SE522531C2 - Metod och anordning för märkning av halvledare - Google Patents
Metod och anordning för märkning av halvledareInfo
- Publication number
- SE522531C2 SE522531C2 SE9904277A SE9904277A SE522531C2 SE 522531 C2 SE522531 C2 SE 522531C2 SE 9904277 A SE9904277 A SE 9904277A SE 9904277 A SE9904277 A SE 9904277A SE 522531 C2 SE522531 C2 SE 522531C2
- Authority
- SE
- Sweden
- Prior art keywords
- pattern
- code
- wafer
- exposure
- variable
- Prior art date
Links
- 238000000034 method Methods 0.000 title claims description 36
- 239000004065 semiconductor Substances 0.000 title abstract description 4
- 238000002372 labelling Methods 0.000 title description 2
- 238000013461 design Methods 0.000 claims abstract description 26
- 238000004519 manufacturing process Methods 0.000 claims abstract description 6
- 230000003287 optical effect Effects 0.000 claims description 21
- 238000012545 processing Methods 0.000 claims description 6
- 238000012937 correction Methods 0.000 claims description 3
- 238000004377 microelectronic Methods 0.000 claims 5
- 230000000977 initiatory effect Effects 0.000 claims 2
- 238000009434 installation Methods 0.000 claims 1
- 238000012986 modification Methods 0.000 abstract description 7
- 230000004048 modification Effects 0.000 abstract description 7
- 235000012431 wafers Nutrition 0.000 description 29
- 239000010410 layer Substances 0.000 description 25
- 230000008569 process Effects 0.000 description 8
- 230000006870 function Effects 0.000 description 6
- 238000006243 chemical reaction Methods 0.000 description 4
- 239000000872 buffer Substances 0.000 description 3
- 238000004590 computer program Methods 0.000 description 3
- 230000033001 locomotion Effects 0.000 description 3
- 238000012827 research and development Methods 0.000 description 3
- 230000004044 response Effects 0.000 description 3
- 230000015572 biosynthetic process Effects 0.000 description 2
- 230000000694 effects Effects 0.000 description 2
- 238000011165 process development Methods 0.000 description 2
- 230000009467 reduction Effects 0.000 description 2
- PQVHMOLNSYFXIJ-UHFFFAOYSA-N 4-[2-(2,3-dihydro-1H-inden-2-ylamino)pyrimidin-5-yl]-1-[2-oxo-2-(2,4,6,7-tetrahydrotriazolo[4,5-c]pyridin-5-yl)ethyl]pyrazole-3-carboxylic acid Chemical compound C1C(CC2=CC=CC=C12)NC1=NC=C(C=N1)C=1C(=NN(C=1)CC(N1CC2=C(CC1)NN=N2)=O)C(=O)O PQVHMOLNSYFXIJ-UHFFFAOYSA-N 0.000 description 1
- 230000008901 benefit Effects 0.000 description 1
- 238000004364 calculation method Methods 0.000 description 1
- 238000004891 communication Methods 0.000 description 1
- 230000000295 complement effect Effects 0.000 description 1
- 230000006835 compression Effects 0.000 description 1
- 238000007906 compression Methods 0.000 description 1
- 238000011161 development Methods 0.000 description 1
- 230000018109 developmental process Effects 0.000 description 1
- 238000006073 displacement reaction Methods 0.000 description 1
- 230000005670 electromagnetic radiation Effects 0.000 description 1
- 238000010894 electron beam technology Methods 0.000 description 1
- 238000003384 imaging method Methods 0.000 description 1
- 238000002513 implantation Methods 0.000 description 1
- 230000010354 integration Effects 0.000 description 1
- 238000010884 ion-beam technique Methods 0.000 description 1
- 239000002184 metal Substances 0.000 description 1
- 238000000059 patterning Methods 0.000 description 1
- 229920002120 photoresistant polymer Polymers 0.000 description 1
- 238000000275 quality assurance Methods 0.000 description 1
- 239000010453 quartz Substances 0.000 description 1
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N silicon dioxide Inorganic materials O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 1
- 239000002356 single layer Substances 0.000 description 1
- 238000004513 sizing Methods 0.000 description 1
- 235000013599 spices Nutrition 0.000 description 1
- 238000003860 storage Methods 0.000 description 1
- 239000000758 substrate Substances 0.000 description 1
- 230000001360 synchronised effect Effects 0.000 description 1
