KR100867308B1 - Testing apparatus for flat panel display and method using the same - Google Patents

Abstract

An apparatus for inspecting flat display panel and a method thereof are provided to selectively repair only the block in which repair are requested by configuring channel section contact block contacting in the OLB(Out Lead Bonding) pad and MB(MontBlanc) pad contact block separably. An inspection apparatus for flat display panel includes a channel section, and an OLB(Out Lead Bonding) pad in which the MB pads are equipped in left and right of the channel section. A channel section contact block(30) sends a signal by short-circuiting the channel section. The MB pad contact block(20) generates a panel operating signal by contacting in the MB pad. The channel section contact block and MB pad contact block are contacted with the channel section and MB pad, at the same time.

Description

Testing apparatus for flat panel display and method using the same}

The present invention relates to an apparatus and method for inspecting line defects or pixel defects of a flat panel display panel, and more particularly, to separate a channel contact block and an MB (Mont Blanc) pad contact block in contact with an out lead bonding (OLB) pad. The present invention relates to an inspection apparatus and method for a flat panel display panel capable of selectively repairing only blocks requiring repair and finely adjusting the channel contact block in the X, Y, and Z directions in addition to the MB block. .

In general, various inspection processes are performed to inspect whether a panel is defective in the manufacturing process of a display panel including an LCD, and various equipments for each inspection process have been developed.

Representative examples include visual inspection (VI) and gross testing, which apply a predetermined voltage to a shorting bar to which a plurality of gate lines and / or data lines are connected. A process of displaying an image and inspecting whether a gate line and / or a data line is defective.

Here, the black and white image may be implemented by applying a predetermined voltage to the shorting bar. The black and white image implemented as described above is used to check whether a dot, line, uniform or the like is defective through a CCD camera.

The Gross Test (GT) is based on the operation characteristics of the liquid crystal panel and the dot / pixel in the same environment as the module in which the backlight unit and the driving ICs are assembled before mounting the gate and data driving ICs. In the process of determining whether there is a defect, after removing the shorting bar, an independent signal is applied to all individual pixels so that the full color is displayed in the same manner as the finished product.

The inspected object (display panel) is provided with an inspection signal input pad in contact with the probe pin of the probe unit for visual inspection, and an OLB pad in contact with the gross test. In addition, the conventional test signal input pad and the OLB pad are electrically connected to the plurality of shorting bars.

However, in the related art, since the gross test is performed after the OLB pads are shorted from the shorting bar after finishing the visual inspection through the shorting bar, the inspection position is different, and the shorting bar has to be shorted.

SUMMARY OF THE INVENTION The present invention has been made to solve the above-described problems, and an object of the present invention is to configure only a block requiring repair by separating a channel contact block and an MB pad contact block contacting an OLB (Out Lead Bonding) pad. The present invention provides an inspection apparatus and method for a flat panel display panel that can be selectively repaired.

Another object of the present invention is to provide an inspection apparatus and method for a flat panel display panel capable of finely adjusting the channel contact block in the X, Y, and Z directions in addition to the MB pad contact block.

In order to solve the above technical problem, in the inspection apparatus of the flat panel display panel having a channel portion according to the present invention, and an OLB (Out Lead Bonding) pad is provided with MB pads on the left and right sides of the channel portion, by shorting the channel portion A channel unit contact block for applying a signal; And an MB pad contact block which contacts the MB pad and applies a signal for driving the panel, wherein the channel part contact block and the MB pad contact block are in contact with the channel part and the MB pad, respectively. do.

In addition, the channel portion contact block preferably includes a conductive member in contact with the entire channel portion. The conductive member is preferably a conductive rubber made of a flexible material.

In addition, the channel block contact block is preferably further provided with an X-axis fine adjustment means for fine-adjusting the conductive member in the X-axis direction, for example, the X-axis fine adjustment means is connected to the conductive member, An X-axis moving member movable in the X-axis direction; And an eccentric bolt having a thread center and a head center different from each other and moving the X-axis moving member in the X-axis direction by the rotation of the head.

