SG132661A1 - Illumination system - Google Patents
Illumination systemInfo
- Publication number
- SG132661A1 SG132661A1 SG200608342-2A SG2006083422A SG132661A1 SG 132661 A1 SG132661 A1 SG 132661A1 SG 2006083422 A SG2006083422 A SG 2006083422A SG 132661 A1 SG132661 A1 SG 132661A1
- Authority
- SG
- Singapore
- Prior art keywords
- illumination system
- coherence
- radiation
- remove
- substantially homogenize
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/70483—Information management; Active and passive control; Testing; Wafer monitoring, e.g. pattern monitoring
- G03F7/7055—Exposure light control in all parts of the microlithographic apparatus, e.g. pulse length control or light interruption
- G03F7/70583—Speckle reduction, e.g. coherence control or amplitude/wavefront splitting
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B27/00—Optical systems or apparatus not provided for by any of the groups G02B1/00 - G02B26/00, G02B30/00
- G02B27/09—Beam shaping, e.g. changing the cross-sectional area, not otherwise provided for
- G02B27/0905—Dividing and/or superposing multiple light beams
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/70058—Mask illumination systems
- G03F7/70075—Homogenization of illumination intensity in the mask plane by using an integrator, e.g. fly's eye lens, facet mirror or glass rod, by using a diffusing optical element or by beam deflection
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Optics & Photonics (AREA)
- Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)
- Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US11/292,275 US20070127005A1 (en) | 2005-12-02 | 2005-12-02 | Illumination system |
Publications (1)
Publication Number | Publication Date |
---|---|
SG132661A1 true SG132661A1 (en) | 2007-06-28 |
Family
ID=37745983
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
SG200608342-2A SG132661A1 (en) | 2005-12-02 | 2006-11-29 | Illumination system |
Country Status (7)
Country | Link |
---|---|
US (4) | US20070127005A1 (fr) |
EP (1) | EP1793278A3 (fr) |
JP (2) | JP4805797B2 (fr) |
KR (1) | KR100835325B1 (fr) |
CN (1) | CN101013267B (fr) |
SG (1) | SG132661A1 (fr) |
TW (1) | TWI358615B (fr) |
Families Citing this family (18)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US20070127005A1 (en) * | 2005-12-02 | 2007-06-07 | Asml Holding N.V. | Illumination system |
US7630136B2 (en) * | 2006-07-18 | 2009-12-08 | Asml Holding N.V. | Optical integrators for lithography systems and methods |
NL1035986A1 (nl) * | 2007-09-28 | 2009-03-31 | Asml Holding Nv | Controlling fluctuations in pointing, positioning, size or divergence errors of a beam of light for an optical apparatus. |
JP5164822B2 (ja) * | 2007-12-21 | 2013-03-21 | エーエスエムエル ホールディング エヌ.ブイ. | 光ビームの特性を検出するためのビーム特性モニタ |
DE102009009366A1 (de) | 2009-02-18 | 2010-08-19 | Limo Patentverwaltung Gmbh & Co. Kg | Vorrichtung zur Homogenisierung von Laserstrahlung |
NL2005548A (en) * | 2009-11-20 | 2011-05-23 | Asml Netherlands Bv | Homogenizer. |
NL2008009A (en) * | 2011-02-02 | 2012-08-06 | Asml Netherlands Bv | Illumination system, lithographic apparatus and method. |
