CN104316295A - Photoelectric test method and device of LED device - Google Patents
Photoelectric test method and device of LED device Download PDFInfo
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- CN104316295A CN104316295A CN201410608553.5A CN201410608553A CN104316295A CN 104316295 A CN104316295 A CN 104316295A CN 201410608553 A CN201410608553 A CN 201410608553A CN 104316295 A CN104316295 A CN 104316295A
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Abstract
The invention discloses a photoelectric test method and device of an LED device. The photoelectric test method includes the steps that all or part of LED chips of the LED device to be tested are lightened, the LED device is tested, and light-emitting data are recorded; one or more lightened LED chips are turned off, the LED device is tested, and light-emitting data are recorded; according to the obtained light-emitting data, the light-emitting data of one or more LED chips are worked out; the light-emitting data of one or more LED chips are compared with preset standard light-emitting data, whether the LED chips are qualified or not is judged, and if the chips are not qualified, it is determined that the LED device is not qualified. The photoelectric test method and device of the LED device are suitable for the photoelectric test of a small-current LED device and have the advantages of being short in test time, high in accuracy rate and high in efficiency.
Description
Technical field
The present invention relates to LED component field tests, more specifically, relate to a kind of photoelectric test method and device of LED component.
Background technology
In recent years, the pursuit shown high-resolution along with the further reduction of LED chip size, the development of encapsulation technology, the decline of price and client, LED indoor display screen obtains and develops fast.At present, the resolution of indoor LED display significantly improves, but LED chip brightness is general higher, and the problems such as dazzling and dizzy easily appear in the beholder of LED display.In order to pursue better display effect, the concept that industry proposition " low bright high ash " point shows apart from indoor LED, this while requiring higher resolution, color saturation and sharpness, also requires that the brightness of LED display meets human eye viewing comfort level to indoor display screen.Current LED indoor brightness of display screen benefit becomes low brightening, and industry starts to propose to adopt low-light level LED chip, or adopts static drive mode, or adopt less scan mode (1/4,1/8), be intended to the screen body display brightness reducing LED display, meet human eye and watch comfortable requirement.
If adopt low bright LED chip or change scan mode and reduce brightness, can require that drive current when LED display works is less, in order to strictly control the optical homogeneity of LED display, require that corresponding LED component is when spectrophotometric test, measuring current is less than or equal to LED display drive current, because drive current is less, make LED chip test light intensity very weak.Traditional indoor Small Distance display applications electric current is general larger, so measuring current is also relatively large, light intensity is tested also larger under this kind of test condition, luminous intensity is generally between 10mcd-200mcd, adopt traditional test scheme directly to light test speed successively to needs test chip and generally between 20ms-50ms, test a chips, automatic test speed quickly, is easy to realize volume production.For " low bright high ash " indoor Small Distance LED display, requirement small electric stream driving LED chip is lighted, its electric current generally can be applied to 0.01mA ~ 1mA, in such cases, cause single chips luminous intensity little especially because electric current is very low, general between 0.1 ~ 10mcd, adopt single LEDs chip to light successively and one chip test will be made long for integral time, general 500 ~ 3000ms.Have a strong impact on testing efficiency, reduce production capacity, improve whole production cost.So, if adopt traditional test scheme to small current driving LED successively single light chip and carry out optical parametric test.On the one hand, because target light source light intensity is excessively weak, make physics long for integral time, testing efficiency is low, makes this series products cannot reach the quick spectrophotometric test requirement of mass production; On the other hand, target light source light intensity is excessively weak, affects the accuracy of test result, by directly affecting the optical homogeneity of LED display product, finally affects display effect.So conventional testing procedures constrains the development that " the low bright high ash " LED advocated at present shows product in testing efficiency and test accuracy.
Summary of the invention
The present invention is intended to solve the problems of the technologies described above at least to a certain extent.
Primary and foremost purpose of the present invention be to provide a kind ofly to test efficiently, the photoelectric test method of LED component accurately
A further object of the present invention is to provide a kind of opto-electronic testing apparatus of LED component.