In addition, the channel block contact block is preferably provided with a Y-axis fine adjustment means for fine-adjusting the conductive member in the Y-axis direction, the Y-axis fine adjustment means may have the same configuration as the X-axis fine adjustment means. .

In addition, the channel contact block is preferably further provided with a Z-axis fine adjustment means for fine-tuning the conductive member in the Z-axis direction, the Z-axis fine adjustment means, is connected to the conductive member, in the Z-axis direction A Z-axis moving member coupled to be movable; And a set screw for moving the Z-axis moving member in the Z-axis direction.

The MB pad contact block may include: a first probe part contacting the MB pad formed on the left side of the OLB pad; And a second probe portion contacting the MB pad formed on the right side of the OLB pad; and a housing in which the first probe portion and the second probe portion are embedded.

In addition, the housing is preferably provided with a recessed portion between the first probe portion and the second probe portion.

A method of inspecting a flat panel display panel having a channel portion and an out lead bonding pad (OLB) pad having MB pads on the left and right sides of the channel portion, the method comprising: 1) applying a signal by shorting the channel portion; And 2) applying a signal for driving the panel by contacting the MB pad.

In addition, steps 1) and 2) are preferably performed at the same time.

In addition, in the step 1), it is preferable to short the conductive member made of a flexible material by contacting the entire channel portion.

Also, in step 2), a plurality of probes may be in contact with the MB pad to apply a signal for driving the panel.

According to the present invention, it is possible to selectively repair only blocks requiring repair by configuring the channel block contact block and the MB pad contact block of the OLB pad to be detachable.

In addition, there is an effect that can be finely adjusted in the X, Y, Z axis direction of the channel contact block separately from the MB pad contact block. In particular, since the fine adjustment is possible in the Z-axis direction it is possible to ensure stable contact of the channel portion.

In addition, the channel contact block includes conductive rubber, which is a flexible material capable of contacting the entire channel portion, and thus there is no possibility of pin miss.

In particular, even a panel without a shorting bar can inspect a visual inspection, that is, a line defect or a pixel defect of the panel.

Hereinafter, with reference to the accompanying drawings will be described the configuration of an embodiment according to the present invention.

FIG. 1A illustrates a structure of a general liquid crystal panel 100, and includes a TFT substrate 120 and a color filter substrate 110. Reference numeral 130 denotes an active region.

FIG. 1B is a schematic view illustrating an OLB pad 140 provided in the liquid crystal panel. The OLB pad 140 has a channel portion 143 at the center thereof, and is provided on both left and right sides of the channel portion 143. MB pads 141 and 142 including pads such as Vcom, Vcst, and Voff of the panel are provided.

2 and 3 show an embodiment according to the present invention. As shown, this embodiment (1) is the body 10, the MB pad contact block 20 is coupled to the lower portion of the body 10, and the channel portion contact block connected to the body ( 30).

The MB pad contact block 10 includes a first probe 21 and a second probe 22 formed of a plurality of probes respectively contacting the MB pads 141 and 142 formed on the left and right sides of the OLB pad 140. Is provided, the first probe unit 21 and the second probe unit 22 is built-in and consists of a housing 23, the lower opening. In addition, a bracket 24 for connecting the housing 23 to the lower portion of the body 10 is provided. In particular, the housing 23 has a recessed portion 23a formed in a space between the first probe portion 21 and the second probe portion 22.

In addition, the channel part contact block 30 may include a conductive rubber 31 which contacts the entire channel part 143 formed at the center of the OLB pad 140, and an X-axis movement in which the conductive rubber 31 is coupled to a lower end thereof. And a member 32. In particular, the conductive rubber 31 is coupled to be located in the depression 23a of the housing 23. In this configuration, the first probe portion 21, the conductive rubber 31, and the second probe portion 22 are brought into contact with the left and right MB pads 141 and 142 and the central channel portion 143 at the same time.

