KR20050006521A - Liquid crystal display and test method thereof - Google Patents

Abstract

PURPOSE: A liquid crystal display device, and a method for inspecting the same are provided to execute OS(Open and Short) inspection in a liquid crystal display device attached with driving circuits in a COG(Chip On Glass) method by forming gate inspection lines or data inspection lines. CONSTITUTION: A display area(101) includes a plurality of signal lines(121,171) and a plurality of thin film transistors formed on an insulation substrate(100). Driving areas(400,500) are formed on the insulation substrate, and include driving input bumpers(51,61) and driving output bumpers(52,62) connected with driving circuits for controlling the thin film transistors. Inspection lines(53,63) are formed at the driving areas and are connected with one ends of the signal lines through the driving output bumpers.

Description

Liquid crystal display and test method thereof

BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a liquid crystal display device and an inspection method thereof, and more particularly, to a method for inspecting open and short circuits of a liquid crystal display device.

The liquid crystal display is one of the most widely used flat panel display devices. The liquid crystal display includes two display panels on which a field generating electrode is formed and a liquid crystal layer interposed therebetween. It is a display device which controls the transmittance | permeability of the light which passes through a liquid crystal layer by rearranging.

Among the liquid crystal display devices, a field generating electrode is provided in each of two display panels. Among them, a liquid crystal display device having a structure in which a plurality of pixel electrodes are arranged in a matrix form on one display panel and one common electrode covering the entire display panel on the other display panel is mainstream. The display of an image in this liquid crystal display device is performed by applying a separate voltage to each pixel electrode. To this end, a thin film transistor, which is a three-terminal element for switching a voltage applied to a pixel electrode, is connected to each pixel electrode, and a gate line for transmitting a signal for controlling the thin film transistor and a data line for transmitting a voltage to be applied to the pixel electrode are provided. Install on the display panel.

Such a liquid crystal display panel has a layered structure in which a plurality of conductive layers and an insulating layer are stacked. In the lower thin film transistor array panel, the gate line, the data line, and the pixel electrode are made of different conductive layers (hereinafter, referred to as gate conductors, data conductors, and pixel conductors, respectively) and separated into insulating layers. Is common.

The thin film transistor array panel is controlled by a driving circuit connected to the gate line and the data line.

The driving circuit can be attached by a tape carrier package (TCP) mounting method and a chip on glass (COG) method. The TCP method is a method of attaching a tape with a driving chip to a thin film transistor array panel separately, and the COG method is a method of attaching a driving chip directly on an insulating substrate of a thin film transistor array panel. Conventionally, the TCP method is mainly used, but the COG method is mainly used due to the reduction of the area occupied by the chip and the cost reduction.

After the driving circuit is attached to the thin film transistor array panel, a visual inspection or a gross test is performed to inspect the defect of the thin film transistor array panel. Visual inspection forms an inspection line that connects each data line or gate line separately for odd and even lines, performs an inspection through the inspection line, and then disconnects the inspection line from the wiring using a laser. The gross test is performed by directly touching the probe tip to each wire.

On the other hand, the OS (Open & Short) test is a test for checking the open or short of the gate line or the data line after the gate line or the data line is formed, and the gate test line (or the data test line) on the left side (or the upper side) of the liquid crystal display panel. To the right side of the gate line (or lower side of the data line) connected to this line, make an OS test pad, connect the gate test line (or data test line) and the OS test pad, and send an electrical signal to the gate line (or data line). Open and short inspection.

However, in the COG method, when a plurality of output bumps are not connected to each other when performing a high detection visual inspection by binding odd lines and even lines separately. Therefore, since there is no gate test line or data test line, OS (Open & Short) test is impossible.

The technical problem of the present invention is to provide a method of inspecting a liquid crystal display device capable of performing OS inspection in a liquid crystal display device having a driving circuit by a COG method.

1 is a diagram illustrating a liquid crystal display according to an exemplary embodiment of the present invention.

2 is a flowchart illustrating a test method of a liquid crystal display according to an exemplary embodiment of the present invention.

<Description of the symbols for the main parts of the drawings>

53: gate inspection line 63: data inspection line

A liquid crystal display according to the present invention includes an insulating substrate, a display area including a plurality of signal lines and a plurality of thin film transistors formed on the insulating substrate, and a driving circuit formed on the insulating substrate and controlling the thin film transistors. And a driving region including a driving input bumper and a driving output bumper, wherein an inspection line connected to one end of the signal line and the driving output bumper is formed in the driving region.

Moreover, it is preferable that the 1st inspection pad is formed in one end of the said inspection line.

In addition, it is preferable that a second inspection pad is formed at the other end of the signal line.

