IT1317517B1 - Testa di misura per microstrutture - Google Patents
Testa di misura per microstruttureInfo
- Publication number
- IT1317517B1 IT1317517B1 IT2000MI001045A ITMI20001045A IT1317517B1 IT 1317517 B1 IT1317517 B1 IT 1317517B1 IT 2000MI001045 A IT2000MI001045 A IT 2000MI001045A IT MI20001045 A ITMI20001045 A IT MI20001045A IT 1317517 B1 IT1317517 B1 IT 1317517B1
- Authority
- IT
- Italy
- Prior art keywords
- microstructures
- measurement head
- measurement
- head
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/06711—Probe needles; Cantilever beams; "Bump" contacts; Replaceable probe pins
- G01R1/06733—Geometry aspects
- G01R1/0675—Needle-like
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/073—Multiple probes
- G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
- G01R1/07357—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card with flexible bodies, e.g. buckling beams
Priority Applications (4)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
IT2000MI001045A IT1317517B1 (it) | 2000-05-11 | 2000-05-11 | Testa di misura per microstrutture |
DE60110149T DE60110149D1 (de) | 2000-05-11 | 2001-05-10 | Testkopf für Mikrostrukturen |
US09/853,884 US6515496B2 (en) | 2000-05-11 | 2001-05-10 | Microstructure testing head |
EP01111419A EP1154276B8 (en) | 2000-05-11 | 2001-05-10 | Testing head for microstructures |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
IT2000MI001045A IT1317517B1 (it) | 2000-05-11 | 2000-05-11 | Testa di misura per microstrutture |
Publications (3)
Publication Number | Publication Date |
---|---|
ITMI20001045A0 ITMI20001045A0 (it) | 2000-05-11 |
ITMI20001045A1 ITMI20001045A1 (it) | 2001-11-11 |
IT1317517B1 true IT1317517B1 (it) | 2003-07-09 |
Family
ID=11445027
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
IT2000MI001045A IT1317517B1 (it) | 2000-05-11 | 2000-05-11 | Testa di misura per microstrutture |
Country Status (4)
Country | Link |
---|---|
US (1) | US6515496B2 (it) |
EP (1) | EP1154276B8 (it) |
DE (1) | DE60110149D1 (it) |
IT (1) | IT1317517B1 (it) |
Families Citing this family (35)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
ITMI20010567A1 (it) * | 2001-03-19 | 2002-09-19 | Technoprobe S R L | Testa di misura a sonde verticali per dispositivi elettronici integrati su semiconduttore |
JP2005050738A (ja) * | 2003-07-31 | 2005-02-24 | Jst Mfg Co Ltd | 電気コネクタ |
US7649372B2 (en) * | 2003-11-14 | 2010-01-19 | Wentworth Laboratories, Inc. | Die design with integrated assembly aid |
JP3791689B2 (ja) * | 2004-01-09 | 2006-06-28 | 日本電子材料株式会社 | プローブカード |
WO2006054329A1 (ja) * | 2004-11-16 | 2006-05-26 | Fujitsu Limited | コンタクタ及びコンタクタを用いた試験方法 |
CA2592901C (en) * | 2007-07-13 | 2012-03-27 | Martin Blouin | Semi-generic in-circuit test fixture |
EP2060922A1 (en) * | 2007-11-16 | 2009-05-20 | Technoprobe S.p.A | Microstructure testing head |
JP5064205B2 (ja) * | 2007-12-27 | 2012-10-31 | タイコエレクトロニクスジャパン合同会社 | コンタクトおよびインタポーザ |
US8808625B2 (en) * | 2008-01-11 | 2014-08-19 | National Institute Of Advanced Industrial Science And Technology | Dispensing apparatus and a dispensing method |
EP2088443B1 (en) * | 2008-02-08 | 2011-08-03 | Technoprobe S.p.A | Contact probe for a testing head having vertical probes with improved scrub movement |
DE102008023761B9 (de) * | 2008-05-09 | 2012-11-08 | Feinmetall Gmbh | Elektrisches Kontaktelement zum Berührungskontaktieren von elektrischen Prüflingen sowie entsprechende Kontaktieranordnung |
US8324919B2 (en) * | 2009-03-27 | 2012-12-04 | Delaware Capital Formation, Inc. | Scrub inducing compliant electrical contact |
JP5514619B2 (ja) * | 2009-12-24 | 2014-06-04 | ガーディアンジャパン株式会社 | 配線検査治具 |
ITMI20110352A1 (it) * | 2011-03-07 | 2012-09-08 | Technoprobe Spa | Testa di misura per un' apparecchiatura di test di dispositivi elettronici |
US10006938B2 (en) * | 2012-01-04 | 2018-06-26 | Formfactor, Inc. | Probes with programmable motion |
US9470715B2 (en) * | 2013-01-11 | 2016-10-18 | Mpi Corporation | Probe head |
TW201625962A (zh) * | 2014-12-04 | 2016-07-16 | 技術探測股份有限公司 | 包括垂直探針之測試頭 |
