TW200632639A - Automatic defect repair system - Google Patents

Automatic defect repair system

Info

Publication number
TW200632639A
TW200632639A TW095102280A TW95102280A TW200632639A TW 200632639 A TW200632639 A TW 200632639A TW 095102280 A TW095102280 A TW 095102280A TW 95102280 A TW95102280 A TW 95102280A TW 200632639 A TW200632639 A TW 200632639A
Authority
TW
Taiwan
Prior art keywords
repair
classifiers
classification
defect
tiered
Prior art date
Application number
TW095102280A
Other languages
English (en)
Other versions
TWI447575B (zh
Inventor
Harry Gallarda
Steven Barnes
Lakshman Srinivasan
Wayne Wang
Original Assignee
Photon Dynamics Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Photon Dynamics Inc filed Critical Photon Dynamics Inc
Publication of TW200632639A publication Critical patent/TW200632639A/zh
Application granted granted Critical
Publication of TWI447575B publication Critical patent/TWI447575B/zh

Links

Classifications

    • G—PHYSICS
    • G02—OPTICS
    • G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
    • G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour 
    • G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour  based on liquid crystals, e.g. single liquid crystal display cells
    • G02F1/1306—Details
    • G02F1/1309—Repairing; Testing
    • G—PHYSICS
    • G02—OPTICS
    • G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
    • G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour 
    • G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour  based on liquid crystals, e.g. single liquid crystal display cells
    • G—PHYSICS
    • G02—OPTICS
    • G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
    • G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour 
    • G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour  based on liquid crystals, e.g. single liquid crystal display cells
    • G02F1/133—Constructional arrangements; Operation of liquid crystal cells; Circuit arrangements
    • G02F1/136—Liquid crystal cells structurally associated with a semi-conducting layer or substrate, e.g. cells forming part of an integrated circuit
    • G02F1/1362—Active matrix addressed cells
    • G02F1/136259—Repairing; Defects
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F18/00—Pattern recognition
    • G06F18/20—Analysing
    • G06F18/24—Classification techniques
    • G06F18/243—Classification techniques relating to the number of classes
    • G06F18/2431—Multiple classes
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/0002—Inspection of images, e.g. flaw detection
    • G06T7/0004—Industrial image inspection
    • G06T7/001—Industrial image inspection using an image reference approach
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06V—IMAGE OR VIDEO RECOGNITION OR UNDERSTANDING
    • G06V10/00—Arrangements for image or video recognition or understanding
    • G06V10/70—Arrangements for image or video recognition or understanding using pattern recognition or machine learning
    • G06V10/764—Arrangements for image or video recognition or understanding using pattern recognition or machine learning using classification, e.g. of video objects
    • G—PHYSICS
    • G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
    • G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
    • G09G3/00—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes
    • G09G3/006—Electronic inspection or testing of displays and display drivers, e.g. of LED or LCD displays
    • G—PHYSICS
    • G02—OPTICS
    • G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
    • G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour 
    • G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour  based on liquid crystals, e.g. single liquid crystal display cells
    • G02F1/133—Constructional arrangements; Operation of liquid crystal cells; Circuit arrangements
    • G02F1/136—Liquid crystal cells structurally associated with a semi-conducting layer or substrate, e.g. cells forming part of an integrated circuit
    • G02F1/1362—Active matrix addressed cells
    • G02F1/136259—Repairing; Defects
    • G02F1/136263—Line defects
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/10—Image acquisition modality
    • G06T2207/10024—Color image
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/30—Subject of image; Context of image processing
    • G06T2207/30108—Industrial image inspection
    • G06T2207/30121—CRT, LCD or plasma display
    • G—PHYSICS
    • G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
    • G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
    • G09G2330/00—Aspects of power supply; Aspects of display protection and defect management
    • G09G2330/08—Fault-tolerant or redundant circuits, or circuits in which repair of defects is prepared