In addition, the Y-axis moving member 34 is coupled to the upper portion of the body 10 so as to be movable to the Y-axis, and the Z-axis moving member 33 is connected to the Y-axis moving member 34 and the Z-axis moving. The member 33 is configured by connecting the X-axis moving member 32.

As the fine adjustment means for moving the Y-axis moving member 34 and the X-axis moving member 32 in the Y-axis direction and the X-axis direction, the eccentric bolt 40 is employed in this embodiment. It can be seen that the eccentric bolt 40 does not coincide with the center C2 of the thread 41 and the center C1 of the head 42.

In addition, the Z-axis moving member 33 is moved in the Z-axis direction by the Z-axis moving means 50. The Z-axis moving means is a pair of shafts 51 connected to the Z-axis moving member 33 and penetrating one end of the Y-axis moving member 34, and a lifting plate fastened to the pair of shafts 51. And a set screw 53 for elevating the elevating plate 52. In addition, a spring 54 is mounted on the outer circumferential surface of the shaft 51 between the Y-axis moving member 34 and the Z-axis moving member 33 and is supported.

4A to 4C, the X-axis direction fine adjustment method of the channel block contact block, and more specifically, the conductive rubber 31, will be described.

First, the X-axis moving member 32 to which the conductive rubber 31 is coupled is fastened to the Z-axis moving member 33 by the eccentric bolt 40 (see FIG. 4A).

In this state, when the head 42 is rotated clockwise, the X-axis moving member 32 is moved to the left with respect to the Z-axis moving member 33 (or the body) (see Fig. 4B).

On the contrary, when the head 42 is rotated counterclockwise, the X-axis moving member 32 is moved to the right with respect to the Z-axis moving member 33 (or the body) (see FIG. 4C). In this way, the conductive rubber 31 is finely adjusted in the X-axis direction.

Meanwhile, as shown in FIG. 2, since the Y-axis moving member 34 is also connected to the body 10 by the eccentric bolt 40, the head of the eccentric bolt 40 is rotated clockwise or counterclockwise. When the Y-axis moving member 34 is moved forward or backward, the conductive rubber 31 can be finely adjusted in the Y-axis direction.

In general, since the pitch of the OLB pad 140 is very fine with a pitch of 50 µm or less, the deformation amount (spread amount) of the conductive rubber 31 is important. That is, the contact performance is determined according to the deformation amount of the conductive rubber 31. In order to improve such contact performance, fine adjustment of the Z-axis direction of the channel block contact block 30 is required.

5A and 5B, a method of fine tuning the Z-axis direction of the channel contact block 30, more specifically, the conductive rubber 31, will be described.

Accordingly, when the set screw 53 is rotated, the lifting plate moves up and down, and thus the Z-axis moving member 33 moves up and down, and in this way, the conductive rubber 31 can be finely adjusted in the Z-axis direction. Therefore, the overdrive value of the conductive rubber can be adjusted separately from the MB pad contact block.

Referring back to Figure 3 will be described the operating state of the embodiment and the inspection method of the panel.

The MB pad contact block 20 contacts the MB pads 141 and 142 formed on both left and right sides of the OLB pad 140, and at the same time, the channel contact block 30 is a channel formed at the center of the OLB pad 140. In contact with the unit 143. At this time, the channel pad contact block 30 is finely adjusted in the X, Y, and Z-axis directions separately from the MB pad contact block 20 to improve the contact performance between the conductive rubber 31 and the channel part 143. Can be. Of course, the MB pad contact block 20 can be finely adjusted irrespective of the channel contact block 30, thereby improving contact performance.

As such, the MB pad contact block 20 is connected to the MB pads 141 and 142 and the channel unit 143, respectively, in the MB pad contact block 20 and the channel pad contact block 30, respectively. A signal for shorting 141 and 142 is applied, and the channel contact block 30 applies a signal for driving a panel to the channel part 143 to display a white, black or gray screen. The displayed screen checks for line defects or pixel defects.

Therefore, according to this embodiment, the liquid crystal panel in which the shorting bar does not exist can be inspected by displaying a visual pattern.

