201018886 六、發明說明： 【發明所屬之技術領域】 本發明係關於一種自動測試系統及方法，特别是〜 種應用於測試至少一發光二極體光源之自動蜊試系统 及方法。 【先前技術】 一般電子產品在出廠前均需接受嚴格的開機滴】201018886 VI. Description of the Invention: [Technical Field] The present invention relates to an automatic test system and method, and more particularly to an automatic test system and method for testing at least one light-emitting diode light source. [Prior Art] General electronic products are subject to strict boot drops before leaving the factory.
試，將具有缺陷或故障的瑕疵品先行挑出，以維持良好 的品管要求，避免這些瑕疵品流入市面後可能詞·廠商造 成信譽受損等問題。舉例來說，在電子產品上大多數都 設有指示其使用狀態或電源之發光二極體（Led)光 源，或是由複數發光二極體光源所組成之顯示面板，為 確保這些發光二極體統可正常運作，便必須透_ 發光二極體光源是否因損壞而呈亮暗點狀態，或 其具有売度不準之情況。目前針對 "Try to pick out defects with defects or failures to maintain good quality control requirements, and avoid problems such as the reputation of the manufacturer and the reputation damage caused by these products. For example, most of the electronic products are provided with a light-emitting diode (Led) light source indicating the state of use or power supply, or a display panel composed of a plurality of light-emitting diode light sources, to ensure these light-emitting diodes If the system is functioning properly, it must be transparent or dark, or it may be inaccurate. Currently targeting "
體光源多採用人工目測的方式來_斷=二極 式極耗費時間及人力’將增加產品之測試成I 之顏色偏差較難以去制。 、發光-極體光游 【發明内容】 —種測試至少一發光 本發明之主要目的係在提供 二極體光源之自動測試系統。 201018886 像擷取裝置、】及:=:自動測試系統包括影 取得至少n極體^置。影像錄裝置用以 各發光二極雜先=少=7影像資訊並分析 ㈣示襄置係電性連接於 品之生產心、發月自動測試系統可應用於電子產 光*極!以自動化檢測方式來測試電子產品之發 不燈或發光二極體顯示面板,判斷是否有亮 ==他不良狀態，以取代傳統人工目測方式，提高 測忒效率及降低測試成本。 ❹ 本發明之自動測試方法係應用於前述之自動測試 系統’其方法包括以下步驟：取得至少—發光二極體光 ,之影像資訊；傳送影像資訊至處理裝置，以分析至 J發光一極體光源之光學特性，以取得分析結果；指 示分析結果。其中光學特性可包括發光二極體光源之亮 度、顏色或亮暗點狀態。 【實施方式】 為能讓貴審查委員能更瞭解本發明之技術内容， 特舉出較佳實施例說明如下。 以下請先參考圖1係本發明之自動測試系統丨之示 意圖。本發明之自動測試系統丨可應用於測試至少一發 光一極體光源110。如圖1所示，在本實施例中，至少一 發光二極體光源110係應用於電子裝置之指示燈。電 子装置100放置於產品之測試動線120上，當電子裝置 4 201018886 100通過定點時’便可藉由本發明之自動測試系統1對至 少一發光二極體光源110進行自動測試。電子裝置100可 為一筆記型電腦、-手機或-衛星導航系統（GPS)。 如圖1所不’自動測試系統1包括影像擷取裝置10、 處理裝置20及指示裝置30。影像擷取裝置10用以取得至 )「發光二極體光源110之影像資訊。處理裝置20係電 性$接於影像梅取装置1〇，經由前述影像擷取裝置1〇所 取得之影像資訊可傳送至處理裝置2G接收，藉由處理裝 鲁 12G對影像資訊中各發光二極體光源UG之至少一光學 特性進行分析’以取得—分析結果^其中處理裝置2〇包 括軟體程式22及資料庫24，軟體程式22用以分析影像資 訊中各發光二極體光源110之至少-光學特性，以取得 至少一分析數據；資料庫24用以比對至少一分析數據進 行，以取得分析結果。指示裝置3〇係電性連接於處理裝 置20，用以指示分析結果。 、請參考圖2係本發明之自動測試方法之流程圖。須 ® /主意的疋，以下雖以圖1所示之自動測試系統1為例說明 ，發明之自動測試方法，但本發明並不以適用於自動測 試系統1為限’任何其他具類似架構之自動測試系統亦 可適用本發明之自動測試方法。如圖2所示，本發明之 自動測試方法包括步驟21〇至步驟24〇。以下將 本發明之自動測試方法之各個步驟。 首先進行步驟210 :取得至少一發光二極體光源ιι〇 之-影像資訊。如圖1所示’本發明之自動測試方法係 應用於前述之自動測試系統卜自動測試系統以括影像 5 201018886 2裝置1〇,在本實施例中，影像揭取裝置ig係為―攝 二翻,ΐ可使用具有影像摘取功能之感光傳感裝置或 裝置==::二實定施:為:。將影像擷取 外接動線 ’相程式控制或 得啟動至少一發光二極體光源110,或使The body light source is mostly manually visually measured. _Bast = two-pole type is extremely time consuming and manpower'. It is more difficult to remove the color deviation of the product test. , illuminating - polar body light travel [Summary of the Invention] - Testing at least one illuminating The primary object of the present invention is to provide an automated test system for a dipole source. 201018886 Like the capture device,] and: =: The automatic test system includes the image to obtain at least the n-pole body. The video recording device is used for each illuminating two-pole first = less = 7 image information and analysis (4) 襄 系 系 系 电 电 电 、 、 、 、 、 、 、 、 、 、 、 、 自动 自动 自动 自动 自动 自动 自动 自动 自动 自动 自动 自动 自动 自动 自动 自动 自动 自动The method is to test the electronic product's non-light or LED display panel to determine whether there is a bright == his bad state, in order to replace the traditional manual visual inspection method, improve the measurement efficiency and reduce the test cost.