SG157296A1 - Electrical contact element for contacting an electrical test sample and contacting apparatus - Google Patents

Electrical contact element for contacting an electrical test sample and contacting apparatus

Info

Publication number
SG157296A1
SG157296A1 SG200903123-8A SG2009031238A SG157296A1 SG 157296 A1 SG157296 A1 SG 157296A1 SG 2009031238 A SG2009031238 A SG 2009031238A SG 157296 A1 SG157296 A1 SG 157296A1
Authority
SG
Singapore
Prior art keywords
contacting
electrical
contact element
test sample
electrical contact
Prior art date
Application number
SG200903123-8A
Other languages
English (en)
Inventor
Achim Weiland
Gunther Boehm
Original Assignee
Feinmetall Gmbh
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Family has litigation
First worldwide family litigation filed litigation Critical https://patents.darts-ip.com/?family=40874826&utm_source=google_patent&utm_medium=platform_link&utm_campaign=public_patent_search&patent=SG157296(A1) "Global patent litigation dataset” by Darts-ip is licensed under a Creative Commons Attribution 4.0 International License.
Application filed by Feinmetall Gmbh filed Critical Feinmetall Gmbh
Publication of SG157296A1 publication Critical patent/SG157296A1/en

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/06711—Probe needles; Cantilever beams; "Bump" contacts; Replaceable probe pins
    • G01R1/06733—Geometry aspects
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/073—Multiple probes
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/073—Multiple probes
    • G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
    • G01R1/07357—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card with flexible bodies, e.g. buckling beams
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
    • H01R13/00—Details of coupling devices of the kinds covered by groups H01R12/70 or H01R24/00 - H01R33/00
    • H01R13/02—Contact members
    • H01R13/22—Contacts for co-operating by abutting
    • H01R13/24—Contacts for co-operating by abutting resilient; resiliently-mounted
    • H01R13/2407—Contacts for co-operating by abutting resilient; resiliently-mounted characterized by the resilient means
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
    • H01R13/00—Details of coupling devices of the kinds covered by groups H01R12/70 or H01R24/00 - H01R33/00
    • H01R13/02—Contact members
    • H01R13/22—Contacts for co-operating by abutting
    • H01R13/24—Contacts for co-operating by abutting resilient; resiliently-mounted
    • H01R13/2435—Contacts for co-operating by abutting resilient; resiliently-mounted with opposite contact points, e.g. C beam
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/06711—Probe needles; Cantilever beams; "Bump" contacts; Replaceable probe pins
    • G01R1/06733—Geometry aspects
    • G01R1/0675—Needle-like
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
    • H01R2201/00—Connectors or connections adapted for particular applications
    • H01R2201/20—Connectors or connections adapted for particular applications for testing or measuring purposes

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Geometry (AREA)
  • Measuring Leads Or Probes (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
SG200903123-8A 2008-05-09 2009-05-07 Electrical contact element for contacting an electrical test sample and contacting apparatus SG157296A1 (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
DE102008023761A DE102008023761B9 (de) 2008-05-09 2008-05-09 Elektrisches Kontaktelement zum Berührungskontaktieren von elektrischen Prüflingen sowie entsprechende Kontaktieranordnung

Publications (1)

Publication Number Publication Date
SG157296A1 true SG157296A1 (en) 2009-12-29

Family

ID=40874826

Family Applications (1)

Application Number Title Priority Date Filing Date
SG200903123-8A SG157296A1 (en) 2008-05-09 2009-05-07 Electrical contact element for contacting an electrical test sample and contacting apparatus

Country Status (8)

Country Link
US (1) US7850460B2 (ja)
EP (1) EP2117081B2 (ja)
JP (1) JP4932871B2 (ja)
KR (1) KR101082459B1 (ja)
CN (1) CN101577378B (ja)
DE (1) DE102008023761B9 (ja)
SG (1) SG157296A1 (ja)
TW (1) TWI394968B (ja)