For solving the problems of the technologies described above, technical scheme of the present invention is as follows:
A photoelectric test method for LED component, comprises the following steps:
S1: all or part of LED chip lighting LED component to be measured, tests and records light-emitting data;
S2: wherein one or many that closes the LED chip lighted in step S1, test and record light-emitting data;
S3: the light-emitting data recorded according to S1 and S2, calculates the light-emitting data of this or plurality of LEDs chip;
S4: the light-emitting data of this or plurality of LEDs chip and the standard luminescent data preset are compared, judge this or plurality of LEDs chip whether qualified, if this or plurality of LEDs chip defective, then judge that this LED component to be measured is defective; If this or plurality of LEDs chip qualified, then repeat the method for step S1 ~ S4, continue to judge that whether all the other LED chips of this LED component to be measured qualified, if whole LED chips of LED component to be measured are all qualified, then judge that this LED component is qualified.
An opto-electronic testing apparatus for LED component, comprising:
Light emitting control module: for lighting all or part of LED chip of LED component to be measured, or close wherein one or many of the LED chip lighted;
Data collection module: for collecting the light-emitting data of LED component to be measured, send data analysis module to;
Data analysis module: for LED chip that light-emitting data when lighting all or part of LED chip of LED component to be measured and closing is lighted wherein one or many time light-emitting data compare analysis, calculate the light-emitting data of this or plurality of LEDs chip;
Decision-making module: the light-emitting data of LED chip for being obtained by data analysis module compares with the standard luminescent data preset, judge this or plurality of LEDs chip whether qualified.
Compared with prior art, the beneficial effect of technical solution of the present invention is:
First the photoelectric test method of LED component of the present invention tests all or part of light-emitting data lighted of LED chip, then the light-emitting data of wherein or plurality of LEDs chip is closed in test, both are carried out com-parison and analysis, calculate light-emitting data when this or plurality of LEDs chip are lighted, and then itself and the standard luminescent data preset are contrasted, judge this or plurality of LEDs chip whether qualified, thus judge that whether LED component is qualified, in test process of the present invention, luminosity is large, therefore the time of small area analysis LED component test is shortened, improve the accuracy of test, the efficiency of automatic test is greatly improved, the opto-electronic testing apparatus of LED component of the present invention is device corresponding to above-mentioned method of testing, said method is implemented on the basis of device, can realize the target of the photoelectricity test of LED component of the present invention.
Accompanying drawing explanation
Fig. 1 is the process flow diagram of the photoelectric test method of LED component of the present invention.
Fig. 2 is the schematic diagram of the opto-electronic testing apparatus of LED component of the present invention.
Fig. 3 is 1010RGB SMD LED component schematic diagram.
Fig. 4 is the process flow diagram of the embodiment of the present invention 1 method.
Fig. 5 is the LED COB module of the embodiment of the present invention 2 and 3.
Fig. 6 is the process flow diagram of the embodiment of the present invention 2 method.
Fig. 7 is the process flow diagram of the embodiment of the present invention 3 method.
1-1, photoelectricity test analyser main frame; 1-2, signal collector; 1-3, power supply; 1-4, computer processor.
Embodiment
Accompanying drawing, only for exemplary illustration, can not be interpreted as the restriction to this patent;
In order to better the present embodiment is described, some parts of accompanying drawing have omission, zoom in or out, and do not represent the size of actual product;
To those skilled in the art, in accompanying drawing, some known features and explanation thereof may be omitted is understandable.
Below in conjunction with drawings and Examples, technical scheme of the present invention is described further.
embodiment 1
As shown in Figure 1, a kind of photoelectric test method of LED component, comprises the following steps:
S1: all or part of LED chip lighting LED component to be measured, tests and records light-emitting data;
S2: wherein one or many that closes the LED chip lighted in step S1, test and record light-emitting data;
S3: the light-emitting data recorded according to S1 and S2, calculates the light-emitting data of this or plurality of LEDs chip;
S4: the light-emitting data of this or plurality of LEDs chip and the standard luminescent data preset are compared, judge this or plurality of LEDs chip whether qualified, if this or plurality of LEDs chip defective, then judge that this LED component to be measured is defective; If this or plurality of LEDs chip qualified, then repeat the method for step S1 ~ S4, continue to judge that whether all the other LED chips of this LED component to be measured qualified, if whole LED chips of LED component to be measured are all qualified, then judge that this LED component is qualified.
