CN102650567A - Detection system and detection method of cluster type LED chip - Google Patents

Detection system and detection method of cluster type LED chip Download PDF

Info

Publication number
CN102650567A
CN102650567A CN2011101890577A CN201110189057A CN102650567A CN 102650567 A CN102650567 A CN 102650567A CN 2011101890577 A CN2011101890577 A CN 2011101890577A CN 201110189057 A CN201110189057 A CN 201110189057A CN 102650567 A CN102650567 A CN 102650567A
Authority
CN
China
Prior art keywords
led chip
formula led
gathering together
detection system
optical detector
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
CN2011101890577A
Other languages
Chinese (zh)
Inventor
翁思渊
陈正雄
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Chroma ATE Inc
Original Assignee
Chroma ATE Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Chroma ATE Inc filed Critical Chroma ATE Inc
Publication of CN102650567A publication Critical patent/CN102650567A/en
Pending legal-status Critical Current

Links

Images

Landscapes

  • Led Devices (AREA)
  • Testing Of Optical Devices Or Fibers (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)

Abstract

A detection system of cluster type LED chips is used for detecting the working state of a cluster type LED chip and comprises a bearing unit, a power supply and an optical detector; the bearing unit is used for bearing the cluster type LED chip; the power supply is used for providing a rated working current for the cluster type LED chip so as to enable the cluster type LED chip to emit a working light beam; the optical detector is used for receiving the working light beam and judging the working state according to the working light beam; in addition, the invention also discloses a detection method of the cluster type LED chip.

