KR20030096011A - 리소그래피장치 및 디바이스 제조방법 - Google Patents
리소그래피장치 및 디바이스 제조방법 Download PDFInfo
- Publication number
- KR20030096011A KR20030096011A KR10-2003-0037230A KR20030037230A KR20030096011A KR 20030096011 A KR20030096011 A KR 20030096011A KR 20030037230 A KR20030037230 A KR 20030037230A KR 20030096011 A KR20030096011 A KR 20030096011A
- Authority
- KR
- South Korea
- Prior art keywords
- programmable patterning
- patterning means
- substrate
- projection
- radiation
- Prior art date
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/027—Making masks on semiconductor bodies for further photolithographic processing not provided for in group H01L21/18 or H01L21/34
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/708—Construction of apparatus, e.g. environment aspects, hygiene aspects or materials
- G03F7/70991—Connection with other apparatus, e.g. multiple exposure stations, particular arrangement of exposure apparatus and pre-exposure and/or post-exposure apparatus; Shared apparatus, e.g. having shared radiation source, shared mask or workpiece stage, shared base-plate; Utilities, e.g. cable, pipe or wireless arrangements for data, power, fluids or vacuum
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/70216—Mask projection systems
- G03F7/70283—Mask effects on the imaging process
- G03F7/70291—Addressable masks, e.g. spatial light modulators [SLMs], digital micro-mirror devices [DMDs] or liquid crystal display [LCD] patterning devices
Landscapes
- Engineering & Computer Science (AREA)
- General Physics & Mathematics (AREA)
- Physics & Mathematics (AREA)
- Environmental & Geological Engineering (AREA)
- Epidemiology (AREA)
- Public Health (AREA)
- Health & Medical Sciences (AREA)
- Computer Networks & Wireless Communication (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)
- Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
Abstract
Description
Claims (8)
- - 방사선의 제1투영빔을 공급하는 방사선시스템;- 소정의 패턴에 따라 제1투영빔을 패터닝시키는 역할을 하는 제1프로그램가능한 패터닝수단;- 제1기판을 잡아주는 제1기판테이블;- 제1기판의 타겟부상으로 패터닝된 상기 제1빔을 투영시키는 제1투영시스템; 및- 상기 소정의 패턴에 따라 상기 제1프로그램가능한 패터닝수단을 세팅하기 위한 제어신호를 제공하는 제어시스템을 포함하는 리소그래피 투영장치에 있어서,- 상기 소정의 패턴에 따라 방사선의 제2투영빔을 패터닝시키는 역할을 하는 제2프로그램가능한 패터닝수단;- 제2기판을 잡아주는 제2기판테이블; 및- 상기 제2기판의 타겟부상으로 패터닝된 상기 제2빔을 투영시키는 제2투영시스템을 더욱 포함하고,상기 제어시스템은 상기 소정의 패턴에 따라 상기 제2프로그램가능한 패터닝수단을 세팅하기 위한 상기 제어신호를 또한 제공하는 것을 특징으로 리소그래피 투영장치.
- 제1항에 있어서,상기 장치는 상기 제1프로그램가능한 패터닝수단으로 입력되는 상기 제어신호를 조정하는 제1캘리브레이션수단 및 상기 제2프로그램가능한 패터닝수단으로 입력되는 상기 제어신호를 조정하는 제2캘리브레이션수단을 더욱 포함하는 것을 특징으로 하는 리소그래피 투영장치.
- 제1항 또는 제2항에 있어서,상기 방사선시스템은 상기 제2투영빔을 더욱 제공하는 것을 특징으로 하는 리소그래피 투영장치.
- 제1항 또는 제2항에 있어서,상기 장치는 상기 제2투영빔을 제공하는 제2방사선시스템을 더욱 포함하는 것을 특징으로 하는 리소그래피 투영장치.
- 제1항 내지 제4항 중 어느 한 항에 있어서,상기 제1기판테이블, 상기 제1프로그램가능한 패터닝수단, 상기 제1투영시스템, 상기 제2기판테이블, 상기 제2프로그램가능한 패터닝수단 및 상기 제2투영시스템은 공통 베이스프레임상에 장착되는 것을 특징으로 하는 리소그래피 투영장치.
- 제1항 내지 제4항 중 어느 한 항에 있어서,상기 제1기판테이블, 상기 제1프로그램가능한 패터닝수단 및 상기 제1투영시스템은 제1베이스프레임상에 장착되고, 상기 제2기판테이블, 상기 제2프로그램가능한 패터닝수단 및 상기 제2투영시스템은 별도의 제2베이스프레임상에 장착되는 것을 특징으로 하는 리소그래피 투영장치.
- - 제1기판을 제공하는 단계;- 방사선시스템을 사용하여 방사선의 제1투영빔을 제공하는 단계;- 제어시스템을 이용하여, 제1프로그램가능한 패터닝수단에 소정의 패턴을 생성하는데 사용되는 제어신호를 발생시키는 단계;- 상기 제1프로그램가능한 패터닝수단을 이용하여, 상기 제1투영빔을 패터닝시키는 단계; 및- 상기 제1기판의 타겟부상으로 패터닝된 상기 제1방사선빔을 투영시키는 단계를 포함하는 디바이스 제조방법에 있어서,- 제2기판을 제공하는 단계;- 상기 제어신호를 이용하여, 제2프로그램가능한 패터닝수단에 상기 소정의 패턴을 생성하는 단계;- 상기 제2프로그램가능한 패터닝수단을 이용하여 제2투영빔을 패터닝시키는 단계; 및- 상기 제2기판의 타겟부상으로 패터닝된 상기 제2빔을 투영시키는 단계를 더욱 포함하는 것을 특징으로 하는 디바이스 제조방법.
