TW200602510A - In-situ process chamber preparation methods for plasma ion implantation systems - Google Patents
In-situ process chamber preparation methods for plasma ion implantation systemsInfo
- Publication number
- TW200602510A TW200602510A TW094116323A TW94116323A TW200602510A TW 200602510 A TW200602510 A TW 200602510A TW 094116323 A TW094116323 A TW 094116323A TW 94116323 A TW94116323 A TW 94116323A TW 200602510 A TW200602510 A TW 200602510A
- Authority
- TW
- Taiwan
- Prior art keywords
- ion implantation
- process chamber
- plasma ion
- substrate
- plasma
- Prior art date
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/32—Gas-filled discharge tubes
- H01J37/32431—Constructional details of the reactor
- H01J37/32458—Vessel
- H01J37/32477—Vessel characterised by the means for protecting vessels or internal parts, e.g. coatings
- H01J37/32495—Means for protecting the vessel against plasma
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P30/00—Ion implantation into wafers, substrates or parts of devices
- H10P30/20—Ion implantation into wafers, substrates or parts of devices into semiconductor materials, e.g. for doping
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/30—Electron-beam or ion-beam tubes for localised treatment of objects
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/32—Gas-filled discharge tubes
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/32—Gas-filled discharge tubes
- H01J37/32009—Arrangements for generation of plasma specially adapted for examination or treatment of objects, e.g. plasma sources
- H01J37/32412—Plasma immersion ion implantation
Landscapes
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Plasma & Fusion (AREA)
- Plasma Technology (AREA)
- Physical Vapour Deposition (AREA)
- Chemical Vapour Deposition (AREA)
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US10/850,222 US20050260354A1 (en) | 2004-05-20 | 2004-05-20 | In-situ process chamber preparation methods for plasma ion implantation systems |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| TW200602510A true TW200602510A (en) | 2006-01-16 |
Family
ID=34970469
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| TW094116323A TW200602510A (en) | 2004-05-20 | 2005-05-19 | In-situ process chamber preparation methods for plasma ion implantation systems |
Country Status (6)
| Country | Link |
|---|---|
| US (1) | US20050260354A1 (https=) |
| JP (1) | JP2007538413A (https=) |
| KR (1) | KR20070026608A (https=) |
| CN (1) | CN1977351A (https=) |
| TW (1) | TW200602510A (https=) |
| WO (1) | WO2005114692A2 (https=) |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| TWI401335B (zh) * | 2006-11-10 | 2013-07-11 | Schott Ag | 塗覆系統、塗覆方法以及經塗覆之物件 |
| TWI749077B (zh) * | 2016-11-08 | 2021-12-11 | 美商瓦里安半導體設備公司 | 一種在工件上沈積摻雜物質的方法、一種在工件中植入摻雜物質的方法及一種處理工件的方法 |
| TWI888823B (zh) * | 2022-05-16 | 2025-07-01 | 大陸商中微半導體設備(上海)股份有限公司 | 部件表面處理方法、電漿處理裝置及其製備方法 |
Families Citing this family (80)
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| US7819981B2 (en) * | 2004-10-26 | 2010-10-26 | Advanced Technology Materials, Inc. | Methods for cleaning ion implanter components |
| US20060205192A1 (en) * | 2005-03-09 | 2006-09-14 | Varian Semiconductor Equipment Associates, Inc. | Shallow-junction fabrication in semiconductor devices via plasma implantation and deposition |
| US20080191153A1 (en) * | 2005-03-16 | 2008-08-14 | Advanced Technology Materials, Inc. | System For Delivery Of Reagents From Solid Sources Thereof |
| US7528386B2 (en) * | 2005-04-21 | 2009-05-05 | Board Of Trustees Of University Of Illinois | Submicron particle removal |
| TWI552797B (zh) | 2005-06-22 | 2016-10-11 | 恩特葛瑞斯股份有限公司 | 整合式氣體混合用之裝置及方法 |
| CN103170447B (zh) | 2005-08-30 | 2015-02-18 | 先进科技材料公司 | 使用替代的氟化含硼前驱体的硼离子注入和用于注入的大氢化硼的形成 |
| US7595271B2 (en) * | 2005-12-01 | 2009-09-29 | Asm America, Inc. | Polymer coating for vapor deposition tool |
| SG171606A1 (en) * | 2006-04-26 | 2011-06-29 | Advanced Tech Materials | Cleaning of semiconductor processing systems |
| JP5241499B2 (ja) * | 2006-09-19 | 2013-07-17 | 東京エレクトロン株式会社 | プラズマクリーニング方法、プラズマcvd方法、およびプラズマ処理装置 |
