CN101738251A - Automatic test system and method - Google Patents
Automatic test system and method Download PDFInfo
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- CN101738251A CN101738251A CN200810172495A CN200810172495A CN101738251A CN 101738251 A CN101738251 A CN 101738251A CN 200810172495 A CN200810172495 A CN 200810172495A CN 200810172495 A CN200810172495 A CN 200810172495A CN 101738251 A CN101738251 A CN 101738251A
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Abstract
The invention relates to an automatic test system and an automatic test method, which are used for testing at least one light-emitting diode (LED) light source. The automatic test system comprises an image acquisition device, a processing device and an indicating device, wherein the image acquisition device is used for acquiring image information of at least one LED light source; the processing device is electrically connected to the image acquisition device, receives the image information and analyzes at least one optical characteristic of each LED light source to acquire an analysis result; and the indicating device is electrically connected to the processing device and is used for indicating the analysis result. The automatic test system and the automatic test method comprise analyzing the optical characteristic of the LED light source for the image information of the LED light source so as to judge whether the LED light source passes the test or not, thereby achieving the aim of automated tests, improving testing efficiency and reducing test cost, and the quality control of electronic products applying the LED light source is easy to control.
Description
Technical field
The present invention relates to a kind of Auto-Test System and method, particularly relate to a kind of Auto-Test System and method that is applied to test at least one LED source.
Background technology
General electronic products all need be accepted strict start test before dispatching from the factory, the faulty materials that will have defective or fault are chosen in advance, to keep good QC requirement, avoids these faulty materials to flow into behind markets and may cause problems such as prestige is impaired to manufacturer.For instance, great majority all are provided with light emitting diode (LED) light source of its user mode of indication or power supply on electronic product, or the display panel of forming by a plurality of LED source, but for guaranteeing these LED source normal operations, just must whether judge LED source because of damage is bright dim spot state by detecting, or it has the inaccurate situation of brightness.LED source at electronic installation adopts artificial visually examine's mode to judge more at present, yet this detection mode utmost point expends time in and manpower, the testing cost of product will be increased, be easier to produce carelessness with visual inspection merely in addition, and be difficult to differentiate for the misalignment of LED source.
Summary of the invention
Fundamental purpose of the present invention is to provide a kind of Auto-Test System of testing at least one LED source.
For reaching above-mentioned purpose, Auto-Test System of the present invention comprises image capture unit, treating apparatus and indicating device.Image capture unit is in order to obtain the image information of at least one LED source; Treating apparatus is electrically connected at image capture unit, and treating apparatus receives image information and analyzes at least one optical characteristics of each LED source, to obtain an analysis result; Indicating device is electrically connected at treating apparatus, in order to the output analysis result.Design by this, Auto-Test System of the present invention can be applicable on the production line of electronic product, test the light emitting diode lamp or the LED display panel of electronic product with the robotization detection mode, bright dim spot or other defective modes have been judged whether, to replace traditional artificial visually examine's mode, improve testing efficiency and reduce testing cost.
Automatic test approach of the present invention is applied to aforesaid Auto-Test System, and its method may further comprise the steps: an image information of obtaining at least one LED source; Transmit image information to treating apparatus, to analyze the optical characteristics of at least one LED source, to obtain analysis result; The indication analysis result.Wherein optical characteristics can comprise brightness, color or the bright dim spot state of LED source.
Design by this, Auto-Test System of the present invention and method comprise the image information at LED source, analyze the optical characteristics of LED source, to judge that whether LED source is by test, reach the purpose of automatic test by this, improve testing efficiency and reduce testing cost, and be easy to control the QC that this type of uses the electronic product of LED source.
Description of drawings
Fig. 1 is the synoptic diagram of Auto-Test System of the present invention.
Fig. 2 is the process flow diagram of automatic test approach of the present invention.
Fig. 3 is the synoptic diagram of another embodiment of Auto-Test System of the present invention.
The primary clustering symbol description:
Auto-Test System 1,1a
Treating apparatus 20
Indicating device 30
Electronic installation 100
Light emitting display device 100a
LED source 110,110a
Test moving-wire 120
Embodiment
For making the auditor can more understand technology contents of the present invention, be described as follows especially exemplified by going out preferred embodiment.
Below please refer to Fig. 1, Fig. 1 is the synoptic diagram of Auto-Test System 1 of the present invention.Auto-Test System 1 of the present invention can be applicable to test at least one LED source 110.As shown in Figure 1, in the present embodiment, at least one LED source 110 is for being applied to the pilot lamp of electronic installation 100.Electronic installation 100 is positioned on the test moving-wire 120 of product, when electronic installation 100 passes through fixed point, just can test automatically by 1 pair of at least one LED source 110 of Auto-Test System of the present invention.Electronic installation 100 can be a notebook computer, a mobile phone or a satellite navigation system (GPS).
