NO315877B1 - Maskin for elektrisk testing av trykte kretser med justerbar posisjoneringav ledende nåler - Google Patents
Maskin for elektrisk testing av trykte kretser med justerbar posisjoneringav ledende nåler Download PDFInfo
- Publication number
- NO315877B1 NO315877B1 NO19982707A NO982707A NO315877B1 NO 315877 B1 NO315877 B1 NO 315877B1 NO 19982707 A NO19982707 A NO 19982707A NO 982707 A NO982707 A NO 982707A NO 315877 B1 NO315877 B1 NO 315877B1
- Authority
- NO
- Norway
- Prior art keywords
- needle
- plates
- plate
- printed circuit
- pin
- Prior art date
Links
- 238000012360 testing method Methods 0.000 title claims abstract description 30
- 239000000523 sample Substances 0.000 description 14
- 238000001514 detection method Methods 0.000 description 7
- 230000006835 compression Effects 0.000 description 4
- 238000007906 compression Methods 0.000 description 4
- 239000000758 substrate Substances 0.000 description 3
- KJLPSBMDOIVXSN-UHFFFAOYSA-N 4-[4-[2-[4-(3,4-dicarboxyphenoxy)phenyl]propan-2-yl]phenoxy]phthalic acid Chemical compound C=1C=C(OC=2C=C(C(C(O)=O)=CC=2)C(O)=O)C=CC=1C(C)(C)C(C=C1)=CC=C1OC1=CC=C(C(O)=O)C(C(O)=O)=C1 KJLPSBMDOIVXSN-UHFFFAOYSA-N 0.000 description 1
- 230000003213 activating effect Effects 0.000 description 1
- 230000005540 biological transmission Effects 0.000 description 1
- 230000007547 defect Effects 0.000 description 1
- 238000009413 insulation Methods 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 238000005259 measurement Methods 0.000 description 1
- 238000000034 method Methods 0.000 description 1
- 230000003252 repetitive effect Effects 0.000 description 1
- 230000032258 transport Effects 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/073—Multiple probes
- G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
- G01R1/07364—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card with provisions for altering position, number or connection of probe tips; Adapting to differences in pitch
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Tests Of Electronic Circuits (AREA)
- Measuring Leads Or Probes (AREA)
- Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
- Testing Electric Properties And Detecting Electric Faults (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
- Printing Elements For Providing Electric Connections Between Printed Circuits (AREA)
- Perforating, Stamping-Out Or Severing By Means Other Than Cutting (AREA)
- Supply And Installment Of Electrical Components (AREA)
- Measurement Of Mechanical Vibrations Or Ultrasonic Waves (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| IT95UD000251A IT1282829B1 (it) | 1995-12-22 | 1995-12-22 | Macchina di test elettrico per circuiti stampati con posizione registrabile degli aghi di sonda |
| PCT/IT1996/000160 WO1997023784A1 (en) | 1995-12-22 | 1996-08-09 | Machine for the electric test of printed circuits with adjustable position of the sound needles |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| NO982707D0 NO982707D0 (no) | 1998-06-12 |
| NO982707L NO982707L (no) | 1998-07-13 |
| NO315877B1 true NO315877B1 (no) | 2003-11-03 |
Family
ID=11421986
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| NO19982707A NO315877B1 (no) | 1995-12-22 | 1998-06-12 | Maskin for elektrisk testing av trykte kretser med justerbar posisjoneringav ledende nåler |