自动 The automatic test method of the present invention is applied to the above-mentioned automatic test system'. The method includes the steps of: obtaining at least - light-emitting diode light, image information; transmitting image information to a processing device for analyzing to a J-light body The optical properties of the source to obtain analytical results; indicate the results of the analysis. The optical characteristics may include the brightness, color, or bright and dark state of the light emitting diode source. [Embodiment] In order to enable the reviewing committee to better understand the technical contents of the present invention, a preferred embodiment will be described below. Hereinafter, please refer to FIG. 1 for the purpose of the automatic test system of the present invention. The automatic test system of the present invention can be applied to test at least one light-emitting body light source 110. As shown in Fig. 1, in the present embodiment, at least one of the light emitting diode light sources 110 is applied to an indicator light of an electronic device. The electronic device 100 is placed on the test line 120 of the product. When the electronic device 4 201018886 100 passes the fixed point, the automatic test system 1 of the present invention can automatically test at least one of the light-emitting diode sources 110. The electronic device 100 can be a notebook computer, a mobile phone or a satellite navigation system (GPS). As shown in Fig. 1, the automatic test system 1 includes an image capture device 10, a processing device 20, and a pointing device 30. The image capturing device 10 is configured to obtain the image information of the light emitting diode light source 110. The processing device 20 is electrically connected to the image capturing device 1 and the image information obtained by the image capturing device 1 It can be transmitted to the processing device 2G for receiving, and the at least one optical characteristic of each of the light-emitting diode light sources UG in the image information is analyzed by the processing device 12G to obtain an analysis result. The processing device 2 includes the software program 22 and the data. The library 24 is configured to analyze at least one optical characteristic of each of the LED light sources 110 in the image information to obtain at least one analysis data; the database 24 is configured to compare the at least one analysis data to obtain an analysis result. The indicating device 3 is electrically connected to the processing device 20 for indicating the analysis result. Please refer to FIG. 2, which is a flow chart of the automatic testing method of the present invention. The ®® / idea 疋, the following is shown in FIG. The automatic test system 1 is an example of an automatic test method of the invention, but the present invention is not limited to the automatic test system 1 'any other automatic test system with a similar structure. The automatic test method of the present invention is applicable. As shown in Fig. 2, the automatic test method of the present invention comprises the steps 21 to 24, and the steps of the automatic test method of the present invention are as follows. First, step 210 is performed: at least one light is obtained. The two-pole light source ιι〇--image information. As shown in FIG. 1 'the automatic test method of the present invention is applied to the above-mentioned automatic test system, the automatic test system includes the image 5 201018886 2 device 1 〇, in this embodiment The image removal device ig is a "photographing device" or a device that uses an image pickup function or a device that has an image pickup function. ==:: 二实定施::: The image is captured by an external moving line 'phase program Controlling or enabling at least one light emitting diode light source 110, or