- - 제1프로그램가능한 패터닝수단에 소정의 패턴을 생성하는데 사용되는 제어신호를 발생시키는 단계;- 상기 제1프로그램가능한 패터닝수단을 이용하여, 제1투영빔을 패터닝시키는 단계; 및- 기판의 타겟부상으로 패터닝된 상기 제1빔을 투영시키는 단계를 수행하도록 상기 장치에 명령을 내리는 코드수단을 포함하는, 리소그래피 투영장치를 제어하는 컴퓨터프로그램에 있어서,상기 컴퓨터프로그램은,- 상기 제어신호를 이용하여, 제2프로그램가능한 패터닝수단에 상기 소정의 패턴을 생성하는 단계;- 상기 제2프로그램가능한 패터닝수단을 이용하여, 제2투영빔을 패터닝시키는 단계; 및- 상기 제2기판의 타겟부상으로 패터닝된 상기 제2빔을 투영시키는 단계를 수행하도록 상기 장치에 명령을 내리는 코드수단을 더욱 포함하는 것을 특징으로 하는 컴퓨터프로그램.
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
EP02254089.2 | 2002-06-12 | ||
EP02254089 | 2002-06-12 |
Publications (2)
Publication Number | Publication Date |
---|---|
KR20030096011A true KR20030096011A (ko) | 2003-12-24 |
KR100545297B1 KR100545297B1 (ko) | 2006-01-24 |
Family
ID=31197950
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
KR1020030037230A KR100545297B1 (ko) | 2002-06-12 | 2003-06-10 | 리소그래피장치 및 디바이스 제조방법 |
Country Status (7)
Country | Link |
---|---|
US (2) | US6870601B2 (ko) |
EP (1) | EP1372036A1 (ko) |
JP (1) | JP2005222963A (ko) |
KR (1) | KR100545297B1 (ko) |
CN (1) | CN1332267C (ko) |
SG (1) | SG130007A1 (ko) |
TW (1) | TWI298825B (ko) |
Families Citing this family (190)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
SG121822A1 (en) | 2002-11-12 | 2006-05-26 | Asml Netherlands Bv | Lithographic apparatus and device manufacturing method |
US7063920B2 (en) * | 2003-05-16 | 2006-06-20 | Asml Holding, N.V. | Method for the generation of variable pitch nested lines and/or contact holes using fixed size pixels for direct-write lithographic systems |
TWI304522B (en) * | 2003-05-28 | 2008-12-21 | Asml Netherlands Bv | Lithographic apparatus, method of calibrating and device manufacturing method |
US6989920B2 (en) | 2003-05-29 | 2006-01-24 | Asml Holding N.V. | System and method for dose control in a lithographic system |
US7061591B2 (en) | 2003-05-30 | 2006-06-13 | Asml Holding N.V. | Maskless lithography systems and methods utilizing spatial light modulator arrays |
EP1482373A1 (en) | 2003-05-30 | 2004-12-01 | ASML Netherlands B.V. | Lithographic apparatus and device manufacturing method |
US7016015B2 (en) | 2003-06-20 | 2006-03-21 | Asml Netherlands B.V | Lithographic apparatus and device manufacturing method |
EP1489449A1 (en) * | 2003-06-20 | 2004-12-22 | ASML Netherlands B.V. | Spatial light modulator |
US7110082B2 (en) * | 2003-06-24 | 2006-09-19 | Asml Holding N.V. | Optical system for maskless lithography |
SG119224A1 (en) * | 2003-06-26 | 2006-02-28 | Asml Netherlands Bv | Calibration method for a lithographic apparatus and device manufacturing method |
US7158215B2 (en) * | 2003-06-30 | 2007-01-02 | Asml Holding N.V. | Large field of view protection optical system with aberration correctability for flat panel displays |
US7154587B2 (en) * | 2003-06-30 | 2006-12-26 | Asml Netherlands B.V | Spatial light modulator, lithographic apparatus and device manufacturing method |
US7224504B2 (en) | 2003-07-30 | 2007-05-29 | Asml Holding N. V. | Deformable mirror using piezoelectric actuators formed as an integrated circuit and method of use |
US6831768B1 (en) * | 2003-07-31 | 2004-12-14 | Asml Holding N.V. | Using time and/or power modulation to achieve dose gray-scaling in optical maskless lithography |
US7414701B2 (en) * | 2003-10-03 | 2008-08-19 | Asml Holding N.V. | Method and systems for total focus deviation adjustments on maskless lithography systems |
SG110196A1 (en) * | 2003-09-22 | 2005-04-28 | Asml Netherlands Bv | Lithographic apparatus and device manufacturing method |
US7410736B2 (en) * | 2003-09-30 | 2008-08-12 | Asml Holding N.V. | Methods and systems to compensate for a stitching disturbance of a printed pattern in a maskless lithography system not utilizing overlap of the exposure zones |
US7023526B2 (en) * | 2003-09-30 | 2006-04-04 | Asml Holding N.V. | Methods and systems to compensate for a stitching disturbance of a printed pattern in a maskless lithography system utilizing overlap without an explicit attenuation |
US6876440B1 (en) * | 2003-09-30 | 2005-04-05 | Asml Holding N.V. | Methods and systems to compensate for a stitching disturbance of a printed pattern in a maskless lithography system utilizing overlap of exposure zones with attenuation of the aerial image in the overlap region |
US7109498B2 (en) * | 2003-10-09 | 2006-09-19 | Asml Netherlands B.V. | Radiation source, lithographic apparatus, and device manufacturing method |
US7196772B2 (en) * | 2003-11-07 | 2007-03-27 | Asml Netherlands B.V. | Lithographic apparatus and device manufacturing method |
US7116398B2 (en) * | 2003-11-07 | 2006-10-03 | Asml Netherlands B.V. | Lithographic apparatus and device manufacturing method |
US7001232B2 (en) * | 2003-12-11 | 2006-02-21 | Montgomery Robert E | Personal watercraft air intake assembly |
US6995830B2 (en) | 2003-12-22 | 2006-02-07 | Asml Netherlands B.V. | Lithographic projection apparatus and device manufacturing method |
