TW200725015A - LCD panel defect inspection system - Google Patents
LCD panel defect inspection systemInfo
- Publication number
- TW200725015A TW200725015A TW094145608A TW94145608A TW200725015A TW 200725015 A TW200725015 A TW 200725015A TW 094145608 A TW094145608 A TW 094145608A TW 94145608 A TW94145608 A TW 94145608A TW 200725015 A TW200725015 A TW 200725015A
- Authority
- TW
- Taiwan
- Prior art keywords
- lcd panel
- defect
- inspection system
- engineer
- units
- Prior art date
Links
Landscapes
- Devices For Indicating Variable Information By Combining Individual Elements (AREA)
Abstract
A LCD panel defect inspection system is used to inspect defects on a LCD panel and can be divided to two modules, engineer editing module and operator operating module. The engineer editing module has units such as patter revision and test revision, and the operator operating module has units, such as defect detection of an object to be tested, electrical characteristic inspection, display panel identification data recording and appearance inspection. Meanwhile, the system can execute a signal processing operation to display related defect data of an object under test on the display panel. Then, directly process the defect evaluation operation, so the testing time of the production line is greatly reduced to provide the best application of a LCD panel production line management.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
TW094145608A TW200725015A (en) | 2005-12-21 | 2005-12-21 | LCD panel defect inspection system |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
TW094145608A TW200725015A (en) | 2005-12-21 | 2005-12-21 | LCD panel defect inspection system |
Publications (1)
Publication Number | Publication Date |
---|---|
TW200725015A true TW200725015A (en) | 2007-07-01 |
Family
ID=57912439
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
TW094145608A TW200725015A (en) | 2005-12-21 | 2005-12-21 | LCD panel defect inspection system |
Country Status (1)
Country | Link |
---|---|
TW (1) | TW200725015A (en) |
Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN102054414A (en) * | 2010-11-28 | 2011-05-11 | 河海大学常州校区 | Program controlled liquid crystal module test image generating system and control method thereof |
TWI497060B (en) * | 2008-05-21 | 2015-08-21 | Photon Dynamics Inc | System and method for detecting defects in a panel under test |
TWI595239B (en) * | 2012-11-28 | 2017-08-11 | 探針科技公司 | Cantilever contact probe for a testing head |
CN116128740A (en) * | 2022-10-10 | 2023-05-16 | 深圳康荣电子有限公司 | Intelligent image processing method and system for liquid crystal display screen |
-
2005
- 2005-12-21 TW TW094145608A patent/TW200725015A/en unknown
Cited By (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
TWI497060B (en) * | 2008-05-21 | 2015-08-21 | Photon Dynamics Inc | System and method for detecting defects in a panel under test |
CN102054414A (en) * | 2010-11-28 | 2011-05-11 | 河海大学常州校区 | Program controlled liquid crystal module test image generating system and control method thereof |
TWI595239B (en) * | 2012-11-28 | 2017-08-11 | 探針科技公司 | Cantilever contact probe for a testing head |
CN116128740A (en) * | 2022-10-10 | 2023-05-16 | 深圳康荣电子有限公司 | Intelligent image processing method and system for liquid crystal display screen |
CN116128740B (en) * | 2022-10-10 | 2024-05-14 | 深圳康荣电子有限公司 | Intelligent image processing method and system for liquid crystal display screen |
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