| US20080090392A1 (en) * | 2006-09-29 | 2008-04-17 | Varian Semiconductor Equipment Associates, Inc. | Technique for Improved Damage Control in a Plasma Doping (PLAD) Ion Implantation |
| US7619229B2 (en) * | 2006-10-16 | 2009-11-17 | Varian Semiconductor Equipment Associates, Inc. | Technique for matching performance of ion implantation devices using an in-situ mask |
| JP5252613B2 (ja) * | 2006-12-25 | 2013-07-31 | 国立大学法人東北大学 | イオン注入装置およびイオン注入方法 |
| US7691755B2 (en) * | 2007-05-15 | 2010-04-06 | Applied Materials, Inc. | Plasma immersion ion implantation with highly uniform chamber seasoning process for a toroidal source reactor |
| US9123509B2 (en) * | 2007-06-29 | 2015-09-01 | Varian Semiconductor Equipment Associates, Inc. | Techniques for plasma processing a substrate |
| KR100855540B1 (ko) * | 2007-07-10 | 2008-09-01 | 주식회사 코미코 | 이온 주입 장치, 이온 주입 장치의 내부 구조물 및 상기이온 주입 장치의 코팅층 형성 방법 |
| US7875125B2 (en) | 2007-09-21 | 2011-01-25 | Semequip, Inc. | Method for extending equipment uptime in ion implantation |
| US7968439B2 (en) * | 2008-02-06 | 2011-06-28 | Applied Materials, Inc. | Plasma immersion ion implantation method using a pure or nearly pure silicon seasoning layer on the chamber interior surfaces |
| JP2011512015A (ja) | 2008-02-11 | 2011-04-14 | アドバンスド テクノロジー マテリアルズ,インコーポレイテッド | 半導体処理システムにおけるイオン源の洗浄 |
| US7659184B2 (en) * | 2008-02-25 | 2010-02-09 | Applied Materials, Inc. | Plasma immersion ion implantation process with chamber seasoning and seasoning layer plasma discharging for wafer dechucking |
| US20090297409A1 (en) * | 2008-05-30 | 2009-12-03 | Buchanan Walter R | Discharge plasma reactor |
| JP5178342B2 (ja) * | 2008-06-23 | 2013-04-10 | キヤノン株式会社 | 堆積物除去方法及び堆積膜形成方法 |
| JP2010050188A (ja) * | 2008-08-20 | 2010-03-04 | Panasonic Corp | プラズマドーピング装置 |
| EP2422359A4 (en) * | 2009-04-20 | 2013-07-03 | Applied Materials Inc | REINFORCED ABSORPTION OF RESTFLUORRADIKALEN WITH THE HELP OF A SILICONE COATING ON PROCESS CHAMBER WALLS |
| US11615941B2 (en) | 2009-05-01 | 2023-03-28 | Advanced Energy Industries, Inc. | System, method, and apparatus for controlling ion energy distribution in plasma processing systems |
| US20110021011A1 (en) | 2009-07-23 | 2011-01-27 | Advanced Technology Materials, Inc. | Carbon materials for carbon implantation |
| US20110039034A1 (en) * | 2009-08-11 | 2011-02-17 | Helen Maynard | Pulsed deposition and recrystallization and tandem solar cell design utilizing crystallized/amorphous material |
| US9627180B2 (en) * | 2009-10-01 | 2017-04-18 | Praxair Technology, Inc. | Method for ion source component cleaning |
| US8598025B2 (en) | 2010-11-15 | 2013-12-03 | Varian Semiconductor Equipment Associates, Inc. | Doping of planar or three-dimensional structures at elevated temperatures |
| WO2013123140A1 (en) * | 2012-02-14 | 2013-08-22 | Advanced Technology Materials, Inc. | Alternate materials and mixtures to minimize phosphorus buildup in implant applications |
| US9685297B2 (en) | 2012-08-28 | 2017-06-20 | Advanced Energy Industries, Inc. | Systems and methods for monitoring faults, anomalies, and other characteristics of a switched mode ion energy distribution system |
| CN103774121B (zh) * | 2012-10-19 | 2016-09-21 | 陕西拓日新能源科技有限公司 | 一种用于非晶硅沉积的控制系统 |
| JP2014137901A (ja) * | 2013-01-16 | 2014-07-28 | Nissin Ion Equipment Co Ltd | イオン注入装置およびイオン注入装置の運転方法 |
| US9209032B2 (en) * | 2013-03-15 | 2015-12-08 | Tokyo Electron Limited | Electric pressure systems for control of plasma properties and uniformity |
| US9123506B2 (en) * | 2013-06-10 | 2015-09-01 | Fei Company | Electron beam-induced etching |
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| CN105849869B (zh) * | 2013-11-26 | 2017-08-11 | 瓦里安半导体设备公司 | 处理工件的方法 |
| JP5750496B2 (ja) * | 2013-12-11 | 2015-07-22 | 株式会社日立ハイテクノロジーズ | プラズマ処理方法 |
| US11015244B2 (en) | 2013-12-30 | 2021-05-25 | Advanced Material Solutions, Llc | Radiation shielding for a CVD reactor |
| US10094018B2 (en) * | 2014-10-16 | 2018-10-09 | Lam Research Corporation | Dynamic precursor dosing for atomic layer deposition |
| US11970772B2 (en) | 2014-08-22 | 2024-04-30 | Lam Research Corporation | Dynamic precursor dosing for atomic layer deposition |