US7012674B2 (en) * | 2004-01-13 | 2006-03-14 | Asml Holding N.V. | Maskless optical writer |
US7580559B2 (en) * | 2004-01-29 | 2009-08-25 | Asml Holding N.V. | System and method for calibrating a spatial light modulator |
JP4083751B2 (ja) * | 2004-01-29 | 2008-04-30 | エーエスエムエル ホールディング エヌ.ブイ. | 空間光変調器アレイを較正するシステムおよび空間光変調器アレイを較正する方法 |
US6847461B1 (en) * | 2004-01-29 | 2005-01-25 | Asml Holding N.V. | System and method for calibrating a spatial light modulator array using shearing interferometry |
US7133118B2 (en) * | 2004-02-18 | 2006-11-07 | Asml Netherlands, B.V. | Lithographic apparatus and device manufacturing method |
US7190434B2 (en) * | 2004-02-18 | 2007-03-13 | Asml Netherlands B.V. | Lithographic apparatus and device manufacturing method |
US7016014B2 (en) * | 2004-02-27 | 2006-03-21 | Asml Netherlands B.V | Lithographic apparatus and device manufacturing method |
US7081947B2 (en) * | 2004-02-27 | 2006-07-25 | Asml Netherlands B.V. | Lithographic apparatus and device manufacturing method |
US7061586B2 (en) * | 2004-03-02 | 2006-06-13 | Asml Netherlands Bv | Lithographic apparatus and device manufacturing method |
USRE43515E1 (en) | 2004-03-09 | 2012-07-17 | Asml Netherlands B.V. | Lithographic apparatus and device manufacturing method |
US7094506B2 (en) * | 2004-03-09 | 2006-08-22 | Asml Netherlands B.V | Lithographic apparatus and device manufacturing method |
US6967711B2 (en) * | 2004-03-09 | 2005-11-22 | Asml Netherlands B.V. | Lithographic apparatus and device manufacturing method |
DE102004013886A1 (de) | 2004-03-16 | 2005-10-06 | Carl Zeiss Smt Ag | Verfahren zur Mehrfachbelichtung, Mikrolithografie-Projektionsbelichtungsanlage und Projektionssystem |
US7561251B2 (en) * | 2004-03-29 | 2009-07-14 | Asml Netherlands B.V. | Lithographic apparatus and device manufacturing method |
US7153616B2 (en) * | 2004-03-31 | 2006-12-26 | Asml Holding N.V. | System and method for verifying and controlling the performance of a maskless lithography tool |
US7053981B2 (en) * | 2004-03-31 | 2006-05-30 | Asml Netherlands B.V. | Lithographic apparatus and device manufacturing method |
US7002666B2 (en) * | 2004-04-16 | 2006-02-21 | Asml Netherlands B.V. | Lithographic apparatus and device manufacturing method |
US6963434B1 (en) * | 2004-04-30 | 2005-11-08 | Asml Holding N.V. | System and method for calculating aerial image of a spatial light modulator |
US20050243295A1 (en) * | 2004-04-30 | 2005-11-03 | Asml Netherlands B.V. | Lithographic apparatus and device manufacturing |
US20050259269A1 (en) | 2004-05-19 | 2005-11-24 | Asml Holding N.V. | Shearing interferometer with dynamic pupil fill |
US7242456B2 (en) | 2004-05-26 | 2007-07-10 | Asml Holdings N.V. | System and method utilizing a lithography tool having modular illumination, pattern generator, and projection optics portions |
US7477403B2 (en) | 2004-05-27 | 2009-01-13 | Asml Netherlands B.V. | Optical position assessment apparatus and method |
US7123348B2 (en) * | 2004-06-08 | 2006-10-17 | Asml Netherlands B.V | Lithographic apparatus and method utilizing dose control |
US6989886B2 (en) * | 2004-06-08 | 2006-01-24 | Asml Netherlands B.V. | Lithographic apparatus and device manufacturing method |
US7016016B2 (en) * | 2004-06-25 | 2006-03-21 | Asml Netherlands Bv | Lithographic apparatus and device manufacturing method |
US7116403B2 (en) * | 2004-06-28 | 2006-10-03 | Asml Netherlands B.V | Lithographic apparatus and device manufacturing method |
US7158208B2 (en) * | 2004-06-30 | 2007-01-02 | Asml Netherlands B.V. | Lithographic apparatus and device manufacturing method |
US7116404B2 (en) * | 2004-06-30 | 2006-10-03 | Asml Netherlands B.V | Lithographic apparatus and device manufacturing method |
US20060001890A1 (en) * | 2004-07-02 | 2006-01-05 | Asml Holding N.V. | Spatial light modulator as source module for DUV wavefront sensor |
US20060012779A1 (en) * | 2004-07-13 | 2006-01-19 | Asml Netherlands B.V. | Lithographic apparatus and device manufacturing method |
US7573574B2 (en) * | 2004-07-13 | 2009-08-11 | Asml Netherlands Bv | Lithographic apparatus and device manufacturing method |
US7335398B2 (en) * | 2004-07-26 | 2008-02-26 | Asml Holding N.V. | Method to modify the spatial response of a pattern generator |
US7259829B2 (en) * | 2004-07-26 | 2007-08-21 | Asml Netherlands B.V. | Lithographic apparatus and device manufacturing method |
US7227613B2 (en) * | 2004-07-26 | 2007-06-05 | Asml Holding N.V. | Lithographic apparatus having double telecentric illumination |
US7142286B2 (en) * | 2004-07-27 | 2006-11-28 | Asml Netherlands B.V. | Lithographic apparatus and device manufacturing method |
US7251020B2 (en) * | 2004-07-30 | 2007-07-31 | Asml Netherlands B.V. | Lithographic apparatus and device manufacturing method |
US7538855B2 (en) * | 2004-08-10 | 2009-05-26 | Asml Netherlands B.V. | Lithographic apparatus and device manufacturing method |
