CN107084989B - Method and system for adding AOI device database - Google Patents
Method and system for adding AOI device database Download PDFInfo
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- CN107084989B CN107084989B CN201710188604.7A CN201710188604A CN107084989B CN 107084989 B CN107084989 B CN 107084989B CN 201710188604 A CN201710188604 A CN 201710188604A CN 107084989 B CN107084989 B CN 107084989B
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- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
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- G01N21/88—Investigating the presence of flaws or contamination
Abstract
The invention relates to an adding method and a system of an AOI device database, wherein the method comprises the steps of scanning and acquiring current image information of one device on a PCB; comparing the current image information with at least one group of reference image information in a parameter database of a target device corresponding to the device respectively to judge whether the current image information is consistent with the reference image information; and if the current image information is not matched with the reference image information in the parameter database and a replaceable parameter adding command is received, adding and storing the current image information of the device into the parameter database. The invention can compare the attribute parameters of the detection device with the related attribute parameters of the original standard device, and can compare the attribute parameters with the related attribute parameters of the substitute device which also meets the requirements, so that the detected device can be judged to meet the requirements if any, and the selection range of the related device in the manufacturing process of the PCB is widened.
Description
Technical Field
The invention relates to the field of circuit board manufacturing, in particular to an AOI device detection method and system.
Background
Aoi (automatic optical inspection), which is generally called automatic optical inspection, is an apparatus for inspecting common defects encountered in soldering production based on optical principles, and is commonly used for inspecting PCB boards to ensure the quality of products.
AOI is a new testing technology which is just emerging in recent years, but the development is rapid, and AOI testing equipment is provided by many manufacturers at present. When automatic detection is carried out, the machine automatically scans the PCB board card through the camera to acquire images, compares the tested welding spots with qualified parameters in the database, inspects the defects existing on the PCB board card through image processing, and displays the corresponding defects through a display or an automatic mark for maintenance personnel to repair.
In the existing AOI detection process, for a certain specific device, for example, for a certain capacitor, capacitor devices produced by different manufacturers may be adopted in the manufacture of a circuit board, and can be used by being replaced with each other when used. However, in the existing AOI detection, only one appearance shape of a device is allowed at a certain position on a PCB card, and when the device is detected to have the same other appearance shape, the device is judged to be unqualified. For example, the existing AOI detection only allows white capacitor devices, and when red capacitor devices of the same type are replaced at the same position of the PCB board, the AOI detection system determines that the red capacitor devices are not satisfactory, which will undoubtedly greatly limit the selection range of relevant devices when the PCB board is installed, and bring inconvenience to practical application.
Disclosure of Invention
Based on the above, the invention mainly aims to solve the problem that the existing AOI detection system only recognizes the device with single attribute parameter during detection, and widens the selection range of the related devices during the manufacture of the PCB card by setting the alternative attribute parameter library.
The invention provides an adding method of an AOI device database, which is used for detecting a PCB, wherein the adding method comprises the following steps:
scanning and acquiring current image information of one device on the PCB;
comparing the current image information with at least one group of reference image information in a parameter database of a target device corresponding to the device respectively to judge whether the current image information is consistent with the reference image information;
and if the current image information is not matched with the reference image information in the parameter database and a replaceable parameter adding command is received, adding and storing the current image information of the device into the parameter database.
The method for adding the AOI device database, wherein the current image information comprises relevant attribute parameters of the device, the parameter database comprises a standard parameter database, and the standard parameter database is a parameter database of the target device, and the method further comprises the following steps:
comparing the related attribute parameters of the device with the corresponding parameters in the standard parameter database one by one to judge whether the related attribute parameters are consistent with the corresponding parameters in the standard parameter database;
and if the relevant attribute parameters of the device are matched with the corresponding parameters in the standard parameter database, confirming that the device passes the detection.