KR101656047B1 (ko) * | 2016-03-23 | 2016-09-09 | 주식회사 나노시스 | 기판 검사용 지그 |
KR101869044B1 (ko) * | 2016-11-10 | 2018-07-19 | 윌테크놀러지(주) | 스크럽 현상이 저감된 수직형 프로브 카드용 니들유닛 및 이를 이용한 프로브 카드 |
WO2018118075A1 (en) * | 2016-12-23 | 2018-06-28 | Intel Corporation | Fine pitch probe card methods and systems |
JP6872960B2 (ja) * | 2017-04-21 | 2021-05-19 | 株式会社日本マイクロニクス | 電気的接続装置 |
DE102017209510A1 (de) * | 2017-06-06 | 2018-12-06 | Feinmetall Gmbh | Kontaktelementsystem |
US11268983B2 (en) | 2017-06-30 | 2022-03-08 | Intel Corporation | Chevron interconnect for very fine pitch probing |
US10775414B2 (en) | 2017-09-29 | 2020-09-15 | Intel Corporation | Low-profile gimbal platform for high-resolution in situ co-planarity adjustment |
US11061068B2 (en) | 2017-12-05 | 2021-07-13 | Intel Corporation | Multi-member test probe structure |
US11204555B2 (en) | 2017-12-28 | 2021-12-21 | Intel Corporation | Method and apparatus to develop lithographically defined high aspect ratio interconnects |
US11073538B2 (en) | 2018-01-03 | 2021-07-27 | Intel Corporation | Electrical testing apparatus with lateral movement of a probe support substrate |
US10866264B2 (en) | 2018-01-05 | 2020-12-15 | Intel Corporation | Interconnect structure with varying modulus of elasticity |
US10488438B2 (en) | 2018-01-05 | 2019-11-26 | Intel Corporation | High density and fine pitch interconnect structures in an electric test apparatus |
DE102018204106A1 (de) * | 2018-03-16 | 2019-09-19 | Feinmetall Gmbh | Prüfkarte zum elektrischen Verbinden eines Prüflings mit einer elektrischen Prüfeinrichtung |
US11543454B2 (en) | 2018-09-25 | 2023-01-03 | Intel Corporation | Double-beam test probe |
US10935573B2 (en) | 2018-09-28 | 2021-03-02 | Intel Corporation | Slip-plane MEMS probe for high-density and fine pitch interconnects |
IT201800021253A1 (it) * | 2018-12-27 | 2020-06-27 | Technoprobe Spa | Testa di misura a sonde verticali avente un contatto perfezionato con un dispositivo da testare |
US11768227B1 (en) | 2019-02-22 | 2023-09-26 | Microfabrica Inc. | Multi-layer probes having longitudinal axes and preferential probe bending axes that lie in planes that are nominally parallel to planes of probe layers |
US20220236304A1 (en) * | 2021-01-28 | 2022-07-28 | Formfactor, Inc. | Probe Head Including a Guide Plate with Angled Holes to Determine Probe Flexure Direction |
Family Cites Families (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3217283A (en) * | 1962-12-26 | 1965-11-09 | Amp Inc | Miniature printed circuit pinboard |
CH661129A5 (de) * | 1982-10-21 | 1987-06-30 | Feinmetall Gmbh | Kontaktiervorrichtung. |
US4686467A (en) * | 1984-03-21 | 1987-08-11 | Dit-Mco International Corp. | Circuit board testing system |
US4774462A (en) * | 1984-06-11 | 1988-09-27 | Black Thomas J | Automatic test system |
JPH0675415B2 (ja) * | 1991-03-15 | 1994-09-21 | 山一電機株式会社 | リードレス形icパッケージ用接続器 |
JPH11142433A (ja) * | 1997-11-10 | 1999-05-28 | Mitsubishi Electric Corp | 垂直針型プローブカード用のプローブ針とその製造方法 |
JPH11145215A (ja) * | 1997-11-11 | 1999-05-28 | Mitsubishi Electric Corp | 半導体検査装置およびその制御方法 |
US5952843A (en) * | 1998-03-24 | 1999-09-14 | Vinh; Nguyen T. | Variable contact pressure probe |
KR20000040104A (ko) * | 1998-12-17 | 2000-07-05 | 김영환 | 실리콘 온 인슐레이터 웨이퍼의 제조방법 |
-
2000
- 2000-05-11 IT IT2000MI001045A patent/IT1317517B1/it active
-
2001
- 2001-05-10 EP EP01111419A patent/EP1154276B8/en not_active Expired - Lifetime
- 2001-05-10 DE DE60110149T patent/DE60110149D1/de not_active Expired - Fee Related
- 2001-05-10 US US09/853,884 patent/US6515496B2/en not_active Expired - Fee Related
Also Published As
Publication number | Publication date |
---|---|
US20020024347A1 (en) | 2002-02-28 |
ITMI20001045A1 (it) | 2001-11-11 |
EP1154276B1 (en) | 2005-04-20 |
US6515496B2 (en) | 2003-02-04 |
DE60110149D1 (de) | 2005-05-25 |
EP1154276A2 (en) | 2001-11-14 |
EP1154276B8 (en) | 2005-06-15 |
ITMI20001045A0 (it) | 2000-05-11 |
EP1154276A3 (en) | 2003-01-08 |
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