US7102733B2 (en) | 2004-08-13 | 2006-09-05 | Asml Holding N.V. | System and method to compensate for static and dynamic misalignments and deformations in a maskless lithography tool |
US7304718B2 (en) * | 2004-08-17 | 2007-12-04 | Asml Netherlands B.V. | Lithographic apparatus and device manufacturing method |
US7500218B2 (en) * | 2004-08-17 | 2009-03-03 | Asml Netherlands B.V. | Lithographic apparatus, method, and computer program product for generating a mask pattern and device manufacturing method using same |
US7079225B2 (en) * | 2004-09-14 | 2006-07-18 | Asml Netherlands B.V | Lithographic apparatus and device manufacturing method |
US7177012B2 (en) | 2004-10-18 | 2007-02-13 | Asml Netherlands B.V. | Lithographic apparatus and device manufacturing method |
US7388663B2 (en) * | 2004-10-28 | 2008-06-17 | Asml Netherlands B.V. | Optical position assessment apparatus and method |
US7423732B2 (en) * | 2004-11-04 | 2008-09-09 | Asml Holding N.V. | Lithographic apparatus and device manufacturing method utilizing placement of a patterning device at a pupil plane |
US7609362B2 (en) * | 2004-11-08 | 2009-10-27 | Asml Netherlands B.V. | Scanning lithographic apparatus and device manufacturing method |
US7170584B2 (en) * | 2004-11-17 | 2007-01-30 | Asml Netherlands B.V. | Lithographic apparatus and device manufacturing method |
US7061581B1 (en) * | 2004-11-22 | 2006-06-13 | Asml Netherlands B.V. | Lithographic apparatus and device manufacturing method |
US7474384B2 (en) * | 2004-11-22 | 2009-01-06 | Asml Holding N.V. | Lithographic apparatus, device manufacturing method, and a projection element for use in the lithographic apparatus |
US7643192B2 (en) * | 2004-11-24 | 2010-01-05 | Asml Holding N.V. | Pattern generator using a dual phase step element and method of using same |
US7713667B2 (en) * | 2004-11-30 | 2010-05-11 | Asml Holding N.V. | System and method for generating pattern data used to control a pattern generator |
US7333177B2 (en) * | 2004-11-30 | 2008-02-19 | Asml Netherlands B.V. | Lithographic apparatus and device manufacturing method |
US7365848B2 (en) * | 2004-12-01 | 2008-04-29 | Asml Holding N.V. | System and method using visible and infrared light to align and measure alignment patterns on multiple layers |
US7391499B2 (en) * | 2004-12-02 | 2008-06-24 | Asml Netherlands B.V. | Lithographic apparatus and device manufacturing method |
US7362415B2 (en) * | 2004-12-07 | 2008-04-22 | Asml Netherlands B.V. | Lithographic apparatus and device manufacturing method |
US7355677B2 (en) * | 2004-12-09 | 2008-04-08 | Asml Netherlands B.V. | System and method for an improved illumination system in a lithographic apparatus |
US7180577B2 (en) * | 2004-12-17 | 2007-02-20 | Asml Netherlands B.V. | Lithographic apparatus and device manufacturing method utilizing a microlens array at an image plane |
US7349068B2 (en) * | 2004-12-17 | 2008-03-25 | Asml Netherlands B.V. | Lithographic apparatus and device manufacturing method |
US7375795B2 (en) * | 2004-12-22 | 2008-05-20 | Asml Netherlands B.V. | Lithographic apparatus, device manufacturing method, and device manufactured thereby |
US7391676B2 (en) * | 2004-12-22 | 2008-06-24 | Asml Netherlands B.V. | Ultrasonic distance sensors |
US7202939B2 (en) * | 2004-12-22 | 2007-04-10 | Asml Netherlands B.V. | Lithographic apparatus and device manufacturing method |
US7256867B2 (en) * | 2004-12-22 | 2007-08-14 | Asml Netherlands B.V. | Lithographic apparatus and device manufacturing method |
US7274502B2 (en) * | 2004-12-22 | 2007-09-25 | Asml Holding N.V. | System, apparatus and method for maskless lithography that emulates binary, attenuating phase-shift and alternating phase-shift masks |
US7230677B2 (en) * | 2004-12-22 | 2007-06-12 | Asml Netherlands B.V. | Lithographic apparatus and device manufacturing method utilizing hexagonal image grids |
US7242458B2 (en) * | 2004-12-23 | 2007-07-10 | Asml Netherlands B.V. | Lithographic apparatus and device manufacturing method utilizing a multiple substrate carrier for flat panel display substrates |
US7538857B2 (en) * | 2004-12-23 | 2009-05-26 | Asml Netherlands B.V. | Lithographic apparatus and device manufacturing method utilizing a substrate handler |
US7656506B2 (en) * | 2004-12-23 | 2010-02-02 | Asml Netherlands B.V. | Lithographic apparatus and device manufacturing method utilizing a substrate handler |
US7426076B2 (en) * | 2004-12-23 | 2008-09-16 | Asml Holding N.V. | Projection system for a lithographic apparatus |
US7279110B2 (en) * | 2004-12-27 | 2007-10-09 | Asml Holding N.V. | Method and apparatus for creating a phase step in mirrors used in spatial light modulator arrays |
US7317510B2 (en) * | 2004-12-27 | 2008-01-08 | Asml Netherlands B.V. | Lithographic apparatus and device manufacturing method |