The method for adding the AOI device database comprises the following steps of comparing the related attribute parameters of the device with the corresponding parameters in the standard parameter database one by one, and judging whether the related attribute parameters are consistent with the corresponding parameters in the standard parameter database, and further comprises the following steps:
and if the related attribute parameters of the device are not matched with the corresponding parameters in the standard parameter database and the alternative parameter adding command is received, adding and storing the current image information of the device into the parameter database and recording the current image information as an alternative parameter database.
The method for adding the AOI device database comprises the following steps of comparing the related attribute parameters of the device with the corresponding parameters in the standard parameter database one by one, and judging whether the related attribute parameters are consistent with the corresponding parameters in the standard parameter database, and further comprises the following steps:
if the relevant attribute parameters of the device are not matched with the corresponding parameters in the standard parameter database, comparing the relevant attribute parameters of the device with the corresponding parameters in the alternative parameter database one by one to judge whether the relevant attribute parameters of the device are matched with the corresponding parameters in the alternative parameter database;
and if the related attribute parameters are not matched with the corresponding parameters in the alternative parameter database, confirming that the device detection is not passed.
The method for adding the AOI device database comprises the steps that the current image information comprises relevant attribute parameters of the device, the relevant attribute parameters comprise model classification parameters, position coordinate parameters and size parameters, and the step of comparing the current image information with the parameter database of the target device corresponding to the device one by one to judge whether the current image information is consistent with the parameter database of the target device comprises the following steps:
comparing the model classification parameters of the device with corresponding parameters in the parameter database of the corresponding target device to judge whether the model classification parameters of the device are matched with the corresponding parameters;
if the model classification parameters of the device are consistent with the corresponding parameters in the parameter database of the corresponding target device, comparing the position coordinate parameters of the device with the corresponding parameters in the parameter database of the corresponding target device to judge whether the model classification parameters of the device are consistent with the corresponding parameters in the parameter database of the corresponding target device;
if the position coordinate parameters of the device are consistent with the corresponding parameters in the parameter database of the corresponding target device, comparing the size parameters of the device with the corresponding parameters in the parameter database of the corresponding target device.
The invention also provides an adding system of the AOI device database, which is used for detecting the PCB, wherein the system comprises:
the image information acquisition module is used for scanning and acquiring the current image information of one device on the PCB;
the comparison and judgment module is used for comparing the current image information with at least one group of reference image information in a parameter database of the target device corresponding to the device respectively so as to judge whether the current image information is matched with the reference image information;
and the information adding module is used for adding and storing the current image information of the device into the parameter database if the current image information is not matched with the reference image information in the parameter database and a replaceable parameter adding command is received.
The adding system of AOI device database, wherein the current image information includes the related attribute parameters of the device, the parameter database includes a standard parameter database, the standard parameter database is the parameter database of the target device, the system also includes a detection confirming module,
the comparison and judgment module is used for comparing the related attribute parameters of the device with the corresponding parameters in the standard parameter database one by one so as to judge whether the related attribute parameters are consistent with the corresponding parameters in the standard parameter database;
and the detection confirmation module is used for confirming that the device passes the detection if the related attribute parameters of the device are consistent with the corresponding parameters in the standard parameter database.
The adding system of the AOI device database is characterized in that the information adding module is further used for adding and storing the current image information of the device into the parameter database and recording the current image information as the alternative parameter database if the relevant attribute parameters of the device are not matched with the corresponding parameters in the standard parameter database and the alternative parameter adding command is received.
The adding system of AOI device database, wherein the parameter database further comprises an alternative parameter database, the alternative parameter database is the parameter database of the added device,
the comparison and judgment module is further used for comparing the relevant attribute parameters of the device with the corresponding parameters in the alternative parameter database one by one to judge whether the relevant attribute parameters of the device are consistent with the corresponding parameters in the standard parameter database;
the detection confirming module is further used for confirming that the device detection is not passed if the related attribute parameters are not matched with the corresponding parameters in the replaceable parameter database.
