NL9401600A - Systeem en werkwijze voor het verwerken van een beeld. - Google Patents

Systeem en werkwijze voor het verwerken van een beeld. Download PDF

Info

Publication number
NL9401600A
NL9401600A NL9401600A NL9401600A NL9401600A NL 9401600 A NL9401600 A NL 9401600A NL 9401600 A NL9401600 A NL 9401600A NL 9401600 A NL9401600 A NL 9401600A NL 9401600 A NL9401600 A NL 9401600A
Authority
NL
Netherlands
Prior art keywords
density
image
workpiece
value
histogram
Prior art date
Application number
NL9401600A
Other languages
English (en)
Dutch (nl)
Inventor
Kazuo Funakubo
Original Assignee
Mitsubishi Electric Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mitsubishi Electric Corp filed Critical Mitsubishi Electric Corp
Publication of NL9401600A publication Critical patent/NL9401600A/nl

Links

Classifications

    • GPHYSICS
    • G06COMPUTING; CALCULATING OR COUNTING
    • G06TIMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00Image analysis
    • G06T7/0002Inspection of images, e.g. flaw detection
    • G06T7/0004Industrial image inspection
    • GPHYSICS
    • G06COMPUTING; CALCULATING OR COUNTING
    • G06TIMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00Image analysis
    • G06T7/10Segmentation; Edge detection
    • G06T7/11Region-based segmentation
    • GPHYSICS
    • G06COMPUTING; CALCULATING OR COUNTING
    • G06TIMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00Image analysis
    • G06T7/10Segmentation; Edge detection
    • G06T7/136Segmentation; Edge detection involving thresholding
    • GPHYSICS
    • G06COMPUTING; CALCULATING OR COUNTING
    • G06TIMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00Indexing scheme for image analysis or image enhancement
    • G06T2207/20Special algorithmic details
    • G06T2207/20092Interactive image processing based on input by user
    • GPHYSICS
    • G06COMPUTING; CALCULATING OR COUNTING
    • G06TIMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00Indexing scheme for image analysis or image enhancement
    • G06T2207/30Subject of image; Context of image processing
    • G06T2207/30108Industrial image inspection
    • G06T2207/30164Workpiece; Machine component
NL9401600A 1994-02-18 1994-09-29 Systeem en werkwijze voor het verwerken van een beeld. NL9401600A (nl)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP6021184A JPH07230546A (ja) 1994-02-18 1994-02-18 画像処理装置及び画像処理方法
JP2118494 1994-02-18

Publications (1)

Publication Number Publication Date
NL9401600A true NL9401600A (nl) 1995-10-02

Family

ID=12047865

Family Applications (1)

Application Number Title Priority Date Filing Date
NL9401600A NL9401600A (nl) 1994-02-18 1994-09-29 Systeem en werkwijze voor het verwerken van een beeld.

Country Status (3)

Country Link
JP (1) JPH07230546A (de)
DE (1) DE4434505C2 (de)
NL (1) NL9401600A (de)

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3545506B2 (ja) * 1995-08-21 2004-07-21 株式会社東芝 特定色領域抽出方式および特定色領域除去方式
JP4149575B2 (ja) * 1998-08-24 2008-09-10 株式会社東芝 印刷物の汚損度検査装置
JP2001016622A (ja) 1999-06-30 2001-01-19 Agilent Technologies Japan Ltd 撮像素子のデバッグ装置と試験方法
JP4635651B2 (ja) * 2005-03-08 2011-02-23 パナソニック株式会社 パターン認識装置およびパターン認識方法
JP2007071684A (ja) * 2005-09-07 2007-03-22 Hitachi Medical Corp 光ファイバ束検査装置
JP4704310B2 (ja) * 2006-10-11 2011-06-15 シャープ株式会社 画像処理方法、画像処理装置、画像処理プログラムおよび画像処理プログラムを記録する記録媒体

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0188193A2 (de) * 1985-01-15 1986-07-23 International Business Machines Corporation Verfahren und Vorrichtung zur Bilddatenbearbeitung
US5138671A (en) * 1989-11-17 1992-08-11 Matsushita Electric Industrial Co., Ltd. Image processing method for distinguishing object by determining threshold of image lightness values

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH07104934B2 (ja) * 1984-11-20 1995-11-13 株式会社明電舍 画像処理装置
JPS61177018A (ja) * 1985-01-31 1986-08-08 Fanuc Ltd 二値化閾値の補正方法
US4731863A (en) * 1986-04-07 1988-03-15 Eastman Kodak Company Digital image processing method employing histogram peak detection

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0188193A2 (de) * 1985-01-15 1986-07-23 International Business Machines Corporation Verfahren und Vorrichtung zur Bilddatenbearbeitung
US5138671A (en) * 1989-11-17 1992-08-11 Matsushita Electric Industrial Co., Ltd. Image processing method for distinguishing object by determining threshold of image lightness values

Non-Patent Citations (2)

* Cited by examiner, † Cited by third party
Title
PIZER E.A.: "adaptative histogram equalization and its variations", COMPUTER VISION GRAPHICS AND IMAGE PROCESSING, vol. 39, no. 3, MA US, pages 355 - 368 *
TSAI AND CHEN: "a fast histogram-clustering approach for multi-level thresholding", PATTERN RECOGNITION LETTERS, vol. 13, no. 4, AMSTERDAM NL, pages 245 - 252, XP000271326 *

Also Published As

Publication number Publication date
DE4434505C2 (de) 1997-01-30
DE4434505A1 (de) 1995-08-24
JPH07230546A (ja) 1995-08-29

Similar Documents

Publication Publication Date Title
JP5564348B2 (ja) 画像処理装置及び外観検査方法
JP2742240B2 (ja) 構造物表面の検査における欠陥の検出方法
KR930006802B1 (ko) 화상문턱값 결정방법
US8086024B2 (en) Defect detection apparatus, defect detection method and computer program
KR20080080998A (ko) 화상 해석에 의해서 결함 검사를 실시하는 결함검사장치
JP2882409B1 (ja) 外観検査装置
NL9401600A (nl) Systeem en werkwijze voor het verwerken van een beeld.
JP3533722B2 (ja) 不良検査方法およびその装置
JP4244046B2 (ja) 画像処理方法および画像処理装置
JP2000171404A (ja) 半導体集積装置のパターン検査装置及びパターン検査方法
US6549655B1 (en) Image binarization method and image processing system using the same
US6335982B1 (en) Method and apparatus for inspecting streak
KR20210000657A (ko) 외관 검사 관리 시스템, 외관 검사 관리 장치, 외관 검사 관리 방법 및 프로그램
JP3374818B2 (ja) 欠陥検出装置及び方法
JPH11175727A (ja) 検査方法および装置
JP3657028B2 (ja) 外観検査装置
EP0416114B1 (de) Bildverarbeitungsverfahren und -vorrichtung
JP3450144B2 (ja) 画像ノイズ分析方法
JP2011232302A (ja) 画像検査方法及び画像検査装置
JP5595247B2 (ja) マハラノビス基準空間の生成方法及び検査装置
JPH08315156A (ja) 画像処理装置及び画像処理方法
JP6690316B2 (ja) シート状の被検査体の欠陥検査装置、欠陥検査方法及び欠陥検査システム
JP3912063B2 (ja) 画像濃淡ムラの検出方法
JPS62194448A (ja) 画像中における粒子像分析方法
JP2002259971A (ja) 画像濃淡ムラ検出方法及びこの検査装置

Legal Events

Date Code Title Description
A1B A search report has been drawn up
BC A request for examination has been filed
BN A decision not to publish the application has become irrevocable