SE9704211L - Halvledarkomponent och tillverkningsförfarande för halvledarkomponent - Google Patents

Halvledarkomponent och tillverkningsförfarande för halvledarkomponent

Info

Publication number
SE9704211L
SE9704211L SE9704211A SE9704211A SE9704211L SE 9704211 L SE9704211 L SE 9704211L SE 9704211 A SE9704211 A SE 9704211A SE 9704211 A SE9704211 A SE 9704211A SE 9704211 L SE9704211 L SE 9704211L
Authority
SE
Sweden
Prior art keywords
layer
semiconductor component
buried
manufacturing procedure
conducting
Prior art date
Application number
SE9704211A
Other languages
English (en)
Other versions
SE513471C2 (sv
SE9704211D0 (sv
Inventor
Anders Soederbaerg
Haakan Sjoedin
Original Assignee
Ericsson Telefon Ab L M
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Ericsson Telefon Ab L M filed Critical Ericsson Telefon Ab L M
Priority to SE9704211A priority Critical patent/SE513471C2/sv
Publication of SE9704211D0 publication Critical patent/SE9704211D0/sv
Priority to TW087100712A priority patent/TW385526B/zh
Priority to CA002310280A priority patent/CA2310280A1/en
Priority to KR1020007005336A priority patent/KR100584969B1/ko
Priority to US09/193,181 priority patent/US6326292B1/en
Priority to CN988131676A priority patent/CN1132238C/zh
Priority to EP98954909A priority patent/EP1040517B1/en
Priority to AU11839/99A priority patent/AU1183999A/en
Priority to JP2000521553A priority patent/JP2001523893A/ja
Priority to DE69838683T priority patent/DE69838683D1/de
Priority to PCT/SE1998/002062 priority patent/WO1999026293A2/en
Publication of SE9704211L publication Critical patent/SE9704211L/sv
Publication of SE513471C2 publication Critical patent/SE513471C2/sv

