SG11201501175TA - Tantalum sputtering target and method for producing same - Google Patents
Tantalum sputtering target and method for producing sameInfo
- Publication number
- SG11201501175TA SG11201501175TA SG11201501175TA SG11201501175TA SG11201501175TA SG 11201501175T A SG11201501175T A SG 11201501175TA SG 11201501175T A SG11201501175T A SG 11201501175TA SG 11201501175T A SG11201501175T A SG 11201501175TA SG 11201501175T A SG11201501175T A SG 11201501175TA
- Authority
- SG
- Singapore
- Prior art keywords
- sputtering target
- producing same
- tantalum sputtering
- tantalum
- producing
- Prior art date
Links
- 238000004519 manufacturing process Methods 0.000 title 1
- 238000005477 sputtering target Methods 0.000 title 1
- 229910052715 tantalum Inorganic materials 0.000 title 1
- GUVRBAGPIYLISA-UHFFFAOYSA-N tantalum atom Chemical compound [Ta] GUVRBAGPIYLISA-UHFFFAOYSA-N 0.000 title 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/32—Gas-filled discharge tubes
- H01J37/34—Gas-filled discharge tubes operating with cathodic sputtering
- H01J37/3411—Constructional aspects of the reactor
- H01J37/3414—Targets
- H01J37/3426—Material
-
- C—CHEMISTRY; METALLURGY
- C01—INORGANIC CHEMISTRY
- C01B—NON-METALLIC ELEMENTS; COMPOUNDS THEREOF; METALLOIDS OR COMPOUNDS THEREOF NOT COVERED BY SUBCLASS C01C
- C01B21/00—Nitrogen; Compounds thereof
- C01B21/06—Binary compounds of nitrogen with metals, with silicon, or with boron, or with carbon, i.e. nitrides; Compounds of nitrogen with more than one metal, silicon or boron
- C01B21/0615—Binary compounds of nitrogen with metals, with silicon, or with boron, or with carbon, i.e. nitrides; Compounds of nitrogen with more than one metal, silicon or boron with transition metals other than titanium, zirconium or hafnium
- C01B21/0617—Binary compounds of nitrogen with metals, with silicon, or with boron, or with carbon, i.e. nitrides; Compounds of nitrogen with more than one metal, silicon or boron with transition metals other than titanium, zirconium or hafnium with vanadium, niobium or tantalum
-
- C—CHEMISTRY; METALLURGY
- C22—METALLURGY; FERROUS OR NON-FERROUS ALLOYS; TREATMENT OF ALLOYS OR NON-FERROUS METALS
- C22C—ALLOYS
- C22C27/00—Alloys based on rhenium or a refractory metal not mentioned in groups C22C14/00 or C22C16/00
- C22C27/02—Alloys based on vanadium, niobium, or tantalum
-
- C—CHEMISTRY; METALLURGY
- C22—METALLURGY; FERROUS OR NON-FERROUS ALLOYS; TREATMENT OF ALLOYS OR NON-FERROUS METALS
- C22F—CHANGING THE PHYSICAL STRUCTURE OF NON-FERROUS METALS AND NON-FERROUS ALLOYS
- C22F1/00—Changing the physical structure of non-ferrous metals or alloys by heat treatment or by hot or cold working
- C22F1/16—Changing the physical structure of non-ferrous metals or alloys by heat treatment or by hot or cold working of other metals or alloys based thereon
- C22F1/18—High-melting or refractory metals or alloys based thereon
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/06—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the coating material
- C23C14/14—Metallic material, boron or silicon
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/06—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the coating material
- C23C14/14—Metallic material, boron or silicon
- C23C14/16—Metallic material, boron or silicon on metallic substrates or on substrates of boron or silicon
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/22—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
- C23C14/34—Sputtering
- C23C14/3407—Cathode assembly for sputtering apparatus, e.g. Target
- C23C14/3414—Metallurgical or chemical aspects of target preparation, e.g. casting, powder metallurgy
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02104—Forming layers
- H01L21/02107—Forming insulating materials on a substrate
- H01L21/02225—Forming insulating materials on a substrate characterised by the process for the formation of the insulating layer