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Theoretical Computer Science (AREA)
  • Nonlinear Science (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Optics & Photonics (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Chemical & Material Sciences (AREA)
  • Artificial Intelligence (AREA)
  • Evolutionary Computation (AREA)
  • Data Mining & Analysis (AREA)
  • Bioinformatics & Cheminformatics (AREA)
  • General Health & Medical Sciences (AREA)
  • Software Systems (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Bioinformatics & Computational Biology (AREA)
  • Evolutionary Biology (AREA)
  • General Engineering & Computer Science (AREA)
  • Medical Informatics (AREA)
  • Multimedia (AREA)
  • Databases & Information Systems (AREA)
  • Computing Systems (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Mathematical Physics (AREA)
  • Quality & Reliability (AREA)
  • Computer Hardware Design (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Liquid Crystal (AREA)
  • Devices For Indicating Variable Information By Combining Individual Elements (AREA)
  • Image Processing (AREA)
TW095102280A 2005-01-21 2006-01-20 自動缺陷修復系統 TWI447575B (zh)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US64611105P 2005-01-21 2005-01-21

Publications (2)

Publication Number Publication Date
TW200632639A true TW200632639A (en) 2006-09-16
TWI447575B TWI447575B (zh) 2014-08-01

Family

ID=36692929

Family Applications (1)

Application Number Title Priority Date Filing Date
TW095102280A TWI447575B (zh) 2005-01-21 2006-01-20 自動缺陷修復系統

Country Status (6)

Country Link
US (1) US7761182B2 (zh)
JP (1) JP2008529067A (zh)
KR (1) KR101387785B1 (zh)
CN (1) CN101536011B (zh)
TW (1) TWI447575B (zh)
WO (1) WO2006078916A2 (zh)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI475215B (zh) * 2009-03-31 2015-03-01 Lg Display Co Ltd 用於測試液晶顯示裝置之系統及方法
TWI755312B (zh) * 2021-04-07 2022-02-11 佑昇雷射股份有限公司 智慧化視覺雷射切割專家系統及其操作流程
TWI821571B (zh) * 2019-06-13 2023-11-11 日商Ｖ科技股份有限公司 雷射修復方法、雷射修復裝置

