SG11201508462PA - High speed photodetector - Google Patents

High speed photodetector

Info

Publication number
SG11201508462PA
SG11201508462PA SG11201508462PA SG11201508462PA SG11201508462PA SG 11201508462P A SG11201508462P A SG 11201508462PA SG 11201508462P A SG11201508462P A SG 11201508462PA SG 11201508462P A SG11201508462P A SG 11201508462PA SG 11201508462P A SG11201508462P A SG 11201508462PA
Authority
SG
Singapore
Prior art keywords
high speed
speed photodetector
photodetector
speed
Prior art date
Application number
SG11201508462PA
Other languages
English (en)
Inventor
Marek Grzegorz Chacinski
Nicolae Pantazi Chitica
Original Assignee
Tyco Electronics Svenska Holdings Ab
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Tyco Electronics Svenska Holdings Ab filed Critical Tyco Electronics Svenska Holdings Ab
Publication of SG11201508462PA publication Critical patent/SG11201508462PA/en

Links

Classifications

    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10FINORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
    • H10F30/00Individual radiation-sensitive semiconductor devices in which radiation controls the flow of current through the devices, e.g. photodetectors
    • H10F30/20Individual radiation-sensitive semiconductor devices in which radiation controls the flow of current through the devices, e.g. photodetectors the devices having potential barriers, e.g. phototransistors
    • H10F30/21Individual radiation-sensitive semiconductor devices in which radiation controls the flow of current through the devices, e.g. photodetectors the devices having potential barriers, e.g. phototransistors the devices being sensitive to infrared, visible or ultraviolet radiation
    • H10F30/22Individual radiation-sensitive semiconductor devices in which radiation controls the flow of current through the devices, e.g. photodetectors the devices having potential barriers, e.g. phototransistors the devices being sensitive to infrared, visible or ultraviolet radiation the devices having only one potential barrier, e.g. photodiodes
    • H10F30/223Individual radiation-sensitive semiconductor devices in which radiation controls the flow of current through the devices, e.g. photodetectors the devices having potential barriers, e.g. phototransistors the devices being sensitive to infrared, visible or ultraviolet radiation the devices having only one potential barrier, e.g. photodiodes the potential barrier being a PIN barrier
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10FINORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
    • H10F77/00Constructional details of devices covered by this subclass
    • H10F77/10Semiconductor bodies
    • H10F77/12Active materials
    • H10F77/124Active materials comprising only Group III-V materials, e.g. GaAs
    • H10F77/1243Active materials comprising only Group III-V materials, e.g. GaAs characterised by the dopants
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10FINORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
    • H10F77/00Constructional details of devices covered by this subclass
    • H10F77/10Semiconductor bodies
    • H10F77/12Active materials
    • H10F77/124Active materials comprising only Group III-V materials, e.g. GaAs
    • H10F77/1248Active materials comprising only Group III-V materials, e.g. GaAs having three or more elements, e.g. GaAlAs, InGaAs or InGaAsP
SG11201508462PA 2013-05-31 2014-05-21 High speed photodetector SG11201508462PA (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
EP13002838.4A EP2808908B1 (en) 2013-05-31 2013-05-31 High-speed photodetector
PCT/EP2014/060432 WO2014191275A1 (en) 2013-05-31 2014-05-21 High speed photodetector

Publications (1)

Publication Number Publication Date
SG11201508462PA true SG11201508462PA (en) 2015-11-27

Family

ID=48538955

Family Applications (1)

Application Number Title Priority Date Filing Date
SG11201508462PA SG11201508462PA (en) 2013-05-31 2014-05-21 High speed photodetector

Country Status (7)

Country Link
US (1) US9882080B2 (enExample)
EP (1) EP2808908B1 (enExample)
JP (1) JP6466416B2 (enExample)
CN (1) CN105283964B (enExample)
SG (1) SG11201508462PA (enExample)
TW (1) TWI620339B (enExample)
WO (1) WO2014191275A1 (enExample)