The adding system of the AOI device database, wherein the current image information includes related attribute parameters of the device, the related attribute parameters include a model classification parameter, a position coordinate parameter and a size parameter, and the comparison and judgment module includes:
a model comparison unit for comparing the model classification parameters of the device with corresponding parameters in the parameter database of the corresponding target device to judge whether the device is matched with the target device;
a coordinate comparison unit, configured to compare the position coordinate parameter of the device with a corresponding parameter in the parameter database of the corresponding target device to determine whether the model classification parameter of the device matches with a corresponding parameter in the parameter database of the corresponding target device;
a size comparing unit, configured to compare the size parameter of the device with a corresponding parameter in the parameter database of the corresponding target device if the position coordinate parameter of the device matches with the corresponding parameter in the parameter database of the corresponding target device.
The adding method and the adding system of the AOI device database can compare the attribute parameters of the detection device with the related attribute parameters of the original standard device and the related attribute parameters of the substitute device which also meets the requirements in actual detection application, and can judge that the detected device meets the requirements if the detected device meets one of the original standard device or the substitute device, thereby greatly widening the selection range of the related devices in the manufacturing process of the PCB board card.
Drawings
FIG. 1 is a schematic block diagram of an adding method of an AOI device database according to a first embodiment of the present invention;
FIG. 2 is a block flow diagram of an AOI device database adding method according to a second embodiment of the present invention;
FIG. 3 is a flowchart illustrating an adding method of AOI device database according to a third embodiment of the present invention;
fig. 4 is a schematic structural diagram of an adding system of an AOI device database in a fourth embodiment of the present invention.
Detailed Description
To facilitate an understanding of the invention, the invention will now be described more fully with reference to the accompanying drawings. Preferred embodiments of the present invention are shown in the drawings. This invention may, however, be embodied in many different forms and should not be construed as limited to the embodiments set forth herein. Rather, these embodiments are provided so that this disclosure will be thorough and complete.
Unless defined otherwise, all technical and scientific terms used herein have the same meaning as commonly understood by one of ordinary skill in the art to which this invention belongs. The terminology used in the description of the invention herein is for the purpose of describing particular embodiments only and is not intended to be limiting of the invention. As used herein, the term "and/or" includes any and all combinations of one or more of the associated listed items.
Referring to fig. 1, the method for adding an AOI device database according to the first embodiment of the present invention specifically includes the following steps:
s101, scanning and obtaining current image information of one device on the PCB. In the actual scanning detection process, the AOI automatic optical detector performs shooting scanning on a device at a specified position on the PCB to obtain the current image information of the device. Specifically, a plurality of devices are installed on an actual PCB board, wherein the plurality of devices include capacitors, resistors, LED indicators, and the like. Different attribute parameters correspond to different devices, for example, for a certain capacitor, the related attribute parameters of the capacitor include the capacitance value, the size, the mounting position coordinates on the PCB board and the like of the capacitor.
S102, comparing the current image information with at least one group of reference image information in a parameter database of the target device corresponding to the device respectively to judge whether the current image information is consistent with the reference image information. After the current image information of one device on the PCB is obtained, the current image information is compared with at least one group of reference image information in a preset corresponding parameter database at the moment, and whether the relevant parameters of the current image information and the reference image information are consistent or not is judged. Specifically, if the device is a capacitor, and the current image information of the capacitor includes a capacitance value, a size, a color, a mounting position coordinate on the PCB board, and the like of the capacitor, it is necessary to compare the capacitance value of the capacitor with a corresponding capacitance value in the parameter database, for example, the capacitance value of the capacitor detected by scanning is 1.5F, the size of the corresponding capacitance value in the parameter database is also 1.5F, and the capacitance value of the capacitor detected by scanning is matched with the capacitance value in the parameter database.
Similarly, for the capacitor, the relationship between the size of the capacitor and the size value of the corresponding capacitor in the parameter database is compared, and similarly, if the size of the capacitor is equal to the size value of the capacitor in the parameter database, it is indicated that the capacitor is matched with the parameter database. It should be noted that, for one device, for example, for the capacitor, since the current image information of the capacitor includes a plurality of attribute parameters, the plurality of attribute parameters of the capacitor need to be compared with the corresponding parameters in the parameter database one by one when performing comparison, and only when the plurality of attribute parameters of the capacitor are matched with the corresponding parameters in the parameter database, it can be confirmed that the capacitor is matched with the parameter database.