KR102291997B1 (ko) * | 2012-03-09 | 2021-08-23 | 칼 짜이스 에스엠티 게엠베하 | Euv 투영 리소그래피용 조명 옵틱스 및 이러한 조명 옵틱스를 갖는 광학 시스템 |
JP6230222B2 (ja) * | 2012-10-12 | 2017-11-15 | キヤノン株式会社 | レンズアレイ光学系及びレンズアレイの製造方法 |
US9110294B2 (en) * | 2013-03-15 | 2015-08-18 | Christie Digital Systems Usa, Inc. | Imaging with shaped highlight beam |
KR20150094403A (ko) * | 2014-02-11 | 2015-08-19 | 삼성전자주식회사 | 조명용 로드 렌즈 및 조명용 로드 렌즈를 포함하는 조명 장치 |
JP6345963B2 (ja) * | 2014-03-28 | 2018-06-20 | 株式会社Screenホールディングス | 光照射装置および描画装置 |
US9413258B2 (en) * | 2014-04-09 | 2016-08-09 | Qualcomm Incorporated | AC load detection and control unit |
US10649315B2 (en) * | 2014-06-17 | 2020-05-12 | Lumileds Llc | Flash module containing an array of reflector cups for phosphor-converted LEDs |
JP7020859B2 (ja) * | 2017-10-24 | 2022-02-16 | キヤノン株式会社 | 照明光学系、露光装置および物品の製造方法 |
EP3605045A1 (fr) | 2018-07-30 | 2020-02-05 | Nederlandse Organisatie voor toegepast- natuurwetenschappelijk onderzoek TNO | Homogénéisateur à fente pour imagerie spectrale |
CN112740111A (zh) | 2018-09-21 | 2021-04-30 | Asml荷兰有限公司 | 辐射系统 |
CN113557477A (zh) * | 2019-03-13 | 2021-10-26 | Asml控股股份有限公司 | 光刻设备、量测设备、光学系统和方法 |
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US4547044A (en) * | 1983-03-31 | 1985-10-15 | International Business Machines Corporation | Beam-folding wedge tunnel |
US4619508A (en) * | 1984-04-28 | 1986-10-28 | Nippon Kogaku K. K. | Illumination optical arrangement |
NO162032C (no) * | 1984-09-04 | 1989-10-25 | Norwegian Contractors | Fremgangsmaate ved fundamentering og stabilisering av en fralandskonstruksjon. |
US4744615A (en) * | 1986-01-29 | 1988-05-17 | International Business Machines Corporation | Laser beam homogenizer |
WO1988000108A1 (fr) * | 1986-07-08 | 1988-01-14 | Kabushiki Kaisha Komatsu Seisakusho | Appareil produisant un faisceau laser |
DE3750174T2 (de) * | 1986-10-30 | 1994-11-17 | Canon Kk | Belichtungseinrichtung. |
JP2755349B2 (ja) * | 1987-09-17 | 1998-05-20 | オリンパス光学工業株式会社 | 半導体露光装置の照明光学系 |
US5523193A (en) * | 1988-05-31 | 1996-06-04 | Texas Instruments Incorporated | Method and apparatus for patterning and imaging member |
US5153773A (en) * | 1989-06-08 | 1992-10-06 | Canon Kabushiki Kaisha | Illumination device including amplitude-division and beam movements |
DE59105735D1 (de) * | 1990-05-02 | 1995-07-20 | Fraunhofer Ges Forschung | Belichtungsvorrichtung. |
JP2677731B2 (ja) * | 1991-12-17 | 1997-11-17 | 三菱電機株式会社 | 投影露光装置 |
US5229872A (en) * | 1992-01-21 | 1993-07-20 | Hughes Aircraft Company | Exposure device including an electrically aligned electronic mask for micropatterning |
US6219015B1 (en) * | 1992-04-28 | 2001-04-17 | The Board Of Directors Of The Leland Stanford, Junior University | Method and apparatus for using an array of grating light valves to produce multicolor optical images |
JP3224041B2 (ja) * | 1992-07-29 | 2001-10-29 | 株式会社ニコン | 露光方法及び装置 |
US5729331A (en) * | 1993-06-30 | 1998-03-17 | Nikon Corporation | Exposure apparatus, optical projection apparatus and a method for adjusting the optical projection apparatus |