First the photoelectric test method of LED component of the present invention tests all or part of light-emitting data lighted of LED chip, then the light-emitting data of wherein or plurality of LEDs chip is closed in test, both are carried out com-parison and analysis, calculate light-emitting data when this or plurality of LEDs chip are lighted, and then itself and the standard luminescent data preset are contrasted, judge this or plurality of LEDs chip whether qualified, thus judge that whether LED component is qualified, in test process of the present invention, luminosity is large, therefore the time of small area analysis LED component test is shortened, improve the accuracy of test, the efficiency of automatic test is greatly improved.
In specific implementation process, the method of testing of this specific embodiment can be carried out based on the proving installation shown in Fig. 2, this proving installation comprises photoelectricity test analyser main frame 1-1, the signal collector 1-2 be connected with photoelectricity test analyser main frame 1-1, power supply 1-3 and data collection process computer processor 1-4, described signal collector 1-2 is provided with positive and negative electrode, and its positive electrode is connected with the positive electrode of power supply 1-3, its negative electrode is connected with the negative electrode of power supply 1-3, described signal collector 1-2 is provided with aperture, described signal collector 1-2 adopts integrating sphere, fibre-optical probe or CCD camera.
In specific implementation process, test LED component is conventional 1010RGB SMD LED component, and it comprises each one of R, G, B LED chip, as shown in Figure 3.Conventional RGB test voltage is 5V, R, G, B LED chip measuring current is respectively 12mA, 8mA, 5mA.The constant current source measuring current of the present embodiment, R, G, B LED chip is respectively 1mA, 0.3mA, 0.2mA.Compare conventional device, measuring current is much smaller, and corresponding light intensity brightness is also much weak.The light-emitting data of test comprises brightness, wavelength, light intensity, and according to the data recorded, the light-emitting data of LED chip, by the spectral distribution data of different-waveband, carries out drawing of software calculating by computer.LED chip number N=3 of LED component to be measured in the present embodiment, the sequence number n=1 of LED chip, 2,3.As shown in Figure 4, concrete testing process is as follows:
1) light whole LED chips of LED component to be measured, test and record the light-emitting data D of LED component
n;
2) close the R LED chip in LED component, light G, B LED chip in LED component, test and record light-emitting data D
n-1; Contrast light-emitting data D
nwith D
n-1, calculate the light-emitting data D of R LED chip
r; By D
rwith the testing standard data D of the R LED chip preset
r0contrast, if D
rmeet testing standard data, enter downstream, otherwise judge that this LED component is as defective;
3) close G LED chip in LED component, light R, B LED chip in LED component, test and record light-emitting data D
n-2; Contrast light-emitting data D
nwith D
n-2, calculate the light-emitting data D of G LED chip
g; By D
gwith the testing standard data D of the G LED chip preset
g0contrast, if D
gmeet testing standard data, enter downstream, otherwise judge that this LED component is as defective;
4) close B LED chip in LED component, light R, G LED chip in LED component, test and record light-emitting data D
n-3; Contrast light-emitting data D
nwith D
n-3, calculate the light-emitting data D of B LED chip
b; By D
bwith the testing standard data D of the B LED chip preset
b0contrast, if D
bmeet testing standard, judge that this device is as qualified, otherwise judge that this LED component is as defective.
Adopt said method to carry out automatic test, test result finds, adopt the method test, statistical test efficiency is >=12 k/h, reaches industry conventionally test efficiency, and this plays an important role for the test of low-light level LED component and affect.