Description

The detection system and the detection method of the formula of gathering together led chip
Technical field
The present invention relates to a kind of detection system of the formula led chip of gathering together, relate in particular to a kind of in order to the gather together detection system of duty of formula led chip of check.
Background technology
Along with light emitting diode (Light Emitting Diode; LED) maturation of technology, LED is used in lighting field widely, and for more diversified lighting system is provided, concentrates the formula of the gathering together led chip of plurality of LEDs on one chip also to receive the attention of many manufacturers.
Yet compared to the led chip that only has single LED unit; The formula of gathering together led chip has blind spot always on detecting; Please with reference to Fig. 1, Fig. 1 is the synoptic diagram of formula led chip of gathering together, and the formula led chip 100 of gathering together can comprise a plurality of LED unit 11; When having minority LED unit 11 unusually in the formula led chip 100 of gathering together; May cause the formula led chip 100 of gathering together when lighting, to have subregion brightness lower, and employed electrical detection mode in the prior art have sizable probability and can not detect such unusual condition; This is because minority LED unit 11 possibly only can cause the very decline of trace of total current unusually, and makes total current drop within the acceptability limit of detection.
In addition; Prior art also can utilize spectrometer to detect the optical characteristics of led chip; Yet such optical detection only can check whether integral color and brightness that the formula led chip 100 of gathering together emits beam is correct, still can't detect dark space among a small circle on the formula led chip 100 of gathering together.
Summary of the invention
Technical matters and purpose that institute of the present invention desire solves:
Edge this; It is a kind of in order to the gather together detection system and the detection method of duty of formula led chip of check that fundamental purpose of the present invention is to provide; This detection system and detection method can detect the duty of formula led chip when lighting of gathering together, defectiveness whether when gathering together the actual use of formula led chip with differentiation.
The technological means that the present invention deals with problems:
A kind of formula light emitting diode of gathering together (Light Emitting Diode; LED) detection system of chip, in order to detect one gather together the formula led chip duty, this detection system comprises load bearing unit, power supply unit and optical detector; Load bearing unit is in order to carry this formula led chip of gathering together; Power supply unit makes this formula led chip of gathering together send a working beam in order to this formula led chip one rated operational current of gathering together to be provided, to use; Optical detector is in order to receiving this working beam, and judges this duty according to this.
In a preferred embodiment of the present invention, this optical detector is an automatic optical detector (Automated Optical Inspection; AOI).
In a preferred embodiment of the present invention, this optical detector comprises image acquisition unit and judging unit, and image acquisition unit and sends this work image in order to receive this working beam to obtain a work image; Judging unit receives this work image in order to this image acquisition unit certainly, and judges this duty according to this; And the preferably among this embodiment, this judging unit can be an industrial computer.
In a preferred embodiment of the present invention, this judging unit is divided into this work image area between a plurality of comparison area, and the brightness between those comparison area is differentiated.
In a preferred embodiment of the present invention, the detection system of the formula of gathering together led chip can also comprise an attenuator, and this attenuator is arranged at before this optical detector, uses this working beam of decay.
In a preferred embodiment of the present invention, the detection system of the formula of gathering together led chip can also comprise a current adjustment unit, and this current adjustment unit is electrically connected at this power supply unit and this is gathered together between the formula led chip, uses this rated operational current of adjustment.
The present invention also discloses a kind of detection method of the formula led chip of gathering together, and comprises following steps: a rated operational current to the formula led chip of gathering together (a) is provided, uses making this formula led chip of gathering together send a working beam; (b) receive this working beam with an optical detector, to obtain a work image; (c) utilize this optical detector that this work image is differentiated, to obtain a duty.
The present invention's effect against existing technologies:
Utilize electrically or spectrometer detects the detection mode of the formula led chip of gathering together compared to existing; The detection system of the formula led chip of gathering together of the present invention and detection method can be when the formula led chip of gathering together be lighted; Whether have abnormal dark space produce, therefore can effectively promote the fiduciary level that detects the formula led chip of gathering together if determining the formula led chip of gathering together.
Describe the present invention below in conjunction with accompanying drawing and specific embodiment, but not as to qualification of the present invention.
Description of drawings
Fig. 1 is the synoptic diagram of formula led chip of gathering together;
Fig. 2 is the first preferred embodiment synoptic diagram of detection system of the present invention;
Fig. 3 is the second preferred embodiment synoptic diagram of detection system of the present invention;
Fig. 4 is the subregion comparison synoptic diagram of work image; And
Fig. 5 is a detection method process flow diagram of the present invention.
Wherein, Reference numeral
The formula of gathering together led chip 100
LED unit 11
Load bearing unit 21
Power supply unit 22
Optical detector 23
Image acquisition unit 231
Judging unit 232
Attenuator 24
Current adjustment unit 25
Work image P1
Z1, Z2 between comparison area
Detection method process flow diagram S101~S107
Embodiment