US7459247B2 (en) * | 2004-12-27 | 2008-12-02 | Asml Netherlands B.V. | Lithographic apparatus and device manufacturing method |
US7126672B2 (en) * | 2004-12-27 | 2006-10-24 | Asml Netherlands B.V. | Lithographic apparatus and device manufacturing method |
US20060138349A1 (en) * | 2004-12-27 | 2006-06-29 | Asml Netherlands B.V. | Lithographic apparatus and device manufacturing method |
US7145636B2 (en) * | 2004-12-28 | 2006-12-05 | Asml Netherlands Bv | System and method for determining maximum operational parameters used in maskless applications |
US7274029B2 (en) * | 2004-12-28 | 2007-09-25 | Asml Netherlands B.V. | Lithographic apparatus and device manufacturing method |
US7403865B2 (en) * | 2004-12-28 | 2008-07-22 | Asml Netherlands B.V. | System and method for fault indication on a substrate in maskless applications |
US7756660B2 (en) * | 2004-12-28 | 2010-07-13 | Asml Netherlands B.V. | Lithographic apparatus and device manufacturing method |
US7253881B2 (en) * | 2004-12-29 | 2007-08-07 | Asml Netherlands Bv | Methods and systems for lithographic gray scaling |
US7342644B2 (en) * | 2004-12-29 | 2008-03-11 | Asml Netherlands B.V. | Methods and systems for lithographic beam generation |
US7567368B2 (en) * | 2005-01-06 | 2009-07-28 | Asml Holding N.V. | Systems and methods for minimizing scattered light in multi-SLM maskless lithography |
US7542013B2 (en) * | 2005-01-31 | 2009-06-02 | Asml Holding N.V. | System and method for imaging enhancement via calculation of a customized optimal pupil field and illumination mode |
US7460208B2 (en) * | 2005-02-18 | 2008-12-02 | Asml Netherlands B.V. | Lithographic apparatus and device manufacturing method |
US7286137B2 (en) * | 2005-02-28 | 2007-10-23 | Asml Holding N.V. | Method and system for constrained pixel graytones interpolation for pattern rasterization |
US7499146B2 (en) * | 2005-03-14 | 2009-03-03 | Asml Netherlands B.V. | Lithographic apparatus and device manufacturing method, an integrated circuit, a flat panel display, and a method of compensating for cupping |
US7812930B2 (en) * | 2005-03-21 | 2010-10-12 | Asml Netherlands B.V. | Lithographic apparatus and device manufacturing method using repeated patterns in an LCD to reduce datapath volume |
US7209216B2 (en) * | 2005-03-25 | 2007-04-24 | Asml Netherlands B.V. | Lithographic apparatus and device manufacturing method utilizing dynamic correction for magnification and position in maskless lithography |
US7403265B2 (en) * | 2005-03-30 | 2008-07-22 | Asml Netherlands B.V. | Lithographic apparatus and device manufacturing method utilizing data filtering |
US7728956B2 (en) * | 2005-04-05 | 2010-06-01 | Asml Netherlands B.V. | Lithographic apparatus and device manufacturing method utilizing multiple die designs on a substrate using a data buffer that stores pattern variation data |
US7330239B2 (en) * | 2005-04-08 | 2008-02-12 | Asml Netherlands B.V. | Lithographic apparatus and device manufacturing method utilizing a blazing portion of a contrast device |
US7209217B2 (en) | 2005-04-08 | 2007-04-24 | Asml Netherlands B.V. | Lithographic apparatus and device manufacturing method utilizing plural patterning devices |
US7221514B2 (en) | 2005-04-15 | 2007-05-22 | Asml Netherlands B.V. | Variable lens and exposure system |
US20060244805A1 (en) * | 2005-04-27 | 2006-11-02 | Ming-Hsiang Yeh | Multicolor pen |
US7400382B2 (en) | 2005-04-28 | 2008-07-15 | Asml Holding N.V. | Light patterning device using tilting mirrors in a superpixel form |
US7738081B2 (en) * | 2005-05-06 | 2010-06-15 | Asml Netherlands B.V. | Lithographic apparatus and device manufacturing method utilizing a flat panel display handler with conveyor device and substrate handler |
US7197828B2 (en) * | 2005-05-31 | 2007-04-03 | Asml Netherlands B.V. | Lithographic apparatus and device manufacturing method utilizing FPD chuck Z position measurement |
US7477772B2 (en) * | 2005-05-31 | 2009-01-13 | Asml Netherlands B.V. | Lithographic apparatus and device manufacturing method utilizing 2D run length encoding for image data compression |
US7292317B2 (en) * | 2005-06-08 | 2007-11-06 | Asml Netherlands B.V. | Lithographic apparatus and device manufacturing method utilizing substrate stage compensating |
US7742148B2 (en) * | 2005-06-08 | 2010-06-22 | Asml Netherlands B.V. | Lithographic apparatus and device manufacturing method for writing a digital image |
US7233384B2 (en) * | 2005-06-13 | 2007-06-19 | Asml Netherlands B.V. | Lithographic apparatus and device manufacturing method, and device manufactured thereby for calibrating an imaging system with a sensor |
US7321416B2 (en) * | 2005-06-15 | 2008-01-22 | Asml Netherlands B.V. | Lithographic apparatus, device manufacturing method, device manufactured thereby, and controllable patterning device utilizing a spatial light modulator with distributed digital to analog conversion |