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L29/00—Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
    • H01L29/66—Types of semiconductor device ; Multistep manufacturing processes therefor
    • H01L29/66007—Multistep manufacturing processes
    • H01L29/66075—Multistep manufacturing processes of devices having semiconductor bodies comprising group 14 or group 13/15 materials
    • H01L29/66227—Multistep manufacturing processes of devices having semiconductor bodies comprising group 14 or group 13/15 materials the devices being controllable only by the electric current supplied or the electric potential applied, to an electrode which does not carry the current to be rectified, amplified or switched, e.g. three-terminal devices
    • H01L29/66234—Bipolar junction transistors [BJT]
    • H01L29/66265—Thin film bipolar transistors
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/70—Manufacture or treatment of devices consisting of a plurality of solid state components formed in or on a common substrate or of parts thereof; Manufacture of integrated circuit devices or of parts thereof
    • H01L21/77—Manufacture or treatment of devices consisting of a plurality of solid state components or integrated circuits formed in, or on, a common substrate
    • H01L21/78—Manufacture or treatment of devices consisting of a plurality of solid state components or integrated circuits formed in, or on, a common substrate with subsequent division of the substrate into plural individual devices
    • H01L21/82—Manufacture or treatment of devices consisting of a plurality of solid state components or integrated circuits formed in, or on, a common substrate with subsequent division of the substrate into plural individual devices to produce devices, e.g. integrated circuits, each consisting of a plurality of components
    • H01L21/84—Manufacture or treatment of devices consisting of a plurality of solid state components or integrated circuits formed in, or on, a common substrate with subsequent division of the substrate into plural individual devices to produce devices, e.g. integrated circuits, each consisting of a plurality of components the substrate being other than a semiconductor body, e.g. being an insulating body
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
    • H01L27/02—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers
    • H01L27/12—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being other than a semiconductor body, e.g. an insulating body
    • H01L27/1203—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being other than a semiconductor body, e.g. an insulating body the substrate comprising an insulating body on a semiconductor body, e.g. SOI
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L29/00—Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
    • H01L29/02—Semiconductor bodies ; Multistep manufacturing processes therefor
    • H01L29/06—Semiconductor bodies ; Multistep manufacturing processes therefor characterised by their shape; characterised by the shapes, relative sizes, or dispositions of the semiconductor regions ; characterised by the concentration or distribution of impurities within semiconductor regions
    • H01L29/08—Semiconductor bodies ; Multistep manufacturing processes therefor characterised by their shape; characterised by the shapes, relative sizes, or dispositions of the semiconductor regions ; characterised by the concentration or distribution of impurities within semiconductor regions with semiconductor regions connected to an electrode carrying current to be rectified, amplified or switched and such electrode being part of a semiconductor device which comprises three or more electrodes
    • H01L29/0821—Collector regions of bipolar transistors
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L29/00—Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
    • H01L29/66—Types of semiconductor device ; Multistep manufacturing processes therefor
    • H01L29/66007—Multistep manufacturing processes
    • H01L29/66075—Multistep manufacturing processes of devices having semiconductor bodies comprising group 14 or group 13/15 materials
    • H01L29/66227—Multistep manufacturing processes of devices having semiconductor bodies comprising group 14 or group 13/15 materials the devices being controllable only by the electric current supplied or the electric potential applied, to an electrode which does not carry the current to be rectified, amplified or switched, e.g. three-terminal devices
    • H01L29/66234—Bipolar junction transistors [BJT]
    • H01L29/66325—Bipolar junction transistors [BJT] controlled by field-effect, e.g. insulated gate bipolar transistors [IGBT]
    • H01L29/66333—Vertical insulated gate bipolar transistors
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L29/00—Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
    • H01L29/66—Types of semiconductor device ; Multistep manufacturing processes therefor
    • H01L29/66007—Multistep manufacturing processes
    • H01L29/66075—Multistep manufacturing processes of devices having semiconductor bodies comprising group 14 or group 13/15 materials
    • H01L29/66227—Multistep manufacturing processes of devices having semiconductor bodies comprising group 14 or group 13/15 materials the devices being controllable only by the electric current supplied or the electric potential applied, to an electrode which does not carry the current to be rectified, amplified or switched, e.g. three-terminal devices
    • H01L29/66409—Unipolar field-effect transistors
    • H01L29/66477—Unipolar field-effect transistors with an insulated gate, i.e. MISFET
    • H01L29/66674—DMOS transistors, i.e. MISFETs with a channel accommodating body or base region adjoining a drain drift region
    • H01L29/66712—Vertical DMOS transistors, i.e. VDMOS transistors
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L29/00—Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
    • H01L29/66—Types of semiconductor device ; Multistep manufacturing processes therefor
    • H01L29/66007—Multistep manufacturing processes
    • H01L29/66075—Multistep manufacturing processes of devices having semiconductor bodies comprising group 14 or group 13/15 materials
    • H01L29/66227—Multistep manufacturing processes of devices having semiconductor bodies comprising group 14 or group 13/15 materials the devices being controllable only by the electric current supplied or the electric potential applied, to an electrode which does not carry the current to be rectified, amplified or switched, e.g. three-terminal devices
    • H01L29/66409—Unipolar field-effect transistors
    • H01L29/66477—Unipolar field-effect transistors with an insulated gate, i.e. MISFET
    • H01L29/66742—Thin film unipolar transistors
    • H01L29/66772—Monocristalline silicon transistors on insulating substrates, e.g. quartz substrates
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L29/00—Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
    • H01L29/66—Types of semiconductor device ; Multistep manufacturing processes therefor
    • H01L29/68—Types of semiconductor device ; Multistep manufacturing processes therefor controllable by only the electric current supplied, or only the electric potential applied, to an electrode which does not carry the current to be rectified, amplified or switched
    • H01L29/70—Bipolar devices
    • H01L29/72—Transistor-type devices, i.e. able to continuously respond to applied control signals
    • H01L29/739—Transistor-type devices, i.e. able to continuously respond to applied control signals controlled by field-effect, e.g. bipolar static induction transistors [BSIT]
    • H01L29/7393—Insulated gate bipolar mode transistors, i.e. IGBT; IGT; COMFET
    • H01L29/7395—Vertical transistors, e.g. vertical IGBT
    • H01L29/7398—Vertical transistors, e.g. vertical IGBT with both emitter and collector contacts in the same substrate side
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L29/00—Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
    • H01L29/66—Types of semiconductor device ; Multistep manufacturing processes therefor
    • H01L29/68—Types of semiconductor device ; Multistep manufacturing processes therefor controllable by only the electric current supplied, or only the electric potential applied, to an electrode which does not carry the current to be rectified, amplified or switched
    • H01L29/76—Unipolar devices, e.g. field effect transistors
    • H01L29/772—Field effect transistors
    • H01L29/78—Field effect transistors with field effect produced by an insulated gate
    • H01L29/7801—DMOS transistors, i.e. MISFETs with a channel accommodating body or base region adjoining a drain drift region
    • H01L29/7802—Vertical DMOS transistors, i.e. VDMOS transistors
    • H01L29/7809—Vertical DMOS transistors, i.e. VDMOS transistors having both source and drain contacts on the same surface, i.e. Up-Drain VDMOS transistors
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10S257/00—Active solid-state devices, e.g. transistors, solid-state diodes
    • Y10S257/903—FET configuration adapted for use as static memory cell
    • Y10S257/904—FET configuration adapted for use as static memory cell with passive components,, e.g. polysilicon resistors