In addition, the liquid crystal display according to the present invention is a display area including an insulating substrate, a plurality of gate lines, data lines, and a plurality of thin film transistors formed on the insulating substrate, and formed on the insulating substrate and controlling the thin film transistors. And a gate driving region including a gate driving input bumper and a gate driving output bumper connected to a gate driving circuit, wherein the gate driving line is connected to one end of the gate line through a gate driving output bumper. It is preferable that it is formed.

In addition, the liquid crystal display according to the present invention is a display area including an insulating substrate, a plurality of gate lines, data lines, and a plurality of thin film transistors formed on the insulating substrate, and formed on the insulating substrate and controlling the thin film transistors. And a data driving region including a data driving input bumper and a data driving output bumper connected to a data driving circuit, wherein the data driving line is connected to one end of the data line through a data driving output bumper. It is preferable that it is formed.

In addition, the inspection method of the liquid crystal display according to the present invention is to form a plurality of gate lines in the display region on the insulating substrate, and to form a gate inspection line connected to all of the plurality of gate lines in the gate driving region on the insulating substrate. The method may include: inspecting one end of the gate inspection line and one end of the gate line and inspecting the open and short of the gate line; forming a plurality of data lines in a display area on the insulation substrate, and forming data on the insulation substrate. And forming a data test line connected to all of the plurality of data lines in a driving region, and inspecting one end of the data test line and one end of the data line to inspect the open and short of the data line.

In the case of forming the gate inspection line and the gate line, it is preferable to form a first gate inspection pad at one end of the gate inspection line and a second gate inspection pad at one end of the gate line.

In the case of forming the data inspection line and the data line, it is preferable to form a first data inspection pad at one end of the data inspection line and a second data inspection pad at one end of the data line.

The method may further include laser trimming the connection portion between the gate inspection line and the gate line after the visual inspection, and laser trimming the connection portion between the data inspection line and the data line.

Then, embodiments of the present invention will be described in detail with reference to the accompanying drawings so that those skilled in the art can easily implement the present invention. As those skilled in the art would realize, the described embodiments may be modified in various different ways, all without departing from the spirit or scope of the present invention.

An inspection apparatus and an inspection method thereof for a liquid crystal display according to an exemplary embodiment of the present invention will now be described in detail with reference to the accompanying drawings.

First, a liquid crystal display according to an exemplary embodiment of the present invention will be described in detail with reference to FIG. 1.

1 is a schematic view of a liquid crystal display according to an exemplary embodiment of the present invention.

Referring to FIG. 1, a liquid crystal display according to an exemplary embodiment of the present invention includes an insulating substrate 100, a display area 101 formed on the insulating substrate 100, and a driving area around the display area 101. 400, 500).

The display area 101 is formed in one direction and includes a gate line 121 for transmitting a scan signal, a data line 171 for defining a pixel area crossing the gate line 121, and transmitting an image signal, and a matrix array. A pixel electrode (not shown) formed in the pixel region and made of a transparent conductive material such as indium tin oxide (ITO) or indium zinc oxide (IZO), and the like where the gate line 121 and the data line 171 cross each other. A thin film transistor (not shown) is formed and electrically connected to the gate line 121 and the data line 171 to control an image signal transmitted to the pixel electrode according to the scan signal.

The driving regions 400 and 500 include a gate driving region 400 and a data driving region 500. In the gate driving region 400, a gate driving circuit (not shown) for transmitting an external signal connected to the gate line 121 is mounted in the form of a chip. A gate driving input bumper 51 and a gate driving output bumper 52 connected to the gate driving circuit are formed in the gate driving region 400.

The gate inspection line 53 is formed in the gate driving region 400. The gate test line 53 is connected to all of the gate driving output bumpers 52 connected to one end of the gate lines 121.

One end of the gate test line 53 connected to the plurality of gate lines 121 is wider than the gate test line 53 to form a first gate test pad 54.

At the other end of the gate line 121, the width of the gate line 121 is wider than that of the gate line 121, and a second gate inspection pad 128 is formed.

In the data driving region 500, a data driving circuit (not shown) for transmitting an external signal connected to the data line 171 is mounted in the form of a chip. The data driving input bumper 61 and the data driving output bumper 62 connected to the data driving circuit are formed in the data driving region 500.

The data inspection line 63 is formed in the data driving region 500. The data test lines 63 are all connected to the plurality of data driving output bumpers 62 connected to one end of the plurality of data lines 171.

One end of the data inspection line 63 connected to the plurality of data lines 171 is wider than the data inspection line 63 to form a first data inspection pad 64.

At the other end of the data line 171, the width of the data line 171 extends larger than that of the data line 171, and a second data inspection pad 178 is formed.

2 is a flowchart illustrating a test method of a liquid crystal display according to an exemplary embodiment of the present invention.

As shown in FIG. 2, in the method of inspecting the liquid crystal display according to the exemplary embodiment, first, a plurality of gate lines 121 are formed and simultaneously insulated in the display area 101 on the insulating substrate 100. A gate test line 53 connected to all of the plurality of gate lines 121 is formed in the gate driving region 400 on the substrate 100 (S100).