- 238000012360 testing method Methods 0.000 description 1
- 230000000007 visual effect Effects 0.000 description 1
Classifications
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/70483—Information management; Active and passive control; Testing; Wafer monitoring, e.g. pattern monitoring
- G03F7/70491—Information management, e.g. software; Active and passive control, e.g. details of controlling exposure processes or exposure tool monitoring processes
- G03F7/70541—Tagging, i.e. hardware or software tagging of features or components, e.g. using tagging scripts or tagging identifier codes for identification of chips, shots or wafers
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03B—APPARATUS OR ARRANGEMENTS FOR TAKING PHOTOGRAPHS OR FOR PROJECTING OR VIEWING THEM; APPARATUS OR ARRANGEMENTS EMPLOYING ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ACCESSORIES THEREFOR
- G03B27/00—Photographic printing apparatus
- G03B27/32—Projection printing apparatus, e.g. enlarger, copying camera
- G03B27/44—Projection printing apparatus, e.g. enlarger, copying camera for multiple copying of the same original at the same time
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/70216—Mask projection systems
- G03F7/70283—Mask effects on the imaging process
- G03F7/70291—Addressable masks, e.g. spatial light modulators [SLMs], digital micro-mirror devices [DMDs] or liquid crystal display [LCD] patterning devices
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/70425—Imaging strategies, e.g. for increasing throughput or resolution, printing product fields larger than the image field or compensating lithography- or non-lithography errors, e.g. proximity correction, mix-and-match, stitching or double patterning
- G03F7/7045—Hybrid exposures, i.e. multiple exposures of the same area using different types of exposure apparatus, e.g. combining projection, proximity, direct write, interferometric, UV, x-ray or particle beam
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/70425—Imaging strategies, e.g. for increasing throughput or resolution, printing product fields larger than the image field or compensating lithography- or non-lithography errors, e.g. proximity correction, mix-and-match, stitching or double patterning
- G03F7/70466—Multiple exposures, e.g. combination of fine and coarse exposures, double patterning or multiple exposures for printing a single feature
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/70483—Information management; Active and passive control; Testing; Wafer monitoring, e.g. pattern monitoring
- G03F7/7055—Exposure light control in all parts of the microlithographic apparatus, e.g. pulse length control or light interruption
- G03F7/70575—Wavelength control, e.g. control of bandwidth, multiple wavelength, selection of wavelength or matching of optical components to wavelength
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L22/00—Testing or measuring during manufacture or treatment; Reliability measurements, i.e. testing of parts without further processing to modify the parts as such; Structural arrangements therefor
- H01L22/30—Structural arrangements specially adapted for testing or measuring during manufacture or treatment, or specially adapted for reliability measurements
- H01L22/34—Circuits for electrically characterising or monitoring manufacturing processes, e. g. whole test die, wafers filled with test structures, on-board-devices incorporated on each die, process control monitors or pad structures thereof, devices in scribe line
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/544—Marks applied to semiconductor devices or parts, e.g. registration marks, alignment structures, wafer maps
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/57—Protection from inspection, reverse engineering or tampering
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2223/00—Details relating to semiconductor or other solid state devices covered by the group H01L23/00