JP3339149B2 (ja) * | 1993-12-08 | 2002-10-28 | 株式会社ニコン | 走査型露光装置ならびに露光方法 |
US5677703A (en) * | 1995-01-06 | 1997-10-14 | Texas Instruments Incorporated | Data loading circuit for digital micro-mirror device |
US5530482A (en) * | 1995-03-21 | 1996-06-25 | Texas Instruments Incorporated | Pixel data processing for spatial light modulator having staggered pixels |
US5724122A (en) * | 1995-05-24 | 1998-03-03 | Svg Lithography Systems, Inc. | Illumination system having spatially separate vertical and horizontal image planes for use in photolithography |
DE69729659T2 (de) * | 1996-02-28 | 2005-06-23 | Johnson, Kenneth C., Santa Clara | Mikrolinsen-rastereinrichtung für mikrolithografie und für konfokale mikroskopie mit grossem aufnahmefeld |
US6312134B1 (en) * | 1996-07-25 | 2001-11-06 | Anvik Corporation | Seamless, maskless lithography system using spatial light modulator |
JPH1062710A (ja) * | 1996-08-22 | 1998-03-06 | Nikon Corp | 照明光学系 |
DE69711929T2 (de) | 1997-01-29 | 2002-09-05 | Micronic Laser Systems Ab Taeb | Verfahren und gerät zur erzeugung eines musters auf einem mit fotoresist beschichteten substrat mittels fokusiertem laserstrahl |
US6177980B1 (en) * | 1997-02-20 | 2001-01-23 | Kenneth C. Johnson | High-throughput, maskless lithography system |
SE509062C2 (sv) | 1997-02-28 | 1998-11-30 | Micronic Laser Systems Ab | Dataomvandlingsmetod för en laserskrivare med flera strålar för mycket komplexa mikrokolitografiska mönster |
US5982553A (en) * | 1997-03-20 | 1999-11-09 | Silicon Light Machines | Display device incorporating one-dimensional grating light-valve array |
SE9800665D0 (sv) * | 1998-03-02 | 1998-03-02 | Micronic Laser Systems Ab | Improved method for projection printing using a micromirror SLM |
KR100841147B1 (ko) | 1998-03-11 | 2008-06-24 | 가부시키가이샤 니콘 | 레이저 장치, 자외광 조사 장치 및 방법, 물체의 패턴 검출장치 및 방법 |
JP4232130B2 (ja) * | 1998-03-11 | 2009-03-04 | 株式会社ニコン | レーザ装置並びにこのレーザ装置を用いた光照射装置および露光方法 |
US6069739A (en) * | 1998-06-30 | 2000-05-30 | Intel Corporation | Method and lens arrangement to improve imaging performance of microlithography exposure tool |
JP2000277421A (ja) * | 1999-03-26 | 2000-10-06 | Nikon Corp | 照明装置 |
DE60045653D1 (de) | 1999-08-13 | 2011-04-07 | Semiconductor Energy Lab | Laserbestrahlungsgerät |
SG124257A1 (en) * | 2000-02-25 | 2006-08-30 | Nikon Corp | Exposure apparatus and exposure method capable of controlling illumination distribution |
TW520526B (en) * | 2000-05-22 | 2003-02-11 | Nikon Corp | Exposure apparatus, method for manufacturing thereof, method for exposing and method for manufacturing micro-device |
JP2002057098A (ja) * | 2000-05-30 | 2002-02-22 | Nikon Corp | 照明光学装置,該照明光学装置を備えた露光装置,及びマイクロデバイスの製造方法 |
US6819490B2 (en) * | 2001-09-10 | 2004-11-16 | Micronic Laser Systems Ab | Homogenization of a spatially coherent radiation beam and printing and inspection, respectively, of a pattern on a workpiece |
SE0103006D0 (sv) * | 2001-09-10 | 2001-09-10 | Micronic Lasersystems Ab | Homogenization of a spatially coherent radiation beam and reading/writing of a pattern on a workpiece |
