SG114513A1 - Illumination optical apparatus and exposure apparatus provided with illumination optical apparatus - Google Patents
Illumination optical apparatus and exposure apparatus provided with illumination optical apparatusInfo
- Publication number
- SG114513A1 SG114513A1 SG200107340A SG200107340A SG114513A1 SG 114513 A1 SG114513 A1 SG 114513A1 SG 200107340 A SG200107340 A SG 200107340A SG 200107340 A SG200107340 A SG 200107340A SG 114513 A1 SG114513 A1 SG 114513A1
- Authority
- SG
- Singapore
- Prior art keywords
- illumination optical
- optical apparatus
- exposure
- exposure apparatus
- apparatus provided
- Prior art date
Links
- 238000005286 illumination Methods 0.000 title 2
- 230000003287 optical effect Effects 0.000 title 2
Classifications
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B27/00—Optical systems or apparatus not provided for by any of the groups G02B1/00 - G02B26/00, G02B30/00
- G02B27/18—Optical systems or apparatus not provided for by any of the groups G02B1/00 - G02B26/00, G02B30/00 for optical projection, e.g. combination of mirror and condenser and objective
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/70058—Mask illumination systems
- G03F7/70066—Size and form of the illuminated area in the mask plane, e.g. reticle masking blades or blinds
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/70058—Mask illumination systems
- G03F7/70075—Homogenization of illumination intensity in the mask plane by using an integrator, e.g. fly's eye lens, facet mirror or glass rod, by using a diffusing optical element or by beam deflection
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/70058—Mask illumination systems
- G03F7/70091—Illumination settings, i.e. intensity distribution in the pupil plane or angular distribution in the field plane; On-axis or off-axis settings, e.g. annular, dipole or quadrupole settings; Partial coherence control, i.e. sigma or numerical aperture [NA]
- G03F7/70108—Off-axis setting using a light-guiding element, e.g. diffractive optical elements [DOEs] or light guides
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/70058—Mask illumination systems
- G03F7/7015—Details of optical elements
- G03F7/70183—Zoom systems for adjusting beam diameter
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Optics & Photonics (AREA)
- Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)
- Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
- Microscoopes, Condenser (AREA)
- Optical Elements Other Than Lenses (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2000363225 | 2000-11-29 | ||
| JP2001074240A JP2002231619A (ja) | 2000-11-29 | 2001-03-15 | 照明光学装置および該照明光学装置を備えた露光装置 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| SG114513A1 true SG114513A1 (en) | 2005-09-28 |
Family
ID=26604841
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| SG200107340A SG114513A1 (en) | 2000-11-29 | 2001-11-28 | Illumination optical apparatus and exposure apparatus provided with illumination optical apparatus |
Country Status (6)
| Country | Link |
|---|---|
| US (2) | US20020085276A1 (enExample) |
| EP (1) | EP1211561A3 (enExample) |
| JP (1) | JP2002231619A (enExample) |
| KR (1) | KR20020042462A (enExample) |
| SG (1) | SG114513A1 (enExample) |
| TW (1) | TW516097B (enExample) |
Families Citing this family (84)
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| TW554411B (en) * | 2001-08-23 | 2003-09-21 | Nikon Corp | Exposure apparatus |
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| US7079321B2 (en) * | 2001-10-18 | 2006-07-18 | Asml Holding N.V. | Illumination system and method allowing for varying of both field height and pupil |