At this time, a gate driving input bumper 51 and a gate driving output bumper 52 connected to the gate driving circuit to be mounted by the COG method are formed in the gate driving region 400.

When the gate inspection line 53 and the gate line 121 are formed, a first gate inspection pad 54 is formed at one end of the gate inspection line 53, and one end of the gate line 121 is formed. The two gate inspection pad 128 is formed.

Then, the first gate inspection pad 54 formed at one end of the gate inspection line 53 and the second gate inspection pad 128 formed at one end of the gate line 121 are probed. The opening and the short of the gate line 121 are inspected by sending an electrical signal (S200).

In addition, the gate test line 53 and the second gate test pad 128 may be probed to send an electrical signal to inspect the open and the short of the gate line 121.

In addition, a plurality of data lines 171 are formed in the display area 101 on the insulating substrate 100 and all the data lines 171 are all connected to the data driving region 500 on the insulating substrate 100. A data inspection line 63 is formed (S300).

At this time, a data driving input bumper 61 and a data driving output bumper 62 connected to the data driving circuit to be mounted by the COG method are formed in the data driving region 500.

In the case of forming the data inspection line 63 and the data line 171, the first data inspection pad 64 is formed at one end of the data inspection line 63, and the second data at one end of the data line 171. An inspection pad 178 is formed.

Then, the first data inspection pad 64 formed at one end of the data inspection line 63 and the second data inspection pad 178 formed at one end of the data line 171 are probed. The open and short of the data line 171 is inspected by sending an electrical signal (S400).

In addition, the open and short of the data line 171 can be inspected by directly probing the data test line 63 and the second data test pad 178 to send an electrical signal.

As the inspection line for visual inspection, the gate inspection line 53 and the data inspection line 63 can be used. As shown in FIG. 1, after the visual inspection, laser trimming of the connection portion A between the gate inspection line 53 and the gate line 121 separates the plurality of gate lines 121 from each other. Thus, the gate line 121 is completed. Similarly, a plurality of data lines 171 are completed by laser trimming the connection portion B between the data inspection line 63 and the data line 171.

Although the present invention has been described with reference to one embodiment shown in the accompanying drawings, this is merely exemplary, and it will be understood by those skilled in the art that various modifications and equivalent other embodiments are possible. Could be. Accordingly, the true scope of protection of the invention should be defined only by the appended claims.

The liquid crystal display and the inspection method thereof according to the present invention have an advantage that OS inspection can be performed by forming a gate inspection line or a data inspection line in a liquid crystal display device having a driving circuit by a COG method.

Claims (9)

Insulation board, A display area including a plurality of signal lines and a plurality of thin film transistors formed on the insulating substrate; A driving region formed on the insulating substrate and including a driving input bumper and a driving output bumper connected to a driving circuit for controlling the thin film transistor, And a test line connected to one end of the signal line and the drive output bumper in the driving area. In claim 1, And a first inspection pad at one end of the inspection line. In claim 2, And a second inspection pad at the other end of the signal line. Insulation board, A display area including a plurality of gate lines, data lines, and a plurality of thin film transistors formed on the insulating substrate; A gate driving region formed on the insulating substrate and including a gate driving input bumper and a gate driving output bumper connected to a gate driving circuit for controlling the thin film transistor, And a gate inspection line connected to one end of the gate line through a gate driving output bumper in the gate driving region. Insulation board, A display area including a plurality of gate lines, data lines, and a plurality of thin film transistors formed on the insulating substrate; A data driving region formed on the insulating substrate and including a data driving input bumper and a data driving output bumper connected to a data driving circuit for controlling the thin film transistor, And a data inspection line connected to one end of the data line through a data driving output bumper in the data driving region. Forming a plurality of gate lines in a display area on the insulating substrate, and forming gate inspection lines connected to all of the plurality of gate lines in the gate driving area on the insulating substrate; Inspecting one end of the gate inspection line and one end of the gate line to inspect the opening and the short of the gate line; Forming a plurality of data lines in a display area on the insulating substrate, and forming a data test line all connected to the plurality of data lines in a data driving area on the insulating substrate; Probing one end of the data inspection line and one end of the data line to inspect the open and short of the data line; Inspection method of the liquid crystal display device comprising a. In claim 6, And a first gate inspection pad at one end of the gate inspection line and a second gate inspection pad at one end of the gate line when the gate inspection line and the gate line are formed. In claim 7, And a first data inspection pad at one end of the data inspection line, and a second data inspection pad at one end of the data line when the data inspection line and the data line are formed. In claim 6, And laser trimming the connection portion between the gate inspection line and the gate line after visual inspection, and laser trimming the connection portion between the data inspection line and the data line.