embodiment 2
The test sample of the present embodiment is LED COB module, and for meeting the first display screen requirement of more high-resolution LED indoor, LED COB module has more obvious advantage.Based on this, the present embodiment to 2 × 2 LED COB module making and test, it comprises 4 groups of R, G, B LED chips, as shown in Figure 5.According to technique scheme, N=12, n=1,2,3 ... 12.As shown in Figure 6, concrete testing process is as follows:
1) light LED COB module to be measured, test and record the light-emitting data D of LED COB module
n;
2) close the R1 LED chip in LED COB module, light remaining chip, test and record light-emitting data D
n-1; Contrast light-emitting data D
nwith D
n-1, calculate the light-emitting data D of R1 LED chip
r1; By D
r1with the testing standard data D of the R LED chip preset
r0contrast, if D
r1meet testing standard data, enter downstream, otherwise judge that this device is as defective;
3) close the G1 LED chip in LED COB module, light remaining chip, test and record light-emitting data D
n-2; Contrast light-emitting data D
nwith D
n-2, calculate the light-emitting data D of G1 LED chip
g1; By D
g1with the testing standard data D of the G LED chip preset
g0contrast, if D
g1meet testing standard data, enter downstream, otherwise judge that this device is as defective;
4) close the B1 LED chip in LED COB module, light remaining chip, test and record light-emitting data D
n-3; Contrast light-emitting data D
nwith D
n-3, calculate the light-emitting data D of B1 LED chip
b1; By D
b1with the testing standard data D of the B LED chip preset
b0contrast, if D
b1meet testing standard data, enter downstream, otherwise judge that this device is as defective;
5) repeat flow process 2) ~ 4) method, the light-emitting data of R2, G2, B2, R3, G3, B3, R4, G4, B4 LED chip of the LED COB module of test 2 × 2 also judges whether qualified, if all LED chips are all qualified, judges that this LED component is qualified.
In test, the light-emitting data of any LEDs chip does not meet default testing standard data, judges that this LED COB module is as defective, carries out LED module test, so circulates.
In LED COB module testing in the present embodiment, testing efficiency is high, for the spectrophotometric test sorting of LED COB module, plays an important role.
embodiment 3
On the basis of embodiment 2, adjustment test procedure, test similar chip successively respectively, as shown in Figure 7, concrete testing process is as follows:
1) R1 ~ R4 LED chip lighted in LED COB module is tested and is recorded the light-emitting data D of LED COB module
r;
2) close R1 LED chip, light R2 ~ R4 LED chip, remaining chip does not all work, and tests and records light-emitting data D
n-1, contrast light-emitting data D
rwith D
n-1, calculate the light-emitting data D of R1 LED chip
r1; By D
r1with the testing standard data D of the R LED chip preset
r0contrast, if D
r1meet testing standard data, enter downstream, otherwise judge that this device is as defective;
3) close R2 LED chip, light R1, R3, R4 LED chip, remaining chip does not all work, and tests and records light-emitting data D
n-2, contrast light-emitting data D
rwith D
n-2, calculate the light-emitting data D of R2 LED chip
r2; By D
r2with the testing standard data D of the R LED chip preset
r0contrast, if D
r2meet testing standard data, enter downstream, otherwise judge that this device is as defective;
4) close R3 LED chip, light R1, R2, R4 LED chip, remaining chip does not all work, and tests and records light-emitting data D
n-3, contrast light-emitting data D
rwith D
n-3, calculate the light-emitting data D of R3 LED chip
r3; By D
r3with the testing standard data D of the R LED chip preset
r0contrast, if D
r3meet testing standard data, enter downstream, otherwise judge that this device is as defective;
5) close R4 LED chip, light R1 ~ R3 LED chip, remaining chip does not all work, and tests and records light-emitting data D
n-4, contrast light-emitting data D
rwith D
n-4, calculate the light-emitting data D of R4 LED chip
r4; By D
r4with the testing standard data D of the R LED chip preset
r0contrast, if D
r4meet testing standard data, enter downstream, otherwise judge that this device is as defective;
6) repeat flow process 1) ~ 5) method, test the light-emitting data of G1 ~ G4, B1 ~ B4 LED luminescence chip respectively, if all LED chips are all qualified, judge that this LED component is qualified.
In test, the light-emitting data of any LEDs chip does not meet default testing standard data, judges that this LED COB module is as defective, carries out module testing, so circulates.
The present embodiment scheme has the test of strict demand for the sorting wavelength of LED COB device or module, and the error that testing scheme can avoid the interference of different chip chamber wavelength to produce, ensures the accuracy of wavelength measurement data.Relative to the testing scheme of embodiment 2, the testing scheme efficiency of the present embodiment declines to some extent, but can meet testing requirement.
From embodiment 1-3, the photoelectric test method of LED component of the present invention, can the optic test comprising multi-form LED component, module and the module product such as SMD LED and COB LED be met, improve efficiency and the accuracy rate of small area analysis LED component photoelectricity test.
embodiment 4
The opto-electronic testing apparatus of the present embodiment LED component is device corresponding to embodiment 1-3 method of testing, said method is implemented on the basis of device, can realize the target of the photoelectricity test of LED component of the present invention.