The present invention is about a kind of detection system of the formula led chip of gathering together, and refers to a kind of in order to the gather together detection system of duty of formula led chip of check especially.Below enumerate a preferred embodiment now with explanation the present invention, right those skilled in the art know that all this is merely one for example, and are not in order to limit invention itself.The detailed description of relevant this preferred embodiment is following.
See also Fig. 2 and Fig. 3, Fig. 2 is the first preferred embodiment synoptic diagram of detection system of the present invention, and Fig. 3 is the second preferred embodiment synoptic diagram of detection system of the present invention.The detection system of the formula led chip 100 of gathering together of the present invention, in order to detect one gather together formula led chip 100 duty, this detection system comprises load bearing unit 21, power supply unit 22 and optical detector 23.
Load bearing unit 21 is in order to carry this formula led chip 100 of gathering together; Power supply unit 22 is to make this formula led chip 100 of gathering together send a working beam in order to this formula led chip 100 1 rated operational currents of gathering together to be provided, to use.
Optical detector 23 is in order to receiving this working beam, and judges this duty according to this; Wherein, in a preferred embodiment of present embodiment, optical detector can be an automatic optical detector (Automated Optical Inspection; AOI); Yet in the prior art, the AOI board is in order to the outward appearance that detects determinand whether flaw to be arranged, and its detection mode is to illuminate determinand with external light source; Whether the surface of judging determinand thereafter again has flaw; Can judge the position of flaw when the advantage of AOI board is to detect outward appearance simultaneously, yet if the brightness of determinand outward appearance is too high, the AOI board just can't judge correctly whether the determinand outward appearance has the position of flaw and flaw.
Therefore if use the AOI board as the optical detector among the present invention 23, the preferably in present embodiment so, detection system can also comprise an attenuator 24, and this attenuator 24 is to be arranged at before this optical detector 23, uses this working beam of decay; Or detection system can comprise a current adjustment unit 25, and this current adjustment unit 25 is to be electrically connected at this power supply unit 22 and this is gathered together between the formula led chip 100, uses this rated operational current of adjustment; Above-mentioned dual mode can reduce the brightness of the received light of optical detector 23, so that optical detector 23 can accurately be judged the duty of the formula led chip 100 of gathering together.
In order to make the efficient of detection higher; Attenuator 24 can be to be made up of at least one decay filter; And the light that is directed against one or more wavelength filters; And optimal situation is to let light luminance difference that optical detector 23 received when gathering together formula led chip 100 operate as normal less than 1%; And the 23 reception required time shutter of working beam of optical detector can be controlled within the 5ms, and when the formula led chip 100 of gathering together had the dark space to produce, the brightness of dark space only had 10%~80% of normal brightness; If use current adjustment unit 25 to reduce the brightness of working beam; Rated operational current turned down be original 50%; The brightness of working beam will be reduced to 60% so, thus the amplitude turned down of rated operational current must to let the 23 required time shutter of optical detector can be controlled within the 5ms comparatively desirable.
See also Fig. 4, Fig. 4 is the subregion comparison synoptic diagram of work image.Preferably in present embodiment; Optical detector 23 can be to comprise image acquisition unit 231 and judging unit 232; Image acquisition unit 231 is in order to receive this working beam to obtain a work image P1; And sending this work image P1, judging unit 232 is to receive this work image P1 in order to this image acquisition unit 231 certainly, and judges this duty according to this; And the preferably in present embodiment, judging unit can be an industrial computer; In addition, this judging unit 232 can be divided into Z1 and Z2 between a plurality of comparison area with this work image P1, and the brightness of Z1 and Z2 between those comparison area is differentiated, and can learn whether the formula led chip 100 of gathering together has the dark space to produce; Be stressed that Z1 and Z2 can do design according to the distributing position of LED unit 11 on the formula led chip 100 of gathering together between comparison area, but can certainly be to do design with arbitrary shape and size.
Please consult Fig. 5 simultaneously, Fig. 5 is detection method process flow diagram of the present invention.Detection method of gathering together the formula led chip of the present invention comprises following steps:
S101: light the formula led chip 100 of gathering together, make the formula led chip 100 emission working beams of gathering together;
S103: when optical detector 23 is the AOI board, can see through attenuator 24 decay working beams, or seeing through current adjustment unit 25 reduces rated operational currents, use and reduce the received light intensity of optical detector 23;
S105: optical detector 23 receives the working beam that the formula led chip 100 of gathering together is sent; And
S107: optical detector 23 receive working beam after obtain work image P1, and work image P1 is differentiated.
Utilize electrically or spectrometer detects the detection mode of the formula led chip 100 of gathering together compared to existing; The detection system of the formula led chip 100 of gathering together of the present invention and detection method can be when the formula led chip 100 of gathering together be lighted; Whether determine the formula led chip 100 of gathering together has abnormal dark space to produce; And if use the AOI board in detection system of the present invention and detection method; Also can overcome the shortcoming that existing AOI board only can detect passive luminous determinand, comprehensive above advantage, the fiduciary level of formula led chip 100 but the knowledge capital invention can very effective lifting detection be gathered together.
Certainly; The present invention also can have other various embodiments; Under the situation that does not deviate from spirit of the present invention and essence thereof; Those of ordinary skill in the art work as can make various corresponding changes and distortion according to the present invention, but these corresponding changes and distortion all should belong to the protection domain of the appended claim of the present invention.