- H01L21/0226—Forming insulating materials on a substrate characterised by the process for the formation of the insulating layer formation by a deposition process
- H01L21/02263—Forming insulating materials on a substrate characterised by the process for the formation of the insulating layer formation by a deposition process deposition from the gas or vapour phase
- H01L21/02266—Forming insulating materials on a substrate characterised by the process for the formation of the insulating layer formation by a deposition process deposition from the gas or vapour phase deposition by physical ablation of a target, e.g. sputtering, reactive sputtering, physical vapour deposition or pulsed laser deposition
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/28—Manufacture of electrodes on semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/268
- H01L21/283—Deposition of conductive or insulating materials for electrodes conducting electric current
- H01L21/285—Deposition of conductive or insulating materials for electrodes conducting electric current from a gas or vapour, e.g. condensation
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/28—Manufacture of electrodes on semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/268
- H01L21/283—Deposition of conductive or insulating materials for electrodes conducting electric current
- H01L21/285—Deposition of conductive or insulating materials for electrodes conducting electric current from a gas or vapour, e.g. condensation
- H01L21/28506—Deposition of conductive or insulating materials for electrodes conducting electric current from a gas or vapour, e.g. condensation of conductive layers
- H01L21/28512—Deposition of conductive or insulating materials for electrodes conducting electric current from a gas or vapour, e.g. condensation of conductive layers on semiconductor bodies comprising elements of Group IV of the Periodic Table
- H01L21/2855—Deposition of conductive or insulating materials for electrodes conducting electric current from a gas or vapour, e.g. condensation of conductive layers on semiconductor bodies comprising elements of Group IV of the Periodic Table by physical means, e.g. sputtering, evaporation
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/70—Manufacture or treatment of devices consisting of a plurality of solid state components formed in or on a common substrate or of parts thereof; Manufacture of integrated circuit devices or of parts thereof
- H01L21/71—Manufacture of specific parts of devices defined in group H01L21/70
- H01L21/768—Applying interconnections to be used for carrying current between separate components within a device comprising conductors and dielectrics
- H01L21/76838—Applying interconnections to be used for carrying current between separate components within a device comprising conductors and dielectrics characterised by the formation and the after-treatment of the conductors
- H01L21/76841—Barrier, adhesion or liner layers
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/52—Arrangements for conducting electric current within the device in operation from one component to another, i.e. interconnections, e.g. wires, lead frames
- H01L23/522—Arrangements for conducting electric current within the device in operation from one component to another, i.e. interconnections, e.g. wires, lead frames including external interconnections consisting of a multilayer structure of conductive and insulating layers inseparably formed on the semiconductor body
- H01L23/532—Arrangements for conducting electric current within the device in operation from one component to another, i.e. interconnections, e.g. wires, lead frames including external interconnections consisting of a multilayer structure of conductive and insulating layers inseparably formed on the semiconductor body characterised by the materials
- H01L23/53204—Conductive materials
- H01L23/53209—Conductive materials based on metals, e.g. alloys, metal silicides