US7408617B2 (en) * | 2005-06-24 | 2008-08-05 | Asml Netherlands B.V. | Lithographic apparatus and device manufacturing method utilizing a large area FPD chuck equipped with encoders an encoder scale calibration method |
US7965373B2 (en) * | 2005-06-28 | 2011-06-21 | Asml Netherlands B.V. | Lithographic apparatus and device manufacturing method utilizing a datapath having a balanced calculation load |
US7307694B2 (en) * | 2005-06-29 | 2007-12-11 | Asml Netherlands B.V. | Lithographic apparatus, radiation beam inspection device, method of inspecting a beam of radiation and device manufacturing method |
US7522258B2 (en) * | 2005-06-29 | 2009-04-21 | Asml Netherlands B.V. | Lithographic apparatus and device manufacturing method utilizing movement of clean air to reduce contamination |
US20070013889A1 (en) * | 2005-07-12 | 2007-01-18 | Asml Netherlands B.V. | Lithographic apparatus, device manufacturing method and device manufactured thereby having an increase in depth of focus |
KR100729263B1 (ko) * | 2005-07-14 | 2007-06-15 | 삼성전자주식회사 | 기판 노광 장치 |
US7251019B2 (en) * | 2005-07-20 | 2007-07-31 | Asml Netherlands B.V. | Lithographic apparatus and device manufacturing method utilizing a continuous light beam in combination with pixel grid imaging |
US7606430B2 (en) * | 2005-08-30 | 2009-10-20 | Asml Netherlands B.V. | Lithographic apparatus and device manufacturing method utilizing a multiple dictionary compression method for FPD |
US20070046917A1 (en) * | 2005-08-31 | 2007-03-01 | Asml Netherlands B.V. | Lithographic apparatus and device manufacturing method that compensates for reticle induced CDU |
JP2007114750A (ja) * | 2005-09-09 | 2007-05-10 | Asml Netherlands Bv | 投影システム設計方法、リソグラフィー装置およびデバイス製造方法 |
US7173270B1 (en) * | 2005-09-20 | 2007-02-06 | Asml Netherlands B.V. | Detector system for detecting a height of a particle, and lithographic apparatus and device manufacturing method including the same. |
US7391503B2 (en) * | 2005-10-04 | 2008-06-24 | Asml Netherlands B.V. | System and method for compensating for thermal expansion of lithography apparatus or substrate |
US7830493B2 (en) * | 2005-10-04 | 2010-11-09 | Asml Netherlands B.V. | System and method for compensating for radiation induced thermal distortions in a substrate or projection system |
US7332733B2 (en) * | 2005-10-05 | 2008-02-19 | Asml Netherlands B.V. | System and method to correct for field curvature of multi lens array |
US20070127005A1 (en) * | 2005-12-02 | 2007-06-07 | Asml Holding N.V. | Illumination system |
US7626181B2 (en) * | 2005-12-09 | 2009-12-01 | Asml Netherlands B.V. | Lithographic apparatus and device manufacturing method |
US20070133007A1 (en) * | 2005-12-14 | 2007-06-14 | Asml Netherlands B.V. | Lithographic apparatus and device manufacturing method using laser trimming of a multiple mirror contrast device |
US7440078B2 (en) * | 2005-12-20 | 2008-10-21 | Asml Netherlands B.V. | Lithographic apparatus and device manufacturing method using interferometric and maskless exposure units |
US20070153249A1 (en) * | 2005-12-20 | 2007-07-05 | Asml Netherlands B.V. | Lithographic apparatus and device manufacturing method using multiple exposures and multiple exposure types |
US7466394B2 (en) * | 2005-12-21 | 2008-12-16 | Asml Netherlands B.V. | Lithographic apparatus and device manufacturing method using a compensation scheme for a patterning array |
US7532403B2 (en) | 2006-02-06 | 2009-05-12 | Asml Holding N.V. | Optical system for transforming numerical aperture |
EP1990828A4 (en) * | 2006-02-16 | 2010-09-15 | Nikon Corp | EXPOSURE DEVICE, EXPOSURE METHOD AND METHOD FOR PRODUCING COMPONENTS |
EP1993121A4 (en) * | 2006-03-03 | 2011-12-07 | Nikon Corp | EXPOSURE DEVICE AND COMPONENT MANUFACTURING METHOD |
US7528933B2 (en) * | 2006-04-06 | 2009-05-05 | Asml Netherlands B.V. | Lithographic apparatus and device manufacturing method utilizing a MEMS mirror with large deflection using a non-linear spring arrangement |
US7508491B2 (en) * | 2006-04-12 | 2009-03-24 | Asml Netherlands B.V. | Lithographic apparatus and device manufacturing method utilized to reduce quantization influence of datapath SLM interface to dose uniformity |
US7839487B2 (en) * | 2006-04-13 | 2010-11-23 | Asml Holding N.V. | Optical system for increasing illumination efficiency of a patterning device |
US7948606B2 (en) * | 2006-04-13 | 2011-05-24 | Asml Netherlands B.V. | Moving beam with respect to diffractive optics in order to reduce interference patterns |
US8264667B2 (en) * | 2006-05-04 | 2012-09-11 | Asml Netherlands B.V. | Lithographic apparatus and device manufacturing method using interferometric and other exposure |
US8934084B2 (en) * | 2006-05-31 | 2015-01-13 | Asml Holding N.V. | System and method for printing interference patterns having a pitch in a lithography system |