Claims (10)

1. detection system of formula led chip of gathering together, in order to detect one gather together the formula led chip a duty, it is characterized in that this detection system comprises:
One load bearing unit is in order to carry this formula led chip of gathering together;
One power supply unit makes this formula led chip of gathering together send a working beam in order to this formula led chip one rated operational current of gathering together to be provided, to use; And
One optical detector in order to receiving this working beam, and is judged this duty according to this.
2. the detection system of the formula led chip of gathering together according to claim 1 is characterized in that, this optical detector is an automatic optical detector.
3. the detection system of the formula led chip of gathering together according to claim 1 is characterized in that, this optical detector comprises:
One image acquisition unit in order to receive this working beam to obtain a work image, and sends this work image; And
One judging unit receives this work image in order to this image acquisition unit certainly, and judges this duty according to this.
4. the detection system of the formula led chip of gathering together according to claim 3 is characterized in that, this judging unit is an industrial computer.
5. the detection system of the formula led chip of gathering together according to claim 3 is characterized in that, this judging unit is divided into this work image area between a plurality of comparison area, and the brightness between those comparison area is differentiated.
6. the detection system of the formula led chip of gathering together according to claim 1 is characterized in that, also comprises an attenuator, and this attenuator is arranged at before this optical detector, uses this working beam of decay.
7. the detection system of the formula led chip of gathering together according to claim 1 is characterized in that, also comprises a current adjustment unit, and this current adjustment unit is electrically connected at this power supply unit and this is gathered together between the formula led chip, uses this rated operational current of adjustment.
8. the detection method of formula led chip of gathering together is characterized in that, comprises:
(a) rated operational current to the formula led chip of gathering together is provided, uses making this formula led chip of gathering together send a working beam;
(b) receive this working beam with an optical detector, to obtain a work image; And
(c) utilize this optical detector that this work image is differentiated, to obtain a duty.
9. the detection method of the formula led chip of gathering together according to claim 8 is characterized in that, in step (b) before, also comprising provides an attenuator before this optical detector, uses this working beam of decay.
10. the detection method of the formula led chip of gathering together according to claim 8; It is characterized in that in step (a), also comprising provides a current adjustment unit; Make this current adjustment unit be electrically connected at this power supply unit and this is gathered together between the formula led chip, use this rated operational current of adjustment.
CN2011101890577A 2011-02-23 2011-06-30 Detection system and detection method of cluster type LED chip Pending CN102650567A (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
TW100105958 2011-02-23
TW100105958A TWI417976B (en) 2011-02-23 2011-02-23 The detection system and detection method of cluster LED chip

Publications (1)

Publication Number Publication Date
CN102650567A true CN102650567A (en) 2012-08-29

Family

ID=46692622

Family Applications (1)

Application Number Title Priority Date Filing Date
CN2011101890577A Pending CN102650567A (en) 2011-02-23 2011-06-30 Detection system and detection method of cluster type LED chip

Country Status (2)

Country Link
CN (1) CN102650567A (en)
TW (1) TWI417976B (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN104237808A (en) * 2014-07-28 2014-12-24 四川大学 Electronic police system light supplementary lamp fault detecting method based on image abnormities
CN110514927A (en) * 2019-08-16 2019-11-29 惠州Tcl移动通信有限公司 The unit exception detection method of mobile terminal, computer-readable medium
CN114823408A (en) * 2022-05-05 2022-07-29 无锡美科微电子技术有限公司 Wafer detection system and wafer detection method

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN101093246A (en) * 2006-06-22 2007-12-26 上海理工大学 Intellectualized online system for testing illuminating quality of headlight of an automobile built from LED
CN201149540Y (en) * 2007-10-25 2008-11-12 珠海华冠光电技术有限公司 LED optical detector
CN201247098Y (en) * 2008-09-03 2009-05-27 长春希达电子技术有限公司 Test system for LED display screen pixel array light intensity distribution
CN101738251A (en) * 2008-11-12 2010-06-16 纬创资通股份有限公司 Automatic test system and method

