SG91362A1 - Probe contact system maving planarity adjustment mechanism - Google Patents

Probe contact system maving planarity adjustment mechanism

Info

Publication number
SG91362A1
SG91362A1 SG200103069A SG200103069A SG91362A1 SG 91362 A1 SG91362 A1 SG 91362A1 SG 200103069 A SG200103069 A SG 200103069A SG 200103069 A SG200103069 A SG 200103069A SG 91362 A1 SG91362 A1 SG 91362A1
Authority
SG
Singapore
Prior art keywords
maving
adjustment mechanism
contact system
probe contact
planarity adjustment
Prior art date
Application number
SG200103069A
Other languages
English (en)
Inventor
Theodore A Khoury
Robert Edward Aldaz
Original Assignee
Advantest Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Advantest Corp filed Critical Advantest Corp
Publication of SG91362A1 publication Critical patent/SG91362A1/en

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/073—Multiple probes
    • G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
    • G01R1/07342—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card the body of the probe being at an angle other than perpendicular to test object, e.g. probe card
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/06794—Devices for sensing when probes are in contact, or in position to contact, with measured object
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/073—Multiple probes
    • G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
    • G01R1/07364—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card with provisions for altering position, number or connection of probe tips; Adapting to differences in pitch
    • G01R1/07378—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card with provisions for altering position, number or connection of probe tips; Adapting to differences in pitch using an intermediate adapter, e.g. space transformers

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Measuring Leads Or Probes (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Tests Of Electronic Circuits (AREA)
SG200103069A 2000-05-31 2001-05-22 Probe contact system maving planarity adjustment mechanism SG91362A1 (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US09/583,837 US6441629B1 (en) 2000-05-31 2000-05-31 Probe contact system having planarity adjustment mechanism

Publications (1)

Publication Number Publication Date
SG91362A1 true SG91362A1 (en) 2002-09-17

Family

ID=24334786

Family Applications (1)

Application Number Title Priority Date Filing Date
SG200103069A SG91362A1 (en) 2000-05-31 2001-05-22 Probe contact system maving planarity adjustment mechanism

Country Status (7)

Country Link
US (3) US6441629B1 (ko)
JP (1) JP4637400B2 (ko)
KR (1) KR100495847B1 (ko)
CN (1) CN1302286C (ko)
DE (1) DE10125345B4 (ko)
SG (1) SG91362A1 (ko)
TW (1) TW548417B (ko)

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US20020057098A1 (en) 2002-05-16
CN1336549A (zh) 2002-02-20
TW548417B (en) 2003-08-21
CN1302286C (zh) 2007-02-28
KR20010109164A (ko) 2001-12-08
JP2002022767A (ja) 2002-01-23
US20020050832A1 (en) 2002-05-02
US6441629B1 (en) 2002-08-27
DE10125345B4 (de) 2008-04-17
US6476626B2 (en) 2002-11-05
US6586956B2 (en) 2003-07-01
KR100495847B1 (ko) 2005-06-17
JP4637400B2 (ja) 2011-02-23
DE10125345A1 (de) 2002-01-10

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