S103, if the current image information is not matched with the reference image information in the parameter database and a replaceable parameter adding command is received, adding and storing the current image information of the device into the parameter database. Specifically, still taking the capacitor as an example, when a plurality of attribute parameters (such as capacitance, size, color, and position coordinates on the PCB) of the capacitor are respectively compared with the parameters in the parameter database, if one attribute parameter of the capacitor does not match the parameters in the parameter database (for example, the color of the scanned and detected capacitor is blue, and the color required in the parameter database is red), then the capacitor does not match the parameters required in the parameter database.
However, in the installation process of the actual PCB device, if only the appearance colors of the capacitors of the same model are different, the normal use of the capacitors is not influenced. That is, the capacitor with the blue appearance color also meets the installation standard and is a replaceable capacitor of the red capacitor. Therefore, when an alternative parameter adding command is received, the relevant parameter information of the blue capacitor is added into the parameter database, namely the parameter characteristic of blue is also added into the parameter database.
Referring to fig. 2, the method for adding an AOI device database according to the second embodiment of the present invention includes the following steps:
s201, scanning and obtaining the current image information of one device on the PCB. The current image information comprises relevant attribute parameters of the device, and the relevant attribute parameters comprise a model classification parameter, a position coordinate parameter and a size parameter of the device. Specifically, a plurality of devices are installed on an actual PCB board, wherein the plurality of devices include capacitors, resistors, LED indicators, and the like. For example, for a certain capacitor, the model classification parameter, the position coordinate parameter and the size parameter respectively correspond to the model of the capacitor, the position coordinate on the PCB and the size, and the information is obtained mainly for subsequent comparison with the corresponding parameters in the parameter database.
S202, comparing the model classification parameters of the device with corresponding parameters in the parameter database of the corresponding target device to judge whether the model classification parameters of the device are matched with the corresponding parameters in the parameter database of the target device. In the actual comparison and judgment process, since the model classification parameters, the position coordinate parameters and the size parameters of the device are obtained through scanning, when the model classification parameters are compared with the parameter database, the model classification parameters are firstly compared with the corresponding parameters in the parameter database, for the capacitor, that is, whether the model of the capacitor is identical with the model in the parameter database is compared, and generally, other attribute parameters of the capacitor are continuously compared only when the model of the capacitor is identical with the model specified in the parameter database.
S203, if the model classification parameters of the device are matched with the corresponding parameters in the parameter database of the corresponding target device, comparing the position coordinate parameters of the device with the corresponding parameters in the parameter database of the corresponding target device to judge whether the model classification parameters of the device are matched with the corresponding parameters in the parameter database of the corresponding target device. Similarly, for example, when the capacitors are arranged at different positions on a PCB, when the type classification parameters of the capacitors are matched with the parameters in the parameter database, the position coordinate parameters of the capacitors are continuously compared with the corresponding parameters in the parameter database, that is, the capacitors of specific types are arranged at the designated positions on the PCB according to the parameter database.
S204, if the position coordinate parameters of the device are matched with the corresponding parameters in the parameter database of the corresponding target device, comparing the size parameters of the device with the corresponding parameters in the parameter database of the corresponding target device to judge whether the size parameters of the device are matched with the corresponding parameters in the parameter database of the corresponding target device. For the device, under the condition that the model classification parameters and the position coordinate parameters are matched, the size parameters of the device are compared with corresponding parameters in the parameter database. For example, when the device is a capacitor, the size parameter of the capacitor is compared with the corresponding parameter in the parameter database. It should be noted that, for the device disposed on the PCB, in the process of comparing and determining the parameters, in addition to comparing the model classification parameter, the position coordinate parameter, and the size parameter, different related attribute parameters need to be compared for different devices, the three parameters are only parameter items that need to be compared, and in this embodiment, all the parameters that need to be compared are not listed completely, which is specifically determined according to different actual detection devices.