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US11043604B2 (en) * 2015-07-28 2021-06-22 University Of Rochester Low dark current, resonant cavity-enhanced infrared photodetectors
JP6880601B2 (ja) * 2016-08-22 2021-06-02 富士通株式会社 光検出器及び撮像装置
US10396527B2 (en) * 2017-06-14 2019-08-27 Mellanox Technologies, Ltd. Vertical-cavity surface-emitting laser with high modulation speed
US10490687B2 (en) 2018-01-29 2019-11-26 Waymo Llc Controlling detection time in photodetectors
CN109244152B (zh) * 2018-08-02 2023-09-29 芯思杰技术(深圳)股份有限公司 一种短距离通信高速光电二极管芯片及其制作方法
UA120025C2 (uk) * 2019-03-26 2019-09-10 Андрій Дмитрович Хворостяний Напівпровідниковий термоелектричний генератор
TWI835924B (zh) * 2019-11-18 2024-03-21 晶元光電股份有限公司 光偵測元件
CN112420859B (zh) * 2020-11-18 2022-05-13 上海科技大学 850nm波段吸收区部分耗尽光电探测器及其制备方法
CN114520270B (zh) * 2020-11-20 2024-07-05 苏州华太电子技术股份有限公司 一种间接带隙半导体光电探测器件及其制作方法
CN114864730B (zh) * 2021-02-04 2024-12-27 迈络思科技有限公司 高调制速度pin型光电二极管
US12278304B2 (en) 2021-02-04 2025-04-15 Mellanox Technologies, Ltd. High modulation speed PIN-type photodiode
US20230299223A1 (en) * 2022-03-16 2023-09-21 Sensors Unlimited, Inc. Photodiode structures
CN117096202A (zh) * 2022-05-20 2023-11-21 瑞德兰科技有限公司 具有不对称接触件的辐射检测器
WO2025238716A1 (ja) * 2024-05-14 2025-11-20 Ntt株式会社 受光素子
CN118825104A (zh) * 2024-06-21 2024-10-22 中国电子科技集团公司第十一研究所 一种高性能铟镓砷红外探测器结构
CN119947336A (zh) * 2025-01-20 2025-05-06 隆基绿能科技股份有限公司 一种太阳能电池片以及光伏组件

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GB2256746B (en) * 1991-06-12 1995-05-03 Marconi Gec Ltd Semiconductor devices
US5576559A (en) * 1994-11-01 1996-11-19 Intevac, Inc. Heterojunction electron transfer device
US5818096A (en) 1996-04-05 1998-10-06 Nippon Telegraph And Telephone Corp. Pin photodiode with improved frequency response and saturation output
JP2000223736A (ja) * 1999-01-28 2000-08-11 Nippon Telegr & Teleph Corp <Ntt> 金属−半導体−金属型受光素子
US7202102B2 (en) 2001-11-27 2007-04-10 Jds Uniphase Corporation Doped absorption for enhanced responsivity for high speed photodiodes
JP2003174185A (ja) * 2001-12-05 2003-06-20 Fujitsu Ltd 半導体受光素子
JP5021888B2 (ja) 2002-02-01 2012-09-12 ピコメトリックス インコーポレイテッド 拡張型光検出器
JP4030847B2 (ja) * 2002-09-20 2008-01-09 ユーディナデバイス株式会社 半導体受光装置
US6740908B1 (en) * 2003-03-18 2004-05-25 Agilent Technologies, Inc. Extended drift heterostructure photodiode having enhanced electron response
JP2006229156A (ja) * 2005-02-21 2006-08-31 Ntt Electornics Corp フォトダイオード
EP2143146A1 (en) * 2007-04-13 2010-01-13 Semiconductor Energy Laboratory Co, Ltd. Photovoltaic device and method for manufacturing the same
WO2009100023A2 (en) * 2008-02-01 2009-08-13 President & Fellows Of Harvard College A multijunction photovoltaic device
JP2011176094A (ja) * 2010-02-24 2011-09-08 Nippon Telegr & Teleph Corp <Ntt> フォトダイオード
JP2011258809A (ja) * 2010-06-10 2011-12-22 Mitsubishi Electric Corp 半導体受光素子
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JP2012146806A (ja) * 2011-01-12 2012-08-02 Irspec Corp 格子不整合赤外化合物半導体受光素子

Also Published As

Publication number Publication date
WO2014191275A1 (en) 2014-12-04
EP2808908A1 (en) 2014-12-03
JP6466416B2 (ja) 2019-02-06
CN105283964A (zh) 2016-01-27
TWI620339B (zh) 2018-04-01
EP2808908B1 (en) 2023-04-19
TW201507187A (zh) 2015-02-16
JP2016522578A (ja) 2016-07-28
US9882080B2 (en) 2018-01-30
CN105283964B (zh) 2018-04-13
US20160172523A1 (en) 2016-06-16

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