M362493 五、新型說明： 【新型所屬之技術領域】 . 賴作是有關於"軸㈣檢職置，尤指~種可使本創 作運用於顯示器檢測，而可對顯示器之缺陷種類進行分析與統 計’達到快速以及準確朗之功效，以提升顯示裝置之製程 率者。 义 【先前技術】 由於科技快速進步與資訊產品普及，現代人類的生活已經 無法脫離資訊電子產品’顯示器也因此成為人類與機器之間的 重要溝通界面，顯示技術相關產業所涵蓋的内容相當廣泛；過 去人機界面採用陰極映像射線管(Cath〇de Ray Tube，CRT)可以 說是唯一選擇，但因CRT體積大、耗電量大及輻射線強等缺 點頗被使用人士所Ί后病。 而目前光電科技產業基於空間、環保、省能源等課題上尋 求解決之道’積極開發平面面板型之顯示器(FlatPanelDisplay 簡稱FPD);經多年研究開發終已有純熟產品推出可以替代 CRT ’如電漿面板顯示器(pDp)、液晶顯示器(Uquid Crystal Display，LCD)、有機電激發光顯示器(〇leD)，真空螢光顯示 器(WD)、場發射顯示器(FED)、投影式微型顯器（Micro Display)、及前瞻性3D顯示技術等類型。一般顯示器係可分 為TN、STN及TFT(薄膜電晶體)等三類，其中TN-LCD開發 最早’結構也較為簡單，顯示品質、反應速度及視角較差，一 般主要是應用於顯示簡單數字與文字的小尺寸螢幕，而 3 M362493 STN-LCD則影像品質及反應速度優於，主要應用於 對反應速度要求較快之商品，另該薄膜電晶體液晶顯示器 (TFT-LCD ’ Thin Film Transistor-Liquid Crystal Display)是屬於 多種平面顯示H中的其中—種，由於具有低電壓、低耗電驅動 之省能源優點、以及體積則、攜帶枝之躲，是傳統crt 顯示器所不及；除此之外，TFT_LCD平面驗可大型化、影 像解析度高、無輻射產生、產品壽命長等，且其應用範圍廣泛， 可用於大尺寸筆記型電腦、桌上型電腦、t視機、數位相機、 液晶投影鮮商品上’更是TFT_LCD之所崎㈣發 要因素。 而於該些顯示器之製程中，每道製程的基板須經過檢測以 確保品質和減少報廢片的產生。目前使用的檢測方式主要分為 、電氣檢查和目視檢查；自動光學檢查為常見的 來檢出里二取得成品的表面狀態，以影像處理 的檢查；而目視檢查是狀眼來完成 欢—的功月&，如：工程内的外觀 、 板模組的最終書質檢杳，目域鏡的表面檢查或面 為主，因此，絲_顯稍置之缺__行m 製程良率;故，一般二:ί Γ進而降低顯示裝置之 用時之所需。a用之顯不器檢測方式並無法符合實際使 【新型内容】 本創作之主要目的係在於，可使本創細於顯示器檢 4 M362493 測’而可對顯示n之缺__行分析與統計，達到快速以及 準確檢測之功效，以提升顯示裝置之製程良率。 為達上述之目的，本創作係—麵示器檢職置，其包含 至^可掏取所需影像之影像娜機構；至少一與影像搁取機 構連接可接«彡像並進油_觀_之處理機構，盆至少 包括有-運算單元、以及分職運算單元連接之前處理過遽 器、影像處理H與連接介面，*該前處理過濾_連接有第 一、二影像龍緩衝單元朗步處理器，且該影像處理器與 接介面之間係連接有記憶單元；以及一與連接介面連接之糾斤 機構，可接收分析判斷後之影像並加以分類。 【實施方式】 請參閱『第i圖』所示，係本創作之基本架構示意圖。 圖所示：本創作係-麵示器檢測裝置，其係由至少一 取機構1、至少一處理機構2以及-分析機構3所構成二° 上述所k之影像擷取機構1可供擷取所需之影/ 像擷取機構1係可為CCD。 石人的 、該處理機構2係與影像擷取機構連接工，可供接 進行相關之處理及比對，其至少包括有—運算單元、、、 =與運算單元2 !連接之前處理過濾器2 2、影像處理= 3厂連接介面2 4 ’而該前處理過濾、器2 2則連接有第一。、_ 衫像資料緩衝單元2 5、2 6及同步處理H2 7，且該巧 理器2 3與連接介面2 4之間係連接有記憶單元2 8，=处 運算單Ml射供作猶處理猶“2、影像處理器^ 5 M362493 3、連接介面2 4、第一、二影像資料緩衝單元25、26、 同步處理H 2 7及記憶單元2 8進行啟動時之運算，而該同步 處理器2 7可供將前處理過濾器2 2、影像處理器2 3、連^ 介面2 4、第-、二影像資料缓衝單元2 5、2 6及記憶翠元 2 8進行啟動時之同步化。 /該分析機構3係與連接介面2 4連接，可供接收分析判斷 後之影像並加以分類，而該分析機構3係可為一電腦。 請參閱『第2及第3圖』所示’係分別為係本創作之運用 1 狀態示意圖及創作運用狀態之方塊示意圖。如圖所示：當本創 作於運用時（請同時配合參閱第i圖），係可將本創作^置於 液晶面板之輸送平台4上，而配合影像擷取機構1、處理機構 2以及分析機構3作為顯示器檢測之用，而於實際運用時係 可將多數影像擷取機構1設於輸送平台4上，並使每一影像擷 取機構1配合一處理機構2，且將各處理機構2與一分析機構 3連接，如此，便可執行顯示器檢測之相關動作； 而當顯不裝置5於輸送平台4上通過各影像擷取機構工 時，各影像擷取機構1便將所擷取之影像傳輸至第—影像資料 緩衝單元2 5，之後再配合運算單元2 χ與同步處理器27之 運作，而由該前處理過遽器2 2係可供濾除不需要之影像，而 將所需之影像加以保留，其他影像則由前處理過濾器2 2透過 第二影像資料緩衝單元傳輸至下一個處理機構2(依此類 推）’並將保留之影像傳輸至該影像處理器2 3進行接收且 同時以影像處理器2 3將前處理過濾器2 2傳輸之影像進行 傅立葉轉換，之後躲行點狀痕跡、條狀痕跡、破裂、鱗污及 刮痕之比對’並將該些比對結果傳輸至記憶單元2 8進行儲 6 M362493 條狀痕跡、破裂、髒污及刮痕之缺 ====，她⑽^= =使糊糊簡===== =類進行分析與統計，達频軌及準確制之功效，以提M362493 V. New description: [New technical field] The Lai is related to the "axis" (IV) inspection position, especially the kind of application can be used for display detection, and the defect types of the display can be analyzed and Statistics 'to achieve fast and accurate performance to improve the processing rate of the display device. Yi [Prior Art] Due to the rapid advancement of technology and the popularization of information products, modern human life can no longer be separated from information electronics. The display has become an important communication interface between humans and machines. The display technology-related industries cover a wide range of contents; In the past, the human-machine interface using Cath〇de Ray Tube (CRT) can be said to be the only choice, but because of the large size of CRT, large power consumption and strong radiation, it is quite ill. At present, the optoelectronic technology industry seeks solutions based on the issues of space, environmental protection and energy conservation. 