US7728954B2 (en) * | 2006-06-06 | 2010-06-01 | Asml Netherlands B.V. | Reflective loop system producing incoherent radiation |
US7649676B2 (en) * | 2006-06-14 | 2010-01-19 | Asml Netherlands B.V. | System and method to form unpolarized light |
JP4584872B2 (ja) * | 2006-06-15 | 2010-11-24 | 東京エレクトロン株式会社 | 基板処理システムおよび基板搬送方法 |
US7936445B2 (en) * | 2006-06-19 | 2011-05-03 | Asml Netherlands B.V. | Altering pattern data based on measured optical element characteristics |
US8896808B2 (en) * | 2006-06-21 | 2014-11-25 | Asml Netherlands B.V. | Lithographic apparatus and method |
US7697115B2 (en) * | 2006-06-23 | 2010-04-13 | Asml Holding N.V. | Resonant scanning mirror |
US7593094B2 (en) * | 2006-06-26 | 2009-09-22 | Asml Netherlands B.V. | Patterning device |
US20080002174A1 (en) * | 2006-06-30 | 2008-01-03 | Asml Netherlands B.V. | Control system for pattern generator in maskless lithography |
US7630136B2 (en) | 2006-07-18 | 2009-12-08 | Asml Holding N.V. | Optical integrators for lithography systems and methods |
US7548315B2 (en) * | 2006-07-27 | 2009-06-16 | Asml Netherlands B.V. | System and method to compensate for critical dimension non-uniformity in a lithography system |
US7738077B2 (en) * | 2006-07-31 | 2010-06-15 | Asml Netherlands B.V. | Patterning device utilizing sets of stepped mirrors and method of using same |
US7626182B2 (en) * | 2006-09-05 | 2009-12-01 | Asml Netherlands B.V. | Radiation pulse energy control system, lithographic apparatus and device manufacturing method |
US7628875B2 (en) * | 2006-09-12 | 2009-12-08 | Asml Netherlands B.V. | MEMS device and assembly method |
US8049865B2 (en) * | 2006-09-18 | 2011-11-01 | Asml Netherlands B.V. | Lithographic system, device manufacturing method, and mask optimization method |
US7683300B2 (en) * | 2006-10-17 | 2010-03-23 | Asml Netherlands B.V. | Using an interferometer as a high speed variable attenuator |
US20080111977A1 (en) * | 2006-11-14 | 2008-05-15 | Asml Holding N.V. | Compensation techniques for fluid and magnetic bearings |
US7453551B2 (en) * | 2006-11-14 | 2008-11-18 | Asml Netherlands B.V. | Increasing pulse-to-pulse radiation beam uniformity |
US7738079B2 (en) * | 2006-11-14 | 2010-06-15 | Asml Netherlands B.V. | Radiation beam pulse trimming |
US8054449B2 (en) * | 2006-11-22 | 2011-11-08 | Asml Holding N.V. | Enhancing the image contrast of a high resolution exposure tool |
US8259285B2 (en) | 2006-12-14 | 2012-09-04 | Asml Holding N.V. | Lithographic system, device manufacturing method, setpoint data optimization method, and apparatus for producing optimized setpoint data |
US7965378B2 (en) * | 2007-02-20 | 2011-06-21 | Asml Holding N.V | Optical system and method for illumination of reflective spatial light modulators in maskless lithography |
US8009269B2 (en) | 2007-03-14 | 2011-08-30 | Asml Holding N.V. | Optimal rasterization for maskless lithography |
US8009270B2 (en) | 2007-03-22 | 2011-08-30 | Asml Netherlands B.V. | Uniform background radiation in maskless lithography |
US7714986B2 (en) * | 2007-05-24 | 2010-05-11 | Asml Netherlands B.V. | Laser beam conditioning system comprising multiple optical paths allowing for dose control |
US20080304034A1 (en) * | 2007-06-07 | 2008-12-11 | Asml Netherlands B.V. | Dose control for optical maskless lithography |
US8189172B2 (en) * | 2007-06-14 | 2012-05-29 | Asml Netherlands B.V. | Lithographic apparatus and method |
US7768627B2 (en) * | 2007-06-14 | 2010-08-03 | Asml Netherlands B.V. | Illumination of a patterning device based on interference for use in a maskless lithography system |
US8692974B2 (en) * | 2007-06-14 | 2014-04-08 | Asml Netherlands B.V. | Lithographic apparatus and device manufacturing method using pupil filling by telecentricity control |
US20090199152A1 (en) * | 2008-02-06 | 2009-08-06 | Micronic Laser Systems Ab | Methods and apparatuses for reducing mura effects in generated patterns |
US20100053588A1 (en) * | 2008-08-29 | 2010-03-04 | Nikon Corporation | Substrate Stage movement patterns for high throughput While Imaging a Reticle to a pair of Imaging Locations |
US8264666B2 (en) * | 2009-03-13 | 2012-09-11 | Nikon Corporation | Exposure apparatus, exposure method, and method of manufacturing device |
US9114121B2 (en) | 2010-01-07 | 2015-08-25 | Bloxr Solutions, Llc | Radiation protection system |
TWI448830B (zh) * | 2010-02-09 | 2014-08-11 | Asml Netherlands Bv | 微影裝置及元件製造方法 |
CN102770811B (zh) * | 2010-02-25 | 2015-05-20 | Asml荷兰有限公司 | 光刻设备和器件制造方法 |
NL2010175A (en) * | 2012-02-10 | 2013-08-13 | Asml Netherlands Bv | A lithography apparatus and system, a method for calibrating a lithography apparatus, and device manufacturing methods. |
JP6297001B2 (ja) | 2014-03-19 | 2018-03-20 | キヤノン株式会社 | リソグラフィ装置、リソグラフィ方法、リソグラフィシステム、プログラム、および物品の製造方法 |
US10283456B2 (en) * | 2015-10-26 | 2019-05-07 | Taiwan Semiconductor Manufacturing Co., Ltd. | Lithography engraving machine for forming water identification marks and aligment marks |