DE10148167A1 (de) | 2001-09-28 | 2003-04-17 | Zeiss Carl Jena Gmbh | Beleuchtungsanordnung |
CN1791839A (zh) * | 2001-11-07 | 2006-06-21 | 应用材料有限公司 | 光点格栅阵列光刻机 |
JP3563384B2 (ja) * | 2001-11-08 | 2004-09-08 | 大日本スクリーン製造株式会社 | 画像記録装置 |
JP2003167213A (ja) * | 2001-12-04 | 2003-06-13 | Sumitomo Heavy Ind Ltd | 可干渉性解消素子およびビームホモジナイザ |
TWI298825B (en) * | 2002-06-12 | 2008-07-11 | Asml Netherlands Bv | Lithographic apparatus and device manufacturing method |
TWI332682B (en) * | 2002-09-19 | 2010-11-01 | Semiconductor Energy Lab | Beam homogenizer and laser irradiation apparatus and method of manufacturing semiconductor device |
US6870554B2 (en) * | 2003-01-07 | 2005-03-22 | Anvik Corporation | Maskless lithography with multiplexed spatial light modulators |
EP1482373A1 (fr) * | 2003-05-30 | 2004-12-01 | ASML Netherlands B.V. | Appareil lithographique et méthode de fabrication d'un dispositif |
DE10338244A1 (de) | 2003-08-20 | 2005-03-10 | Zeiss Carl Sms Gmbh | Kohärenzminderer und Herstellungsverfahren eines Kohärenzminderers |
DE10345784A1 (de) | 2003-10-01 | 2005-04-21 | Zeiss Carl Sms Gmbh | Kohärenzminderer |
US7081947B2 (en) | 2004-02-27 | 2006-07-25 | Asml Netherlands B.V. | Lithographic apparatus and device manufacturing method |
US7158208B2 (en) * | 2004-06-30 | 2007-01-02 | Asml Netherlands B.V. | Lithographic apparatus and device manufacturing method |
JP4291230B2 (ja) * | 2004-08-06 | 2009-07-08 | 株式会社日本製鋼所 | 結晶化膜の形成方法及びその装置 |
US20070127005A1 (en) * | 2005-12-02 | 2007-06-07 | Asml Holding N.V. | Illumination system |
-
2005
- 2005-12-02 US US11/292,275 patent/US20070127005A1/en not_active Abandoned
-
2006
- 2006-11-22 EP EP06255958A patent/EP1793278A3/fr not_active Withdrawn
- 2006-11-28 TW TW095143977A patent/TWI358615B/zh not_active IP Right Cessation
- 2006-11-29 SG SG200608342-2A patent/SG132661A1/en unknown
- 2006-11-30 US US11/606,386 patent/US20070247606A1/en not_active Abandoned
- 2006-12-01 JP JP2006325363A patent/JP4805797B2/ja not_active Expired - Fee Related
- 2006-12-01 CN CN2006100647036A patent/CN101013267B/zh not_active Expired - Fee Related
- 2006-12-01 KR KR1020060120808A patent/KR100835325B1/ko not_active IP Right Cessation
-
2008
- 2008-12-04 US US12/328,204 patent/US8159651B2/en not_active Expired - Fee Related
- 2008-12-04 US US12/328,251 patent/US8164740B2/en not_active Expired - Fee Related
-
2010
- 2010-04-26 JP JP2010101208A patent/JP2010199605A/ja active Pending
Also Published As
Publication number | Publication date |
---|---|
TW200727090A (en) | 2007-07-16 |
US8164740B2 (en) | 2012-04-24 |
JP2007179039A (ja) | 2007-07-12 |
US20090091734A1 (en) | 2009-04-09 |
CN101013267A (zh) | 2007-08-08 |
EP1793278A3 (fr) | 2007-12-05 |
US20090168072A1 (en) | 2009-07-02 |
US8159651B2 (en) | 2012-04-17 |
US20070247606A1 (en) | 2007-10-25 |
US20070127005A1 (en) | 2007-06-07 |
JP4805797B2 (ja) | 2011-11-02 |
TWI358615B (en) | 2012-02-21 |
CN101013267B (zh) | 2011-07-27 |
EP1793278A2 (fr) | 2007-06-06 |
KR20070058361A (ko) | 2007-06-08 |
JP2010199605A (ja) | 2010-09-09 |
KR100835325B1 (ko) | 2008-06-04 |
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