Landscapes

  • Engineering & Computer Science (AREA)
  • Power Engineering (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Ceramic Engineering (AREA)
  • Manufacturing & Machinery (AREA)
  • Bipolar Transistors (AREA)
  • Electrodes Of Semiconductors (AREA)
SE9704211A 1997-11-17 1997-11-17 Halvledarkomponent och tillverkningsförfarande för halvledarkomponent SE513471C2 (sv)

Priority Applications (11)

Application Number Priority Date Filing Date Title
SE9704211A SE513471C2 (sv) 1997-11-17 1997-11-17 Halvledarkomponent och tillverkningsförfarande för halvledarkomponent
TW087100712A TW385526B (en) 1997-11-17 1998-01-20 Semiconductor component and manufacturing method for semiconductor component
PCT/SE1998/002062 WO1999026293A2 (en) 1997-11-17 1998-11-16 Semiconductor component and manufacturing method for semiconductor component
US09/193,181 US6326292B1 (en) 1997-11-17 1998-11-16 Semiconductor component and manufacturing method for semiconductor component
KR1020007005336A KR100584969B1 (ko) 1997-11-17 1998-11-16 반도체 소자 및 반도체 소자 제조 방법
CA002310280A CA2310280A1 (en) 1997-11-17 1998-11-16 Semiconductor component and manufacturing method for semiconductor component
CN988131676A CN1132238C (zh) 1997-11-17 1998-11-16 半导体元件及其制造方法
EP98954909A EP1040517B1 (en) 1997-11-17 1998-11-16 Semiconductor component and manufacturing method for semiconductor component
AU11839/99A AU1183999A (en) 1997-11-17 1998-11-16 Semiconductor component and manufacturing method for semiconductor component
JP2000521553A JP2001523893A (ja) 1997-11-17 1998-11-16 半導体素子と半導体素子の製造方法
DE69838683T DE69838683D1 (de) 1997-11-17 1998-11-16 Halbleiterbauelement und verfahren zur herstellung

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
SE9704211A SE513471C2 (sv) 1997-11-17 1997-11-17 Halvledarkomponent och tillverkningsförfarande för halvledarkomponent

Publications (3)

Publication Number Publication Date
SE9704211D0 SE9704211D0 (sv) 1997-11-17
SE9704211L true SE9704211L (sv) 1999-05-18
SE513471C2 SE513471C2 (sv) 2000-09-18

Family

ID=20409015

Family Applications (1)

Application Number Title Priority Date Filing Date
SE9704211A SE513471C2 (sv) 1997-11-17 1997-11-17 Halvledarkomponent och tillverkningsförfarande för halvledarkomponent

Country Status (11)

Country Link
US (1) US6326292B1 (sv)
EP (1) EP1040517B1 (sv)
JP (1) JP2001523893A (sv)
KR (1) KR100584969B1 (sv)
CN (1) CN1132238C (sv)
AU (1) AU1183999A (sv)
CA (1) CA2310280A1 (sv)
DE (1) DE69838683D1 (sv)
SE (1) SE513471C2 (sv)
TW (1) TW385526B (sv)
WO (1) WO1999026293A2 (sv)