- H01L2223/544—Marks applied to semiconductor devices or parts
- H01L2223/54433—Marks applied to semiconductor devices or parts containing identification or tracking information
- H01L2223/5444—Marks applied to semiconductor devices or parts containing identification or tracking information for electrical read out
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/0001—Technical content checked by a classifier
- H01L2924/0002—Not covered by any one of groups H01L24/00, H01L24/00 and H01L2224/00
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Manufacturing & Machinery (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- Automation & Control Theory (AREA)
- Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)
- Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
Priority Applications (11)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
SE9904277A SE522531C2 (sv) | 1999-11-24 | 1999-11-24 | Metod och anordning för märkning av halvledare |
PCT/SE2000/002325 WO2001039269A1 (en) | 1999-11-24 | 2000-11-24 | Method and apparatus for personalization of semiconductor |
EP00982014A EP1232526A1 (en) | 1999-11-24 | 2000-11-24 | Method and apparatus for personalization of semiconductor |
US10/129,364 US6813058B1 (en) | 1999-11-24 | 2000-11-24 | Method and apparatus for personalization of semiconductor |
CNB008162018A CN1227737C (zh) | 1999-11-24 | 2000-11-24 | 用于半导体器件个性化的装置与方法 |
AU19092/01A AU1909201A (en) | 1999-11-24 | 2000-11-24 | Method and apparatus for personalization of semiconductor |
JP2001540838A JP2003515930A (ja) | 1999-11-24 | 2000-11-24 | 半導体の個別化を行う方法および装置 |
KR1020027006620A KR100726054B1 (ko) | 1999-11-24 | 2000-11-24 | 마이크로전자 소자의 설계 및 제조 방법, 칩-고유 정보 기록장치, 스탭퍼 제어 시스템, 칩-고유 정보를 가진 칩 설계 블록, 웨이퍼 상의 다이 개별화 방법 및 패턴 발생기의 위치 에러 수정 방법 |
US10/953,560 US7211453B2 (en) | 1999-11-24 | 2004-09-30 | Method and apparatus for personalization of semiconductor |
US11/378,266 US20060161254A1 (en) | 1999-11-24 | 2006-03-20 | Method and apparatus for personalization of semiconductor |
US11/980,432 US7842525B2 (en) | 1999-11-24 | 2007-10-31 | Method and apparatus for personalization of semiconductor |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
SE9904277A SE522531C2 (sv) | 1999-11-24 | 1999-11-24 | Metod och anordning för märkning av halvledare |
Publications (3)
Publication Number | Publication Date |
---|---|
SE9904277D0 SE9904277D0 (sv) | 1999-11-24 |
SE9904277L SE9904277L (sv) | 2001-05-25 |
SE522531C2 true SE522531C2 (sv) | 2004-02-17 |
Family
ID=20417858
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
SE9904277A SE522531C2 (sv) | 1999-11-24 | 1999-11-24 | Metod och anordning för märkning av halvledare |
Country Status (8)
Country | Link |
---|---|
US (4) | US6813058B1 (ja) |
EP (1) | EP1232526A1 (ja) |
JP (1) | JP2003515930A (ja) |
KR (1) | KR100726054B1 (ja) |
CN (1) | CN1227737C (ja) |
AU (1) | AU1909201A (ja) |
SE (1) | SE522531C2 (ja) |
WO (1) | WO2001039269A1 (ja) |
Families Citing this family (54)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
SE522531C2 (sv) * | 1999-11-24 | 2004-02-17 | Micronic Laser Systems Ab | Metod och anordning för märkning av halvledare |
US7316934B2 (en) * | 2000-12-18 | 2008-01-08 | Zavitan Semiconductors, Inc. | Personalized hardware |
JP2003046496A (ja) * | 2001-07-31 | 2003-02-14 | Canon Inc | 情報管理方法、情報管理システム及び処理装置 |
KR100445974B1 (ko) * | 2001-12-01 | 2004-08-25 | 주식회사 이오테크닉스 | 칩 스케일 마커의 마킹 위치 보정 방법 및 그 장치 |
TWI471900B (zh) * | 2004-02-20 | 2015-02-01 | 尼康股份有限公司 | Exposure method, exposure apparatus, exposure system, and device manufacturing method |
US7153616B2 (en) * | 2004-03-31 | 2006-12-26 | Asml Holding N.V. | System and method for verifying and controlling the performance of a maskless lithography tool |
EP2282338B1 (en) | 2004-04-19 | 2014-08-06 | STMicroelectronics Srl | Structures for indexing dice |
US7102733B2 (en) * | 2004-08-13 | 2006-09-05 | Asml Holding N.V. | System and method to compensate for static and dynamic misalignments and deformations in a maskless lithography tool |
