TW200624797A - Method and system for testing a display panel assembly - Google Patents

Method and system for testing a display panel assembly

Info

Publication number
TW200624797A
TW200624797A TW094138085A TW94138085A TW200624797A TW 200624797 A TW200624797 A TW 200624797A TW 094138085 A TW094138085 A TW 094138085A TW 94138085 A TW94138085 A TW 94138085A TW 200624797 A TW200624797 A TW 200624797A
Authority
TW
Taiwan
Prior art keywords
display panel
panel assembly
section
active area
area image
Prior art date
Application number
TW094138085A
Other languages
English (en)
Inventor
Sang-Hyuk Kwon
Kyoung-Ho Yang
Soon-Jae Park
Original Assignee
Samsung Electronics Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Samsung Electronics Co Ltd filed Critical Samsung Electronics Co Ltd
Publication of TW200624797A publication Critical patent/TW200624797A/zh

Links

Classifications

    • G—PHYSICS
    • G02—OPTICS
    • G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
    • G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour 
    • G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour  based on liquid crystals, e.g. single liquid crystal display cells
    • G02F1/1306—Details
    • G02F1/1309—Repairing; Testing
    • G—PHYSICS
    • G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
    • G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
    • G09G3/00—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes
    • G09G3/006—Electronic inspection or testing of displays and display drivers, e.g. of LED or LCD displays
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N2021/1765—Method using an image detector and processing of image signal

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Theoretical Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Nonlinear Science (AREA)
  • Optics & Photonics (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Chemical & Material Sciences (AREA)
  • Liquid Crystal (AREA)
  • Testing Of Optical Devices Or Fibers (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Devices For Indicating Variable Information By Combining Individual Elements (AREA)
  • Control Of Indicators Other Than Cathode Ray Tubes (AREA)
  • Testing, Inspecting, Measuring Of Stereoscopic Televisions And Televisions (AREA)
  • Liquid Crystal Display Device Control (AREA)
TW094138085A 2004-11-11 2005-10-31 Method and system for testing a display panel assembly TW200624797A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
KR1020040091809A KR20060044032A (ko) 2004-11-11 2004-11-11 표시패널용 검사 장치 및 이의 검사 방법

Publications (1)

Publication Number Publication Date
TW200624797A true TW200624797A (en) 2006-07-16

Family

ID=36574255

Family Applications (1)

Application Number Title Priority Date Filing Date
TW094138085A TW200624797A (en) 2004-11-11 2005-10-31 Method and system for testing a display panel assembly

Country Status (5)

Country Link
US (1) US7860296B2 (zh)
JP (1) JP4615322B2 (zh)
KR (1) KR20060044032A (zh)
CN (1) CN1773301B (zh)
TW (1) TW200624797A (zh)