S205, if the size parameters of the device are matched with the corresponding parameters in the parameter database of the corresponding target device, the device is confirmed to pass the detection. Specifically, if the model classification parameter, the position coordinate parameter, and the size parameter (which may be determined and compared for different devices and other related parameters) are all matched with the corresponding parameters in the parameter database, it may be determined that the device has passed the detection.
Referring to fig. 3, with respect to the method for adding an AOI device database in the third embodiment of the present invention, specifically, for the current image information, the current image information includes related attribute parameters of the device, and for the parameter database, the parameter database includes a standard parameter database and an alternative parameter database, where the standard parameter database is a parameter database of the target device, the alternative parameter database is a parameter database of an alternatively added device, the standard parameter database is a database that is compared first, and the alternative parameter database is a database that is compared in an alternative manner.
In the actual comparison and judgment process, for a certain device, the related attribute parameters of the device are compared with the corresponding parameters in the standard parameter database one by one to judge whether the related attribute parameters are consistent with the corresponding parameters in the standard parameter database. For example, when the device is a capacitor, the related attribute parameters of the capacitor (for example, the capacitance value, the size, the position on the PCB, and the like of the capacitor) are compared with the parameters in the standard parameter database in the parameter database, and if the related attribute parameters of the capacitor all conform to the parameter standards in the standard parameter database, the device can be determined to pass the detection.
In addition, when the related attribute parameters of the capacitor are compared with the corresponding parameters in the standard parameter database, if the related attribute parameters of the capacitor (for example, including the capacitance value, the size, the color, the position on the PCB, and the like of the capacitor) do not match the corresponding parameters in the parameter database, and a command for adding the alternative parameter is received, the current image information of the device is added and stored in the parameter database, and is recorded as the alternative parameter database.
Specifically, for example, when the capacitor is blue, and the capacitor specified in the standard parameter database is red, the capacitor with the appearance color of blue may also be mounted on the PCB board, that is, the blue capacitor is a replaceable capacitor of the red capacitor. And at the moment, if the alternative parameter adding command is received, adding the related attribute parameters of the blue capacitor into the parameter database to form an alternative parameter database so as to widen the overall range of the parameter database. When the blue capacitor with the same model is detected next time, the detection can be directly passed by taking the corresponding parameter in the replaceable parameter database as a standard. It should be noted here that there is no limitation on the number of times the related attribute parameter of the replaceable device is added, and as long as the replaceable related device is a replaceable related device, the related attribute parameter of the replaceable device can be added to the parameter database.
Meanwhile, when the related attribute parameters of the capacitor (such as the capacitance value, the size, the color, the position on the PCB, and the like of the capacitor) are compared and judged with the corresponding parameters in the standard parameter database, if the related attribute parameters of the capacitor (such as the capacitance value, the size, the color, the position on the PCB, and the like of the capacitor) do not match with the corresponding parameters in the parameter database, the related attribute parameters of the device are compared with the corresponding parameters in the alternative parameter database one by one to judge whether the related attribute parameters of the capacitor (such as the capacitance value, the size, the color, the position on the PCB, and the like of the capacitor) match with the parameters in the alternative parameter database, and the device is determined not to pass the detection, at this time, the current device needs to be replaced so as to finally reach the standard matching with the parameter database (i.e. including the standard parameter database and the alternative parameter database).
Referring to fig. 4, regarding an adding system of an AOI device database in a fourth embodiment of the present invention, the system is also configured to detect a PCB, where the system includes an image information obtaining module, a comparison and determination module, and an information adding module, which are connected in sequence;
the image information acquisition module is used for scanning and acquiring the current image information of one device on the PCB; the comparison judging module is used for comparing the current image information with a parameter database of a target device corresponding to the device one by one to judge whether the current image information is consistent with the parameter database of the target device; the information adding module is used for adding and storing the current image information of the device into the parameter database if the current image information is not matched with the parameter database of the target device corresponding to the device and a replaceable parameter adding command is received.