As shown in Figure 1, Auto-Test System 1 comprises image capture unit 10, treating apparatus 20 and indicating device 30.Image capture unit 10 is in order to obtain the image information of at least one LED source 110.Treating apparatus 20 is electrically connected at image capture unit 10, can be sent to treating apparatus 20 via aforementioned image capture unit 10 obtained image informations receives, at least one optical characteristics by each LED source 110 in 20 pairs of image informations for the treatment of apparatus is analyzed, to obtain an analysis result.Wherein treating apparatus 20 comprises software program 22 and database 24, and software program 22 is in order to analyze at least one optical characteristics of each LED source 110 in the image information, to obtain at least one analysis data; Database 24 is in order to compare at least one analysis data, to obtain analysis result.Indicating device 30 is electrically connected at treating apparatus 20, in order to the indication analysis result.
Please refer to Fig. 2, Fig. 2 is the process flow diagram of automatic test approach of the present invention.Be noted that, though below be that example illustrates automatic test approach of the present invention with Auto-Test System shown in Figure 11, but the present invention is not to be applicable to that Auto-Test System 1 exceeds the also applicable automatic test approach of the present invention of the Auto-Test System of any other tool analog architecture.As shown in Figure 2, automatic test approach of the present invention comprises that step 210 is to step 240.Below will describe each step of automatic test approach of the present invention in detail.
At first carry out step 210: an image information of obtaining at least one LED source 110.As shown in Figure 1, automatic test approach of the present invention is applied to aforesaid Auto-Test System 1.Auto-Test System 1 comprises image capture unit 10, and in the present embodiment, image capture unit 10 is a video camera, but also can use sensitization sensing device or other similar devices with image acquisition function to replace, and does not exceed with present embodiment.Image capture unit 10 is arranged at the fixed point of testing on the moving-wire 120, start at least one LED source 110 by modes such as programmed control or external power supplys, or make electronic installation 100 be open state, therefore when electronic installation 100 is fixed a point along with test moving-wire 120 processes, can obtain an image information of at least one LED source 110 by image capture unit 10.
After step 210, carry out step 220: transmit image information to treating apparatus 20, to analyze at least one optical characteristics of each LED source 110, to obtain analysis result.As shown in Figure 1, Auto-Test System 1 comprises treating apparatus 20, can be sent to treating apparatus 20 at abovementioned steps 210 obtained image informations, by treating apparatus 20 at this image information analyzing and processing in addition, to obtain an analysis result.Obtained analysis result can be stored in the treating apparatus 20.Wherein treating apparatus 20 comprises software program 22 and database 24, can find out the position of each LED source 110 in the image information by software program 22, the LED source 110 of complying with setting and demand difference and selecting desire to analyze, and carry out data analysis at least one optical characteristics of single or multiple LED source 110, to obtain at least one analysis data; Aforementioned obtained at least one analysis data and database 24 built-in a plurality of optical characteristics data data are compared, can be obtained analysis result.Wherein optical characteristics comprises a brightness, a color or a bright dim spot state of LED source, analyzes at the different optical characteristic according to the setting of software program 22 is different.For example, when automatic test approach of the present invention is applied to the pilot lamp test of electronic installation 100, because pilot lamp may present different color according to different conditions, but so optical characteristics such as software program 22 setpoint colors and bright dim spot, whether color is correct when lighting at pilot lamp, or whether pilot lamp state such as does not light and analyze.Database 24 also can be according to the test of different LED source in addition, and a plurality of optical characteristics data data of change The built-in.
After step 220, carry out step 230: the indication analysis result.As shown in Figure 1, Auto-Test System 1 comprises indicating device 30, can indicate the obtained analysis result of abovementioned steps 220 by indicating device 30, and can use different modes to present analysis result according to the difference of indicating device 30.In the present embodiment, indicating device 30 is a display device, can utilize visual manner to present analysis result by display device, for example can be according to LED source by whether testing, on display device, show corresponding character or figure, differentiate with auxiliary on-the-spot test personnel.Indicating device 30 also can be an alarm device in addition, when not by test, can send effects such as caution sound or flash of light by alarm device, has the auxiliary function of differentiating equally.
In addition, after step 220, also can carry out step 240: transmit analysis result and to server 40, store.Except can being indicated by indicating device 30, treating apparatus 20 also can be sent to analysis result in the server 40 and store by the obtained analysis result of abovementioned steps 220.Server 40 can be for the analysis result that deposits a large amount of LED source 110 in, and it can inquire about the test result of all electronic installations 100 of once testing together for the tester, or compares the not test result of homogeneous, to control the QC state of Related product.