'Actively develop flat panel type display (FlatPanelDisplay for short); after years of research and development, the ready-made products can replace CRT 'such as plasma Panel display (pDp), liquid crystal display (LCD), organic electroluminescent display (〇leD), vacuum fluorescent display (WD), field emission display (FED), projection micro display (Micro Display) And forward-looking 3D display technology and other types. The general display system can be divided into three categories: TN, STN and TFT (thin film transistor). Among them, the earliest development of TN-LCD is simple, and the display quality, reaction speed and viewing angle are poor. Generally, it is mainly used to display simple numbers and The small size screen of the text, while the 3 M362493 STN-LCD is superior in image quality and response speed, mainly used for products requiring fast response speed, and the thin film transistor liquid crystal display (TFT-LCD 'Thin Film Transistor-Liquid Crystal Display) is one of many kinds of flat display H. It has the energy-saving advantages of low voltage and low power consumption, as well as the volume and carrying of the branches. It is beyond the reach of traditional crt displays; TFT_LCD plane inspection can be large-scale, high image resolution, no radiation generation, long product life, etc., and its wide range of applications, can be used for large-size notebook computers, desktop computers, t-cameras, digital cameras, LCD projection On the merchandise, it is the factor of the TFT_LCD. In the process of these displays, each process of the substrate must be tested to ensure quality and reduce the generation of scrap. At present, the detection methods used are mainly divided into electrical inspections and visual inspections; automatic optical inspections are common to detect the surface state of the finished product, and the image processing is checked; and the visual inspection is to complete the joy of the image. Month &, such as: the appearance of the project, the final book quality inspection of the board module, the surface inspection of the eyepiece mirror or the surface is mainly, therefore, the silk_display is slightly lacking __ line m process yield; , generally two: ί Γ and thus reduce the need for the use of the display device. a use of the display detection method does not conform to the actual [new content] The main purpose of this creation is to make this creation fine on the monitor 4 M362493 test 'can be used to display the lack of __ line analysis and statistics To achieve fast and accurate detection to improve the process yield of the display device. In order to achieve the above purposes, the creative department is an inspector, which includes an image camera that can capture the desired image; at least one is connected to the image shelving mechanism to connect with the image and enter the oil_view_ The processing mechanism includes at least an operation unit and a sub-operation unit connected to the device, the image processing H and the connection interface, and the pre-processing filter _ is connected to the first and second image dragon buffer units. And a memory unit is connected between the image processor and the interface; and a charging mechanism connected to the connection interface can receive and classify the image after analysis and judgment. [Embodiment] Please refer to the "I" diagram, which is a schematic diagram of the basic structure of this creation. The drawing system of the present invention is composed of at least one taking mechanism 1, at least one processing mechanism 2, and an analyzing mechanism 3. The image capturing mechanism 1 of the above k is available for drawing. The desired shadow/image capture mechanism 1 can be a CCD. The stone human, the processing mechanism 2 is connected with the image capturing mechanism, and can be connected to perform related processing and comparison, and at least includes the - computing unit, , = and the computing unit 2! 