US7457547B2 (en) * | 2004-11-08 | 2008-11-25 | Optium Australia Pty Limited | Optical calibration system and method |
US20060216869A1 (en) * | 2005-03-22 | 2006-09-28 | Asml Netherlands B.V. | Lithographic apparatus, device manufacturing method, code reading device and substrate |
JP2006286966A (ja) * | 2005-03-31 | 2006-10-19 | Fujitsu Ltd | 半導体装置の生産管理方法及び半導体基板 |
US20070153249A1 (en) * | 2005-12-20 | 2007-07-05 | Asml Netherlands B.V. | Lithographic apparatus and device manufacturing method using multiple exposures and multiple exposure types |
US7532403B2 (en) * | 2006-02-06 | 2009-05-12 | Asml Holding N.V. | Optical system for transforming numerical aperture |
US7468664B2 (en) * | 2006-04-20 | 2008-12-23 | Nve Corporation | Enclosure tamper detection and protection |
US7787034B2 (en) * | 2006-04-27 | 2010-08-31 | Avago Technologies General Ip (Singapore) Pte. Ltd. | Identification of integrated circuits using pixel or memory cell characteristics |
US8264667B2 (en) | 2006-05-04 | 2012-09-11 | Asml Netherlands B.V. | Lithographic apparatus and device manufacturing method using interferometric and other exposure |
US20080057677A1 (en) * | 2006-09-06 | 2008-03-06 | International Business Machines Corporation | Chip location identification |
US20080080712A1 (en) * | 2006-09-29 | 2008-04-03 | Haiquan Huang | System and methods for secure communication using an enhanced GPS receiver |
CN101583736A (zh) * | 2007-01-19 | 2009-11-18 | 应用材料股份有限公司 | 浸没式等离子体室 |
EP2135254B1 (en) | 2007-03-09 | 2016-05-25 | NVE Corporation | Stressed magnetoresistive tamper detection devices |
US20100290016A1 (en) * | 2008-01-02 | 2010-11-18 | Bryan Kaehr | Microdevice fabrication |
US20090199152A1 (en) * | 2008-02-06 | 2009-08-06 | Micronic Laser Systems Ab | Methods and apparatuses for reducing mura effects in generated patterns |
US8754538B2 (en) * | 2008-06-24 | 2014-06-17 | Infineon Technologies Ag | Semiconductor chip including identifying marks |
US20100054287A1 (en) * | 2008-09-04 | 2010-03-04 | Farzan Ghauri | Method and System for Laser-Based High-Speed Digital Marking of Objects |
JP2010060990A (ja) * | 2008-09-05 | 2010-03-18 | Hitachi High-Technologies Corp | 露光装置、露光方法、及び表示用パネル基板の製造方法 |
US8015514B2 (en) * | 2008-12-29 | 2011-09-06 | International Business Machines Corporation | Random personalization of chips during fabrication |
US9099480B2 (en) | 2009-09-30 | 2015-08-04 | Stmicroelectronics S.R.L. | Indexing of electronic devices distributed on different chips |
EP2306517B1 (en) | 2009-09-30 | 2016-11-02 | STMicroelectronics Srl | Indexing of electronic devices using marks distributed on two coupled chips |
JP2011107569A (ja) * | 2009-11-20 | 2011-06-02 | Hitachi High-Technologies Corp | 露光装置、露光方法、及び表示用パネル基板の製造方法 |
US8539395B2 (en) | 2010-03-05 | 2013-09-17 | Micronic Laser Systems Ab | Method and apparatus for merging multiple geometrical pixel images and generating a single modulator pixel image |
CN102193322B (zh) * | 2010-03-05 | 2013-01-23 | 上海微电子装备有限公司 | 光刻机物镜顶板的检测装置及调整方法 |
JP5335840B2 (ja) * | 2011-03-15 | 2013-11-06 | 株式会社オーク製作所 | 露光装置 |
JP5335761B2 (ja) * | 2010-12-13 | 2013-11-06 | 株式会社オーク製作所 | 露光装置 |
JP5335755B2 (ja) * | 2010-11-04 | 2013-11-06 | 株式会社オーク製作所 | 露光装置 |
US8415813B2 (en) * | 2011-06-15 | 2013-04-09 | Truesense Imaging, Inc. | Identification of dies on a semiconductor wafer |
CN104903793A (zh) * | 2012-10-29 | 2015-09-09 | 西北大学 | 热启动和投影平版印刷系统和方法 |
US10020264B2 (en) * | 2015-04-28 | 2018-07-10 | Infineon Technologies Ag | Integrated circuit substrate and method for manufacturing the same |
CN106707692B (zh) * | 2015-07-27 | 2018-03-27 | 中国科学院理化技术研究所 | 一种跨尺度结构协同工作的无掩模光刻系统 |
US10262164B2 (en) | 2016-01-15 | 2019-04-16 | Blockchain Asics Llc | Cryptographic ASIC including circuitry-encoded transformation function |
US9846128B2 (en) * | 2016-01-19 | 2017-12-19 | Applied Materials Israel Ltd. | Inspection system and a method for evaluating an exit pupil of an inspection system |
KR102395629B1 (ko) * | 2016-07-19 | 2022-05-09 | 에이에스엠엘 네델란즈 비.브이. | 리소그래피 단계에서 기판에 적용될 패턴의 조합의 결정 |