Country Status (27)
| Country | Link |
|---|---|
| US (1) | US6124722A (uk) |
| EP (1) | EP0876619B1 (uk) |
| JP (1) | JP2000502791A (uk) |
| KR (1) | KR100526744B1 (uk) |
| CN (1) | CN1175270C (uk) |
| AT (1) | ATE202850T1 (uk) |
| AU (1) | AU718507B2 (uk) |
| BR (1) | BR9612251A (uk) |
| CA (1) | CA2241326C (uk) |
| CZ (1) | CZ298035B6 (uk) |
| DE (1) | DE69613717T2 (uk) |
| DK (1) | DK0876619T3 (uk) |
| ES (1) | ES2160830T3 (uk) |
| GR (1) | GR3036790T3 (uk) |
| HU (1) | HUP9901931A3 (uk) |
| IT (1) | IT1282829B1 (uk) |
| MX (1) | MX9805100A (uk) |
| NO (1) | NO315877B1 (uk) |
| NZ (1) | NZ315085A (uk) |
| PL (1) | PL327496A1 (uk) |
| PT (1) | PT876619E (uk) |
| RO (1) | RO119659B1 (uk) |
| RU (1) | RU2212775C2 (uk) |
| SI (1) | SI9620133B (uk) |
| TR (1) | TR199801178T2 (uk) |
| UA (1) | UA28121C2 (uk) |
| WO (1) | WO1997023784A1 (uk) |
Families Citing this family (11)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| IT1282827B1 (it) | 1995-09-22 | 1998-03-31 | New System Srl | Macchina per il controllo contrapposto dei circuiti stampati |
| WO2002008773A2 (en) * | 2000-07-19 | 2002-01-31 | Orbotech Ltd. | Apparatus and method for electrical testing of electrical circuits |
| WO2005093441A1 (fr) * | 2004-03-26 | 2005-10-06 | Quanta Display Inc. | Dispositif et procede de reparation et de mise a l'essai d'un defaut de ligne |
| CN100357752C (zh) * | 2004-03-26 | 2007-12-26 | 广辉电子股份有限公司 | 线路缺陷检测维修设备及方法 |
| CN100388001C (zh) * | 2004-05-24 | 2008-05-14 | 名威科技实业有限公司 | 具有多个侦测单元的检测芯片 |
| DE102009004555A1 (de) | 2009-01-14 | 2010-09-30 | Atg Luther & Maelzer Gmbh | Verfahren zum Prüfen von Leiterplatten |
| CN108761233B (zh) * | 2018-05-23 | 2024-07-26 | 沈小晴 | 针对ied设备柔性化测试的模块可切换针盘设备及测试方法 |
| EP3891516B1 (en) * | 2018-09-11 | 2024-05-29 | Magicmotorsport Srl | Tool and assembly for carrying out tests on electrical and/or electronic circuits |
| KR102501995B1 (ko) * | 2019-12-18 | 2023-02-20 | 주식회사 아도반테스토 | 하나 이상의 피시험 장치를 테스트하기 위한 자동식 테스트 장비 및 자동식 테스트 장비의 작동 방법 |
| JP7217293B2 (ja) | 2019-12-18 | 2023-02-02 | 株式会社アドバンテスト | １または複数の被テストデバイスをテストするための自動テスト装置、および、自動テスト装置を操作するための方法 |
| TWI797552B (zh) * | 2020-02-06 | 2023-04-01 | 日商愛德萬測試股份有限公司 | 用於測試一或多個受測裝置之自動測試設備及用於操作自動測試設備的方法 |
Family Cites Families (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| SU563614A1 (ru) * | 1974-04-17 | 1977-06-30 | Московский Ордена Ленина Энергетический Институт | Вихретоковый преобразователь |
| DE2628428C3 (de) * | 1976-06-24 | 1979-02-15 | Siemens Ag, 1000 Berlin Und 8000 Muenchen | Adapter zum Verbinden von Anschluß- und/oder Prüfpunkten einer Baugruppe mit einer Mefischaltung |
| US4841241A (en) * | 1986-08-07 | 1989-06-20 | Siemens Aktiengesellschaft | Testing device for both-sided contacting of component-equipped printed circuit boards |
| DE3781979D1 (de) * | 1986-08-07 | 1992-11-05 | Siemens Ag | Pruefeinrichtung fuer beidseitige, zweistufige kontaktierung bestueckter leiterplatten. |
| US4975637A (en) * | 1989-12-29 | 1990-12-04 | International Business Machines Corporation | Method and apparatus for integrated circuit device testing |
| US5436567A (en) * | 1993-02-08 | 1995-07-25 | Automated Test Engineering, Inc. | Double-sided automatic test equipment probe clamshell with vacuum-actuated bottom probe contacts and mechanical-actuated top probe contacts |
-
1995