Please refer to Fig. 3, Fig. 3 is the synoptic diagram of another embodiment of Auto-Test System 1a of the present invention.As shown in Figure 3, in the present embodiment, at least one LED source 110a is the panel light source that is applied to light emitting display device 100a.But Auto-Test System 1a of the present invention is the application of aforementioned automatic test approach also, tests at light emitting display device 100a via abovementioned steps.Because the panel light source of display device 100a is made of a plurality of LED source 110a, have the situation of bright dim spot easily, therefore set by software program 22a and analyze at bright dim spot, and data information in the bright dim spot characteristic of the built-in respective leds display device of database 100a, by Auto-Test System 1a detecting the bright dim spot quantity whether light emitting display device 100a has bright dim spot or had, and by the obtained analysis result of indicating device 30 indications.
Design by this, Auto-Test System of the present invention and method comprise the image information at LED source, analyze the optical characteristics of LED source, to judge that whether LED source is by test, reach the purpose of automatic test by this, improve testing efficiency and reduce testing cost, and be easy to control the QC that this type of uses the electronic product of LED source.
To sum up institute is old, and no matter the present invention everywhere all shows it totally different in the feature of known technology with regard to purpose, means and effect, is a quantum jump, earnestly asks the auditor to perceive, and grants quasi patent early, makes Jiahui society, and the true feeling moral just.Only must notice that the foregoing description only is illustrative principle of the present invention and effect thereof, but not is used to limit the scope of the invention.Any those skilled in the art all can be under know-why of the present invention and spirit, and embodiment is made an amendment and changes.The scope of the present invention should be as described in the appending claims scope.
Claims (21)
1. Auto-Test System, in order to test at least one LED source, described Auto-Test System comprises:
One image capture unit is in order to obtain an image information of described at least one light emitting diode;
One treating apparatus is electrically connected at described image capture unit, and described treating apparatus receives described image information and analyzes at least one optical characteristics of each described LED source, to obtain an analysis result; And
One indicating device is electrically connected at described treating apparatus, in order to indicate described analysis result.
2. Auto-Test System as claimed in claim 1, wherein said treating apparatus comprises:
One software program is in order to analyze at least one optical characteristics of each described LED source in the described image information, to obtain at least one analysis data;
One database is in order to compare described at least one analysis data, to obtain described analysis result.
3. Auto-Test System as claimed in claim 1, wherein said optical characteristics comprise a brightness, a color or a bright dim spot state of described LED source.
4. Auto-Test System as claimed in claim 1, wherein said treating apparatus can store described analysis result.
5. Auto-Test System as claimed in claim 1, wherein said indicating device are a display device.
6. Auto-Test System as claimed in claim 1, wherein said indicating device are an alarm device.
7. Auto-Test System as claimed in claim 1 also comprises a server, is electrically connected at described treating apparatus, and described treating apparatus can be sent to described server stores with described analysis result.
8. Auto-Test System as claimed in claim 1, wherein said LED source are the pilot lamp that is applied to an electronic installation.
9. Auto-Test System as claimed in claim 1, wherein said LED source are the panel light source that is applied to a light emitting display device.
10. automatic test approach, in order to test at least one LED source, described method comprises:
Obtain an image information of described at least one LED source;
Transmit described image information to a treating apparatus, to analyze at least one optical characteristics of each described LED source, to obtain an analysis result; And
Indicate described analysis result.
11. automatic test approach as claimed in claim 10, wherein by an image capture unit to obtain described image information.
12. automatic test approach as claimed in claim 10, wherein said treating apparatus comprises a software program, in order to described image information is carried out data analysis, to obtain at least one analysis data.
13. automatic test approach as claimed in claim 12, wherein said treating apparatus comprises a database, compares by described database and described at least one analysis data, to obtain described analysis result.
14. automatic test approach as claimed in claim 10 wherein can store described analysis result by described treating apparatus.
15. automatic test approach as claimed in claim 10, wherein said optical characteristics comprise a brightness, a color or a bright dim spot state of described LED source.
16. automatic test approach as claimed in claim 10 is wherein indicated described analysis result by an indicating device.
17. automatic test approach as claimed in claim 10, wherein said indicating device are a display device.
18. automatic test approach as claimed in claim 10, wherein said indicating device are an alarm device.
19. automatic test approach as claimed in claim 10 is further comprising the steps of:
Transmit in described analysis result to a server and store.
20. automatic test approach as claimed in claim 10, wherein said LED source are the pilot lamp that is applied to an electronic installation.