Sit 開機狀態’因此當電子裝置100隨著測 m經過定點時，即可藉由影像操取裝置1〇取得 至夕一發光二極體光源110之一影像資訊。 於步驟2職進行步額G :傳送影像資訊至處理裝 〇，以为析各發光二極體光源11〇 性，以取得分析結果。如圖!所示，自動賴= ίΠ2〇 ’於前述步驟210所取得之影像資訊可傳送 析藉由處理裝置2〇針對此影像資訊加以分 於處理裝'置二一 Γ斤結果。所取得之分析結果可儲存 料t 處理裝置2°包括軟體程切及資 鲁 體=位軟置體 光學舰進行數據分析，以取得至2 =數 中光學特性包括發光二:源 析，而言，當本發明= M方法應用於電子裝置100之指示燈測試時，由於指 201018886 示燈依不㈣態可能會呈現Μ色彩，因此軟體程切 可設定顏色及亮㈣等鮮純，針對㈣燈亮起時顏 確’或^燈是否未麵等狀態進行分析。此 外資料庫24亦可依據不同發光二極體光源之測試，而變 更其内建之複數光學特性數據資料。 ❹ —於步驟220後進行步驟230 :指示分析結果。如圖丄 所不’自動測試系統1包括指示裝置3〇，藉由指示裝置 3〇可指示出前述步驟220所取得之分析絲，且依據指 不m不同可運用不同方式呈現分析結果。在本實 施例中’指示裝置3G係為-顯示裝置，透過顯示裝置可 利用視覺方式呈現分析結果，例如可依據發光二極體光 源通過測試與否’於顯示裝置上顯示對應之文字或圖 形’以輔助現場測試人員進行_。此外指示裝置3〇亦 可為一警報裝置，當未通過測試時，可透過警報裝置發 出警示聲或閃光等效果，同樣具有辅助制之功能。 此外，於步驟220後更可進行步驟240 :傳送分析結 =至伺服H4G中儲存。藉由前述步驟22()所取得之分析 ，果$ 了可藉由指示裝置30加以指示外’處理裝置20亦 可將分析結果傳送至伺服器40中儲存 。伺服器40可供存 入大量發光二極體総110之分析結果 ，其可供測試人 員查洶同一次進行測試之所有電子裝置100之測試結 果，或比對不同次之測試結果，以掌控相關產品的品管 狀態。 一 4參考圖3係本發明之自動測試系統la另一實施例 之示意圖。如圖3所示，在本實施例中至少一發光二 201018886 極體光源ll〇a係應用於發光二極體顯示裝置1〇〇&之面 板光源。本發明之自動測試系統la亦可應用前述自動測 試方法，經由前述步驟針對發光二極體顯示裝置1〇〇&進 行測試。由於顯示裝置l〇〇a之面板光源由複數發光二極 體光源110a所構成，容易出現有亮暗點之情況，因此透 過軟體程式22a設定針對亮暗點進行分析，且於資料庫 内建對應發光二極體顯示裝置l〇〇a之亮暗點特性之數 據資料’藉由自動測試系統la以檢測發光二極體顯示裝 置100a是否具有亮暗點或所具有之亮暗點數量，並透過 指示裝置30指示所取得之分析結果。 藉此設計’本發明之自動測試系統及方法針對包括 發光二極體光源之影像資訊，分析發光二極體光源之光 學特性，以判斷發光二極體光源是否通過測試，藉此達 到自動化測試之目的，提高測試效率及降低測試成本， 且易於掌控此類應用發光二極體光源之電子產品之品 管。 綜上所陳，本發明無論就目的 '手段及功效，在在 均顯示其迥異於習知技術之特徵，為一大突破，懇請 貴審查委員明察，早曰賜准專利，俾嘉惠社會，實感德 便。惟須注意，上述實施例僅為例示性說明本發明之原 理及其功效，而非用於限制本發明之範圍。任何熟於此 項技藝之人士均可在不違背本發明之技術原理及精神 下，對實施例作修改與變化。本發明之權利保護範圍應 如後述之申清專利範圍所述。 【圖式簡單說明】 201018886 圖1係本發明之自動測試系統之示意圖。 圖2係本發明之自動測試方法之流程圖。 圖3係本發明之自動測試系統另一實施例之示意圖。 【主要元件符號說明】 自動測試系統1、1 a 影像擷取裝置10 處理裝置20 軟體程式22、22a 資料庫24、24a 指示裝置30 電子裝置100 發光二極體顯示裝置100a 發光二極體光源110、110a 測試動線120The Sit is turned on. Therefore, when the electronic device 100 passes the measurement, the image information of one of the light-emitting diodes 110 can be obtained by the image manipulation device 1 . In Step 2, the step G is performed: the image information is transmitted to the processing device, so that the luminance of each of the LED sources is analyzed to obtain an analysis result. As shown in Fig.!, the image information obtained in the above step 210 can be transmitted and analyzed by the processing device 2, and the image information is divided into the processing device. The obtained analysis results can be stored in the material processing device 2° including software path cutting and zilu = position soft-spaced optical ship for data analysis to obtain optical characteristics including 2 = number of light sources: source analysis, When the method of the present invention = M is applied to the indicator test of the electronic device 100, since the indicator of the 201018886 indicator may be in a Μ color, the software can set the color and the brightness (4) and the like, and the (4) light is bright. When the time is OK or the light is not surfaced, etc. The external database 24 can also change the built-in complex optical characteristic data according to the test of different light-emitting diode sources. ❹ - After step 220, proceed to step 230: indicating the analysis result. As shown in Fig. 自动, the automatic test system 1 includes a pointing device 3, which can indicate the analysis wire obtained in the foregoing step 220 by the pointing device 3, and can present the analysis result in different ways according to the difference of the finger. In the present embodiment, the 'indicating device 3G is a display device, and the display device can visually present the analysis result, for example, according to the light-emitting diode light source, whether the corresponding text or graphic is displayed on the display device. To assist field testers to carry out _. In addition, the indicating device 3 can also be an alarm device. When