TW200801553A - Method and apparatus for inspecting a display substrate - Google Patents

Method and apparatus for inspecting a display substrate

Info

Publication number
TW200801553A
TW200801553A TW096116296A TW96116296A TW200801553A TW 200801553 A TW200801553 A TW 200801553A TW 096116296 A TW096116296 A TW 096116296A TW 96116296 A TW96116296 A TW 96116296A TW 200801553 A TW200801553 A TW 200801553A
Authority
TW
Taiwan
Prior art keywords
display substrate
signal
inspecting
test
generated
Prior art date
Application number
TW096116296A
Other languages
Chinese (zh)
Inventor
Chan-Hyang Lim
Kyu-Tae Kim
In-Cheol Song
Original Assignee
Samsung Electronics Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Samsung Electronics Co Ltd filed Critical Samsung Electronics Co Ltd
Publication of TW200801553A publication Critical patent/TW200801553A/en

Links

Classifications

    • G—PHYSICS
    • G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
    • G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
    • G09G3/00—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes
    • G09G3/006—Electronic inspection or testing of displays and display drivers, e.g. of LED or LCD displays
    • H—ELECTRICITY
    • H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K13/00—Apparatus or processes specially adapted for manufacturing or adjusting assemblages of electric components
    • H05K13/08—Monitoring manufacture of assemblages
    • H05K13/0895—Maintenance systems or processes, e.g. indicating need for maintenance

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • General Physics & Mathematics (AREA)
  • Theoretical Computer Science (AREA)
  • Operations Research (AREA)
  • Manufacturing & Machinery (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Liquid Crystal (AREA)
  • Devices For Indicating Variable Information By Combining Individual Elements (AREA)
  • Testing Electric Properties And Detecting Electric Faults (AREA)
  • Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)

Abstract

A method for inspecting a display substrate and an apparatus for inspecting a display substrate are provided. The display substrate includes a plurality of test lines, a plurality of signal-applying pads electrically connected to each of the test lines, and a plurality of signal lines electrically connected to the signal-applying pads. In the method, a plurality of first test signals is applied to the test lines to inspect whether a first signal defect has been generated or not, The signal-applying pads are electrically shorted to each other when the first signal defect has been generated. A plurality of second test signals is applied to the test lines to inspect whether a second signal defect has been generated or not. Thus, reliability of inspections for the display substrate may be enhanced.
TW096116296A 2006-05-08 2007-05-08 Method and apparatus for inspecting a display substrate TW200801553A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
KR1020060040827A KR20070108589A (en) 2006-05-08 2006-05-08 Method of display substrate inspection and apparatus of display substrate inspection using the method

Publications (1)

Publication Number Publication Date
TW200801553A true TW200801553A (en) 2008-01-01

Family

ID=38838106

Family Applications (1)

Application Number Title Priority Date Filing Date
TW096116296A TW200801553A (en) 2006-05-08 2007-05-08 Method and apparatus for inspecting a display substrate

Country Status (4)

Country Link
JP (1) JP2007304083A (en)
KR (1) KR20070108589A (en)
CN (1) CN101071157A (en)
TW (1) TW200801553A (en)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR102296768B1 (en) * 2014-12-03 2021-09-01 엘지디스플레이 주식회사 Display panel and method for testing of display panel
KR20190129153A (en) * 2018-05-09 2019-11-20 삼성디스플레이 주식회사 Display device
CN109459653A (en) * 2018-12-29 2019-03-12 北方奥钛纳米技术有限公司 A kind of battery core short circuit testing tool

Also Published As

Publication number Publication date
KR20070108589A (en) 2007-11-13
JP2007304083A (en) 2007-11-22
CN101071157A (en) 2007-11-14

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