Families Citing this family (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20020140030A1 (en) * 2001-03-30 2002-10-03 Mandelman Jack A. SOI devices with integrated gettering structure
US6830986B2 (en) * 2002-01-24 2004-12-14 Matsushita Electric Industrial Co., Ltd. SOI semiconductor device having gettering layer and method for producing the same
EP1353368A1 (en) * 2002-04-11 2003-10-15 AMI Semiconductor Belgium BVBA Semiconductor structure and method for manufacturing the same
JP4020195B2 (ja) * 2002-12-19 2007-12-12 三菱電機株式会社 誘電体分離型半導体装置の製造方法
ITTO20050056A1 (it) * 2005-02-03 2006-08-04 St Microelectronics Srl Procedimento di fabbricazione di una fetta soi con aumentata capacita' di segregazione delle impurita'
US20080121985A1 (en) * 2006-11-07 2008-05-29 International Business Machines Corporation Structure and method to improve short channel effects in metal oxide semiconductor field effect transistors
US7679164B2 (en) * 2007-01-05 2010-03-16 International Business Machines Corporation Bipolar transistor with silicided sub-collector
DE102008046388A1 (de) * 2008-09-09 2010-03-18 Infineon Technologies Ag Vertikaler Bipolartransistor
US8338265B2 (en) * 2008-11-12 2012-12-25 International Business Machines Corporation Silicided trench contact to buried conductive layer
DE102012003748B4 (de) * 2011-03-01 2016-12-15 Infineon Technologies Austria Ag Verfahren zum Herstellen eines porösen Halbleiterkörpergebiets und zum Einbringen eines Fremdstoffes
CN103022088A (zh) * 2011-09-21 2013-04-03 株式会社东芝 具有沟道结构体的半导体装置及其制造方法
CN105977333B (zh) * 2016-07-12 2017-11-14 李会欣 光伏电池组件及光伏发电系统

Family Cites Families (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS61191043A (ja) * 1985-02-20 1986-08-25 Toshiba Corp 半導体装置
US4704368A (en) * 1985-10-30 1987-11-03 International Business Machines Corporation Method of making trench-incorporated monolithic semiconductor capacitor and high density dynamic memory cells including the capacitor
US5057443A (en) 1988-06-29 1991-10-15 Texas Instruments Incorporated Method for fabricating a trench bipolar transistor
US4965217A (en) 1989-04-13 1990-10-23 International Business Machines Corporation Method of making a lateral transistor
US5109263A (en) * 1989-07-28 1992-04-28 Hitachi, Ltd. Semiconductor device with optimal distance between emitter and trench isolation
US5278438A (en) 1991-12-19 1994-01-11 North American Philips Corporation Electrically erasable and programmable read-only memory with source and drain regions along sidewalls of a trench structure
US5358884A (en) 1992-09-11 1994-10-25 Micron Technology, Inc. Dual purpose collector contact and isolation scheme for advanced bicmos processes
US5283454A (en) * 1992-09-11 1994-02-01 Motorola, Inc. Semiconductor device including very low sheet resistivity buried layer
US5478758A (en) * 1994-06-03 1995-12-26 At&T Corp. Method of making a getterer for multi-layer wafers
US5643821A (en) * 1994-11-09 1997-07-01 Harris Corporation Method for making ohmic contact to lightly doped islands from a silicide buried layer and applications
JP2708027B2 (ja) 1995-10-05 1998-02-04 日本電気株式会社 半導体装置およびその製造方法

Also Published As

Publication number Publication date
CN1286803A (zh) 2001-03-07
WO1999026293A3 (en) 1999-07-15
CA2310280A1 (en) 1999-05-27
JP2001523893A (ja) 2001-11-27
EP1040517A2 (en) 2000-10-04
KR100584969B1 (ko) 2006-05-29
CN1132238C (zh) 2003-12-24
EP1040517B1 (en) 2007-11-07
KR20010032149A (ko) 2001-04-16
SE513471C2 (sv) 2000-09-18
SE9704211D0 (sv) 1997-11-17
TW385526B (en) 2000-03-21
DE69838683D1 (de) 2007-12-20
WO1999026293A2 (en) 1999-05-27
US6326292B1 (en) 2001-12-04
AU1183999A (en) 1999-06-07

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