TW200725015A - LCD panel defect inspection system - Google Patents

LCD panel defect inspection system

Info

Publication number
TW200725015A
TW200725015A TW094145608A TW94145608A TW200725015A TW 200725015 A TW200725015 A TW 200725015A TW 094145608 A TW094145608 A TW 094145608A TW 94145608 A TW94145608 A TW 94145608A TW 200725015 A TW200725015 A TW 200725015A
Authority
TW
Taiwan
Prior art keywords
lcd panel
defect
inspection system
engineer
units
Prior art date
Application number
TW094145608A
Other languages
Chinese (zh)
Inventor
Chao-Chih Lai
Original Assignee
Chao-Chih Lai
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Chao-Chih Lai filed Critical Chao-Chih Lai
Priority to TW094145608A priority Critical patent/TW200725015A/en
Publication of TW200725015A publication Critical patent/TW200725015A/en

Links

Landscapes

  • Devices For Indicating Variable Information By Combining Individual Elements (AREA)

Abstract

A LCD panel defect inspection system is used to inspect defects on a LCD panel and can be divided to two modules, engineer editing module and operator operating module. The engineer editing module has units such as patter revision and test revision, and the operator operating module has units, such as defect detection of an object to be tested, electrical characteristic inspection, display panel identification data recording and appearance inspection. Meanwhile, the system can execute a signal processing operation to display related defect data of an object under test on the display panel. Then, directly process the defect evaluation operation, so the testing time of the production line is greatly reduced to provide the best application of a LCD panel production line management.
TW094145608A 2005-12-21 2005-12-21 LCD panel defect inspection system TW200725015A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
TW094145608A TW200725015A (en) 2005-12-21 2005-12-21 LCD panel defect inspection system

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
TW094145608A TW200725015A (en) 2005-12-21 2005-12-21 LCD panel defect inspection system

Publications (1)

Publication Number Publication Date
TW200725015A true TW200725015A (en) 2007-07-01

Family

ID=57912439

Family Applications (1)

Application Number Title Priority Date Filing Date
TW094145608A TW200725015A (en) 2005-12-21 2005-12-21 LCD panel defect inspection system

Country Status (1)

Country Link
TW (1) TW200725015A (en)

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN102054414A (en) * 2010-11-28 2011-05-11 河海大学常州校区 Program controlled liquid crystal module test image generating system and control method thereof
TWI497060B (en) * 2008-05-21 2015-08-21 Photon Dynamics Inc System and method for detecting defects in a panel under test
TWI595239B (en) * 2012-11-28 2017-08-11 探針科技公司 Cantilever contact probe for a testing head
CN116128740A (en) * 2022-10-10 2023-05-16 深圳康荣电子有限公司 Intelligent image processing method and system for liquid crystal display screen

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI497060B (en) * 2008-05-21 2015-08-21 Photon Dynamics Inc System and method for detecting defects in a panel under test
CN102054414A (en) * 2010-11-28 2011-05-11 河海大学常州校区 Program controlled liquid crystal module test image generating system and control method thereof
TWI595239B (en) * 2012-11-28 2017-08-11 探針科技公司 Cantilever contact probe for a testing head
CN116128740A (en) * 2022-10-10 2023-05-16 深圳康荣电子有限公司 Intelligent image processing method and system for liquid crystal display screen
CN116128740B (en) * 2022-10-10 2024-05-14 深圳康荣电子有限公司 Intelligent image processing method and system for liquid crystal display screen

Similar Documents

Publication Publication Date Title
ATE301611T1 (en) METHOD AND ARRANGEMENT FOR REMOTE MONITORING OF AN ELEVATOR
TW200707616A (en) Semiconductor failure analysis apparatus, failure analysis method, failure analysis program, and failure analysis system
CN108037444A (en) GNSS PCBA automatization test systems and its application process
CN107024475A (en) Touch panel automatic checkout equipment based on automatic optics inspection program
CN116540682B (en) Method, system, device, equipment and medium for testing analog single machine
CN101738251A (en) Automatic test system and method
TW200725015A (en) LCD panel defect inspection system
TW200636272A (en) Test equipment, test method, manufacturing method of electronic device, test simulator, and test simulation method
CN204944460U (en) A kind of accurate detection screws the device of state
CN104459516A (en) Testing method used for SMT first article detection
CN103376577A (en) Automatic test method and system for liquid crystal display panel with LVDS (low voltage differential signaling) interface
CN104101614A (en) Detection method and device
CN104390982A (en) Test method for SMT first article inspection
CN204964931U (en) Light leakage detection device
CN105300330A (en) Device for accurately detecting screw state and method
CN102539948A (en) Data cable quality testing system
CN102135582A (en) Mainboard tester
CN114994503A (en) Circuit board detection device
CN110196504B (en) Interference stain shielding method and system applied to AOI (automated optical inspection) test of LCD (liquid Crystal display) glass
CN203520072U (en) Signal converter assembly detection device
JP2001289733A (en) Defect inspection system
CN206340326U (en) A kind of detection means of probe unit and display panel
CN203385814U (en) Automotive ABS wire harness detection bench
CN109426015B (en) Liquid crystal display screen electric testing jig for automatically detecting OTP missed burning and testing method thereof
CN204855409U (en) A equipment for detecting but, transparent material surface image