WO2011078374A3 - 太陽電池の検査装置、太陽電池の検査方法およびプログラム - Google Patents

太陽電池の検査装置、太陽電池の検査方法およびプログラム Download PDF

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Publication number
WO2011078374A3
WO2011078374A3 PCT/JP2010/073486 JP2010073486W WO2011078374A3 WO 2011078374 A3 WO2011078374 A3 WO 2011078374A3 JP 2010073486 W JP2010073486 W JP 2010073486W WO 2011078374 A3 WO2011078374 A3 WO 2011078374A3
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WO
WIPO (PCT)
Prior art keywords
solar cell
region
cell inspection
band
inspection device
Prior art date
Application number
PCT/JP2010/073486
Other languages
English (en)
French (fr)
Other versions
WO2011078374A2 (ja
Inventor
吉成 森尾
石川　誠
高橋　潤一
後藤　正宏
Original Assignee
日清紡メカトロニクス株式会社
国立大学法人三重大学
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 日清紡メカトロニクス株式会社, 国立大学法人三重大学 filed Critical 日清紡メカトロニクス株式会社
Publication of WO2011078374A2 publication Critical patent/WO2011078374A2/ja
Publication of WO2011078374A3 publication Critical patent/WO2011078374A3/ja

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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N21/9501—Semiconductor wafers
    • H—ELECTRICITY
    • H02—GENERATION; CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
    • H02S—GENERATION OF ELECTRIC POWER BY CONVERSION OF INFRARED RADIATION, VISIBLE LIGHT OR ULTRAVIOLET LIGHT, e.g. USING PHOTOVOLTAIC [PV] MODULES
    • H02S50/00—Monitoring or testing of PV systems, e.g. load balancing or fault identification
    • H02S50/10—Testing of PV devices, e.g. of PV modules or single PV cells
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/66—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light electrically excited, e.g. electroluminescence
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
    • Y02E—REDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
    • Y02E10/00—Energy generation through renewable energy sources
    • Y02E10/50—Photovoltaic [PV] energy

Abstract

　太陽電池セル内の帯状の欠陥の位置を特定することが可能な太陽電池の検査装置を提供する　本発明の太陽電池の検査装置は、通電された状態の太陽電池セルを表すセル画像に探索窓４３を適用して、太陽電池セル内の帯状の欠陥の位置を特定する欠陥位置特定手段を備える。探索窓４３は、帯状の第１の領域４０ａと、第１の領域４０ａにより二分される第２の領域４０ｂと、を含む。欠陥位置特定手段は、探索窓４３がセル画像内に定められたときの第１の領域４０ａ内の明度と第２の領域４０ｂ内の明度とに基づいて、第１の領域４０ａと同じ方向に延伸する帯状の欠陥の位置を特定する。
PCT/JP2010/073486 2009-12-22 2010-12-17 太陽電池の検査装置、太陽電池の検査方法およびプログラム WO2011078374A2 (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2009290557A JP2011134764A (ja) 2009-12-22 2009-12-22 太陽電池の検査装置、太陽電池の検査方法およびプログラム
JP2009-290557 2009-12-22

Publications (2)

Publication Number Publication Date
WO2011078374A2 WO2011078374A2 (ja) 2011-06-30
WO2011078374A3 true WO2011078374A3 (ja) 2011-09-15

Family

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PCT/JP2010/073486 WO2011078374A2 (ja) 2009-12-22 2010-12-17 太陽電池の検査装置、太陽電池の検査方法およびプログラム

Country Status (3)

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JP (1) JP2011134764A (ja)
TW (1) TW201144843A (ja)
WO (1) WO2011078374A2 (ja)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI494580B (zh) * 2013-02-27 2015-08-01 Inventec Solar Energy Corp 電池片檢測方法與裝置
TWI564577B (zh) * 2015-09-11 2017-01-01 英穩達科技股份有限公司 具有缺陷之太陽能電池的檢出方法
JP6880699B2 (ja) * 2016-12-16 2021-06-02 東京電力ホールディングス株式会社 検査装置、検査方法および検査プログラム
WO2021182061A1 (ja) * 2020-03-13 2021-09-16 アートビーム有限会社 太陽電池、太陽電池の製造方法、およびその測定装置
KR102592029B1 (ko) * 2021-06-25 2023-10-23 경북대학교 산학협력단 열화상 기술을 이용한 태양광 모듈의 특징 추출 방법 및 장치

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2005114671A (ja) * 2003-10-10 2005-04-28 Lion Engineering Co Ltd 欠陥検査方法
WO2009084702A1 (ja) * 2007-12-28 2009-07-09 Nisshinbo Industries, Inc. 太陽電池検査装置及び太陽電池欠陥判定方法

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2005114671A (ja) * 2003-10-10 2005-04-28 Lion Engineering Co Ltd 欠陥検査方法
WO2009084702A1 (ja) * 2007-12-28 2009-07-09 Nisshinbo Industries, Inc. 太陽電池検査装置及び太陽電池欠陥判定方法

Non-Patent Citations (1)

* Cited by examiner, † Cited by third party
Title
KAZUHIRO FUKUI: "Edge Extraction Based on Separability of Image Features", IPSJ SIG NOTES, vol. 94, no. 5, 20 January 1994 (1994-01-20), pages 1 - 8 *

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Publication number Publication date
JP2011134764A (ja) 2011-07-07
TW201144843A (en) 2011-12-16
WO2011078374A2 (ja) 2011-06-30

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