Families Citing this family (47)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE202008001997U1 (de) * 2008-02-14 2008-04-03 Rosenberger Hochfrequenztechnik Gmbh & Co. Kg Kontaktfeder
JP2011111141A (ja) 2009-11-30 2011-06-09 Hitachi Ltd 電気自動車のシャーシフレームおよび電気自動車
JP5083426B2 (ja) * 2011-03-14 2012-11-28 オムロン株式会社 端子およびこれを用いたコネクタ
US9702904B2 (en) 2011-03-21 2017-07-11 Formfactor, Inc. Non-linear vertical leaf spring
US9052342B2 (en) 2011-09-30 2015-06-09 Formfactor, Inc. Probe with cantilevered beam having solid and hollow sections
US10006938B2 (en) * 2012-01-04 2018-06-26 Formfactor, Inc. Probes with programmable motion
SG11201406561XA (en) * 2012-04-13 2014-11-27 Capital Formation Inc Test probe assembly and related methods
US20140043054A1 (en) * 2012-08-09 2014-02-13 Formfactor, Inc. Vertical probes for multi-pitch full grid contact array
US9774121B2 (en) * 2012-12-04 2017-09-26 Japan Electronics Material Corporation Contact probe
KR101398550B1 (ko) * 2013-04-22 2014-05-27 리노공업주식회사 컨택트 프로브 및 그 제조방법
WO2015006499A1 (en) * 2013-07-09 2015-01-15 Formfactor, Inc. Multipath electrical probe and probe assemblies with signal paths through and secondary paths between electrically conductive guide plates
CN104901061A (zh) * 2015-02-13 2015-09-09 深圳巴斯巴科技发展有限公司 一种新型软连接高压连接器
DE102015001926B4 (de) 2015-02-13 2023-03-09 Feinmetall Gmbh Elektrisches Kontaktelement
WO2016146476A1 (en) * 2015-03-13 2016-09-22 Technoprobe S.P.A. Testing head with vertical probes, particularly for high frequency applications
TWI704352B (zh) * 2015-03-13 2020-09-11 義大利商探針科技公司 測試頭之接觸探針
KR101813006B1 (ko) * 2016-01-04 2017-12-28 주식회사 아이에스시 반도체 테스트용 콘택터
RU2670282C2 (ru) * 2016-02-01 2018-10-22 Российская Федерация, от имени которой выступает Государственная корпорация по атомной энергии "Росатом" Устройство для электрического соединения внутрикамерных компонентов с вакуумным корпусом термоядерного реактора
RU2639320C1 (ru) * 2016-09-16 2017-12-21 Российская Федерация, от имени которой выступает Государственная корпорация по атомной энергии "Росатом" Устройство для электрического соединения внутрикамерных компонентов с вакуумным корпусом термоядерного реактора
JP6642359B2 (ja) * 2016-09-21 2020-02-05 オムロン株式会社 プローブピンおよび検査ユニット
JP6872960B2 (ja) * 2017-04-21 2021-05-19 株式会社日本マイクロニクス 電気的接続装置
DE102017209441A1 (de) 2017-06-02 2018-12-06 Feinmetall Gmbh Elektrische Kontaktieranordnung zur Berührungskontaktierung
DE102017209510A1 (de) 2017-06-06 2018-12-06 Feinmetall Gmbh Kontaktelementsystem
KR101958351B1 (ko) 2017-08-04 2019-03-15 리노공업주식회사 검사프로브 및 이를 사용한 검사장치
KR101958353B1 (ko) * 2017-08-04 2019-03-15 리노공업주식회사 검사장치
EP3499653B1 (en) * 2017-12-12 2021-08-18 Rasco GmbH Contactor spring and contactor socket
CN207781937U (zh) * 2018-01-04 2018-08-28 富士康(昆山)电脑接插件有限公司 电连接器端子
JP7032167B2 (ja) * 2018-02-09 2022-03-08 日置電機株式会社 プローブピン、プローブユニットおよび検査装置
US11973301B2 (en) 2018-09-26 2024-04-30 Microfabrica Inc. Probes having improved mechanical and/or electrical properties for making contact between electronic circuit elements and methods for making
KR102114210B1 (ko) 2018-12-17 2020-05-25 주식회사 코리아 인스트루먼트 프로브 빔 및 프로브 모듈
US11768227B1 (en) 2019-02-22 2023-09-26 Microfabrica Inc. Multi-layer probes having longitudinal axes and preferential probe bending axes that lie in planes that are nominally parallel to planes of probe layers
IT201900024889A1 (it) * 2019-12-19 2021-06-19 Technoprobe Spa Sonda di contatto per applicazioni ad alta frequenza con migliorata portata di corrente
IT201900024964A1 (it) 2019-12-20 2021-06-20 Technoprobe Spa Testa di misura per applicazioni a ridotto pitch
US11761982B1 (en) 2019-12-31 2023-09-19 Microfabrica Inc. Probes with planar unbiased spring elements for electronic component contact and methods for making such probes
US11867721B1 (en) 2019-12-31 2024-01-09 Microfabrica Inc. Probes with multiple springs, methods for making, and methods for using
DE102020102302A1 (de) * 2020-01-30 2021-08-05 Ingun Prüfmittelbau Gmbh Hochfrequenz-Prüfkontaktelement und Prüfstiftvorrichtung
DE102020202230B4 (de) 2020-02-20 2021-09-23 Feinmetall Gesellschaft mit beschränkter Haftung Prüfkarte
TWI736361B (zh) * 2020-07-15 2021-08-11 中華精測科技股份有限公司 探針卡裝置及其柵欄狀探針
TW202206824A (zh) 2020-08-04 2022-02-16 義大利商探針科技公司 電子裝置的探針頭的接觸探針
US11774467B1 (en) 2020-09-01 2023-10-03 Microfabrica Inc. Method of in situ modulation of structural material properties and/or template shape
IT202000028364A1 (it) * 2020-11-25 2022-05-25 Technoprobe Spa Sonda di contatto per teste di misura di dispositivi elettronici
TWI745182B (zh) * 2020-11-30 2021-11-01 中華精測科技股份有限公司 探針卡裝置及雙臂式探針
KR102321083B1 (ko) * 2021-07-21 2021-11-03 (주)새한마이크로텍 접촉 프로브
IT202200005345A1 (it) * 2022-03-18 2023-09-18 Microtest S P A Un rele’ con generazione del campo magnetico attraverso un pcb
TWI805298B (zh) * 2022-03-31 2023-06-11 中華精測科技股份有限公司 多針形垂直式探針卡
WO2023188369A1 (ja) * 2022-03-31 2023-10-05 日本電子材料株式会社 プローブピンおよびプローブカード
TWI831328B (zh) * 2022-08-15 2024-02-01 思達科技股份有限公司 探針陣列及探針結構
KR20240055543A (ko) 2022-10-20 2024-04-29 주식회사 에이엠에스티 프로브 핀, 프로브 핀을 포함하는 프로브 카드 및 이들의 제조방법