Families Citing this family (43)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR101291794B1 (ko) * 2006-03-17 2013-07-31 엘지디스플레이 주식회사 액정표시패널 제조 시스템 및 이에 의해 제조된액정표시패널
JP4842034B2 (ja) * 2006-07-12 2011-12-21 株式会社日本マイクロニクス 液晶パネルの検査方法および画像処理装置
JP4909672B2 (ja) * 2006-08-08 2012-04-04 株式会社日本マイクロニクス 液晶パネル検査方法及び装置
CN100454006C (zh) * 2006-09-07 2009-01-21 哈尔滨工业大学 一种基于机器视觉的液晶显示器斑痕缺陷检测方法与系统
KR100805873B1 (ko) * 2006-11-28 2008-02-20 세광테크 주식회사 Ｌｃｄ 패널의 자동 압흔검사장치
JP4982213B2 (ja) * 2007-03-12 2012-07-25 株式会社日立ハイテクノロジーズ 欠陥検査装置及び欠陥検査方法
KR101494466B1 (ko) * 2007-12-14 2015-02-23 엘지전자 주식회사 이물질검출장치 및 이물질검출방법
CN101576594B (zh) * 2008-05-06 2011-05-04 大元科技股份有限公司 自动光学检查设备及其光源模块
US8488001B2 (en) * 2008-12-10 2013-07-16 Honeywell International Inc. Semi-automatic relative calibration method for master slave camera control
US9930297B2 (en) 2010-04-30 2018-03-27 Becton, Dickinson And Company System and method for acquiring images of medication preparations
US8520080B2 (en) 2011-01-31 2013-08-27 Hand Held Products, Inc. Apparatus, system, and method of use of imaging assembly on mobile terminal
US8502967B2 (en) * 2011-02-01 2013-08-06 Cooper S. K. Kuo Apparatus for optical inspection
KR20140007583A (ko) 2012-07-09 2014-01-20 삼성디스플레이 주식회사 표시패널 검사 장치 및 그 방법
KR101474611B1 (ko) * 2012-10-30 2014-12-18 삼성전기주식회사 불량위치 분석 시스템 및 방법
CN103063405A (zh) * 2012-12-18 2013-04-24 黄山市中显微电子有限公司 一种lcd产品响应速度测试仪器
JP6104016B2 (ja) * 2013-04-01 2017-03-29 株式会社日本マイクロニクス 液晶パネル検査装置
KR20150001094A (ko) 2013-06-26 2015-01-06 삼성디스플레이 주식회사 기판 검사 방법
KR101362330B1 (ko) * 2013-08-21 2014-02-12 한동희 디스플레이용 패널의 검사장치
KR101362329B1 (ko) * 2013-09-12 2014-02-12 한동희 디스플레이용 패널의 검사장치
KR20150066018A (ko) * 2013-12-05 2015-06-16 주식회사 이엘피 Ａｍｏｌｅｄ 패널 검사를 위한 표시 패널 검사 장치 및 그 방법
CN105701436A (zh) * 2014-11-27 2016-06-22 英业达科技有限公司 检测显示模块间隙宽度的方法
CN105628710A (zh) * 2014-11-28 2016-06-01 浙江金徕镀膜有限公司 物料检测系统及其检测方法
CN104460060B (zh) * 2014-12-05 2018-02-06 深圳鼎晶光电有限公司 液晶显示模组光学检测设备及方法
CN104506855B (zh) * 2015-01-09 2017-01-18 重庆卓美华视光电有限公司 裸眼3d模组校正装置及方法
CN106153296B (zh) * 2015-04-28 2019-02-12 信泰光学(深圳)有限公司 亮度异常提醒保护装置与方法
CN104765173B (zh) * 2015-04-29 2018-01-16 京东方科技集团股份有限公司 一种检测装置及其检测方法
CN105044127A (zh) * 2015-07-31 2015-11-11 深圳市星火辉煌系统工程有限公司 一种oled微型显示器缺陷检测装置及检测方法
CN105206233B (zh) * 2015-09-11 2018-05-18 京东方科技集团股份有限公司 一种驱动模式切换方法及模块和显示装置
CN107655899A (zh) * 2015-12-23 2018-02-02 苏州精濑光电有限公司 光学检测机
ES2819699T3 (es) 2016-03-07 2021-04-19 Hyla Inc Detección de daño de pantalla para dispositivos
CN106442560A (zh) * 2016-08-23 2017-02-22 汕头大学 一种显示屏的定位测量与缺陷检测方法
WO2018078753A1 (ja) * 2016-10-26 2018-05-03 堺ディスプレイプロダクト株式会社 補正システム
CN107015385A (zh) * 2017-03-24 2017-08-04 惠科股份有限公司 一种显示面板的检测方法和检测装置
CN106842651A (zh) * 2017-04-11 2017-06-13 惠科股份有限公司 显示装置及显示面板的测试方法
CN207068439U (zh) * 2017-08-16 2018-03-02 京东方科技集团股份有限公司 点灯机
CN107564446A (zh) * 2017-09-30 2018-01-09 深圳市华星光电半导体显示技术有限公司 一种面板点灯机、面板点灯测试系统及测试方法
KR102411607B1 (ko) 2017-10-13 2022-06-22 삼성디스플레이 주식회사 표시 패널의 검사 방법
CN108333805B (zh) * 2018-02-26 2020-11-03 京东方科技集团股份有限公司 不良点坐标自动检测方法和装置、设备和存储介质
US11460725B2 (en) 2018-12-04 2022-10-04 Samsung Display Co., Ltd. Inspection apparatus and method of driving the same
US11704887B2 (en) 2019-09-16 2023-07-18 Assurant, Inc. System, method, apparatus, and computer program product for utilizing machine learning to process an image of a mobile device to determine a mobile device integrity status
CN110657948B (zh) * 2019-09-26 2021-01-15 联想(北京)有限公司 用于测试电子设备的屏幕的方法、装置、测试设备和介质
CN110988558B (zh) * 2019-12-20 2022-06-07 京东方科技集团股份有限公司 一种触摸屏测试系统及方法
CN114923672B (zh) * 2022-05-17 2023-10-17 深圳市华星光电半导体显示技术有限公司 一种液晶显示面板的光学性能检测方法

