NL192156B - Voorlaadketen voor gebruik in een halfgeleidegeheugeneenheid. - Google Patents
Voorlaadketen voor gebruik in een halfgeleidegeheugeneenheid.Info
- Publication number
- NL192156B NL192156B NL8801634A NL8801634A NL192156B NL 192156 B NL192156 B NL 192156B NL 8801634 A NL8801634 A NL 8801634A NL 8801634 A NL8801634 A NL 8801634A NL 192156 B NL192156 B NL 192156B
- Authority
- NL
- Netherlands
- Prior art keywords
- semiconductor memory
- memory unit
- precharge circuit
- precharge
- circuit
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
- G11C11/21—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements
- G11C11/34—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices
- G11C11/40—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
- G11C11/21—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements
- G11C11/34—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices
- G11C11/40—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors
- G11C11/41—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors forming static cells with positive feedback, i.e. cells not needing refreshing or charge regeneration, e.g. bistable multivibrator or Schmitt trigger
- G11C11/413—Auxiliary circuits, e.g. for addressing, decoding, driving, writing, sensing, timing or power reduction
- G11C11/417—Auxiliary circuits, e.g. for addressing, decoding, driving, writing, sensing, timing or power reduction for memory cells of the field-effect type
- G11C11/419—Read-write [R-W] circuits
Landscapes
- Engineering & Computer Science (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Computer Hardware Design (AREA)
- Static Random-Access Memory (AREA)
- Dram (AREA)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR870006581 | 1987-06-27 | ||
KR1019870006581A KR900004635B1 (ko) | 1987-06-27 | 1987-06-27 | 반도체 메모리장치의 충전 및 등화회로 |
Publications (3)
Publication Number | Publication Date |
---|---|
NL8801634A NL8801634A (nl) | 1989-01-16 |
NL192156B true NL192156B (nl) | 1996-10-01 |
NL192156C NL192156C (nl) | 1997-02-04 |
Family
ID=19262408
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
NL8801634A NL192156C (nl) | 1987-06-27 | 1988-06-27 | Voorlaadketen voor gebruik in een halfgeleidegeheugeneenheid. |
Country Status (4)
Country | Link |
---|---|
US (1) | US4852064A (nl) |
JP (1) | JPS6452282A (nl) |
KR (1) | KR900004635B1 (nl) |
NL (1) | NL192156C (nl) |
Families Citing this family (22)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH01211394A (ja) * | 1988-02-19 | 1989-08-24 | Sony Corp | メモリ装置 |
JPH0762955B2 (ja) * | 1989-05-15 | 1995-07-05 | 株式会社東芝 | ダイナミック型ランダムアクセスメモリ |
US5239237A (en) * | 1990-02-14 | 1993-08-24 | Zilog, Inc. | Control circuit having outputs with differing rise and fall times |
US5187686A (en) * | 1990-02-14 | 1993-02-16 | Zilog, Inc. | Control circuit having outputs with differing rise and fall times |
JPH03278396A (ja) * | 1990-03-27 | 1991-12-10 | Nec Corp | 半導体記憶装置 |
KR920010345B1 (ko) * | 1990-06-30 | 1992-11-27 | 삼성전자 주식회사 | 선충전수단을 구비한 라이트 드라이버(write driver) |
KR940008296B1 (ko) * | 1991-06-19 | 1994-09-10 | 삼성전자 주식회사 | 고속 센싱동작을 수행하는 센스앰프 |
JPH0660665A (ja) * | 1992-08-10 | 1994-03-04 | Nec Corp | 半導体スタティックramのビット線負荷回路 |
US5339274A (en) * | 1992-10-30 | 1994-08-16 | International Business Machines Corporation | Variable bitline precharge voltage sensing technique for DRAM structures |
US6631093B2 (en) * | 2001-06-29 | 2003-10-07 | Intel Corporation | Low power precharge scheme for memory bit lines |
DE102005025149B4 (de) | 2005-06-01 | 2011-08-18 | Infineon Technologies AG, 81669 | Einrichtung zur Verwendung beim Auslesen einer Speicherzelle, und Verfahren zum Auslesen einer Speicherzelle |
US8064271B2 (en) * | 2005-09-28 | 2011-11-22 | Texas Instruments Incorporated | Static random access memory device having bit line voltage control for retain till accessed mode and method of operating the same |
EP1966803A2 (en) * | 2005-12-29 | 2008-09-10 | SanDisk Corporation | Non-volatile memory operated on the basis of a two-step bit-line precharge operation and a two-pass sensing operation |
US7447094B2 (en) * | 2005-12-29 | 2008-11-04 | Sandisk Corporation | Method for power-saving multi-pass sensing in non-volatile memory |
US7733704B2 (en) | 2005-12-29 | 2010-06-08 | Sandisk Corporation | Non-volatile memory with power-saving multi-pass sensing |
US7936624B2 (en) * | 2006-12-30 | 2011-05-03 | Texas Instruments Incorporated | Reduced power bitline precharge scheme for low power applications in memory devices |
JP2009043357A (ja) * | 2007-08-10 | 2009-02-26 | Toshiba Corp | 半導体記憶装置 |
KR101475346B1 (ko) * | 2008-07-02 | 2014-12-23 | 삼성전자주식회사 | 비트라인 쌍의 디벨롭 레벨을 클립핑하는 디벨롭 레벨클리핑 회로, 이를 포함하는 컬럼 경로 회로 및 멀티 포트반도체 메모리 장치 |
JP2011138569A (ja) * | 2009-12-25 | 2011-07-14 | Toshiba Corp | 不揮発性半導体記憶装置 |
US8605526B2 (en) * | 2011-05-31 | 2013-12-10 | Infineon Technologies Ag | Memory reliability verification techniques |
US9842631B2 (en) * | 2012-12-14 | 2017-12-12 | Nvidia Corporation | Mitigating external influences on long signal lines |
US9922701B2 (en) * | 2016-08-08 | 2018-03-20 | Taiwan Semiconductor Manufacturing Company Limited | Pre-charging bit lines through charge-sharing |
Family Cites Families (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5851354B2 (ja) * | 1980-10-15 | 1983-11-16 | 富士通株式会社 | 半導体記憶装置 |
JPS61190787A (ja) * | 1985-02-20 | 1986-08-25 | Hitachi Ltd | スタテイツク型ram |
JPS629590A (ja) * | 1985-07-08 | 1987-01-17 | Nec Corp | 増幅回路 |
-
1987
- 1987-06-27 KR KR1019870006581A patent/KR900004635B1/ko not_active IP Right Cessation
-
1988
- 1988-06-16 US US07/207,518 patent/US4852064A/en not_active Expired - Lifetime
- 1988-06-23 JP JP63153688A patent/JPS6452282A/ja active Pending
- 1988-06-27 NL NL8801634A patent/NL192156C/nl not_active IP Right Cessation
Also Published As
Publication number | