動軸134。儘管並未詳細顯示,傳動軸134可連接至電源供應單元(並未顯示)以提供區動工率,並且電源供應單元可為電動機、缸、功率傳送元件以及利用不同方法之類似者。 The exit unit 110 for selectively exiting one of the dies 20 can push the selected die 20 up. The driving unit 130 may include a head 132 coupled to the exit unit 110 and a drive shaft 134 for transmitting a driving force. Although not shown in detail, the drive shaft 134 can be coupled to a power supply unit (not shown) to provide zone operating rates, and the power supply unit can be an electric motor, a cylinder, a power transfer element, and the like that utilizes different methods.

舉例來說,退出單元110可為近似方柱之形狀,並且如圖所示,可為具有上開孔之氣室112。舉例來說,退出單元110包括具有圓盤形狀之支撐部分以及放置於支撐部分上且為方柱形之退出部分。壓縮空氣可經由傳動軸134提供至氣室112。 For example, the exit unit 110 can be approximately square-shaped and, as shown, can be a plenum 112 having an upper opening. For example, the exit unit 110 includes a support portion having a disk shape and an exit portion placed on the support portion and having a square column shape. Compressed air may be provided to the plenum 112 via a drive shaft 134.

支架120具有容納退出單元110之內部空間。舉例來說,支架120包括具有用以允許退出單元110垂直移動之至少一穿孔122A之上面板122,以及自上面板122向下延伸且具有底部開口之外殼124。 The bracket 120 has an internal space that accommodates the exit unit 110. For example, the bracket 120 includes a top panel 122 having at least one perforation 122A to allow vertical movement of the exit unit 110, and a housing 124 extending downwardly from the upper panel 122 and having a bottom opening.

具有底部開口之外殼124可與本體140耦接,且頭部132以及驅動單元130之傳動軸134可於本體140中垂直移動。 The outer casing 124 having a bottom opening can be coupled to the body 140, and the head 132 and the drive shaft 134 of the drive unit 130 can be vertically moved in the body 140.

舉例來說,支架120之外殼124以及本體140分別為近似圓形管狀。然而,本發明之範圍並不限於外殼124以及本 體140之形狀。 For example, the outer casing 124 and the body 140 of the bracket 120 are each an approximately circular tubular shape. However, the scope of the present invention is not limited to the outer casing 124 and the present The shape of the body 140.

本體140之頂部可插入外殼124之下開口。舉例來說,如圖所示,插入本體140之限制角度的臨限值可由本體140之上外表面所決定。 The top of the body 140 can be inserted into the opening below the outer casing 124. For example, as shown, the threshold of the restriction angle of the insertion body 140 can be determined by the outer surface above the body 140.

另一方面,支撐部件126係為外殼124之內部表面。支撐部件126可用以限制退出單元110向下之移動,當支架120以及退出單元110自本體140分離時,也可用以承載退出單元110。 On the other hand, the support member 126 is the inner surface of the outer casing 124. The support member 126 can be used to limit the downward movement of the exit unit 110, and can also be used to carry the exit unit 110 when the bracket 120 and the exit unit 110 are separated from the body 140.

支架120內之退出單元110之水平移動係由形成於上面板122之穿孔122A所限制,且只允許其垂直移動。特別的是,退出單元110之向上移動可被上面板122所限制,其向下移動係由支撐元件126所限制。基於上述之事項,退出單元110僅允許於支架120中垂直移動一個既定的距離。若有需要,退出單元110以及支架120可同時被取代。 The horizontal movement of the exit unit 110 within the bracket 120 is limited by the perforations 122A formed in the upper panel 122 and is only allowed to move vertically. In particular, the upward movement of the exit unit 110 can be limited by the upper panel 122, with its downward movement being limited by the support member 126. Based on the above, the exit unit 110 is only allowed to move vertically within the bracket 120 by a predetermined distance. The exit unit 110 and the bracket 120 can be replaced at the same time if necessary.

根據本發明之一實施例,當需要更換退出單元110成為對應晶粒20大小之變化時,支架120以及退出單元110皆可同時更換。特別的是,可更換之分別構成退出單元110以及支架120的座,可分別對應晶粒20而預先準備,並且根據對應的晶粒20之大小,退出單元110以及支架120可選擇性地使用。 According to an embodiment of the present invention, when the replacement of the exit unit 110 is required to change the size of the corresponding die 20, the bracket 120 and the exit unit 110 can be replaced at the same time. In particular, the replaceable seats constituting the exit unit 110 and the bracket 120, respectively, may be prepared in advance for the die 20, and the exit unit 110 and the bracket 120 may be selectively used depending on the size of the corresponding die 20.

尤其是如第1圖所示,晶粒退出裝置100包括支架傳送單元200夾取且傳送包括退出單元110之支架120以傳送退出單元110、支架120以及用以承載被支架傳送單元200傳送之支架120之支架承載單元300。分別具有內建退出單元之對應不同晶粒20大小以及形狀之複數支架120,可承載於支架承載單 元300。支架傳送單元200以及支架承載單元300將如下文中所述。 In particular, as shown in FIG. 1, the die exit device 100 includes a bracket transfer unit 200 that picks up and transports the bracket 120 including the exit unit 110 to transport the exit unit 110, the bracket 120, and the bracket for carrying the transport by the bracket transport unit 200. The bracket carrier unit 300 of 120. A plurality of brackets 120 having built-in exit units corresponding to different die sizes and shapes, which can be carried on the carrier carrier Yuan 300. The rack transport unit 200 and the rack load unit 300 will be described below.

此外,耦接支架120與本體140之結構以及耦接退出單元110與驅動單元130之結構,可配置為更簡單地進行更換退出單元110以及支架120之方式。 In addition, the structure of the coupling bracket 120 and the body 140 and the structure of the coupling exit unit 110 and the driving unit 130 can be configured to more easily replace the exit unit 110 and the bracket 120.

舉例來說,並未顯示於圖式中,本體140以及外殼124可利用磁力相互耦接。也就是,永久性磁鐵(並未顯示)可放置於本體140以及外殼124之一者,而將本體140以及外殼124相互耦接。 For example, not shown in the drawings, the body 140 and the outer casing 124 may be coupled to each other by magnetic force. That is, a permanent magnet (not shown) can be placed on one of the body 140 and the outer casing 124, and the body 140 and the outer casing 124 are coupled to each other.

再者,藉由一磁力,退出單元110可與驅動單元130之頭部132相耦接。舉例來說,永久性磁鐵136可放置於頭部132之內,且退出單元110之支撐部份可以磁性材料做成。 Moreover, the exit unit 110 can be coupled to the head 132 of the drive unit 130 by a magnetic force. For example, the permanent magnet 136 can be placed within the head 132 and the support portion of the exit unit 110 can be made of a magnetic material.

第4、5圖係顯示使用第3圖所示之晶粒退出器102之退出晶粒20之方法之剖面示意圖。 4 and 5 are schematic cross-sectional views showing a method of exiting the die 20 using the die exiter 102 shown in Fig. 3.

參考第4、5圖,並未顯示於圖式中,晶粒退出器102可藉由額外的驅動單元(並未顯示)而向上移動,以便支架120之上面板122可與切割帶32緊密連接。 Referring to Figures 4 and 5, which are not shown in the drawings, the die ejector 102 can be moved upward by an additional drive unit (not shown) so that the upper panel 122 of the bracket 120 can be closely coupled to the dicing tape 32. .

接著,藉由驅動單元130可使退出單元110可向上移動,以便自第4圖所示之上面板122之上表面凸出,因而連帶切割帶32一起將所選之晶粒20向上推升。在此實施例中,上面板122具有複數真空孔洞122B(參考第3圖),以吸收部份之切割帶32。 Next, the exit unit 110 can be moved upward by the driving unit 130 so as to protrude from the upper surface of the upper panel 122 shown in FIG. 4, so that the associated cutting tape 32 together pushes up the selected die 20. In this embodiment, the upper panel 122 has a plurality of vacuum holes 122B (refer to FIG. 3) to absorb a portion of the dicing tape 32.

舉例來說,如圖所示,複數真空孔洞122B可放置於穿孔122A以及退出單元110之周圍,可吸收位於所選之晶粒 20周邊之部分切割帶32。藉由吸收位於所選之晶粒20周邊之部分切割帶32,允許了所選之晶粒20輕易地自切割帶32分離。 For example, as shown, a plurality of vacuum holes 122B can be placed around the perforations 122A and the exit unit 110 to absorb the selected crystal grains. A portion of the peripheral portion 20 is cut 32. By absorbing a portion of the dicing tape 32 at the periphery of the selected die 20, the selected die 20 is allowed to easily detach from the dicing tape 32.

特別的是,如第4圖所示,當退出單元110自上面板122向上凸出時,所選之晶粒20之邊緣部份可自切割帶32分離。 In particular, as shown in FIG. 4, when the ejecting unit 110 protrudes upward from the upper panel 122, the edge portion of the selected die 20 can be separated from the dicing tape 32.

緊接著,如第5圖所示,壓縮空氣可注入氣室112。在此實施例中,因為退出單元110之上表面與切割帶32緊密連接,位於退出單元110之部份切割帶32可部份充氣,因而允許所選之晶粒20逐漸地與切割帶32分離。 Next, as shown in FIG. 5, compressed air may be injected into the plenum 112. In this embodiment, since the upper surface of the exit unit 110 is tightly coupled to the dicing tape 32, a portion of the dicing tape 32 located at the exit unit 110 can be partially inflated, thereby allowing the selected die 20 to be gradually separated from the dicing tape 32. .

另一方面,壓縮空氣可由傳動軸134以及頭部132所提供,真空可經由本體140提供至支架120。在此狀況下,如圖所示,第一密封元件170以及第二密封元件172可分別放置於本體140與外殼124之間以及退出單元110與頭部132之間。 Compressed air, on the other hand, may be provided by the drive shaft 134 and the head 132, and vacuum may be provided to the bracket 120 via the body 140. In this case, as shown, the first sealing element 170 and the second sealing element 172 can be placed between the body 140 and the outer casing 124 and between the exit unit 110 and the head 132, respectively.

第6圖係顯示第3圖所示之支架120以及本體140之側面圖。 Fig. 6 is a side view showing the holder 120 and the body 140 shown in Fig. 3.

參考第6圖,用以對齊支架120以及退出單元110之旋轉角度之定位梢148可放置於本體140之上外表面,且定位梢148插入對應之對齊凹口(alignment recess)129,對齊凹口129位於支架120之下開口處。 Referring to Fig. 6, a positioning tip 148 for aligning the rotation angle of the bracket 120 and the exit unit 110 can be placed on the outer surface of the body 140, and the positioning tip 148 is inserted into a corresponding alignment recess 129, the alignment notch. 129 is located at the opening below the bracket 120.

特別的是,根據本發明之一實施例,根據晶粒20之種類而準備好複數組之支架120以及退出單元110,當需要更換時,可在短時間內更換完成支架120以及退出單元110。由於上述事項,因為用以更換支架120以及退出單元110之時間減少了,包括晶粒退出裝置100之晶粒附著設備之使用率也跟著上 升。 In particular, according to an embodiment of the present invention, the plurality of brackets 120 and the exit unit 110 are prepared according to the type of the die 20, and when the replacement is required, the completed bracket 120 and the exit unit 110 can be replaced in a short time. Due to the above matters, since the time for replacing the bracket 120 and the exit unit 110 is reduced, the usage rate of the die attaching device including the die exit device 100 is also followed. Rise.

第7圖係顯示第3圖所示之支架120以及退出單元110之另一實施例之剖面示意圖。 Fig. 7 is a schematic cross-sectional view showing another embodiment of the holder 120 and the exit unit 110 shown in Fig. 3.

參考第7圖,根據本發明之另一實施例,放置於包括上面板192以及外殼194之支架190內的退出裝置180,包括插入形成於支架190之上面板192之穿孔192A之退出梢182以及放置於支架190且支撐退出梢182之支撐面板184。 Referring to Figure 7, in accordance with another embodiment of the present invention, an exit device 180 disposed within a bracket 190 including an upper panel 192 and a housing 194 includes an exit tab 182 that is inserted into a perforation 192A formed in the upper panel 192 of the bracket 190 and The support panel 184 is placed on the bracket 190 and supports the exit tip 182.

如圖所示,支撐面板184包括對應放置於驅動單元130之頭部132之永久性磁鐵136之永久性磁鐵186,由於由永久性磁鐵136、186所產生之磁力,退出單元180以及頭部132相互耦接。並且,由於支撐面板184之永久性磁鐵186之磁力,退出梢182也可與支撐面板184相耦接。 As shown, the support panel 184 includes a permanent magnet 186 corresponding to a permanent magnet 136 placed on the head 132 of the drive unit 130. The exit unit 180 and the head 132 are due to the magnetic force generated by the permanent magnets 136, 186. Coupled to each other. Also, due to the magnetic force of the permanent magnet 186 of the support panel 184, the exit tip 182 can also be coupled to the support panel 184.

第8圖係顯示第1圖所示之支架傳送單元之支架抓取器210之透視示意圖。第9圖係顯示第8圖所示之支架抓取器210之剖面示意圖。第10圖係顯示第9圖所示之夾取塊以及夾取部件。 Fig. 8 is a schematic perspective view showing the holder gripper 210 of the stent transport unit shown in Fig. 1. Fig. 9 is a schematic cross-sectional view showing the stent grasper 210 shown in Fig. 8. Fig. 10 shows the gripping block and the gripping member shown in Fig. 9.

參考第8至10圖,支架傳送單元200可抓取以及傳送承載退出單元110,而更換退出單元110以及支架120。也就是,支架120可自本體140抓取且可被傳送至支架承載單元300,新的支架120可自支架承載單元300抓取而耦接至本體140。 Referring to Figures 8 to 10, the carriage transport unit 200 can grasp and transport the load exit unit 110, and replace the exit unit 110 and the bracket 120. That is, the bracket 120 can be grasped from the body 140 and can be transferred to the bracket carrying unit 300, and the new bracket 120 can be grasped from the bracket carrying unit 300 to be coupled to the body 140.

特別的是,支架傳送單元200包括用以抓起支架120之外表面之支架抓取器210以及用以水平與垂直傳送支架抓取器210之傳送部件270(參考第1圖)。在此實施例中,傳送部 件270可用以傳送夾取器60,也就是,支架抓取器210可與傳送部件270以及夾取器60相耦接。 In particular, the carriage transport unit 200 includes a stent gripper 210 for grasping the outer surface of the stent 120 and a transporting member 270 for transporting the stent grasper 210 horizontally and vertically (refer to FIG. 1). In this embodiment, the transmission unit The member 270 can be used to transfer the gripper 60, that is, the bracket grabber 210 can be coupled to the transfer member 270 and the gripper 60.

傳送部件270包括用以水平傳送夾取器60以及支架抓取器210之水平傳送部件280,以及用以垂直傳送支架抓取器210之垂直傳送部件290。在此實施例中,水平傳送部件280可共同用於夾取器60以及支架抓取器210。 The transporting member 270 includes a horizontal transporting member 280 for horizontally transporting the gripper 60 and the rack grabber 210, and a vertical transporting member 290 for vertically transporting the stent gripper 210. In this embodiment, the horizontal transfer members 280 can be used in common with the gripper 60 and the stent gripper 210.

舉例來說,如第1圖所示,卡夾12、晶粒退出器102、基座40以及支架承載單元300可放置於水平方向之一直線上,且水平傳送部件280可在水平方向上傳送夾取器60以及支架抓取器210。 For example, as shown in FIG. 1, the clip 12, the die exiter 102, the base 40, and the carrier carrying unit 300 may be placed on one of the horizontal directions, and the horizontal transfer member 280 may be transported in the horizontal direction. The picker 60 and the bracket grabber 210.

也就是,支架承載單元300可放置於基座40之一邊,且基座40可放置於卡夾12以及支架承載單元300之間。水平傳送部件280可在卡夾12、基座40以及支架承載單元300所放置之方向上,傳送夾取器60以及支架抓取器210。舉例來說,水平傳送部件280可使用包括發動機、滾珠螺桿(ball screw)以及滾珠螺母(ball nut)等之驅動部份以及諸如線性運動導軌(linear motion guide)之線性導軌元件所控制。 That is, the rack carrying unit 300 can be placed on one side of the base 40, and the base 40 can be placed between the clip 12 and the rack carrying unit 300. The horizontal transfer member 280 can transport the gripper 60 and the stent gripper 210 in the direction in which the clip 12, the base 40, and the rack carrying unit 300 are placed. For example, the horizontal transfer member 280 can be controlled using a drive portion including an engine, a ball screw, and a ball nut, and a linear guide member such as a linear motion guide.

如上所述,因為支架承載單元300放置於晶粒退出器102放置之基座40之一邊(基座40之較低的空間),有大幅度的範圍可使用。並且,因為支架抓取器210與夾取器60一同被傳送,需要提供額外的驅動力給支架傳送單元200。因此,晶粒退出裝置100所佔的面積可降低,且可進一步降低製造晶粒退出裝置100之成本。 As described above, since the rack carrying unit 300 is placed on one side of the base 40 on which the die ejector 102 is placed (lower space of the susceptor 40), a wide range can be used. Also, since the rack grabber 210 is conveyed together with the gripper 60, it is necessary to provide additional driving force to the rack transport unit 200. Therefore, the area occupied by the die exit device 100 can be reduced, and the cost of manufacturing the die exit device 100 can be further reduced.

另一方面,垂直傳送部件290可與水平傳送部件 280相耦接且可於水平方向傳送。再者,垂直傳送部件290可於垂直方向傳送支架抓取器210,以抓取以及放置支架120。舉例來說,垂直傳送部件290可利用氣動(pneumatic)或液壓缸(hydraulic cylinder)所組成。 On the other hand, the vertical transfer member 290 can be combined with the horizontal transfer member The 280 is coupled and can be transmitted in a horizontal direction. Furthermore, the vertical transport member 290 can transport the stent gripper 210 in a vertical direction to grasp and place the stent 120. For example, the vertical transfer member 290 can be constructed using a pneumatic or hydraulic cylinder.

根據本發明之一實施例,如第8、9圖所示,支架抓取器210包括放置於垂直傳送部件290之基底區塊212以及用以抓取支架120之外表面之複數夾取部件230。基底區塊212具有接收支架120之接收部份,夾取部件230可抓取由基底區塊212之接收部份所接收之支架120。舉例來說,基底區塊212具有開口214以接收支架120,夾取部件230可放置於開口214。 According to an embodiment of the present invention, as shown in FIGS. 8 and 9, the stent gripper 210 includes a base block 212 placed on the vertical transfer member 290 and a plurality of gripping members 230 for gripping the outer surface of the bracket 120. . The base block 212 has a receiving portion for receiving the bracket 120, and the gripping member 230 can grasp the bracket 120 received by the receiving portion of the base block 212. For example, the base block 212 has an opening 214 to receive the bracket 120 and the gripping member 230 can be placed in the opening 214.

夾取部件230可利位於基底區塊212之兩邊的用夾取驅動器240而前後移動。舉例來說,作為夾取驅動器240之氣動缸可放置於基底區塊212之兩側,夾取部件230放置之凹槽位於基底區塊212之開口214之內表面上。 The gripping member 230 can be moved forward and backward by the gripping driver 240 on both sides of the base block 212. For example, the pneumatic cylinders as the gripping drive 240 can be placed on both sides of the base block 212, and the recess in which the gripping member 230 is placed is located on the inner surface of the opening 214 of the base block 212.

根據本發明之一實施例,夾取區塊250放置於開口214之內表面上之凹槽,且可分別連接至夾取驅動器240。在本實施例中,夾取部件230可放置於夾取區塊250上。舉例來說,兩個夾取部件230可放置於個別之夾取區塊250上。 In accordance with an embodiment of the present invention, the gripping block 250 is placed in a recess on the inner surface of the opening 214 and is connectable to the gripper driver 240, respectively. In the present embodiment, the gripping member 230 can be placed on the gripping block 250. For example, the two gripping members 230 can be placed on the individual gripping blocks 250.

特別是,夾取部件230可彈性地安置於夾取區塊250,夾取部件230彈性移動之方向分別與支架120之外表面相垂直。詳細的說,夾取部件230可安置於夾取區塊250,以彈性移動於相對於支架120之中心軸之半徑方向。當夾取部件230藉由夾取驅動器240與支架120之外表面緊密連接時,個別的夾取部件230之接觸表面與支架120之外表面之切線面相同。 In particular, the gripping member 230 is elastically disposed on the gripping block 250, and the direction in which the gripping member 230 is elastically moved is perpendicular to the outer surface of the bracket 120, respectively. In detail, the gripping member 230 may be disposed in the gripping block 250 to elastically move in a radial direction with respect to a central axis of the bracket 120. When the gripping member 230 is tightly coupled to the outer surface of the bracket 120 by the gripping driver 240, the contact surface of the individual gripping members 230 is the same as the tangent plane of the outer surface of the bracket 120.

另一方面,如第10圖所示,面對支架120之夾取區塊250的側面包括形成鈍角之第一側面252以及第二側面254,夾取部件230可分別彈性地安置第一側面252以及第二側面254。並且,安置於第一側面252以及第二側面254之夾取部件230所夾之角度可為銳角。因此當抓取支架120時,藉由夾取部件230足以施加足夠的彈性恢復力於支架120。 On the other hand, as shown in FIG. 10, the side of the gripping block 250 facing the bracket 120 includes a first side 252 and a second side 254 which form an obtuse angle, and the gripping member 230 can elastically position the first side 252, respectively. And a second side 254. Moreover, the angle of the clamping member 230 disposed on the first side 252 and the second side 254 may be an acute angle. Therefore, when the bracket 120 is grasped, it is sufficient to apply sufficient elastic restoring force to the bracket 120 by the gripping member 230.

舉例來說,如圖所示之夾取部件230可受彈簧232支彈性力支撐。詳細來說,彈簧232以及夾取部件230所插入之孔洞256,分別位於夾取區塊250之第一側面252以及第二側面254。並且,夾取部件230分別被設置為可由第一側面252以及第二側面254凸出。在此實施例中,如圖所示,限制夾取部件230凸出之程度的停止元件258係位於夾取區塊250之孔洞256。 For example, the gripping member 230 as shown can be supported by the spring 232 elastic force. In detail, the spring 232 and the holes 256 into which the gripping members 230 are inserted are respectively located on the first side 252 and the second side 254 of the gripping block 250. Also, the gripping members 230 are respectively disposed to be protruded by the first side surface 252 and the second side surface 254. In this embodiment, as shown, the stop element 258, which limits the extent to which the gripping member 230 projects, is located in the aperture 256 of the gripping block 250.

然而,夾取部件230之彈性支撐結構可以進行不同的改變,因此本發明並不限定於此。舉例來說,廣為熟知的彈簧柱塞(spring plunger)可安置於夾取區塊250上。 However, the elastic support structure of the gripping member 230 can be variously changed, and thus the present invention is not limited thereto. For example, a well-known spring plunger can be placed on the gripping block 250.

另一方面,如第3圖所示,夾取部件230所插入之溝槽128可安置於支架120之外表面,也就是在外殼125之外表面。詳細來說,當夾取支架120時,支架120隨著支架傳送單元200下降而被插入至基底區塊212之開口214,接著夾取部件230藉由夾取驅動器240而與溝槽128之內表面緊密連接。 On the other hand, as shown in FIG. 3, the groove 128 into which the gripping member 230 is inserted may be disposed on the outer surface of the bracket 120, that is, on the outer surface of the outer casing 125. In detail, when the bracket 120 is gripped, the bracket 120 is inserted into the opening 214 of the base block 212 as the bracket transport unit 200 is lowered, and then the gripping member 230 is inside the groove 128 by the grip driver 240. The surface is tightly connected.

參考第8圖,限制支架120向上移動高於基底區塊212之停止區塊220位於基底區塊212。當夾取支架120時,停止區塊220可限制支架120插入基底區塊212之開口214的程度。再者,當支架120安置於本體140時,停止區塊220可藉由垂直傳 送部件290傳送壓力至支架120。另一方面,基底區塊212具有開口214之頂端為封閉之結構。在此實施例中,停止區塊220可省略。 Referring to FIG. 8, the stop block 220, which limits the upward movement of the support 120 above the base block 212, is located at the base block 212. The stop block 220 can limit the extent to which the bracket 120 is inserted into the opening 214 of the base block 212 when the bracket 120 is gripped. Moreover, when the bracket 120 is disposed on the body 140, the stop block 220 can be vertically transmitted. The delivery member 290 transmits pressure to the bracket 120. On the other hand, the base block 212 has a structure in which the top end of the opening 214 is closed. In this embodiment, the stop block 220 can be omitted.

另一方面,支架抓取器210包括感測開口214所接收之支架120之感測器。舉例來說,用以偵測開口214內之支架120的光學感測器260,可安置於基底區塊212之一邊,穿孔216將開口214以及光學感測器260相互連接。也就是,光學感應器260可經由穿孔216發射光線,也可接收支架120所反射之光線,藉此決定支架120是否存在。 In another aspect, the stent gripper 210 includes a sensor that senses the stent 120 received by the opening 214. For example, the optical sensor 260 for detecting the bracket 120 in the opening 214 can be disposed at one side of the base block 212, and the through hole 216 connects the opening 214 and the optical sensor 260 to each other. That is, the optical sensor 260 can emit light through the perforations 216, and can also receive the light reflected by the bracket 120, thereby determining whether the bracket 120 is present.

第11圖係顯示第1圖所示之支架承載單元300之放大剖面示意圖。第12、13圖係顯示第11圖所示之支架承載單元300之動作之放大剖面示意圖。 Fig. 11 is an enlarged schematic cross-sectional view showing the carrier carrying unit 300 shown in Fig. 1. Figs. 12 and 13 are enlarged cross-sectional views showing the operation of the holder carrying unit 300 shown in Fig. 11.

參考第11至13圖,支架承載單元300包括複數支架承載部件310。根據本發明之一實施例,支架承載單元300包括具有圓盤形狀之底座面板302以及用以旋轉底座面板302以及安置於底座面板302之複數支架承載部件310之旋轉驅動器304(參考第1圖)。 Referring to Figures 11 through 13, the rack carrying unit 300 includes a plurality of rack carrying members 310. According to an embodiment of the present invention, the rack carrying unit 300 includes a base panel 302 having a disk shape and a rotary driver 304 for rotating the base panel 302 and the plurality of bracket bearing members 310 disposed on the base panel 302 (refer to FIG. 1). .

當需要更換支架時,旋轉驅動器304可旋轉底座面板302藉由支架傳送單元200放置閒置的支架承載部件310於支架抓取器210至承載支架120之路徑上,接著以特定方式旋轉底座面板302,使得仍在底座面板302上之支架120之一者被支架抓取器210所抓取。 When the bracket needs to be replaced, the rotary drive 304 can rotate the base panel 302 to place the idle bracket carrier member 310 on the path of the bracket grabber 210 to the carrier bracket 120 by the bracket transport unit 200, and then rotate the base panel 302 in a specific manner. One of the brackets 120 still on the base panel 302 is grasped by the bracket grabber 210.

支架承載部件310可沿著圓周的方向,安置於底座面板302。支架承載部件310可分別包括用以插入外殼124之下 開口的卡盤320以及用以自卡盤320之外表面凸出且與外殼124之下開口的內表面緊密連結以抓取支架120與之複數接觸元件330。 The bracket carrier member 310 can be disposed to the base panel 302 in a circumferential direction. The bracket carrying members 310 can be respectively included to be inserted under the housing 124 The open chuck 320 and the inner surface for projecting from the outer surface of the chuck 320 and open to the bottom of the outer casing 124 are closely coupled to grip the bracket 120 and the plurality of contact members 330.

卡盤320可安置於底座面板302,而可垂直移動驅動接觸元件330之活塞340可放置於卡盤320上。特別的是,活塞340可藉由放置於底座面板302下之活塞驅動器360而垂直移動,活塞驅動器360之傳動軸所穿過之穿孔可放置於底座面板302。舉例來說,活塞驅動器360可為氣動或液壓缸,但並非限定於此。 The chuck 320 can be disposed on the base panel 302, and the piston 340 that can vertically move the drive contact member 330 can be placed on the chuck 320. In particular, the piston 340 can be moved vertically by the piston driver 360 placed under the base panel 302, and the perforations through which the drive shaft of the piston driver 360 passes can be placed on the base panel 302. For example, the piston driver 360 can be a pneumatic or hydraulic cylinder, but is not limited thereto.

活塞340為近似圓柱形,且如圖所示,包括具有既定梯度之上邊坡342。特別是,個別的接觸元件330具有與外殼124之下開口的內表面緊密接觸之外表面,以及與上邊坡342緊密接觸之內表面。接觸元件330之內表面滑動於活塞340之上邊坡342之上。 Piston 340 is approximately cylindrical and, as shown, includes a slope 342 having a predetermined gradient. In particular, the individual contact elements 330 have an outer surface that is in intimate contact with the inner surface of the opening below the outer casing 124, and an inner surface that is in intimate contact with the upper side 342. The inner surface of the contact element 330 slides over the upper slope 342 of the piston 340.

特別的是,如圖所示,因為活塞340之垂直移動,接觸元件330可移向卡盤320之內部或外部,藉此抓取或放下支架120。 In particular, as shown, because of the vertical movement of the piston 340, the contact member 330 can be moved toward the interior or exterior of the chuck 320, thereby grasping or lowering the bracket 120.

另一方面,接觸元件330所移動的移動路徑322可由卡盤320所提供。移動路徑322具有自卡盤320內部至卡盤320外部逐漸上升之梯度。因此,如圖所示,當活塞340漸升,接觸元件330可於活塞340之上邊坡342上滑動,因而自卡盤320向外凸出。 On the other hand, the moving path 322 that the contact element 330 moves can be provided by the chuck 320. The moving path 322 has a gradient that gradually rises from the inside of the chuck 320 to the outside of the chuck 320. Thus, as shown, as the piston 340 is raised, the contact member 330 can slide over the upper slope 342 of the piston 340 and thus project outwardly from the chuck 320.

如上所述,根據本發明之一實施例,當由支架傳送單元200傳送之支架120與卡盤320相耦接後活塞340上升,藉 此允許接觸元件330與外殼124之下開口之內表面緊密接觸。因此,支架120之中心軸以及卡盤320之中心軸能夠準確地重疊,因而當自卡盤320抓取支架120後,能夠避免軸中心不對齊而產生之抓取錯誤。 As described above, according to an embodiment of the present invention, when the bracket 120 transmitted by the bracket transport unit 200 is coupled to the chuck 320, the piston 340 rises, borrowing This allows the contact element 330 to be in intimate contact with the inner surface of the opening below the outer casing 124. Therefore, the central axis of the bracket 120 and the central axis of the chuck 320 can be accurately overlapped, so that when the bracket 120 is grasped from the chuck 320, the gripping error caused by the misalignment of the shaft center can be avoided.

根據本發明之一實施例,永久性磁鐵350可內建於活塞340中,藉此允許接觸元件330因永久性磁鐵350之磁力,而與上邊坡342永遠緊密接觸。因此當活塞340上升以及下降時,接觸元件330可移動至卡盤320之內部以及外部。 In accordance with an embodiment of the present invention, the permanent magnet 350 can be built into the piston 340, thereby allowing the contact element 330 to be in intimate contact with the upper slope 342 forever due to the magnetic force of the permanent magnet 350. Therefore, when the piston 340 is raised and lowered, the contact member 330 can be moved to the inside and outside of the chuck 320.

參考第8圖,由支架抓取器210之開口214內的夾取部件230所支撐之支架120係由夾取部件230之彈性力所支撐,因而支架120可於開口214中水平移動。特別的是,支架120可於夾取區塊250前後移動之方向移動,因而支架抓取器210之夾取區塊250前後移動之方向,正是夾取驅動器240以及夾取區塊250安排的方向與水平傳送部件280傳送支架抓取器210之方向相平行。此即用以穩定抓取或放置支架120,儘管當利用支架抓取器210抓取或放置支架120時,些微不對齊發生於本體140或卡盤320之中心軸與支架120之中心軸間。 Referring to Fig. 8, the bracket 120 supported by the gripping member 230 in the opening 214 of the stent gripper 210 is supported by the elastic force of the gripping member 230, so that the bracket 120 can be horizontally moved in the opening 214. In particular, the bracket 120 is movable in the direction in which the gripping block 250 moves back and forth, and thus the direction in which the gripping block 250 of the bracket gripper 210 moves back and forth is exactly the arrangement of the gripping driver 240 and the gripping block 250. The direction is parallel to the direction in which the horizontal transport member 280 transmits the stent gripper 210. This is used to stably grasp or place the stent 120, although slight misalignment occurs between the central axis of the body 140 or the chuck 320 and the central axis of the stent 120 when the stent 120 is grasped or placed by the stent grasper 210.

再者,儘管並未顯示無圖式中,為了穩定抓取或放置支架120,外殼124之下開口之內角落被導角,本體140之上角落以及卡盤320之上角落也被導角。 Moreover, although not shown in the figure, in order to stably grasp or place the bracket 120, the inner corner of the opening below the outer casing 124 is guided, and the upper corner of the body 140 and the upper corner of the chuck 320 are also led.

如上所述,根據本實施例,支架承載單元300位於卡夾12之對面,使得基座40可放置於支架承載單元300以及卡夾12之間。再者,支架抓取器210以及夾取器60可利用水平傳送部件280所傳送。因而,可降低晶粒退出裝置100所佔之整體 面積,晶粒退出裝置100製造的成本也可降低。 As described above, according to the present embodiment, the rack carrying unit 300 is located opposite the clip 12 such that the base 40 can be placed between the rack carrying unit 300 and the clip 12. Further, the stent gripper 210 and the gripper 60 can be transported using the horizontal transfer member 280. Therefore, the overall size of the die exit device 100 can be reduced. The area, the cost of manufacturing the die exit device 100 can also be reduced.

儘管晶粒退出裝置參考特定實施例加以敘述,但卻不限定於此。因此,該領域具有技能者能夠瞭解不同的調整以及變形可再不背離本發明之申請專利範圍所定義的精神以及範圍下而完成。 Although the die exit device is described with reference to a specific embodiment, it is not limited thereto. Therefore, those skilled in the art can understand that various modifications and variations can be made without departing from the spirit and scope defined by the scope of the invention.

1‧‧‧裝置 1‧‧‧ device

10‧‧‧矽晶圓 10‧‧‧矽 wafer

12‧‧‧卡夾 12‧‧‧Card holder

40‧‧‧基座 40‧‧‧Base

60‧‧‧夾取器 60‧‧‧Clipper

70‧‧‧導軌 70‧‧‧rails

100‧‧‧晶粒退出裝置 100‧‧‧ die exit device

102‧‧‧晶粒退出器 102‧‧‧ die exitor

200‧‧‧支架傳送單元 200‧‧‧Bracket transfer unit

210‧‧‧支架抓取器 210‧‧‧ bracket grabber

270‧‧‧傳送部件 270‧‧‧Transfer parts

280‧‧‧水平傳送部件 280‧‧‧ horizontal transfer parts

290‧‧‧垂直傳送部件 290‧‧‧Vertical transmission parts

300‧‧‧支架承載單元 300‧‧‧ bracket bearing unit

302‧‧‧底座面板 302‧‧‧Base panel

304‧‧‧旋轉驅動器 304‧‧‧Rotary drive

Claims (9)

一種晶粒退出裝置,包括:一基座,用以支撐附著複數晶粒之一切割帶;一晶粒退出器,包括放置於上述基座下且用以選擇性地將上述晶粒之一者向上推之一退出單元、包括用以垂直移動上述退出單元之一本體以及一第一支架,其中上述退出單元內建於上述第一支架且上述第一支架具有一下開口以允許上述本體之一頂端插入;一支架承載單元,放置於上述基座之一邊,上述支架承載單元內建複數第二支架以及複數退出單元;以及一支架傳送單元,用以傳送介於上述晶粒退出器以及上述支架承載單元間之上述第二支架,而以上述支架承載單元內之上述第二支架之一者更換上述第一支架。 A die exit device includes: a pedestal for supporting a dicing tape attached to a plurality of dies; and a die ejector for placing the pedestal under the pedestal for selectively selecting one of the dies Pushing up one of the exit units, including a body for vertically moving the exit unit and a first bracket, wherein the exit unit is built in the first bracket and the first bracket has a lower opening to allow one of the top ends of the body Inserting; a bracket carrying unit disposed on one side of the base, the bracket carrying unit having a plurality of second brackets and a plurality of exit units; and a bracket transporting unit for transporting the die exiting device and the bracket carrying The second bracket between the units is replaced by one of the second brackets in the bracket carrying unit. 如申請專利範圍第1項所述之晶粒退出裝置,其中上述支架承載單元包括:一底座面板,具有一圓盤形;複數支架承載部件,以沿著一圓周方向安置於上述底座面板上,以分別承載上述第二支架;以及一旋轉驅動器,用以旋轉上述底座面板。 The die exiting device of claim 1, wherein the bracket carrying unit comprises: a base panel having a disc shape; and a plurality of bracket carrying members disposed on the base panel along a circumferential direction, To respectively carry the second bracket; and a rotary driver for rotating the base panel. 如申請專利範圍第2項所述之晶粒退出裝置,其中上述支架承載單元放置於承載複數矽晶圓之一卡夾的對面,上述基座放置於上述支架承載單元以及上述卡夾之間。 The die exit device of claim 2, wherein the bracket carrying unit is placed opposite a clip carrying one of the plurality of wafers, and the base is placed between the bracket carrying unit and the clip. 如申請專利範圍第3項所述之晶粒退出裝置,其中上述支架傳送單元包括: 一支架抓取器,用以抓取上述第一支架之一外部表面;一傳送部件,用以水平地或垂直地傳送上述支架抓取器,其中上述支架抓取器與上述傳送部件以及自上述卡夾退出以及傳送上述矽晶圓之一者至上述基座上之一夾取器耦接在一起。 The die exit device of claim 3, wherein the bracket transfer unit comprises: a bracket grabber for gripping an outer surface of one of the first brackets; a transporting member for transporting the bracket grabber horizontally or vertically, wherein the bracket gripper and the transporting member and the The clip exits and one of the above-mentioned wafers is transferred to one of the grippers on the base. 如申請專利範圍第4項所述之晶粒退出裝置,其中用以與上述支架抓取器耦接之一溝槽係形成於上述支架之上述外表面。 The die exit device of claim 4, wherein a groove for coupling with the bracket grabber is formed on the outer surface of the bracket. 如申請專利範圍第2項所述之晶粒退出裝置,其中上述支架承載部件分別包括:一卡盤,用以插入上述第一支架之上述下開口;以及複數接觸元件,用以自上述卡盤之一邊凸出,且與上述支架之上述下開口之一內表面緊密連接而抓取上述第一支架。 The die exiting device of claim 2, wherein the bracket bearing member comprises: a chuck for inserting the lower opening of the first bracket; and a plurality of contact elements for the chuck One of the sides protrudes and is tightly coupled to an inner surface of one of the lower openings of the bracket to grasp the first bracket. 如申請專利範圍第6項所述之晶粒退出裝置,其中上述用以垂直移動之一活塞包括具有一既定梯度之一上邊坡,上述活塞放置於上述卡盤中,以及上述接觸元件分別包括用以與上述支架之上述下開口之上述內表面緊密連接之一外表面以及用以與上述活塞之上述上邊坡緊密連接之一內表面,以及藉由上述活塞之垂直運動與上述第一支架之上述下開口之上述內表面緊密連接。 The die exit device of claim 6, wherein the piston for vertically moving comprises an upper slope having a predetermined gradient, the piston is placed in the chuck, and the contact elements are respectively included An outer surface closely coupled to the inner surface of the lower opening of the bracket and an inner surface for tightly connecting to the upper slope of the piston, and the vertical movement of the piston and the first bracket The inner surface of the lower opening is closely connected. 如申請專利範圍第7項所述之晶粒退出裝置,其中上述接觸元件之複數移動路徑係提供於上述卡盤內,上述移動路徑具有由上述卡盤內部至上述卡盤外部逐漸增加之一梯 度。 The die exit device of claim 7, wherein the plurality of moving paths of the contact elements are provided in the chuck, and the moving path has a ladder gradually increasing from the inside of the chuck to the outside of the chuck. degree. 如申請專利範圍第7項所述之晶粒退出裝置,其中一永久性磁鐵內建於上述活塞中,因為上述永久性磁鐵的關係,上述接觸元件與上述上邊坡保持緊密接觸。 The die exit device of claim 7, wherein a permanent magnet is built in the piston, and the contact member is in close contact with the upper slope because of the permanent magnet.
TW102135626A 2012-10-30 2013-10-02 Die ejecting apparatus TWI521586B (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
KR1020120121458A KR101471715B1 (en) 2012-10-30 2012-10-30 Die ejecting apparatus