For the system for adding the AOI device database, wherein the current image information comprises relevant attribute parameters of the device, the parameter database comprises a standard parameter database, the standard parameter database is a parameter database of the target device, the system further comprises a detection confirmation module,
the comparison and judgment module is used for comparing the related attribute parameters of the device with the corresponding parameters in the standard parameter database one by one so as to judge whether the related attribute parameters are consistent with the corresponding parameters in the standard parameter database; if the relevant attribute parameters of the device are not matched with the corresponding parameters in the standard parameter database, comparing the relevant attribute parameters of the device with the corresponding parameters in the alternative parameter database one by one, and continuously judging whether the relevant attribute parameters of the device are matched with the corresponding parameters in the alternative parameter database;
and the detection confirmation module is used for confirming that the device passes the detection if the related attribute parameters of the device are matched with the corresponding parameters in the standard parameter database. Meanwhile, the detection confirmation module is further configured to confirm that the device detection fails if the relevant attribute parameters of the device do not match the corresponding parameters in the alternative parameter database.
The information adding module is further configured to add and store the current image information of the device in the parameter database and record the current image information as a replaceable parameter database if the relevant attribute parameters of the device are not matched with the corresponding parameters in the standard parameter database and the replaceable parameter adding command is received.
The adding system of the AOI device database comprises a current image information module, a comparison judging module and a parameter database module, wherein the current image information comprises related attribute parameters of the device, the related attribute parameters comprise model classification parameters, position coordinate parameters and size parameters, the comparison judging module comprises a model comparing unit, a coordinate comparing unit and a size comparing unit which are sequentially connected, and the model comparing unit is used for comparing the model classification parameters of the device with corresponding parameters in the parameter database of the corresponding target device and judging whether the model classification parameters are matched with the corresponding parameters;
the coordinate comparison unit is used for comparing the position coordinate parameters of the device with the corresponding parameters in the parameter database of the corresponding target device and judging whether the position coordinate parameters of the device are matched with the corresponding parameters in the parameter database of the corresponding target device if the model classification parameters of the device are matched with the corresponding parameters in the parameter database of the corresponding target device;
the size comparison unit is configured to compare the size parameter of the device with a corresponding parameter in the parameter database of the corresponding target device if the position coordinate parameter of the device matches the corresponding parameter in the parameter database of the corresponding target device.
The adding method and the adding system of the AOI device database can compare the attribute parameters of the detection device with the related attribute parameters of the original standard device and the related attribute parameters of the substitute device which also meets the requirements in actual detection application, and can judge that the detected device meets the requirements if the detected device meets one of the original standard device or the substitute device, thereby greatly widening the selection range of the related devices in the manufacturing process of the PCB board card.
The above-mentioned embodiments only express several embodiments of the present invention, and the description thereof is more specific and detailed, but not construed as limiting the scope of the present invention. It should be noted that, for a person skilled in the art, several variations and modifications can be made without departing from the inventive concept, which falls within the scope of the present invention. Therefore, the protection scope of the present patent shall be subject to the appended claims.