US20180068047A1 (en) | 2016-09-08 | 2018-03-08 | Mapper Lithography Ip B.V. | Method and system for fabricating unique chips using a charged particle multi-beamlet lithography system |
US10522472B2 (en) | 2016-09-08 | 2019-12-31 | Asml Netherlands B.V. | Secure chips with serial numbers |
JP7221198B2 (ja) * | 2016-09-08 | 2023-02-13 | エーエスエムエル ネザーランズ ビー.ブイ. | 荷電粒子マルチビームレットリソグラフィーシステムを使用し、一意的チップを製作すること |
US10079206B2 (en) * | 2016-10-27 | 2018-09-18 | Mapper Lithography Ip B.V. | Fabricating unique chips using a charged particle multi-beamlet lithography system |
NL2019503B1 (en) * | 2016-09-08 | 2018-08-31 | Mapper Lithography Ip Bv | Fabricating unique chips using a charged particle multi-beamlet lithography system |
NL2019502B1 (en) * | 2016-09-08 | 2018-08-31 | Mapper Lithography Ip Bv | Method and system for fabricating unique chips using a charged particle multi-beamlet lithography system |
CN114355733B (zh) * | 2016-12-23 | 2024-03-15 | Asml荷兰有限公司 | 使用带电粒子多小束光刻系统制造独特芯片 |
TWI627440B (zh) * | 2017-05-17 | 2018-06-21 | 力晶科技股份有限公司 | 影像亮度重配模組及影像亮度重配方法 |
US10372943B1 (en) | 2018-03-20 | 2019-08-06 | Blockchain Asics Llc | Cryptographic ASIC with combined transformation and one-way functions |
US10404454B1 (en) | 2018-04-25 | 2019-09-03 | Blockchain Asics Llc | Cryptographic ASIC for derivative key hierarchy |
CN109471336B (zh) * | 2018-12-21 | 2020-07-10 | 武汉华星光电技术有限公司 | 一种打码方法、打码装置和打码系统 |
US20200328102A1 (en) * | 2019-04-15 | 2020-10-15 | Tokyo Electron Limited | Method for die-level unique authentication and serialization of semiconductor devices |
WO2022138583A1 (ja) * | 2020-12-25 | 2022-06-30 | 株式会社ニコン | 半導体集積回路の製造方法、半導体デバイスの製造方法、および露光装置 |
Family Cites Families (21)
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US4409686A (en) | 1980-06-16 | 1983-10-11 | Harris Corporation | Method of serialization of dice |
JPS63283021A (ja) | 1987-05-14 | 1988-11-18 | Sanyo Electric Co Ltd | 露光方法 |
EP0434141B1 (en) | 1989-12-20 | 1998-11-04 | Koninklijke Philips Electronics N.V. | Method for encoding identification information on circuit dice using step and repeat lithography |
US5302491A (en) * | 1989-12-20 | 1994-04-12 | North American Philips Corporation | Method of encoding identification information on circuit dice using step and repeat lithography |
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JPH07123101B2 (ja) * | 1990-09-14 | 1995-12-25 | 株式会社東芝 | 半導体装置 |
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-
1999
- 1999-11-24 SE SE9904277A patent/SE522531C2/sv not_active IP Right Cessation
-
2000
- 2000-11-24 CN CNB008162018A patent/CN1227737C/zh not_active Expired - Fee Related
- 2000-11-24 EP EP00982014A patent/EP1232526A1/en not_active Withdrawn
- 2000-11-24 JP JP2001540838A patent/JP2003515930A/ja active Pending
- 2000-11-24 AU AU19092/01A patent/AU1909201A/en not_active Abandoned
- 2000-11-24 KR KR1020027006620A patent/KR100726054B1/ko not_active IP Right Cessation
- 2000-11-24 US US10/129,364 patent/US6813058B1/en not_active Expired - Fee Related
- 2000-11-24 WO PCT/SE2000/002325 patent/WO2001039269A1/en active Application Filing
-
2004
- 2004-09-30 US US10/953,560 patent/US7211453B2/en not_active Expired - Lifetime
-
2006
- 2006-03-20 US US11/378,266 patent/US20060161254A1/en not_active Abandoned
-
2007
- 2007-10-31 US US11/980,432 patent/US7842525B2/en not_active Expired - Fee Related
Also Published As
Publication number | Publication date |
---|---|
SE9904277L (sv) | 2001-05-25 |
AU1909201A (en) | 2001-06-04 |
CN1227737C (zh) | 2005-11-16 |
SE9904277D0 (sv) | 1999-11-24 |
JP2003515930A (ja) | 2003-05-07 |
US20050047543A1 (en) | 2005-03-03 |
US7211453B2 (en) | 2007-05-01 |
US7842525B2 (en) | 2010-11-30 |
KR20020070440A (ko) | 2002-09-09 |
CN1399796A (zh) | 2003-02-26 |
US20080062389A1 (en) | 2008-03-13 |
KR100726054B1 (ko) | 2007-06-11 |
US6813058B1 (en) | 2004-11-02 |
EP1232526A1 (en) | 2002-08-21 |
US20060161254A1 (en) | 2006-07-20 |
WO2001039269A1 (en) | 2001-05-31 |
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