- H01L23/53228—Conductive materials based on metals, e.g. alloys, metal silicides the principal metal being copper
- H01L23/53238—Additional layers associated with copper layers, e.g. adhesion, barrier, cladding layers
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/0001—Technical content checked by a classifier
- H01L2924/0002—Not covered by any one of groups H01L24/00, H01L24/00 and H01L2224/00
Landscapes
- Chemical & Material Sciences (AREA)
- Engineering & Computer Science (AREA)
- Organic Chemistry (AREA)
- Physics & Mathematics (AREA)
- Mechanical Engineering (AREA)
- Metallurgy (AREA)
- Materials Engineering (AREA)
- Computer Hardware Design (AREA)
- General Physics & Mathematics (AREA)
- Power Engineering (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Manufacturing & Machinery (AREA)
- Crystallography & Structural Chemistry (AREA)
- Thermal Sciences (AREA)
- Plasma & Fusion (AREA)
- Analytical Chemistry (AREA)
- Inorganic Chemistry (AREA)
- Optics & Photonics (AREA)
- Physical Vapour Deposition (AREA)
- Forging (AREA)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2012276883 | 2012-12-19 | ||
PCT/JP2013/082764 WO2014097897A1 (ja) | 2012-12-19 | 2013-12-06 | タンタルスパッタリングターゲット及びその製造方法 |
Publications (1)
Publication Number | Publication Date |
---|---|
SG11201501175TA true SG11201501175TA (en) | 2015-05-28 |
Family
ID=50978232
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
SG11201501175TA SG11201501175TA (en) | 2012-12-19 | 2013-12-06 | Tantalum sputtering target and method for producing same |
Country Status (9)
Country | Link |
---|---|
US (1) | US10490393B2 (ko) |
EP (1) | EP2878699B1 (ko) |
JP (1) | JP5847309B2 (ko) |
KR (2) | KR20170036120A (ko) |
CN (1) | CN105431565B (ko) |
IL (1) | IL237919B (ko) |
SG (1) | SG11201501175TA (ko) |
TW (1) | TWI580796B (ko) |
WO (1) | WO2014097897A1 (ko) |
Families Citing this family (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP2878700B1 (en) | 2012-12-19 | 2021-01-20 | JX Nippon Mining & Metals Corporation | Method for producing tantalum sputtering target |
US9859104B2 (en) | 2013-03-04 | 2018-01-02 | Jx Nippon Mining & Metals Corporation | Tantalum sputtering target and production method therefor |
CN105593399B (zh) | 2013-10-01 | 2018-05-25 | 吉坤日矿日石金属株式会社 | 钽溅射靶 |
SG11201704463VA (en) | 2015-05-22 | 2017-07-28 | Jx Nippon Mining & Metals Corp | Tantalum sputtering target, and production method therefor |
SG11201708112TA (en) | 2015-05-22 | 2017-11-29 | Jx Nippon Mining & Metals Corp | Tantalum sputtering target, and production method therefor |
TW201738395A (zh) * | 2015-11-06 | 2017-11-01 | 塔沙Smd公司 | 具有提高的沉積速率的製備鉭濺鍍靶材的方法 |
JP7053411B2 (ja) * | 2018-08-31 | 2022-04-12 | 株式会社アイシン | 金属部品の製造方法 |
CN109338316B (zh) * | 2018-09-12 | 2020-04-28 | 中南大学 | 一种组织及织构可控的超高纯钽及其制备方法和应用 |
CN114990502A (zh) * | 2022-06-02 | 2022-09-02 | 有研亿金新材料(山东)有限公司 | 一种高性能钽靶坯的制备方法 |
Family Cites Families (34)
Publication number | Priority date | Publication date | Assignee | Title |
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JPH1180942A (ja) | 1997-09-10 | 1999-03-26 | Japan Energy Corp | Taスパッタターゲットとその製造方法及び組立体 |
US6348139B1 (en) * | 1998-06-17 | 2002-02-19 | Honeywell International Inc. | Tantalum-comprising articles |
JP4817536B2 (ja) | 2001-06-06 | 2011-11-16 | 株式会社東芝 | スパッタターゲット |
US7081148B2 (en) | 2001-09-18 | 2006-07-25 | Praxair S.T. Technology, Inc. | Textured-grain-powder metallurgy tantalum sputter target |
JP4883546B2 (ja) | 2002-09-20 | 2012-02-22 | Jx日鉱日石金属株式会社 | タンタルスパッタリングターゲットの製造方法 |
JP4263900B2 (ja) | 2002-11-13 | 2009-05-13 | 日鉱金属株式会社 | Taスパッタリングターゲット及びその製造方法 |
US6794753B2 (en) | 2002-12-27 | 2004-09-21 | Lexmark International, Inc. | Diffusion barrier and method therefor |
JP4672967B2 (ja) | 2003-01-10 | 2011-04-20 | Jx日鉱日石金属株式会社 | ターゲットの製造方法 |
WO2004090193A1 (ja) | 2003-04-01 | 2004-10-21 | Nikko Materials Co., Ltd. | タンタルスパッタリングターゲット及びその製造方法 |
CN101857950B (zh) * | 2003-11-06 | 2012-08-08 | Jx日矿日石金属株式会社 | 钽溅射靶 |