Families Citing this family (67)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7301133B2 (en) * 2005-01-21 2007-11-27 Photon Dynamics, Inc. Tracking auto focus system
TWI447575B (zh) 2005-01-21 2014-08-01 Photon Dynamics Inc 自動缺陷修復系統
JP4956984B2 (ja) * 2005-12-14 2012-06-20 ソニー株式会社 欠陥修正装置及び欠陥修正方法
JP2007189589A (ja) * 2006-01-16 2007-07-26 Sony Corp 情報処理装置および情報処理方法、学習装置および学習方法、並びにプログラム
US7786742B2 (en) 2006-05-31 2010-08-31 Applied Materials, Inc. Prober for electronic device testing on large area substrates
DE102006039356A1 (de) * 2006-08-22 2008-03-20 Robert Bosch Gmbh Verfahren zum Steuern eines Karosserierohbau-Laserschweißsystems und Karosserierohbau-Laserschweißsystem
JP4813322B2 (ja) * 2006-10-17 2011-11-09 シャープ株式会社 基板修復システム、基板修復方法、プログラム及びコンピュータ読み取り可能な記録媒体
JP4940941B2 (ja) * 2006-12-25 2012-05-30 ソニー株式会社 欠陥修正装置及び欠陥修正方法
JP4374552B2 (ja) 2007-04-12 2009-12-02 ソニー株式会社 基板の製造方法および基板製造システム、並びに表示装置の製造方法
US8023766B1 (en) * 2007-04-30 2011-09-20 Hewlett-Packard Development Company, L.P. Method and system of processing an image containing undesirable pixels
JP5353179B2 (ja) * 2008-10-22 2013-11-27 ソニー株式会社 欠陥修正装置および欠陥修正方法
JP5158365B2 (ja) * 2008-11-14 2013-03-06 オムロン株式会社 基板の欠陥検査装置
US7979969B2 (en) * 2008-11-17 2011-07-19 Solopower, Inc. Method of detecting and passivating a defect in a solar cell
US9020943B2 (en) * 2009-01-07 2015-04-28 Oracle International Corporation Methods, systems, and computer program product for automatically categorizing defects
US8219514B2 (en) * 2009-01-07 2012-07-10 Oracle International Corporation Methods, systems, and computer program product for implementing expert assessment of a product
JP5640328B2 (ja) * 2009-05-20 2014-12-17 ソニー株式会社 欠陥修正装置及び欠陥修正方法
US10996258B2 (en) * 2009-11-30 2021-05-04 Ignis Innovation Inc. Defect detection and correction of pixel circuits for AMOLED displays
JP2013068645A (ja) * 2010-01-28 2013-04-18 Sharp Corp 表示装置の欠陥修正方法、表示装置およびその製造方法
US8315453B2 (en) * 2010-07-27 2012-11-20 Applied Materials Israel, Ltd. Defect classification with optimized purity
US8331650B2 (en) 2010-07-29 2012-12-11 Sharp Laboratories Of America, Inc. Methods, systems and apparatus for defect detection
US8995747B2 (en) * 2010-07-29 2015-03-31 Sharp Laboratories Of America, Inc. Methods, systems and apparatus for defect detection and classification
US9053391B2 (en) 2011-04-12 2015-06-09 Sharp Laboratories Of America, Inc. Supervised and semi-supervised online boosting algorithm in machine learning framework
CN102829858B (zh) * 2011-06-15 2014-09-10 上海天马微电子有限公司 光传感器阵列面板的缺陷检测修复装置及其方法
CN102262663B (zh) * 2011-07-25 2013-01-02 中国科学院软件研究所 一种软件缺陷报告修复方法
US9092842B2 (en) 2011-08-04 2015-07-28 Sharp Laboratories Of America, Inc. System for defect detection and repair
US10043264B2 (en) 2012-04-19 2018-08-07 Applied Materials Israel Ltd. Integration of automatic and manual defect classification
US9715723B2 (en) 2012-04-19 2017-07-25 Applied Materials Israel Ltd Optimization of unknown defect rejection for automatic defect classification
JP2013257208A (ja) * 2012-06-12 2013-12-26 Sharp Corp 欠陥原因工程分析装置および欠陥原因工程分析方法
US8831333B2 (en) * 2012-06-13 2014-09-09 Nanya Technology Corporation Mask pattern analysis apparatus and method for analyzing mask pattern
US8995745B2 (en) * 2012-07-31 2015-03-31 Fei Company Sequencer for combining automated and manual-assistance jobs in a charged particle beam device
KR20200011577A (ko) 2013-02-18 2020-02-03 카티바, 인크. Oled 스택 필름의 품질 평가를 위한 시스템, 장치, 및 방법
US20140270347A1 (en) * 2013-03-13 2014-09-18 Sharp Laboratories Of America, Inc. Hierarchical image classification system
US10114368B2 (en) 2013-07-22 2018-10-30 Applied Materials Israel Ltd. Closed-loop automatic defect inspection and classification
CN103440654B (zh) * 2013-08-27 2016-08-10 南京大学 一种lcd异物缺陷检测方法
US10268927B2 (en) 2014-10-14 2019-04-23 Eigen Innovations Inc. System, apparatus and method for configuration of industrial vision control modules
US10650508B2 (en) 2014-12-03 2020-05-12 Kla-Tencor Corporation Automatic defect classification without sampling and feature selection
DE102015204800B3 (de) * 2015-03-17 2016-12-01 MTU Aero Engines AG Verfahren und Vorrichtung zur Qualitätsbeurteilung eines mittels eines additiven Herstellungsverfahrens hergestellten Bauteils
CN105161517B (zh) * 2015-08-14 2018-10-12 京东方科技集团股份有限公司 阵列基板的修复方法、修复装置和制备方法
DE102015119240B3 (de) * 2015-11-09 2017-03-30 ATENSOR Engineering and Technology Systems GmbH Automatisches detektieren und robotergestütztes bearbeiten von oberflächendefekten
KR102510003B1 (ko) * 2015-12-22 2023-03-13 엘지디스플레이 주식회사 유기 발광 표시 장치
US10580055B2 (en) 2016-10-13 2020-03-03 International Business Machines Corporation Identifying physical tools to manipulate physical components based on analyzing digital images of the physical components
US10217031B2 (en) 2016-10-13 2019-02-26 International Business Machines Corporation Identifying complimentary physical components to known physical components
US10578937B2 (en) * 2016-12-21 2020-03-03 HKC Corporation Limited Method and apparatus of repairing transistor
CN106814479B (zh) * 2017-01-11 2019-07-16 昆山国显光电有限公司 一种面板缺陷位置的偏移补偿方法、装置及系统
CN106950758B (zh) * 2017-03-03 2019-06-18 惠科股份有限公司 一种显示面板及其制程和显示装置
CN107093679A (zh) * 2017-04-28 2017-08-25 京东方科技集团股份有限公司 修复有机电致发光器件亮点的方法、有机电致发光器件及其制备方法及显示装置
CN107040725B (zh) * 2017-05-15 2021-04-30 惠科股份有限公司 一种图像获取装置的坐标校正方法及图像获取装置
CN107464236B (zh) * 2017-07-28 2020-05-05 武汉华星光电半导体显示技术有限公司 一种基于aoi的柔性显示基板缺陷判别方法
CN107886500A (zh) * 2017-10-13 2018-04-06 北京邮电大学 一种基于机器视觉和机器学习的产品生产监控方法及系统
TWI649659B (zh) 2017-10-27 2019-02-01 財團法人工業技術研究院 自動光學檢測影像分類方法、系統及含有該方法之電腦可讀取媒體
CN108196029A (zh) * 2018-03-02 2018-06-22 绵阳金泰机械设备制造有限公司 一种金属零件缺陷检测系统及修复方法
KR20200123858A (ko) * 2018-03-21 2020-10-30 케이엘에이 코포레이션 합성 이미지를 사용한 머신 러닝 모델 트레이닝
TWI703514B (zh) * 2018-05-24 2020-09-01 牧德科技股份有限公司 人工智慧複檢系統及其方法
US10713769B2 (en) * 2018-06-05 2020-07-14 Kla-Tencor Corp. Active learning for defect classifier training
US11315231B2 (en) 2018-06-08 2022-04-26 Industrial Technology Research Institute Industrial image inspection method and system and computer readable recording medium
CN109118482B (zh) * 2018-08-07 2019-12-31 腾讯科技（深圳）有限公司 一种面板缺陷分析方法、装置及存储介质
JP2019003203A (ja) * 2018-08-10 2019-01-10 株式会社ニューフレアテクノロジー 検査方法および検査装置
CN110961857B (zh) * 2019-11-07 2021-05-04 中广核工程有限公司 一种控制棒驱动机构密封焊缝唇边坡口再制方法及系统
CN111054638A (zh) * 2019-11-27 2020-04-24 奥特斯科技(重庆)有限公司 制造部件承载件的方法及在制造期间操控面板的设备
CN111337512B (zh) * 2020-05-22 2020-09-08 深圳新视智科技术有限公司 用于aoi缺陷检测的缺陷提取方法
DE102020120559A1 (de) 2020-08-04 2022-02-10 Bayerische Motoren Werke Aktiengesellschaft Verfahren zum Bearbeiten wenigstens eines Defekts einer Oberfläche eines Bauteils, insbesondere in einem Bereich wenigstens eines Oberflächenmerkmals
TWI737447B (zh) * 2020-08-13 2021-08-21 新加坡商鴻運科股份有限公司 影像處理方法、電子裝置和存儲介質
CN112827857A (zh) * 2020-12-30 2021-05-25 凌云光技术股份有限公司 一种基于aoi检测的人工重新判定装置、方法和系统
CN115147329A (zh) * 2021-03-29 2022-10-04 北京小米移动软件有限公司 一种柔性面板的修复方法、装置、设备及存储介质
KR102643090B1 (ko) * 2021-10-27 2024-03-04 주식회사 코윈디에스티 인공지능(ai)을 이용한 잉크젯 방식의 디스플레이 패널에 대한 자동 결함 수리 방법
TWI816549B (zh) * 2022-09-14 2023-09-21 朝陽科技大學 自動化瑕疵檢測方法
CN115815134B (zh) * 2023-02-15 2023-05-02 泰州新源电工器材有限公司 基于视觉检测系统可修复表面缺陷的纸板分选设备