| US6813003B2 (en) * | 2002-06-11 | 2004-11-02 | Mark Oskotsky | Advanced illumination system for use in microlithography |
| US7006295B2 (en) * | 2001-10-18 | 2006-02-28 | Asml Holding N.V. | Illumination system and method for efficiently illuminating a pattern generator |
| TW567406B (en) | 2001-12-12 | 2003-12-21 | Nikon Corp | Diffraction optical device, refraction optical device, illuminating optical device, exposure system and exposure method |
| JP4207478B2 (ja) * | 2002-07-12 | 2009-01-14 | 株式会社ニコン | オプティカルインテグレータ、照明光学装置、露光装置および露光方法 |
| JP4332331B2 (ja) * | 2002-08-05 | 2009-09-16 | キヤノン株式会社 | 露光方法 |
| EP3226073A3 (en) * | 2003-04-09 | 2017-10-11 | Nikon Corporation | Exposure method and apparatus, and method for fabricating device |
| DE10322393A1 (de) * | 2003-05-12 | 2004-12-02 | Carl Zeiss Smt Ag | Beleuchtungssystem für eine Mikrolithographie-Projektionsbelichtungsanlage |
| JPWO2004112107A1 (ja) * | 2003-06-16 | 2006-07-27 | 株式会社ニコン | 照明光学装置、露光装置および露光方法 |
| JP2005032847A (ja) * | 2003-07-09 | 2005-02-03 | Advanced Lcd Technologies Development Center Co Ltd | 結晶化装置、結晶化方法およびデバイス |
| JP4717813B2 (ja) * | 2003-09-12 | 2011-07-06 | カール・ツァイス・エスエムティー・ゲーエムベーハー | マイクロリソグラフィ投影露光設備のための照明系 |
| TWI511179B (zh) * | 2003-10-28 | 2015-12-01 | 尼康股份有限公司 | 照明光學裝置、曝光裝置、曝光方法以及元件製造方法 |
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| TWI395068B (zh) | 2004-01-27 | 2013-05-01 | 尼康股份有限公司 | 光學系統、曝光裝置以及曝光方法 |
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| US6563567B1 (en) * | 1998-12-17 | 2003-05-13 | Nikon Corporation | Method and apparatus for illuminating a surface using a projection imaging apparatus |
| JP2001174615A (ja) * | 1999-04-15 | 2001-06-29 | Nikon Corp | 回折光学素子、該素子の製造方法、該素子を備える照明装置、投影露光装置、露光方法、及び光ホモジナイザー、該光ホモジナイザーの製造方法 |
| US6671035B2 (en) * | 1999-09-29 | 2003-12-30 | Asml Netherlands B.V. | Illuminator for a lithography apparatus, a lithography apparatus comprising such an illuminator, and a manufacturing method employing such a lithography apparatus |
-
2001
- 2001-03-15 JP JP2001074240A patent/JP2002231619A/ja active Pending
- 2001-08-23 TW TW090120743A patent/TW516097B/zh active
- 2001-11-28 SG SG200107340A patent/SG114513A1/en unknown
- 2001-11-28 KR KR1020010074517A patent/KR20020042462A/ko not_active Withdrawn
- 2001-11-28 US US09/994,861 patent/US20020085276A1/en not_active Abandoned
- 2001-11-29 EP EP01128550A patent/EP1211561A3/en not_active Withdrawn
-
2004
- 2004-05-13 US US10/844,353 patent/US20040263817A1/en not_active Abandoned
Patent Citations (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH11274060A (ja) * | 1998-03-19 | 1999-10-08 | Nikon Corp | 照明光学装置および該照明光学装置を備えた露光装置 |
| US6236449B1 (en) * | 1998-03-19 | 2001-05-22 | Nikon Corporation | Illumination optical apparatus and exposure apparatus |
| EP0949541A2 (en) * | 1998-04-08 | 1999-10-13 | Asm Lithography B.V. | Lithography apparatus |
| JPH11317344A (ja) * | 1998-04-30 | 1999-11-16 | Nikon Corp | 露光装置 |
| JP2002110502A (ja) * | 2000-09-26 | 2002-04-12 | Canon Inc | 照明装置及び露光装置 |
| JP2002075859A (ja) * | 2001-07-09 | 2002-03-15 | Canon Inc | 照明装置、露光装置及びデバイス製造方法 |
Also Published As
| Publication number | Publication date |
|---|---|
| TW516097B (en) | 2003-01-01 |
| US20020085276A1 (en) | 2002-07-04 |
| JP2002231619A (ja) | 2002-08-16 |
| EP1211561A3 (en) | 2005-01-26 |
| EP1211561A2 (en) | 2002-06-05 |
| KR20020042462A (ko) | 2002-06-05 |
| US20040263817A1 (en) | 2004-12-30 |
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