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5304211B2 (en) * 2008-12-11 2013-10-02 ソニー株式会社 Display device, brightness adjusting device, backlight device, brightness adjusting method and program
TWM362493U (en) * 2009-03-05 2009-08-01 Hiromi System Co Ltd Testing device for display

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN101093246A (en) * 2006-06-22 2007-12-26 上海理工大学 Intellectualized online system for testing illuminating quality of headlight of an automobile built from LED
CN201149540Y (en) * 2007-10-25 2008-11-12 珠海华冠光电技术有限公司 LED optical detector
CN201247098Y (en) * 2008-09-03 2009-05-27 长春希达电子技术有限公司 Test system for LED display screen pixel array light intensity distribution
CN101738251A (en) * 2008-11-12 2010-06-16 纬创资通股份有限公司 Automatic test system and method

Non-Patent Citations (1)

* Cited by examiner, † Cited by third party
Title
ELODIE MAHLER ET AL: "Testing LED Lighting for Colour Discrimination and Colour Rendering", 《COLOR RESEARCH AND APPLICATION》 *

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN104237808A (en) * 2014-07-28 2014-12-24 四川大学 Electronic police system light supplementary lamp fault detecting method based on image abnormities
CN104237808B (en) * 2014-07-28 2017-01-18 四川大学 Electronic police system light supplementary lamp fault detecting method based on image abnormities
CN110514927A (en) * 2019-08-16 2019-11-29 惠州Tcl移动通信有限公司 The unit exception detection method of mobile terminal, computer-readable medium
CN114823408A (en) * 2022-05-05 2022-07-29 无锡美科微电子技术有限公司 Wafer detection system and wafer detection method
CN114823408B (en) * 2022-05-05 2023-10-24 无锡美科微电子技术有限公司 Wafer detection system and wafer detection method

Also Published As

Publication number Publication date
TWI417976B (en) 2013-12-01
TW201236096A (en) 2012-09-01

Similar Documents

Publication Publication Date Title
CN101712926B (en) For the device of microbiological analysis
CN102721694A (en) Apparatus for inspecting light emitting diode and inspecting method using said apparatus
JP2015145869A (en) lighting module and appearance inspection system using the same
CN102959385A (en) Detection device of printed circuit board
CN102650567A (en) Detection system and detection method of cluster type LED chip
US20130262006A1 (en) White LED Quality Inspection Method and Device
CN101963527A (en) The illuminator of brightness impression examining system and this system of use
CN102752942B (en) Special point light emitting diode (LED) light source lamp for railway signals
KR20140012342A (en) Inspection apparatus for led module
US20090219534A1 (en) Imaging device for solder paste inspection
CN105300666A (en) LED lamp strip detection device and method
US7872484B2 (en) Chip pin test apparatus
CN104797052A (en) Annular high-brightness LED light source for machine vision systems
US20100053626A1 (en) Mounting test method
CN102325409B (en) Machine vision light source system and control method thereof
CN102865514B (en) Surface defect detection line light source
CN206497716U (en) Backlight source driving circuit, backlight module and display device
CN112326667A (en) Copper-clad detection method and device for conductive connecting hole
CN104880466A (en) Chip detection method
CN202676609U (en) Semiconductor module detection equipment
CN114126132B (en) Method and device for determining parameters of LED in gear illumination controller
CN114395906B (en) Quick turning and detecting auxiliary mechanism for socks of hosiery machine
CN110426795A (en) The function indicating means of optical module and optical module
US11028978B2 (en) Light source module and illumination device
CN111458107A (en) Automatic detection system and method thereof

Legal Events

Date Code Title Description
C06 Publication
PB01 Publication
C10 Entry into substantive examination
SE01 Entry into force of request for substantive examination
C12 Rejection of a patent application after its publication
RJ01 Rejection of invention patent application after publication

Application publication date: 20120829