TW200719014A - Inspection method and apparatus for FPD - Google Patents

Inspection method and apparatus for FPD

Info

Publication number
TW200719014A
TW200719014A TW095104290A TW95104290A TW200719014A TW 200719014 A TW200719014 A TW 200719014A TW 095104290 A TW095104290 A TW 095104290A TW 95104290 A TW95104290 A TW 95104290A TW 200719014 A TW200719014 A TW 200719014A
Authority
TW
Taiwan
Prior art keywords
fpd
inspection
gross
test
panel
Prior art date
Application number
TW095104290A
Other languages
Chinese (zh)
Inventor
Jun-Ho Choi
Original Assignee
Kodi S Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Kodi S Co Ltd filed Critical Kodi S Co Ltd
Publication of TW200719014A publication Critical patent/TW200719014A/en

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/073—Multiple probes
    • G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/04—Housings; Supporting members; Arrangements of terminals
    • G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2801—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
    • G—PHYSICS
    • G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
    • G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
    • G09G3/00—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes
    • G09G3/006—Electronic inspection or testing of displays and display drivers, e.g. of LED or LCD displays

Abstract

Disclosed herein are an FPD inspection method and apparatus for allowing a visual test and gross test to be subsequently performed with same equipment. The inspection method for a flat panel display (FPD) comprises a loading process for seating an FPD panel, which is transferred to an FPD inspection table, onto an inspection pad, a gross test process for applying electric power and control signals to a channel portion of the inspection pad via a plurality of probes of a gross test unit after seating an FPD inspection apparatus, in which the gross test unit is integrally formed with a visual test unit, onto the inspection pad, thereby outputting a gross test screen on the FPD panel, so as to detect defects of the FPD panel through the gross test screen, and a visual test process for bring the visual test unit into contact with the channel portion of the inspection pad to short the pad at the channel portion, thereby outputting a visual test screen on the FPD panel, so as to detect line defects and cell defects of the FPD panel through the visual test screen.
TW095104290A 2005-11-15 2006-02-09 Inspection method and apparatus for FPD TW200719014A (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
KR20050109360 2005-11-15
KR1020060007227A KR100611608B1 (en) 2005-11-15 2006-01-24 Inspection method of flat display panel and unit for inspection of flat display panel

Publications (1)

Publication Number Publication Date
TW200719014A true TW200719014A (en) 2007-05-16

Family

ID=37594228

Family Applications (1)

Application Number Title Priority Date Filing Date
TW095104290A TW200719014A (en) 2005-11-15 2006-02-09 Inspection method and apparatus for FPD

Country Status (3)

Country Link
KR (1) KR100611608B1 (en)
CN (1) CN100514126C (en)
TW (1) TW200719014A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI559271B (en) * 2013-12-05 2016-11-21 Ｅｌｐ股份有限公司 Apparatus for testing display panel and model changing method of thereof

Families Citing this family (17)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR101312079B1 (en) 2006-09-29 2013-09-26 주식회사 아이에스시 Probe unit assembly and testing method of flat panel display using the same
KR100818563B1 (en) * 2007-02-16 2008-04-02 안재일 Method of testing for display panel and the device thereof
CN101354485B (en) * 2007-07-23 2011-04-06 奇美电子股份有限公司 System and method for testing display apparatus
KR100902600B1 (en) 2008-05-06 2009-06-11 (주)유비프리시젼 Contact block
KR100867308B1 (en) 2008-06-05 2008-11-06 주식회사 코디에스 Testing apparatus for flat panel display and method using the same
KR100995811B1 (en) * 2008-11-07 2010-11-22 주식회사 크라또 Probe unit being capable of delicate adjustment of probe
JP5156970B2 (en) * 2008-11-10 2013-03-06 株式会社日本マイクロニクス Probe unit for electrical inspection, electrical inspection device, and lighting inspection device
KR100916218B1 (en) 2008-11-25 2009-09-08 주식회사 코디에스 Multi testing apparatus for flat panel display
JP2010127706A (en) * 2008-11-26 2010-06-10 Micronics Japan Co Ltd Probe unit and inspection apparatus
KR101003394B1 (en) * 2008-12-11 2010-12-23 주식회사 크라또 Probe unit including a detachable part using a sliding PCB type
KR101021622B1 (en) 2009-01-15 2011-03-17 주식회사 코디에스 Multi testing apparatus for flat panel display
KR100945951B1 (en) 2009-01-15 2010-03-05 주식회사 코디에스 Probe unit for both visual inspection and gross test
KR101618134B1 (en) 2009-09-22 2016-05-09 엘지디스플레이 주식회사 Auto probe test method
CN102819126B (en) * 2012-08-06 2015-05-20 深圳市华星光电技术有限公司 Testing device and testing method
JP6084426B2 (en) * 2012-10-15 2017-02-22 株式会社日本マイクロニクス Inspection device
KR101749888B1 (en) 2015-12-24 2017-06-23 주식회사 하우토 Inspection apparatus of display panel and inspection method thereof
CN112233580B (en) * 2020-11-03 2022-07-19 天长市辉盛电子有限公司 Base module of fast assembly LED module

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100815146B1 (en) * 2002-01-24 2008-03-19 삼성전자주식회사 Apparatus and method for detecting a line error of liquid crystal display panel
KR20050006521A (en) * 2003-07-09 2005-01-17 삼성전자주식회사 Liquid crystal display and test method thereof
KR100973803B1 (en) * 2003-07-24 2010-08-03 삼성전자주식회사 Liquid crystal display
KR100970246B1 (en) * 2004-01-26 2010-07-16 삼성전자주식회사 Thin Film Transistor Substrate And Method of Manufacturing LCD Panel Comprising The Same

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI559271B (en) * 2013-12-05 2016-11-21 Ｅｌｐ股份有限公司 Apparatus for testing display panel and model changing method of thereof

Also Published As

Publication number Publication date
CN100514126C (en) 2009-07-15
CN1967317A (en) 2007-05-23
KR100611608B1 (en) 2006-08-11

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