KR100559395B1 (ko) | 2003-11-10 | 2006-03-10 | 현대자동차주식회사 | 마이크로 보링 베어링 |
US7686926B2 (en) | 2004-05-26 | 2010-03-30 | Applied Materials, Inc. | Multi-step process for forming a metal barrier in a sputter reactor |
US7998287B2 (en) | 2005-02-10 | 2011-08-16 | Cabot Corporation | Tantalum sputtering target and method of fabrication |
WO2006117949A1 (ja) | 2005-04-28 | 2006-11-09 | Nippon Mining & Metals Co., Ltd. | スパッタリングターゲット |
EP1942204B1 (en) | 2005-10-04 | 2012-04-25 | JX Nippon Mining & Metals Corporation | Sputtering target |
KR101100288B1 (ko) | 2005-12-02 | 2011-12-28 | 가부시키가이샤 알박 | Cu막의 형성방법 |
JP4714123B2 (ja) | 2006-10-30 | 2011-06-29 | 株式会社東芝 | スパッタリングターゲット用高純度Ta材の製造方法 |
WO2009107763A1 (ja) | 2008-02-29 | 2009-09-03 | 新日鉄マテリアルズ株式会社 | 金属系スパッタリングターゲット材 |
JP5583140B2 (ja) | 2008-12-02 | 2014-09-03 | アリゾナ・ボード・オブ・リージェンツ,フォー・アンド・オン・ビハーフ・オブ・アリゾナ・ステート・ユニバーシティ | フレキシブル基板アセンブリを準備する方法およびその方法により準備されたフレキシブル基板アセンブリ |
JP5144760B2 (ja) | 2009-05-22 | 2013-02-13 | Jx日鉱日石金属株式会社 | タンタルスパッタリングターゲット |
TW201117262A (en) | 2009-05-29 | 2011-05-16 | Univ Arizona | Method of providing a flexible semiconductor device at high temperatures and flexible semiconductor device thereof |
CN104018127B (zh) | 2009-08-11 | 2019-06-21 | 吉坤日矿日石金属株式会社 | 钽溅射靶 |
EP2465968A4 (en) | 2009-08-11 | 2014-04-30 | Jx Nippon Mining & Metals Corp | TANTALE SPRAY TARGET |
DE112010003274T5 (de) * | 2009-08-12 | 2012-12-27 | Ulvac, Inc. | Verfahren zur Herstellung eines Sputtertargets sowie Sputtertarget |
JP5714506B2 (ja) * | 2009-11-17 | 2015-05-07 | 株式会社東芝 | タンタルスパッタリングターゲットおよびタンタルスパッタリングターゲットの製造方法ならびに半導体素子の製造方法 |
KR101051945B1 (ko) | 2009-12-02 | 2011-07-27 | 황도희 | 즉석 양념갈비 소스의 제조방법 |
KR20130037215A (ko) | 2010-08-09 | 2013-04-15 | 제이엑스 닛코 닛세키 킨조쿠 가부시키가이샤 | 탄탈 스퍼터링 타깃 |
KR20130008089A (ko) | 2010-08-09 | 2013-01-21 | 제이엑스 닛코 닛세키 킨조쿠 가부시키가이샤 | 탄탈 스퍼터링 타깃 |
SG2014009997A (en) | 2011-11-30 | 2014-04-28 | Jx Nippon Mining & Metals Corp | Tantalum sputtering target and method for manufacturing same |
KR101882606B1 (ko) | 2012-03-21 | 2018-07-26 | 제이엑스금속주식회사 | 탄탈 스퍼터링 타깃 및 그 제조 방법 그리고 동 타깃을 사용하여 형성한 반도체 배선용 배리어막 |
EP2878700B1 (en) | 2012-12-19 | 2021-01-20 | JX Nippon Mining & Metals Corporation | Method for producing tantalum sputtering target |
US9859104B2 (en) | 2013-03-04 | 2018-01-02 | Jx Nippon Mining & Metals Corporation | Tantalum sputtering target and production method therefor |
CN105593399B (zh) | 2013-10-01 | 2018-05-25 | 吉坤日矿日石金属株式会社 | 钽溅射靶 |
KR102112937B1 (ko) | 2014-03-27 | 2020-05-19 | 제이엑스금속주식회사 | 탄탈 스퍼터링 타깃 및 그 제조 방법 |
-
2013
- 2013-12-06 SG SG11201501175TA patent/SG11201501175TA/en unknown
- 2013-12-06 US US14/433,948 patent/US10490393B2/en active Active
- 2013-12-06 EP EP13866236.6A patent/EP2878699B1/en active Active
- 2013-12-06 KR KR1020177007784A patent/KR20170036120A/ko not_active Application Discontinuation
- 2013-12-06 WO PCT/JP2013/082764 patent/WO2014097897A1/ja active Application Filing
- 2013-12-06 KR KR1020157007541A patent/KR101950549B1/ko active IP Right Grant
- 2013-12-06 JP JP2014524215A patent/JP5847309B2/ja active Active
- 2013-12-06 CN CN201380053775.9A patent/CN105431565B/zh active Active
- 2013-12-11 TW TW102145544A patent/TWI580796B/zh active
-
2015
- 2015-03-24 IL IL237919A patent/IL237919B/en active IP Right Grant
Also Published As
Publication number | Publication date |
---|---|
US20150279637A1 (en) | 2015-10-01 |
JPWO2014097897A1 (ja) | 2017-01-12 |
KR20150046278A (ko) | 2015-04-29 |
EP2878699B1 (en) | 2020-07-15 |
JP5847309B2 (ja) | 2016-01-20 |
EP2878699A1 (en) | 2015-06-03 |
EP2878699A4 (en) | 2016-03-30 |
IL237919B (en) | 2018-02-28 |
TW201439335A (zh) | 2014-10-16 |
KR20170036120A (ko) | 2017-03-31 |
WO2014097897A1 (ja) | 2014-06-26 |
CN105431565A (zh) | 2016-03-23 |
KR101950549B1 (ko) | 2019-02-20 |
CN105431565B (zh) | 2018-06-05 |
TWI580796B (zh) | 2017-05-01 |
US10490393B2 (en) | 2019-11-26 |
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