Meanwhile, the MB pad contact block 20 and the channel contact block 30 have different characteristics and lifespans, respectively. Therefore, the replacement cycle is different. If any one of these is required, only the corresponding block is replaced.

1a schematically illustrates a general liquid crystal panel.

FIG. 1B illustrates an OLB pad of the liquid crystal panel shown in FIG. 1A.

2 is an exploded perspective view of an embodiment according to the present invention.

3 is a perspective view of the embodiment shown in FIG.

4A to 4C show the X-axis fine adjustment means and method of the embodiment shown in FIG.

5A and 5B show the Z-axis fine adjustment means and method of the embodiment shown in FIG.

** Description of the symbols for the main parts of the drawings **

1: Inspection device 10: Body

20: MB pad contact block 21: the first probe portion

22: second probe 23: housing

24: Bracket 30: Channel contact block

31: conductive rubber 32: X-axis moving member

33: Z axis moving member 34: Y axis moving member

40: eccentric bolt 50: Z axis moving means

51: shaft 52: elevating plate

53: set screw 54: spring

Claims (15)

In the inspection apparatus of the flat panel display panel having a channel portion and the OLB (Out Lead Bonding) pad is provided with MB (Mont Blanc) pads on the left and right sides of the channel portion, A channel unit contact block for shorting the channel unit to apply a signal; And And an MB pad contact block configured to contact the MB pad and apply a signal for driving the panel. And the channel portion contact block and the MB pad contact block are in contact with the channel portion and the MB pad, respectively. The method of claim 1, The channel block contact block includes a conductive member in contact with the entire channel portion flat panel display panel inspection apparatus. The method of claim 2, The conductive member is a test device for a flat panel display panel, characterized in that the conductive rubber. The method of claim 2, The channel block contact block further comprises an X-axis fine adjusting means for fine-adjusting the conductive member in the X-axis direction. The method of claim 4, wherein The X-axis fine adjustment means, An X-axis moving member connected to the conductive member and movable in the X-axis direction; And Thread center and the head center is formed differently, the eccentric bolt for moving the X-axis moving member in the X-axis direction by the rotation of the head; flat screen display panel inspection apparatus comprising a. The method of claim 2, The channel block contact block further comprises a Y-axis fine adjustment means for fine-adjusting the conductive member in the Y-axis direction. The method of claim 6, The Y-axis fine adjustment means, A Y-axis moving member connected to the conductive member and movable in the Y-axis direction; And Thread center and the head center is formed differently, the eccentric bolt for moving the Y-axis moving member in the Y-axis direction by the rotation of the head; flat display panel inspection apparatus comprising a. The method of claim 2, The channel block contact block further comprises a Z-axis fine adjustment means for fine-adjusting the conductive member in the Z-axis direction. The method of claim 8, The Z-axis fine adjustment means, A Z-axis moving member connected to the conductive member and movably coupled in the Z-axis direction; And Set screw for moving the Z-axis movement member in the Z-axis direction; flat display panel inspection apparatus comprising a. The method of claim 1, The MB pad contact block, A first probe part in contact with the MB pad formed on the left side of the OLB pad; A second probe part in contact with the MB pad formed on the right side of the OLB pad; and And a housing having the first probe portion and the second probe portion embedded therein. The method of claim 10, And said housing is provided with a depression between said first probe portion and said second probe portion. In the inspection method of the flat panel display panel having a channel portion and the OLB (Out Lead Bonding) pad is provided on the left and right sides of the channel portion, 1) shorting the channel part to apply a signal; And 2) applying a signal for driving the panel to the MB pad. The method of claim 12, 1) and 2) are the inspection method of the flat panel display panel, characterized in that performed simultaneously. The method of claim 12, Step 1) is a method for inspecting a flat panel display panel, characterized in that for shorting the conductive member of the flexible material in contact with the entire channel portion. The method of claim 12, The method of claim 2, wherein the plurality of probes are in contact with the MB pad to apply a signal for driving the panel.

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