21. automatic test approach as claimed in claim 10, wherein said LED source are the panel light source that is applied to a light emitting display device.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN200810172495A CN101738251A (en) | 2008-11-12 | 2008-11-12 | Automatic test system and method |
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| Application Number | Priority Date | Filing Date | Title |
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| CN200810172495A CN101738251A (en) | 2008-11-12 | 2008-11-12 | Automatic test system and method |
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Cited By (12)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN102175958A (en) * | 2010-12-30 | 2011-09-07 | 中国科学院长春光学精密机械与物理研究所 | Onboard calibration light source LED screening method |
| CN102645276A (en) * | 2011-02-16 | 2012-08-22 | 台湾超微光学股份有限公司 | Spectrum sensing equipment, system and method |
| CN102650567A (en) * | 2011-02-23 | 2012-08-29 | 致茂电子股份有限公司 | Detection system and detection method of cluster type LED chip |
| CN103185663A (en) * | 2011-12-28 | 2013-07-03 | 英业达股份有限公司 | Light-emitting diode detection method by utilizing digital image |
| CN103558010A (en) * | 2013-10-30 | 2014-02-05 | 工业和信息化部电子第五研究所 | Test box and method for monitoring whether lamp in test box fails |
| CN104316295A (en) * | 2014-11-03 | 2015-01-28 | 广东威创视讯科技股份有限公司 | Photoelectric test method and device of LED device |
| CN104698005A (en) * | 2015-03-20 | 2015-06-10 | 蒋海兵 | Display board testing device and method |
| CN105116265A (en) * | 2015-03-20 | 2015-12-02 | 蒋海兵 | Intelligent terminal automatic test device |
| CN105784331A (en) * | 2016-03-11 | 2016-07-20 | 利亚德光电股份有限公司 | Data-acquisition-equipment-based data acquisition method and data acquisition equipment |
| WO2017117875A1 (en) * | 2016-01-07 | 2017-07-13 | 中兴通讯股份有限公司 | Light source state detection system and method |
| CN109374125A (en) * | 2018-10-19 | 2019-02-22 | 义乌臻格科技有限公司 | The rapid detection method of All-in-One display type LED lamp bead mould group |
| CN112985587A (en) * | 2019-12-13 | 2021-06-18 | 旺矽科技股份有限公司 | Method for processing luminous material image |
-
2008
- 2008-11-12 CN CN200810172495A patent/CN101738251A/en active Pending
Cited By (16)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN102175958A (en) * | 2010-12-30 | 2011-09-07 | 中国科学院长春光学精密机械与物理研究所 | Onboard calibration light source LED screening method |
| CN102645276A (en) * | 2011-02-16 | 2012-08-22 | 台湾超微光学股份有限公司 | Spectrum sensing equipment, system and method |
| CN102650567A (en) * | 2011-02-23 | 2012-08-29 | 致茂电子股份有限公司 | Detection system and detection method of cluster type LED chip |
| CN103185663B (en) * | 2011-12-28 | 2015-11-25 | 英业达股份有限公司 | Utilize digitized video to the detection method of light emitting diode |
| CN103185663A (en) * | 2011-12-28 | 2013-07-03 | 英业达股份有限公司 | Light-emitting diode detection method by utilizing digital image |
| CN103558010A (en) * | 2013-10-30 | 2014-02-05 | 工业和信息化部电子第五研究所 | Test box and method for monitoring whether lamp in test box fails |
| CN104316295B (en) * | 2014-11-03 | 2018-04-20 | 广东威创视讯科技股份有限公司 | The photoelectric test method and device of a kind of LED component |
| CN104316295A (en) * | 2014-11-03 | 2015-01-28 | 广东威创视讯科技股份有限公司 | Photoelectric test method and device of LED device |
| CN104698005A (en) * | 2015-03-20 | 2015-06-10 | 蒋海兵 | Display board testing device and method |
| CN105116265A (en) * | 2015-03-20 | 2015-12-02 | 蒋海兵 | Intelligent terminal automatic test device |
| CN104698005B (en) * | 2015-03-20 | 2017-07-04 | 湖南海铭德电子科技有限公司 | One kind display board test apparatus and method of testing |
| WO2017117875A1 (en) * | 2016-01-07 | 2017-07-13 | 中兴通讯股份有限公司 | Light source state detection system and method |
| CN105784331A (en) * | 2016-03-11 | 2016-07-20 | 利亚德光电股份有限公司 | Data-acquisition-equipment-based data acquisition method and data acquisition equipment |
| CN109374125A (en) * | 2018-10-19 | 2019-02-22 | 义乌臻格科技有限公司 | The rapid detection method of All-in-One display type LED lamp bead mould group |
| CN112985587A (en) * | 2019-12-13 | 2021-06-18 | 旺矽科技股份有限公司 | Method for processing luminous material image |
| CN112985587B (en) * | 2019-12-13 | 2024-04-09 | 旺矽科技股份有限公司 | Method for processing image of luminous material |
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Application publication date: 20100616 |