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB1470007A (en) * 1973-08-01 1977-04-14 Amp Inc Electrical contact pin
US4737114A (en) * 1985-06-13 1988-04-12 Hirose Electric Co. Electrical contact pin
DE4104215A1 (de) * 1991-02-12 1992-08-13 Standard Elektrik Lorenz Ag Elektrischer hochstromkontakt

Family Cites Families (43)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3806801A (en) 1972-12-26 1974-04-23 Ibm Probe contactor having buckling beam probes
US4026011A (en) * 1975-08-28 1977-05-31 Burroughs Corporation Flexible circuit assembly
US4116523A (en) * 1976-01-23 1978-09-26 James M. Foster High frequency probe
US4027935A (en) 1976-06-21 1977-06-07 International Business Machines Corporation Contact for an electrical contactor assembly
US4076356A (en) * 1976-10-18 1978-02-28 Bell Telephone Laboratories, Incorporated Interconnection pin for multilayer printed circuit boards
CH661129A5 (de) * 1982-10-21 1987-06-30 Feinmetall Gmbh Kontaktiervorrichtung.
US5917707A (en) * 1993-11-16 1999-06-29 Formfactor, Inc. Flexible contact structure with an electrically conductive shell
EP0256541A3 (de) * 1986-08-19 1990-03-14 Feinmetall Gesellschaft mit beschrÀ¤nkter Haftung Kontaktiervorrichtung
US5399982A (en) * 1989-11-13 1995-03-21 Mania Gmbh & Co. Printed circuit board testing device with foil adapter
JPH07109780B2 (ja) * 1991-02-19 1995-11-22 山一電機株式会社 電気部品用ソケットにおけるコンタクト
US5225777A (en) * 1992-02-04 1993-07-06 International Business Machines Corporation High density probe
GB2291544B (en) * 1994-07-12 1996-10-02 Everett Charles Tech Electrical connectors
US5952843A (en) * 1998-03-24 1999-09-14 Vinh; Nguyen T. Variable contact pressure probe
US6024579A (en) * 1998-05-29 2000-02-15 The Whitaker Corporation Electrical connector having buckling beam contacts
US6491968B1 (en) * 1998-12-02 2002-12-10 Formfactor, Inc. Methods for making spring interconnect structures
JP4344032B2 (ja) 1999-01-27 2009-10-14 三菱電機株式会社 ウエハテスト用プローブカード
JP4414017B2 (ja) * 1999-05-25 2010-02-10 モレックス インコーポレイテド Ｉｃソケット
NL1012695C2 (nl) * 1999-07-23 2001-01-24 Berg Electronics Mfg Contactelement, werkwijze voor het vervaardigen daarvan en connector die hetzelfde omvat.
IT1317517B1 (it) * 2000-05-11 2003-07-09 Technoprobe S R L Testa di misura per microstrutture
IT1318734B1 (it) 2000-08-04 2003-09-10 Technoprobe S R L Testa di misura a sonde verticali.
US6507207B2 (en) * 2001-02-20 2003-01-14 Vinh T. Nguyen Contact probe pin for wafer probing apparatus
US6626708B2 (en) * 2001-03-30 2003-09-30 Tyco Electronics Corporation Single piece spring contact
US20060238209A1 (en) 2002-05-07 2006-10-26 Microfabrica Inc. Vertical microprobes for contacting electronic components and method for making such probes
US6945827B2 (en) * 2002-12-23 2005-09-20 Formfactor, Inc. Microelectronic contact structure
US6758682B1 (en) * 2003-02-13 2004-07-06 Itt Manufacturing Enterprises, Inc. Pogo contact