Family Cites Families (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6205239B1 (en) * 1996-05-31 2001-03-20 Texas Instruments Incorporated System and method for circuit repair
JP4002655B2 (ja) * 1998-01-06 2007-11-07 株式会社日立製作所 パターン検査方法およびその装置
US6476913B1 (en) * 1998-11-30 2002-11-05 Hitachi, Ltd. Inspection method, apparatus and system for circuit pattern
US6539106B1 (en) * 1999-01-08 2003-03-25 Applied Materials, Inc. Feature-based defect detection
JP4348979B2 (ja) * 2003-03-27 2009-10-21 東レ株式会社 リペア装置およびリペア方法
US7356175B2 (en) * 2003-09-25 2008-04-08 Columbia Forest Products, Inc. Identifying defects in decorative wood panels
US7394534B1 (en) * 2003-11-19 2008-07-01 Kla-Tencor Corporation Process excursion detection
US7084970B2 (en) * 2004-05-14 2006-08-01 Photon Dynamics, Inc. Inspection of TFT LCD panels using on-demand automated optical inspection sub-system
US7142992B1 (en) * 2004-09-30 2006-11-28 Kla-Tencor Technologies Corp. Flexible hybrid defect classification for semiconductor manufacturing
TWI447575B (zh) 2005-01-21 2014-08-01 Photon Dynamics Inc 自動缺陷修復系統