An opto-electronic testing apparatus for LED component, comprising:
Light emitting control module: for lighting all or part of LED chip of LED component to be measured, or close wherein one or many of the LED chip lighted;
Data collection module: for collecting the light-emitting data of LED component to be measured, send data analysis module to;
Data analysis module: for LED chip that light-emitting data when lighting all or part of LED chip of LED component to be measured and closing is lighted wherein one or many time light-emitting data compare analysis, calculate the light-emitting data of this or plurality of LEDs chip;
Decision-making module: the light-emitting data of LED chip for being obtained by data analysis module compares with the standard luminescent data preset, judge this or plurality of LEDs chip whether qualified.
In specific implementation process, described light-emitting data comprises brightness, wavelength, light intensity, described LED component to be measured is SMD LED component or LED COB module, and the some light current of R, G, B LED chip of described LED component to be measured is respectively 1mA, 0.3mA, 0.2mA.
The corresponding same or analogous parts of same or analogous label;
The term describing position relationship in accompanying drawing, only for exemplary illustration, can not be interpreted as the restriction to this patent;
Obviously, the above embodiment of the present invention is only for example of the present invention is clearly described, and is not the restriction to embodiments of the present invention.For those of ordinary skill in the field, can also make other changes in different forms on the basis of the above description.Here exhaustive without the need to also giving all embodiments.All any amendments done within the spirit and principles in the present invention, equivalent to replace and improvement etc., within the protection domain that all should be included in the claims in the present invention.
Claims (10)
1. a photoelectric test method for LED component, is characterized in that, comprises the following steps:
S1: all or part of LED chip lighting LED component to be measured, tests and records light-emitting data;
S2: wherein one or many that closes the LED chip lighted in step S1, test and record light-emitting data;
S3: the light-emitting data recorded according to S1 and S2, calculates the light-emitting data of this or plurality of LEDs chip;
S4: the light-emitting data of this or plurality of LEDs chip and the standard luminescent data preset are compared, judge this or plurality of LEDs chip whether qualified, if this or plurality of LEDs chip defective, then judge that this LED component to be measured is defective; If this or plurality of LEDs chip qualified, then repeat the method for step S1 ~ S4, continue to judge that whether all the other LED chips of this LED component to be measured qualified, if whole LED chips of LED component to be measured are all qualified, then judge that this LED component is qualified.
2. the photoelectric test method of LED component according to claim 1, is characterized in that, described light-emitting data comprises brightness, wavelength and light intensity.
3. the photoelectric test method of LED component according to claim 1, is characterized in that, described LED component to be measured is SMD LED component or LED COB module.
4. the photoelectric test method of LED component according to claim 3, is characterized in that, when described LED component to be measured is LED COB module, tests respectively R, G, B LED chip.
5. the photoelectric test method of LED component according to claim 1, is characterized in that, adopts steady current to control to power for LED component to be measured.
6. the photoelectric test method of LED component according to claim 1, is characterized in that, the some light current of R, G, B LED chip of described LED component to be measured is respectively 1mA, 0.3mA, 0.2mA.
7. an opto-electronic testing apparatus for LED component, is characterized in that, comprising:
Light emitting control module: for lighting all or part of LED chip of LED component to be measured, or close wherein one or many of the LED chip lighted;
Data collection module: for collecting the light-emitting data of LED component to be measured, send data analysis module to;
Data analysis module: for LED chip that light-emitting data when lighting all or part of LED chip of LED component to be measured and closing is lighted wherein one or many time light-emitting data compare analysis, calculate the light-emitting data of this or plurality of LEDs chip;
Decision-making module: the light-emitting data of LED chip for being obtained by data analysis module compares with the standard luminescent data preset, judge this or plurality of LEDs chip whether qualified.
8. the opto-electronic testing apparatus of LED component according to claim 7, is characterized in that, described light-emitting data comprises brightness, wavelength, light intensity.
9. the opto-electronic testing apparatus of LED component according to claim 7, is characterized in that, described LED component to be measured is SMD LED component or LED COB module.
10. the opto-electronic testing apparatus of LED component according to claim 7, is characterized in that, the some light current of R, G, B LED chip of described LED component to be measured is respectively 1mA, 0.3mA, 0.2mA.
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