| US10109488B2 (en) * | 2014-09-01 | 2018-10-23 | Entegris, Inc. | Phosphorus or arsenic ion implantation utilizing enhanced source techniques |
| CN104465292B (zh) * | 2014-11-28 | 2017-05-03 | 上海华力微电子有限公司 | 一种离子注入机的预处理方法 |
| US10553411B2 (en) | 2015-09-10 | 2020-02-04 | Taiwan Semiconductor Manufacturing Co., Ltd. | Ion collector for use in plasma systems |
| EP4226999A3 (en) | 2015-10-01 | 2023-09-06 | Milton Roy, LLC | Plasma reactor for liquid and gas and related methods |
| US12296313B2 (en) | 2015-10-01 | 2025-05-13 | Milton Roy, Llc | System and method for formulating medical treatment effluents |
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| US10882021B2 (en) | 2015-10-01 | 2021-01-05 | Ion Inject Technology Llc | Plasma reactor for liquid and gas and method of use |
| US10187968B2 (en) | 2015-10-08 | 2019-01-22 | Ion Inject Technology Llc | Quasi-resonant plasma voltage generator |
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| JP6584927B2 (ja) * | 2015-11-13 | 2019-10-02 | 住友重機械イオンテクノロジー株式会社 | イオン注入装置、およびイオン注入装置の制御方法 |
| US10046300B2 (en) | 2015-12-09 | 2018-08-14 | Ion Inject Technology Llc | Membrane plasma reactor |
| FR3045206B1 (fr) * | 2015-12-10 | 2020-01-03 | Ion Beam Services | Procede de commande pour un implanteur fonctionnant en immersion plasma |
| US20180247800A1 (en) * | 2017-02-28 | 2018-08-30 | International Business Machines Corporation | Gallium implantation cleaning method |
| US10161034B2 (en) | 2017-04-21 | 2018-12-25 | Lam Research Corporation | Rapid chamber clean using concurrent in-situ and remote plasma sources |
| TWI635539B (zh) * | 2017-09-15 | 2018-09-11 | Corremax International Co., Ltd. | 高介電常數介電層、其製造方法及執行該方法之多功能設備 |
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| US11437221B2 (en) | 2017-11-17 | 2022-09-06 | Advanced Energy Industries, Inc. | Spatial monitoring and control of plasma processing environments |
| CN111788654B (zh) | 2017-11-17 | 2023-04-14 | 先进工程解决方案全球控股私人有限公司 | 等离子体处理系统中的调制电源的改进应用 |
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| US12165852B2 (en) * | 2022-03-05 | 2024-12-10 | Applied Materials, Inc. | Cover ring to mitigate carbon contamination in plasma doping chamber |
| JP2023178891A (ja) * | 2022-06-06 | 2023-12-18 | 株式会社サイコックス | 陰極、高速原子ビーム線源、接合基板の製造方法、および、陰極の再生方法 |
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| US4376688A (en) * | 1981-04-03 | 1983-03-15 | Xerox Corporation | Method for producing semiconductor films |
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| JP2708533B2 (ja) * | 1989-03-14 | 1998-02-04 | 富士通株式会社 | Cvd装置の残留ガス除去方法 |
| GB9101462D0 (en) * | 1991-01-23 | 1991-03-06 | Unilever Plc | Edible spread |
| US5366764A (en) * | 1992-06-15 | 1994-11-22 | Sunthankar Mandar B | Environmentally safe methods and apparatus for depositing and/or reclaiming a metal or semi-conductor material using sublimation |
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-
2004
- 2004-05-20 US US10/850,222 patent/US20050260354A1/en not_active Abandoned
-
2005
- 2005-05-19 JP JP2007527467A patent/JP2007538413A/ja not_active Withdrawn
- 2005-05-19 CN CNA2005800203293A patent/CN1977351A/zh active Pending
- 2005-05-19 WO PCT/US2005/017699 patent/WO2005114692A2/en not_active Ceased
- 2005-05-19 KR KR1020067026723A patent/KR20070026608A/ko not_active Withdrawn
- 2005-05-19 TW TW094116323A patent/TW200602510A/zh unknown
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| TWI401335B (zh) * | 2006-11-10 | 2013-07-11 | Schott Ag | 塗覆系統、塗覆方法以及經塗覆之物件 |
| TWI749077B (zh) * | 2016-11-08 | 2021-12-11 | 美商瓦里安半導體設備公司 | 一種在工件上沈積摻雜物質的方法、一種在工件中植入摻雜物質的方法及一種處理工件的方法 |
| TWI888823B (zh) * | 2022-05-16 | 2025-07-01 | 大陸商中微半導體設備(上海)股份有限公司 | 部件表面處理方法、電漿處理裝置及其製備方法 |
Also Published As
| Publication number | Publication date |
|---|---|
| WO2005114692A3 (en) | 2006-03-02 |
| US20050260354A1 (en) | 2005-11-24 |
| JP2007538413A (ja) | 2007-12-27 |
| KR20070026608A (ko) | 2007-03-08 |
| WO2005114692A2 (en) | 2005-12-01 |
| WO2005114692A9 (en) | 2006-01-19 |
| CN1977351A (zh) | 2007-06-06 |
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