- 1995-12-22 IT IT95UD000251A patent/IT1282829B1/it active IP Right Grant
- 1995-12-22 NZ NZ315085A patent/NZ315085A/en unknown
-
1996
- 1996-08-09 US US09/091,677 patent/US6124722A/en not_active Expired - Fee Related
- 1996-08-09 SI SI9620133A patent/SI9620133B/sl not_active IP Right Cessation
- 1996-08-09 CZ CZ0187498A patent/CZ298035B6/cs not_active IP Right Cessation
- 1996-08-09 RO RO98-01087A patent/RO119659B1/ro unknown
- 1996-08-09 UA UA98063229A patent/UA28121C2/uk unknown
- 1996-08-09 JP JP9523485A patent/JP2000502791A/ja not_active Ceased
- 1996-08-09 HU HU9901931A patent/HUP9901931A3/hu unknown
- 1996-08-09 AU AU66684/96A patent/AU718507B2/en not_active Ceased
- 1996-08-09 CN CNB961992778A patent/CN1175270C/zh not_active Expired - Fee Related
- 1996-08-09 PL PL96327496A patent/PL327496A1/xx unknown
- 1996-08-09 PT PT96926571T patent/PT876619E/pt unknown
- 1996-08-09 KR KR10-1998-0704775A patent/KR100526744B1/ko not_active IP Right Cessation
- 1996-08-09 DK DK96926571T patent/DK0876619T3/da active
- 1996-08-09 DE DE69613717T patent/DE69613717T2/de not_active Expired - Fee Related
- 1996-08-09 RU RU98113859/09A patent/RU2212775C2/ru not_active IP Right Cessation
- 1996-08-09 CA CA002241326A patent/CA2241326C/en not_active Expired - Fee Related
- 1996-08-09 WO PCT/IT1996/000160 patent/WO1997023784A1/en active IP Right Grant
- 1996-08-09 BR BR9612251A patent/BR9612251A/pt not_active IP Right Cessation
- 1996-08-09 AT AT96926571T patent/ATE202850T1/de not_active IP Right Cessation
- 1996-08-09 ES ES96926571T patent/ES2160830T3/es not_active Expired - Lifetime
- 1996-08-09 EP EP96926571A patent/EP0876619B1/en not_active Expired - Lifetime
- 1996-08-09 TR TR1998/01178T patent/TR199801178T2/xx unknown
-
1998
- 1998-06-12 NO NO19982707A patent/NO315877B1/no unknown
- 1998-06-22 MX MX9805100A patent/MX9805100A/es not_active IP Right Cessation
-
2001
- 2001-10-03 GR GR20010401652T patent/GR3036790T3/el not_active IP Right Cessation
Also Published As
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| US5818248A (en) | Loaded board test fixture with integral translator fixture for testing closely spaced test sites | |
| NO315877B1 (no) | Maskin for elektrisk testing av trykte kretser med justerbar posisjoneringav ledende nåler | |
| US5945838A (en) | Apparatus for testing circuit boards | |
| KR950023986A (ko) | 인쇄회로기판의 상호접속부 검사장치 및 인쇄회로기판 검사방법 | |
| US6856154B2 (en) | Test board for testing IC package and tester calibration method using the same | |
| EP1031839A2 (en) | Test fixture for matched impedance testing | |
| US7973551B2 (en) | Test fixture for printed circuit board | |
| KR100638330B1 (ko) | 도체장치 검사용 어댑터 | |
| EP1022572B1 (en) | Scan test apparatus for continuity testing of bare printed circuit boards | |
| NO316412B1 (no) | Fremgangsmåte for kontroll av kretskort | |
| EP1041389B1 (en) | System and method for characterising a test fixture | |
| KR20060019552A (ko) | 반도체 집적회로 테스트용 테스터 구조 | |
| EP0989409A1 (en) | Scan test machine for densely spaced test sites | |
| JP2965174B2 (ja) | 半導体素子検査装置 | |
| KR960006912Y1 (ko) | 초고주파 회로용 회로기판 시험장치 | |
| JPH05315414A (ja) | プローブカード及びその仕様検査方法 | |
| WO1997011378A1 (en) | Machine for the control of printed circuits | |
| JPS5935442A (ja) | 信号方式 | |
| JPH08201431A (ja) | ウェハプローバ | |
| KR20040000760A (ko) | 인덱서 센싱구조가 개선된 반도체 소자 검사장치 |