Family Cites Families (33)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH01101646A (ja) * 1987-10-15 1989-04-19 Matsushita Electric Ind Co Ltd アクティブマトリクス液晶表示装置の製造方法
US5285150A (en) * 1990-11-26 1994-02-08 Photon Dynamics, Inc. Method and apparatus for testing LCD panel array
US5235272A (en) * 1991-06-17 1993-08-10 Photon Dynamics, Inc. Method and apparatus for automatically inspecting and repairing an active matrix LCD panel
US5184082A (en) * 1991-09-18 1993-02-02 Honeywell Inc. Apparatus and method for testing an active matrix pixel display
US5256578A (en) * 1991-12-23 1993-10-26 Motorola, Inc. Integral semiconductor wafer map recording
US5764209A (en) * 1992-03-16 1998-06-09 Photon Dynamics, Inc. Flat panel display inspection system
IL108974A (en) * 1994-03-14 1999-11-30 Orbotech Ltd Device and method for testing a display panel
JPH08292406A (ja) * 1995-04-24 1996-11-05 Advantest Corp Ｌｃｄパネル検査装置
US5917935A (en) * 1995-06-13 1999-06-29 Photon Dynamics, Inc. Mura detection apparatus and method
JP3333686B2 (ja) * 1996-06-28 2002-10-15 松下電器産業株式会社 表示画面検査方法
US5850205A (en) * 1997-03-10 1998-12-15 Northern Telecom Limited Automatic contrast control for liquid crystal displays
JP4251377B2 (ja) 1997-04-23 2009-04-08 宇東科技股▲ふん▼有限公司 アクティブマトリックス発光ダイオードピクセル構造及び方法
US6396505B1 (en) * 1998-10-07 2002-05-28 Microsoft Corporation Methods and apparatus for detecting and reducing color errors in images
JP4514871B2 (ja) 1999-01-29 2010-07-28 株式会社半導体エネルギー研究所 半導体装置および電子機器
JP4334045B2 (ja) 1999-02-09 2009-09-16 三洋電機株式会社 エレクトロルミネッセンス表示装置
JP2000321545A (ja) * 1999-03-05 2000-11-24 Ricoh Co Ltd 液晶パネル検査装置
JP3711781B2 (ja) 1999-03-12 2005-11-02 セイコーエプソン株式会社 電気光学装置及びその製造方法
US6483937B1 (en) * 1999-06-17 2002-11-19 International Business Machines Corporation Process for inspecting an object
IL131282A (en) * 1999-08-05 2009-02-11 Orbotech Ltd Apparatus and methods for inspection of objects
AU2073801A (en) * 1999-12-09 2001-06-18 Cellomics, Inc. A system for cell-based screening
DE10025751A1 (de) * 2000-05-24 2001-12-06 Atg Test Systems Gmbh Verfahren zum Untersuchen einer leiterplatte an einem vorbestimmten Bereich der Leiterplatte und Vorrichtung zum Durchführen des Verfahrens
JP4649051B2 (ja) * 2001-03-21 2011-03-09 オリンパス株式会社 検査画面の表示方法及び基板検査システム
KR100512716B1 (ko) * 2001-05-04 2005-09-07 삼성전자주식회사 디스플레이장치의 색상조정방법
JP3794298B2 (ja) * 2001-08-02 2006-07-05 セイコーエプソン株式会社 検査装置
JP2003061115A (ja) * 2001-08-20 2003-02-28 Hitachi Kokusai Electric Inc 電子ディスプレイ画質検査装置
US6859677B2 (en) * 2001-10-25 2005-02-22 International Truck Intellectual Property Company, Llc Assembly verification method and inspection system
US6741377B2 (en) * 2002-07-02 2004-05-25 Iridigm Display Corporation Device having a light-absorbing mask and a method for fabricating same
JP4027284B2 (ja) * 2002-07-26 2007-12-26 キヤノン株式会社 画像表示装置の製造方法
CN100409300C (zh) * 2002-09-20 2008-08-06 皇家飞利浦电子股份有限公司 柔性显示器的亮度和色彩变化补偿
JP2004286532A (ja) * 2003-03-20 2004-10-14 Olympus Corp 外観検査方法及びその装置
KR100541449B1 (ko) * 2003-07-23 2006-01-11 삼성전자주식회사 패널검사장치
KR100955486B1 (ko) * 2004-01-30 2010-04-30 삼성전자주식회사 디스플레이 패널의 검사장치 및 검사방법
US7122819B2 (en) * 2004-05-06 2006-10-17 Micron Technology, Inc. Method and apparatus for imager die package quality testing