USD510043S1 (en) * 2003-06-11 2005-09-27 K&S Interconnect, Inc. Continuously profiled probe beam
US6859054B1 (en) * 2003-08-13 2005-02-22 Advantest Corp. Probe contact system using flexible printed circuit board
US6935901B2 (en) * 2003-09-24 2005-08-30 Motorola, Inc. Self-cleaning connector
TWM251354U (en) * 2003-09-30 2004-11-21 Hon Hai Prec Ind Co Ltd I/O connector
DE60312692T2 (de) 2003-10-13 2007-12-06 Technoprobe S.P.A, Cernusco Lombardone Prüfkopf mit vertikalen Prüfnadeln für integrierte Halbleitergeräte
US6855010B1 (en) * 2004-01-26 2005-02-15 Chuan Yi Precision Industry Co., Ltd. Terminal for electric connector for communication apparatus
US7759949B2 (en) * 2004-05-21 2010-07-20 Microprobe, Inc. Probes with self-cleaning blunt skates for contacting conductive pads
US7172431B2 (en) * 2004-08-27 2007-02-06 International Business Machines Corporation Electrical connector design and contact geometry and method of use thereof and methods of fabrication thereof
US7279916B2 (en) * 2004-10-05 2007-10-09 Nanoconduction, Inc. Apparatus and test device for the application and measurement of prescribed, predicted and controlled contact pressure on wires
TWI271524B (en) 2005-02-02 2007-01-21 Mjc Probe Inc Vertical probe card
US7690925B2 (en) * 2005-02-24 2010-04-06 Advanced Interconnections Corp. Terminal assembly with pin-retaining socket
JP4823617B2 (ja) * 2005-09-09 2011-11-24 日本発條株式会社 導電性接触子および導電性接触子の製造方法
KR100701498B1 (ko) * 2006-02-20 2007-03-29 주식회사 새한마이크로텍 반도체 검사용 프로브핀 조립체 및 그 제조방법
JP2007240235A (ja) * 2006-03-07 2007-09-20 Micronics Japan Co Ltd 通電試験用プローブおよびプローブ組立体
US7413484B2 (en) * 2006-08-02 2008-08-19 Tyco Electronics Corporation Electrical terminal having a compliant retention section
TWM314962U (en) * 2007-01-22 2007-07-01 Nextronics Engineering Corp Press-type power connector
TWM321163U (en) * 2007-02-26 2007-10-21 Hon Hai Prec Ind Co Ltd Electrical contact
US7671610B2 (en) 2007-10-19 2010-03-02 Microprobe, Inc. Vertical guided probe array providing sideways scrub motion

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB1470007A (en) * 1973-08-01 1977-04-14 Amp Inc Electrical contact pin
US4737114A (en) * 1985-06-13 1988-04-12 Hirose Electric Co. Electrical contact pin
DE4104215A1 (de) * 1991-02-12 1992-08-13 Standard Elektrik Lorenz Ag Elektrischer hochstromkontakt

Also Published As

Publication number Publication date
DE102008023761A1 (de) 2009-11-12
CN101577378B (zh) 2011-10-19
DE102008023761B9 (de) 2012-11-08
JP2009272308A (ja) 2009-11-19
KR101082459B1 (ko) 2011-11-11
US20090280676A1 (en) 2009-11-12
EP2117081A1 (de) 2009-11-11
KR20090117645A (ko) 2009-11-12
CN101577378A (zh) 2009-11-11
JP4932871B2 (ja) 2012-05-16
TWI394968B (zh) 2013-05-01
EP2117081B1 (de) 2018-11-07
TW201007187A (en) 2010-02-16
DE102008023761B4 (de) 2012-10-31
EP2117081B2 (de) 2021-10-06
US7850460B2 (en) 2010-12-14

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