TW201144843A - Inspecting apparatus, inspecting method and inspecting program for photovoltaic devices - Google Patents

Inspecting apparatus, inspecting method and inspecting program for photovoltaic devices

Info

Publication number
TW201144843A
TW201144843A TW099145369A TW99145369A TW201144843A TW 201144843 A TW201144843 A TW 201144843A TW 099145369 A TW099145369 A TW 099145369A TW 99145369 A TW99145369 A TW 99145369A TW 201144843 A TW201144843 A TW 201144843A
Authority
TW
Taiwan
Prior art keywords
inspecting
area
photovoltaic devices
program
search window
Prior art date
Application number
TW099145369A
Other languages
English (en)
Chinese (zh)
Inventor
Yoshinari Morio
Makoto Ishikawa
Junichi Takahashi
Masahiro Goto
Original Assignee
Nisshinbo Mechatronics Inc
Univ Mie
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nisshinbo Mechatronics Inc, Univ Mie filed Critical Nisshinbo Mechatronics Inc
Publication of TW201144843A publication Critical patent/TW201144843A/zh

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N21/9501—Semiconductor wafers
    • H—ELECTRICITY
    • H02—GENERATION; CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
    • H02S—GENERATION OF ELECTRIC POWER BY CONVERSION OF INFRARED RADIATION, VISIBLE LIGHT OR ULTRAVIOLET LIGHT, e.g. USING PHOTOVOLTAIC [PV] MODULES
    • H02S50/00—Monitoring or testing of PV systems, e.g. load balancing or fault identification
    • H02S50/10—Testing of PV devices, e.g. of PV modules or single PV cells
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/66—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light electrically excited, e.g. electroluminescence
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
    • Y02E—REDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
    • Y02E10/00—Energy generation through renewable energy sources
    • Y02E10/50—Photovoltaic [PV] energy
TW099145369A 2009-12-22 2010-12-22 Inspecting apparatus, inspecting method and inspecting program for photovoltaic devices TW201144843A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2009290557A JP2011134764A (ja) 2009-12-22 2009-12-22 太陽電池の検査装置、太陽電池の検査方法およびプログラム

Publications (1)

Publication Number Publication Date
TW201144843A true TW201144843A (en) 2011-12-16

Family

ID=44196225

Family Applications (1)

Application Number Title Priority Date Filing Date
TW099145369A TW201144843A (en) 2009-12-22 2010-12-22 Inspecting apparatus, inspecting method and inspecting program for photovoltaic devices

Country Status (3)

Country Link
JP (1) JP2011134764A (ja)
TW (1) TW201144843A (ja)
WO (1) WO2011078374A2 (ja)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI494580B (zh) * 2013-02-27 2015-08-01 Inventec Solar Energy Corp 電池片檢測方法與裝置
TWI564577B (zh) * 2015-09-11 2017-01-01 英穩達科技股份有限公司 具有缺陷之太陽能電池的檢出方法

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP6880699B2 (ja) * 2016-12-16 2021-06-02 東京電力ホールディングス株式会社 検査装置、検査方法および検査プログラム
WO2021182061A1 (ja) * 2020-03-13 2021-09-16 アートビーム有限会社 太陽電池、太陽電池の製造方法、およびその測定装置
KR102592029B1 (ko) * 2021-06-25 2023-10-23 경북대학교 산학협력단 열화상 기술을 이용한 태양광 모듈의 특징 추출 방법 및 장치

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2005114671A (ja) * 2003-10-10 2005-04-28 Lion Engineering Co Ltd 欠陥検査方法
JP5243785B2 (ja) * 2007-12-28 2013-07-24 日清紡ホールディングス株式会社 太陽電池検査装置及び太陽電池欠陥判定方法

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI494580B (zh) * 2013-02-27 2015-08-01 Inventec Solar Energy Corp 電池片檢測方法與裝置
TWI564577B (zh) * 2015-09-11 2017-01-01 英穩達科技股份有限公司 具有缺陷之太陽能電池的檢出方法

Also Published As

Publication number Publication date
WO2011078374A2 (ja) 2011-06-30
JP2011134764A (ja) 2011-07-07
WO2011078374A3 (ja) 2011-09-15

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