Also Published As

Publication number Publication date
JP2006139237A (ja) 2006-06-01
US20060120588A1 (en) 2006-06-08
CN1773301A (zh) 2006-05-17
US7860296B2 (en) 2010-12-28
KR20060044032A (ko) 2006-05-16
CN1773301B (zh) 2010-10-20
JP4615322B2 (ja) 2011-01-19

Similar Documents

Publication Publication Date Title
TW200624797A (en) Method and system for testing a display panel assembly
WO2007079344A3 (en) Methods and systems for binning defects detected on a specimen
US10656206B1 (en) Multi-function electronic device testing
WO2006130802A3 (en) Apparatus, method and system for performing phase-resolved optical frequency domain imaging
GB0510154D0 (en) Automatically triggered snapshot data dump for storage unit with embedded system
US20060262110A1 (en) Driving method for display device
CA2342408A1 (en) Method of verifying defect management area information of disc and test apparatus for performing the same
WO2006037014A3 (en) Methods and apparatus for using location information to manage spillover in an audience monitoring system
US20130123960A1 (en) Automatic audio track setup
US20170163979A1 (en) Testing device of display devices and testing method thereof
WO2005111570A3 (en) Adaptive leak testing method
CN105120259B (zh) 数字电视机检测方法及装置
WO2009028476A1 (ja) 表示制御装置、検査システム、表示制御方法、プログラム、及び該プログラムを記録したコンピュータ読み取り可能な記録媒体
US20190096300A1 (en) Display quality monitoring and calibration
KR102020981B1 (ko) 터치 스크린을 포함하는 디스플레이 장치 및 터치 스크린 검사 방법
EP1056004A3 (en) Fully lazy linking.
CA2342555A1 (en) Method of verifying defect management area information of disc upon reinitialization with certification and test apparatus for performing same
US20080172577A1 (en) Testing apparatus and method using test script in mobile communication system
WO2022055819A1 (en) On-chip testing architecture for display system
EP1755107A2 (en) Method and apparatus of correcting color coordinates and display device including apparatus of correcting color coordinates
KR100516620B1 (ko) 액정 셀의 검사방법 및 검사장치
CN111988722B (zh) 测试音频的产生方法及分析方法
JP2013115521A (ja) 表示装置、及びそのプログラム
JP2008310374A (ja) タッチパネル機能の検査方法およびタッチパネル機能の検査装置
TW200801553A (en) Method and apparatus for inspecting a display substrate