TW200504942A - Asymmetric memory cell - Google Patents

Asymmetric memory cell

Info

Publication number
TW200504942A
TW200504942A TW093114287A TW93114287A TW200504942A TW 200504942 A TW200504942 A TW 200504942A TW 093114287 A TW093114287 A TW 093114287A TW 93114287 A TW93114287 A TW 93114287A TW 200504942 A TW200504942 A TW 200504942A
Authority
TW
Taiwan
Prior art keywords
epvr
area
forming
memory cell
asymmetric memory
Prior art date
Application number
TW093114287A
Other languages
English (en)
Other versions
TWI239599B (en
Inventor
Sheng Teng Hsu
Tingkai Li
David Russell Evans
Original Assignee
Sharp Kk
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Sharp Kk filed Critical Sharp Kk
Publication of TW200504942A publication Critical patent/TW200504942A/zh
Application granted granted Critical
Publication of TWI239599B publication Critical patent/TWI239599B/zh

Links

Classifications

    • A—HUMAN NECESSITIES
    • A47—FURNITURE; DOMESTIC ARTICLES OR APPLIANCES; COFFEE MILLS; SPICE MILLS; SUCTION CLEANERS IN GENERAL
    • A47G—HOUSEHOLD OR TABLE EQUIPMENT
    • A47G21/00—Table-ware
    • A47G21/10—Sugar tongs; Asparagus tongs; Other food tongs
    • A47G21/103—Chop-sticks
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C13/00—Digital stores characterised by the use of storage elements not covered by groups G11C11/00, G11C23/00, or G11C25/00
    • G11C13/0002—Digital stores characterised by the use of storage elements not covered by groups G11C11/00, G11C23/00, or G11C25/00 using resistive RAM [RRAM] elements
    • G11C13/0007—Digital stores characterised by the use of storage elements not covered by groups G11C11/00, G11C23/00, or G11C25/00 using resistive RAM [RRAM] elements comprising metal oxide memory material, e.g. perovskites
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B82—NANOTECHNOLOGY
    • B82Y—SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
    • B82Y10/00—Nanotechnology for information processing, storage or transmission, e.g. quantum computing or single electron logic
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
    • G11C11/02—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using magnetic elements
    • G11C11/14—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using magnetic elements using thin-film elements
    • G11C11/15—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using magnetic elements using thin-film elements using multiple magnetic layers
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10N—ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10N70/00—Solid-state devices having no potential barriers, and specially adapted for rectifying, amplifying, oscillating or switching
    • H10N70/20—Multistable switching devices, e.g. memristors
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10N—ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10N70/00—Solid-state devices having no potential barriers, and specially adapted for rectifying, amplifying, oscillating or switching
    • H10N70/801—Constructional details of multistable switching devices
    • H10N70/821—Device geometry
    • H10N70/826—Device geometry adapted for essentially vertical current flow, e.g. sandwich or pillar type devices
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10N—ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10N70/00—Solid-state devices having no potential barriers, and specially adapted for rectifying, amplifying, oscillating or switching
    • H10N70/801—Constructional details of multistable switching devices
    • H10N70/841—Electrodes
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10N—ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10N70/00—Solid-state devices having no potential barriers, and specially adapted for rectifying, amplifying, oscillating or switching
    • H10N70/801—Constructional details of multistable switching devices
    • H10N70/881—Switching materials
    • H10N70/883—Oxides or nitrides
    • H10N70/8836—Complex metal oxides, e.g. perovskites, spinels
    • A—HUMAN NECESSITIES
    • A47—FURNITURE; DOMESTIC ARTICLES OR APPLIANCES; COFFEE MILLS; SPICE MILLS; SUCTION CLEANERS IN GENERAL
    • A47G—HOUSEHOLD OR TABLE EQUIPMENT
    • A47G2400/00—Details not otherwise provided for in A47G19/00-A47G23/16
    • A47G2400/02—Hygiene
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C2213/00—Indexing scheme relating to G11C13/00 for features not covered by this group
    • G11C2213/30—Resistive cell, memory material aspects
    • G11C2213/31—Material having complex metal oxide, e.g. perovskite structure
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C2213/00—Indexing scheme relating to G11C13/00 for features not covered by this group
    • G11C2213/50—Resistive cell structure aspects
    • G11C2213/52—Structure characterized by the electrode material, shape, etc.