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI475215B (zh) * 2009-03-31 2015-03-01 Lg Display Co Ltd 用於測試液晶顯示裝置之系統及方法
TWI821571B (zh) * 2019-06-13 2023-11-11 日商Ｖ科技股份有限公司 雷射修復方法、雷射修復裝置
TWI755312B (zh) * 2021-04-07 2022-02-11 佑昇雷射股份有限公司 智慧化視覺雷射切割專家系統及其操作流程

Also Published As

Publication number Publication date
JP2008529067A (ja) 2008-07-31
CN101536011B (zh) 2013-01-09
US7761182B2 (en) 2010-07-20
WO2006078916A3 (en) 2009-04-16
KR20070095437A (ko) 2007-09-28
CN101536011A (zh) 2009-09-16
TWI447575B (zh) 2014-08-01
WO2006078916A2 (en) 2006-07-27
KR101387785B1 (ko) 2014-04-25
US20060226865A1 (en) 2006-10-12

Similar Documents

Publication Publication Date Title
TW200632639A (en) Automatic defect repair system
Ardente et al. Recycling of electronic displays: Analysis of pre-processing and potential ecodesign improvements
CN203853770U (zh) 转盘式汽车门铰链螺母座安装与打螺丝装置
CA2497040A1 (en) Systems and methods enabling automated return to and/or repair of inconsistencies with a material placement machine
EP1580693A3 (en) System and method for excluding extraneous features from image inspection operations
EP1186899A3 (en) Supporting framework for display panel or probe block
CA2561815A1 (en) Systems and methods for using light to indicate inconsistency locations on a composite structure
EP2267759A3 (en) Exposure apparatus, exposure method and device manufacturing method
CN105590573A (zh) Amoled显示面板线缺陷的修复结构及修复方法
CN102674007B (zh) 液晶面板搬运方法及搬运装置
CN106743271A (zh) 一种服装吊挂生产线及其使用方法
Workineh et al. Autonomous maintenance: a case study on Assela Malt Factory
CN103324380A (zh) 一种摄像头模件组测试结果的计算机显示方法
US8610889B2 (en) Automated optical inspection device and calibration method thereof
WO2011078374A3 (ja) 太陽電池の検査装置、太陽電池の検査方法およびプログラム
TW200511148A (en) Defect display apparatus
CN101183182A (zh) 液晶面板的激光修整系统
CN201233375Y (zh) 玻璃检测仪
SG161215A1 (en) Method of analyzing cell structures and their components
CN207081910U (zh) 雷射修补机
CN101592812B (zh) 显示面板及其像素缺陷检查方法
CN112697805A (zh) 一种织物疵点智能检测装置
CN203366099U (zh) 取件防错系统
CN205881927U (zh) 一种明场光线下高精度硅片检测系统
CN211181172U (zh) 一种电气自动化综合实训考核装置