EP3710893A4 (en) | 2018-01-08 | 2021-09-22 | Digilens Inc. | SYSTEMS AND METHODS FOR HIGH RATE RECORDING OF HOLOGRAPHIC NETWORKS IN WAVEGUIDE CELLS |
Family Cites Families (12)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CH566016A5 (ko) * | 1972-12-14 | 1975-08-29 | Nigg Juerg | |
US4090189A (en) | 1976-05-20 | 1978-05-16 | General Electric Company | Brightness control circuit for LED displays |
US4653903A (en) * | 1984-01-24 | 1987-03-31 | Canon Kabushiki Kaisha | Exposure apparatus |
JP3336436B2 (ja) * | 1991-04-02 | 2002-10-21 | 株式会社ニコン | リソグラフィシステム、情報収集装置、露光装置、及び半導体デバイス製造方法 |
US5290992A (en) * | 1992-10-07 | 1994-03-01 | International Business Machines Corporation | Apparatus for maximizing light beam utilization |
TW448487B (en) * | 1997-11-22 | 2001-08-01 | Nippon Kogaku Kk | Exposure apparatus, exposure method and manufacturing method of device |
US6238852B1 (en) * | 1999-01-04 | 2001-05-29 | Anvik Corporation | Maskless lithography system and method with doubled throughput |
DE19937417C1 (de) * | 1999-08-07 | 2000-07-06 | Agfa Gevaert Ag | Vorrichtung und Verfahren zum Belichten eines digitalen Bildes auf lichtempfindliches Material |
DE19950135A1 (de) | 1999-10-18 | 2001-04-19 | Patent Treuhand Ges Fuer Elektrische Gluehlampen Mbh | Ansteuerschaltung für LED und zugehöriges Betriebsverfahren |
EP1107064A3 (en) | 1999-12-06 | 2004-12-29 | Olympus Optical Co., Ltd. | Exposure apparatus |
US6379867B1 (en) * | 2000-01-10 | 2002-04-30 | Ball Semiconductor, Inc. | Moving exposure system and method for maskless lithography system |
US6509955B2 (en) * | 2000-05-25 | 2003-01-21 | Ball Semiconductor, Inc. | Lens system for maskless photolithography |
-
2003
- 2003-06-10 TW TW092115674A patent/TWI298825B/zh not_active IP Right Cessation
- 2003-06-10 JP JP2003196786A patent/JP2005222963A/ja active Pending
- 2003-06-10 EP EP03253650A patent/EP1372036A1/en not_active Withdrawn
- 2003-06-10 KR KR1020030037230A patent/KR100545297B1/ko active IP Right Grant
- 2003-06-10 CN CNB03143858XA patent/CN1332267C/zh not_active Expired - Lifetime
- 2003-06-10 US US10/457,786 patent/US6870601B2/en not_active Expired - Lifetime
- 2003-06-10 SG SG200303470-9A patent/SG130007A1/en unknown
-
2004
- 2004-11-23 US US10/994,669 patent/US20050068511A1/en not_active Abandoned
Also Published As
Publication number | Publication date |
---|---|
JP2005222963A (ja) | 2005-08-18 |
SG130007A1 (en) | 2007-03-20 |
TW200401956A (en) | 2004-02-01 |
US20050068511A1 (en) | 2005-03-31 |
CN1475863A (zh) | 2004-02-18 |
CN1332267C (zh) | 2007-08-15 |
US6870601B2 (en) | 2005-03-22 |
KR100545297B1 (ko) | 2006-01-24 |
TWI298825B (en) | 2008-07-11 |
EP1372036A1 (en) | 2003-12-17 |
US20040041104A1 (en) | 2004-03-04 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
KR100545297B1 (ko) | 리소그래피장치 및 디바이스 제조방법 | |
KR100756504B1 (ko) | 리소그래피 장치 및 디바이스 제조방법 | |
JP4991914B2 (ja) | リソグラフィ投影装置およびデバイス製造方法 | |
KR100730060B1 (ko) | 리소그래피 장치 및 디바이스 제조 방법 | |
KR100734596B1 (ko) | 리소그래피 장치 및 디바이스 제조방법 | |
US7859735B2 (en) | Systems and methods for minimizing scattered light in multi-SLM maskless lithography | |
KR100565111B1 (ko) | 리소그래피장치 및 디바이스제조방법 | |
KR100589232B1 (ko) | 리소그래피 투영장치 및 디바이스 제조방법 | |
US20090153954A1 (en) | Off-Axis Catadioptric Projection Optical System for Lithography | |
KR100659256B1 (ko) | 리소그래피장치 및 디바이스 제조방법 | |
JP2005025186A (ja) | 光空間変調器、リソグラフィ装置およびデバイス製造方法 | |
US7333177B2 (en) | Lithographic apparatus and device manufacturing method | |
JP4087819B2 (ja) | コンピュータ・プログラム、リソグラフィ装置及びデバイス製造方法 | |
KR100666741B1 (ko) | 리소그래피 장치 및 디바이스 제조방법 | |
EP1500981A1 (en) | Lithographic apparatus and device manufacturing method | |
EP1424598B1 (en) | Lithographic projection apparatus and device manufacturing method | |
EP1380897B1 (en) | Lithographic apparatus and device manufacturing method | |
EP1439425A1 (en) | Lithographic projection apparatus and device manufacturing method |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
A201 | Request for examination | ||
E902 | Notification of reason for refusal | ||
E701 | Decision to grant or registration of patent right | ||
GRNT | Written decision to grant | ||
FPAY | Annual fee payment |
Payment date: 20130110 Year of fee payment: 8 |
|
FPAY | Annual fee payment |
Payment date: 20140103 Year of fee payment: 9 |
|
FPAY | Annual fee payment |
Payment date: 20150109 Year of fee payment: 10 |
|
FPAY | Annual fee payment |
Payment date: 20160108 Year of fee payment: 11 |
|
FPAY | Annual fee payment |
Payment date: 20170106 Year of fee payment: 12 |
|
FPAY | Annual fee payment |
Payment date: 20180105 Year of fee payment: 13 |
|
FPAY | Annual fee payment |
Payment date: 20190107 Year of fee payment: 14 |
|
FPAY | Annual fee payment |
Payment date: 20200103 Year of fee payment: 15 |