Publications (2)

Publication Number Publication Date
TW201430927A true TW201430927A (en) 2014-08-01
TWI521586B TWI521586B (en) 2016-02-11

Family

ID=50670073

Family Applications (1)

Application Number Title Priority Date Filing Date
TW102135626A TWI521586B (en) 2012-10-30 2013-10-02 Die ejecting apparatus

Country Status (3)

Country Link
KR (1) KR101471715B1 (en)
CN (1) CN103794531B (en)
TW (1) TWI521586B (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI649810B (en) * 2016-06-13 2019-02-01 日商捷進科技有限公司 Semiconductor manufacturing device and method for manufacturing semiconductor device

Families Citing this family (16)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR101593801B1 (en) * 2014-05-29 2016-02-12 세메스 주식회사 Apparatus for ejecting dies
KR102146776B1 (en) * 2014-06-11 2020-08-21 세메스 주식회사 Apparatus for exchanging a collet and a hood
KR102146774B1 (en) * 2014-06-11 2020-08-21 세메스 주식회사 Apparatus for exchanging a collet and a hood
KR102207869B1 (en) * 2014-08-18 2021-01-26 세메스 주식회사 Apparatus for exchanging a collet and a hood
KR102386333B1 (en) * 2015-06-12 2022-04-13 세메스 주식회사 A stacker unit
KR102371538B1 (en) * 2015-06-30 2022-03-07 세메스 주식회사 A stacker unit and apparatus for exchanging a collet and a hood including the stacker unit
KR101791787B1 (en) * 2016-05-27 2017-10-30 세메스 주식회사 Ejector pin assembly and die ejecting apparatus having the same
KR102559271B1 (en) * 2016-06-03 2023-07-25 세메스 주식회사 Apparatus for binding dies
KR101935097B1 (en) * 2016-08-10 2019-01-03 세메스 주식회사 Die ejecting apparatus
KR102000081B1 (en) * 2017-09-19 2019-07-17 세메스 주식회사 Die stage unit for testing die and die binding apparatus having the same
KR102594542B1 (en) 2018-10-31 2023-10-26 세메스 주식회사 Die ejecting apparatus
KR102330648B1 (en) 2019-07-02 2021-11-23 세메스 주식회사 Die ejecting apparatus
KR102189274B1 (en) 2019-07-02 2020-12-09 세메스 주식회사 Die pickup method and die pickup apparatus
KR102245805B1 (en) 2019-07-18 2021-04-28 세메스 주식회사 Die ejector and die pickup apparatus including the same
KR102288927B1 (en) 2019-09-06 2021-08-12 세메스 주식회사 Die ejector and die pickup apparatus including the same
KR20220052718A (en) 2020-10-21 2022-04-28 세메스 주식회사 Die ejector and die pickup apparatus including the same

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR20000046802A (en) * 1998-12-31 2000-07-25 김영환 Apparatus for picking up semiconductor chip
JP2990197B1 (en) * 1999-01-20 1999-12-13 熊本日本電気株式会社 Semiconductor chip pickup device
US7665204B2 (en) * 2006-10-16 2010-02-23 Asm Assembly Automation Ltd. Die detachment apparatus comprising pre-peeling structure
JP4985513B2 (en) * 2008-03-26 2012-07-25 富士通セミコンダクター株式会社 Method and apparatus for peeling electronic parts
KR20090108447A (en) * 2008-04-11 2009-10-15 주식회사 탑 엔지니어링 Ejector
KR101248313B1 (en) * 2012-06-29 2013-03-27 세메스 주식회사 Apparatus for exchanging a head and system for bonding dies having the apparatus

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI649810B (en) * 2016-06-13 2019-02-01 日商捷進科技有限公司 Semiconductor manufacturing device and method for manufacturing semiconductor device

Also Published As

Publication number Publication date
KR101471715B1 (en) 2014-12-10
TWI521586B (en) 2016-02-11
KR20140055104A (en) 2014-05-09
CN103794531B (en) 2016-09-14
CN103794531A (en) 2014-05-14

Similar Documents

Publication Publication Date Title
TWI521586B (en) Die ejecting apparatus
KR101271291B1 (en) Die ejecting apparatus
KR101496053B1 (en) Die ejecting apparatus
KR102084792B1 (en) Method for detaching a semiconductor chip from a foil
KR200468690Y1 (en) Die ejecting apparatus
KR101593801B1 (en) Apparatus for ejecting dies
TW201200447A (en) Workpiece transport method and workpiece transport device
KR101482870B1 (en) Apparatus for exchanging a collet
JP5941701B2 (en) Die bonder
KR101422356B1 (en) Die pickup unit and die bonder including the same
KR20120109561A (en) Pair of substrate holders, method for manufacturing device, separation device, method for separating substrates, substrate holder, and device for positioning substrate
KR20140035232A (en) Die bonder and bonding method
TW200800816A (en) Molding device and method for setting up mold
KR101422355B1 (en) Buffer stage and die bonder including the same
KR101957959B1 (en) Method and apparatus for ejecting a die
WO2019013022A1 (en) Conveyance device, substrate processing system, conveyance method, and substrate processing method
KR200466085Y1 (en) Die ejecting apparatus
KR200470831Y1 (en) Die ejecting apparatus
KR20150142717A (en) Apparatus for exchanging a collet and a hood
KR20160139265A (en) Gripper for gripping a substrate and apparatus including the same
KR20150142716A (en) Apparatus for exchanging a collet and a hood
KR102161520B1 (en) Apparatus for ejecting a die
JP2014239135A (en) Method of manufacturing semiconductor device
KR101515710B1 (en) Apparatus for supplying collets
KR20170137329A (en) Apparatus for binding dies