Claims (4)
1. An adding method of an AOI device database is used for detecting a PCB, and is characterized by comprising the following steps:
scanning and acquiring current image information of one device on the PCB, wherein the current image information comprises related attribute parameters of the device, and the related attribute parameters comprise a model classification parameter, a position coordinate parameter and a size parameter;
comparing the current image information with at least one group of reference image information in a parameter database of a target device corresponding to the device respectively to judge whether the current image information is consistent with the reference image information;
if the current image information is not matched with the reference image information in the parameter database and a replaceable parameter adding command is received, adding and storing the current image information of the device into the parameter database;
the parameter database comprises a standard parameter database and an alternative parameter database, wherein the standard parameter database is a parameter database of the target device, and the alternative parameter database is a parameter database of a device which can be added in an alternative way;
the method further comprises the following steps:
when the current image information of any device is judged to be not matched with the reference image information in the standard parameter database, comparing the current image information of the device with the corresponding parameters in the alternative parameter database one by one, and judging whether the current image information of the device is matched with the reference image information in the standard parameter database;
if the current image information of the device is not matched with the corresponding parameters in the replaceable parameter database, replacing the device;
the step of comparing the current image information with the parameter database of the target device corresponding to the device one by one to judge whether the current image information is matched with the parameter database of the target device comprises the following steps:
comparing the model classification parameters of the device with corresponding parameters in the parameter database of the corresponding target device to judge whether the model classification parameters of the device are matched with the corresponding parameters;
if the model classification parameters of the device are consistent with the corresponding parameters in the parameter database of the corresponding target device, comparing the position coordinate parameters of the device with the corresponding parameters in the parameter database of the corresponding target device to judge whether the model classification parameters of the device are consistent with the corresponding parameters in the parameter database of the corresponding target device;
if the position coordinate parameters of the device are consistent with the corresponding parameters in the parameter database of the corresponding target device, comparing the size parameters of the device with the corresponding parameters in the parameter database of the corresponding target device.
2. The method of claim 1, wherein the current image information comprises related attribute parameters of the device, the parameter database comprises a standard parameter database, and the standard parameter database is a parameter database of the target device, the method further comprising:
comparing the related attribute parameters of the device with the corresponding parameters in the standard parameter database one by one to judge whether the related attribute parameters are consistent with the corresponding parameters in the standard parameter database;
and if the relevant attribute parameters of the device are matched with the corresponding parameters in the standard parameter database, confirming that the device passes the detection.
3. An adding system of AOI device database, which is used for detecting PCB board, characterized in that the system includes:
the image information acquisition module is used for scanning and acquiring current image information of one device on the PCB, wherein the current image information comprises related attribute parameters of the device, and the related attribute parameters comprise a model classification parameter, a position coordinate parameter and a size parameter;
the comparison and judgment module is used for comparing the current image information with at least one group of reference image information in a parameter database of the target device corresponding to the device respectively so as to judge whether the current image information is matched with the reference image information;
an information adding module, configured to add and store the current image information of the device in the parameter database if the current image information is not matched with the reference image information in the parameter database and a replaceable parameter adding command is received;
the parameter database comprises a standard parameter database and an alternative parameter database, wherein the standard parameter database is a parameter database of the target device, and the alternative parameter database is a parameter database of a device which can be added in an alternative way;
the system is further configured to:
when the current image information of any device is judged to be not matched with the reference image information in the standard parameter database, comparing the current image information of the device with the corresponding parameters in the alternative parameter database one by one, and judging whether the current image information of the device is matched with the reference image information in the standard parameter database;
if the current image information of the device is not matched with the corresponding parameters in the replaceable parameter database, replacing the device;
the comparison and judgment module comprises:
a model comparison unit for comparing the model classification parameters of the device with corresponding parameters in the parameter database of the corresponding target device to judge whether the device is matched with the target device;
a coordinate comparison unit, configured to compare the position coordinate parameter of the device with a corresponding parameter in the parameter database of the corresponding target device to determine whether the model classification parameter of the device matches with a corresponding parameter in the parameter database of the corresponding target device;
a size comparing unit, configured to compare the size parameter of the device with a corresponding parameter in the parameter database of the corresponding target device if the position coordinate parameter of the device matches with the corresponding parameter in the parameter database of the corresponding target device.
4. The system for adding AOI device database according to claim 3, wherein the current image information comprises related attribute parameters of the device, the parameter database comprises a standard parameter database, the standard parameter database is the parameter database of the target device, the system further comprises a detection confirmation module,
the comparison and judgment module is used for comparing the related attribute parameters of the device with the corresponding parameters in the standard parameter database one by one so as to judge whether the related attribute parameters are consistent with the corresponding parameters in the standard parameter database;
and the detection confirmation module is used for confirming that the device passes the detection if the related attribute parameters of the device are consistent with the corresponding parameters in the standard parameter database.
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