the test fails, the warning device can emit an alert sound or a flashing effect, and the auxiliary function is also provided. In addition, after step 220, step 240: transmitting the analysis node = to the servo H4G for storage. By the analysis obtained in the foregoing step 22(), the processing device 20 can also transmit the analysis result to the server 40 for storage by the pointing device 30. The server 40 can store the analysis result of a large number of LEDs 110, which can be used by the tester to check the test results of all the electronic devices 100 that are tested at the same time, or to compare the test results of different times to control the relevant The quality control status of the product. 4 is a schematic view of another embodiment of the automatic test system 1a of the present invention. As shown in Fig. 3, in the present embodiment, at least one of the light-emitting diodes 201018886 is used for the surface light source of the light-emitting diode display device 1& The automatic test system 1a of the present invention can also be applied to the light-emitting diode display device 1 & via the aforementioned steps by applying the aforementioned automatic test method. Since the panel light source of the display device 10a is composed of the plurality of light-emitting diode light sources 110a, it is easy to have bright and dark spots. Therefore, the software program 22a is set to analyze the bright and dark points, and the corresponding data is built in the database. The data of the bright and dark spot characteristics of the light-emitting diode display device l〇〇a is used to detect whether the light-emitting diode display device 100a has a bright or dark point or a number of bright and dark spots, and is transmitted through the automatic test system 1a. The pointing device 30 indicates the analysis result obtained. In this way, the automatic test system and method of the present invention analyzes the optical characteristics of the light-emitting diode light source for image information including the light-emitting diode light source to determine whether the light-emitting diode light source passes the test, thereby achieving automatic test. The purpose is to improve the test efficiency and reduce the test cost, and to easily control the quality control of such electronic products using the light-emitting diode source. In summary, the present invention is a major breakthrough in both the means and the efficacy of the present invention, which are different from the characteristics of the prior art, and asks the reviewing committee to inspect the patent, and to provide benefits to the society. Real sense of virtue. It is to be noted that the above-described embodiments are merely illustrative of the principles of the invention and its effects, and are not intended to limit the scope of the invention. Modifications and variations of the embodiments can be made by those skilled in the art without departing from the spirit and scope of the invention. The scope of protection of the present invention should be as described in the scope of the patents described later. BRIEF DESCRIPTION OF THE DRAWINGS 201018886 FIG. 1 is a schematic diagram of an automatic test system of the present invention. 2 is a flow chart of an automatic test method of the present invention. 3 is a schematic diagram of another embodiment of an automated test system of the present invention. [Main component symbol description] Automatic test system 1, 1 a Image capture device 10 Processing device 20 Software program 22, 22a Database 24, 24a Instruction device 30 Electronic device 100 Light-emitting diode display device 100a Light-emitting diode light source 110 , 110a test line 120