Landscapes

  • Engineering & Computer Science (AREA)
  • Chemical & Material Sciences (AREA)
  • Materials Engineering (AREA)
  • Nanotechnology (AREA)
  • Physics & Mathematics (AREA)
  • Mathematical Physics (AREA)
  • Theoretical Computer Science (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Computer Hardware Design (AREA)
  • Hall/Mr Elements (AREA)
  • Semiconductor Memories (AREA)
  • Mram Or Spin Memory Techniques (AREA)
TW093114287A 2003-05-21 2004-05-20 Asymmetric memory cell TWI239599B (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US10/442,627 US6927074B2 (en) 2003-05-21 2003-05-21 Asymmetric memory cell

Publications (2)

Publication Number Publication Date
TW200504942A true TW200504942A (en) 2005-02-01
TWI239599B TWI239599B (en) 2005-09-11

Family

ID=33097988

Family Applications (1)

Application Number Title Priority Date Filing Date
TW093114287A TWI239599B (en) 2003-05-21 2004-05-20 Asymmetric memory cell

Country Status (6)

Country Link
US (1) US6927074B2 (zh)
EP (1) EP1480225A3 (zh)
JP (2) JP4493008B2 (zh)
KR (1) KR100644111B1 (zh)
CN (1) CN1574295A (zh)
TW (1) TWI239599B (zh)

Families Citing this family (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7009235B2 (en) * 2003-11-10 2006-03-07 Unity Semiconductor Corporation Conductive memory stack with non-uniform width
JP2004273656A (ja) * 2003-03-07 2004-09-30 Taiyo Yuden Co Ltd Ｅｐｉｒ素子及びそれを利用した半導体装置
KR100754930B1 (ko) * 2004-12-22 2007-09-03 한국과학기술원 전압제어 자화반전 기록방식의 ｍｒａｍ 소자 및 이를이용한 정보의 기록 및 판독 방법
KR100657944B1 (ko) * 2005-01-12 2006-12-14 삼성전자주식회사 상전이 램 동작 방법
KR100697282B1 (ko) 2005-03-28 2007-03-20 삼성전자주식회사 저항 메모리 셀, 그 형성 방법 및 이를 이용한 저항 메모리배열
JP2006344876A (ja) * 2005-06-10 2006-12-21 Sharp Corp 不揮発性記憶素子とその製造方法
CN100409444C (zh) * 2005-07-06 2008-08-06 中国科学院上海硅酸盐研究所 基于电阻变化的非挥发性存储器、切换方法及制备方法
JP4396621B2 (ja) 2005-12-02 2010-01-13 ソニー株式会社 記憶素子及び記憶装置
JP4118942B2 (ja) 2006-10-16 2008-07-16 松下電器産業株式会社 不揮発性記憶素子およびその製造方法
KR101151594B1 (ko) * 2007-03-22 2012-05-31 파나소닉 주식회사 기억 소자 및 기억 장치
US9171613B2 (en) * 2009-07-28 2015-10-27 Hewlett-Packard Development Company, L.P. Memristors with asymmetric electrodes
EP2943958B1 (en) 2013-01-14 2019-05-22 Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V. Asymmetrical memristor
US20210249600A1 (en) * 2020-02-11 2021-08-12 Macronix International Co., Ltd. Phase change memory with a carbon buffer layer

Family Cites Families (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5740100A (en) * 1995-10-05 1998-04-14 Samsung Electronics Co., Ltd. Method for preventing polarization loss in ferroelectric capacitors by controlling imprint
US6147395A (en) * 1996-10-02 2000-11-14 Micron Technology, Inc. Method for fabricating a small area of contact between electrodes
KR100268453B1 (ko) * 1998-03-30 2000-11-01 윤종용 반도체 장치 및 그것의 제조 방법
US6204139B1 (en) * 1998-08-25 2001-03-20 University Of Houston Method for switching the properties of perovskite materials used in thin film resistors
US6005800A (en) * 1998-11-23 1999-12-21 International Business Machines Corporation Magnetic memory array with paired asymmetric memory cells for improved write margin
IL143649A0 (en) * 1999-02-17 2002-04-21 Ibm Microelectronic device for storing information and method thereof
KR100391987B1 (ko) * 2000-09-18 2003-07-22 삼성전자주식회사 강유전체 캐퍼시터를 갖는 반도체 장치 및 그 제조방법
US6531371B2 (en) * 2001-06-28 2003-03-11 Sharp Laboratories Of America, Inc. Electrically programmable resistance cross point memory
JP4011334B2 (ja) * 2001-12-04 2007-11-21 富士通株式会社 強誘電体キャパシタの製造方法およびターゲット
US6759249B2 (en) * 2002-02-07 2004-07-06 Sharp Laboratories Of America, Inc. Device and method for reversible resistance change induced by electric pulses in non-crystalline perovskite unipolar programmable memory

Also Published As

Publication number Publication date
KR20040101037A (ko) 2004-12-02
CN1574295A (zh) 2005-02-02
JP2004349691A (ja) 2004-12-09
JP4493008B2 (ja) 2010-06-30
TWI239599B (en) 2005-09-11
US20040233708A1 (en) 2004-11-25
US6927074B2 (en) 2005-08-09
EP1480225A3 (en) 2006-05-10
EP1480225A2 (en) 2004-11-24
JP2010123989A (ja) 2010-06-03
KR100644111B1 (ko) 2006-11-10

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MM4A Annulment or lapse of patent due to non-payment of fees