2. Image processing = 3 factory connection interface 2 4 ' and the pre-processing filter 2 2 is connected first. , _ shirt image buffer unit 2 5, 2 6 and synchronization processing H2 7, and the connection between the router 2 3 and the connection interface 24 is connected to the memory unit 2 8, = operation unit Ml shot for processing Still, "2, image processor ^ 5 M362493 3, connection interface 2 4, first and second image data buffer units 25, 26, synchronization processing H 2 7 and memory unit 28 perform the operation at startup, and the synchronization processor 2 7 can be used to synchronize the pre-processing filter 2, the image processor 2 3, the interface 2 4, the first and second image data buffer units 2 5, 26 and the memory of the Cuiyuan 2 8 / The analysis mechanism 3 is connected to the connection interface 24 for receiving and classifying the image after analysis and judgment, and the analysis mechanism 3 can be a computer. Please refer to the "Figures 2 and 3" The system is a block diagram of the state of the application and the state of the creation and application of the creation. As shown in the figure: When the creation is used (please refer to the i-th image at the same time), the creation can be placed on the LCD panel. On the transport platform 4, with the image capturing mechanism 1, the processing mechanism 2, and the analyzing mechanism 3 For the purpose of detecting the display, in practice, the majority of the image capturing mechanism 1 can be disposed on the conveying platform 4, and each image capturing mechanism 1 cooperates with a processing mechanism 2, and each processing mechanism 2 and one The analysis mechanism 3 is connected, so that the related actions of the display detection can be performed; and when the display device 5 is operated by the image capture mechanism on the transport platform 4, each image capture mechanism 1 transmits the captured image. Up to the first - image data buffer unit 25, and then cooperate with the operation of the arithmetic unit 2 and the synchronization processor 27, and the pre-processed filter 2 2 is used to filter out unnecessary images, and the required The image is retained, and the other images are transmitted by the pre-processing filter 2 2 through the second image data buffer unit to the next processing mechanism 2 (and so on) and the retained image is transmitted to the image processor 23 for reception and At the same time, the image processed by the pre-processing filter 22 is subjected to Fourier transform by the image processor 23, and then the alignment of the dot marks, the strip marks, the cracks, the scales and the scratches are avoided' and the comparison results are obtained. pass To the memory unit 2 8 to store 6 M362493 strip marks, cracks, dirt and scratches ====, she (10) ^ = = make the paste simple ===== = class analysis and statistics, up to the frequency track And the effectiveness of the system to mention
=‘，、、員不齡ϋ之餘良率，細使賴作之產纽更進步、更 、用更4合使用者之賴，確已符合創作專财請之要件， 爰依法提出專利申請。 ，以上所述者’僅為本創作之較佳實施例而已，當不能以 此限疋本創作實施之細；故，凡依本辦巾料舰圍及創 作說明書内容所作之簡單的等效變化與修飾，皆應仍屬本創作 專利涵蓋之範圍内。 【圖式簡單說明】 第1圖，係本創作之基本架構示意圖。 第2圖，係本創作之運用狀態示意圖。 第3圓’係本創作運用狀態之方塊示意圖。 【主要元件符號說明】 影像擷取機構1 處理機構2 運算單元21 7 M362493 前處理過濾器2 2 影像處理器23 連接介面2 4 第一影像資料緩衝單元2 5 第二影像資料缓衝單元2 6 同步處理器2 7 記憶單元2 8 分析機構3 • 輸送平台4 顯示器5= ',,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,, . The above-mentioned ones are only the preferred embodiments of the present invention. When it is not possible to limit the implementation of this creation; therefore, the simple equivalent changes made by the contents of the container and the contents of the creation manual. And the modifications should still be within the scope of this creation patent. [Simple description of the diagram] Figure 1 is a schematic diagram of the basic structure of the creation. Figure 2 is a schematic diagram of the state of use of this creation. The third circle is a block diagram of the state of use of the creation. [Main component symbol description] Image capture mechanism 1 Processing mechanism 2 Operation unit 21 7 M362493 Pre-processing filter 2 2 Image processor 23 Connection interface 2 4 First image data buffer unit 2 5 Second image data buffer unit 2 6 Synchronization processor 2 7 memory unit 2 8 analysis mechanism 3 • conveyor platform 4 display 5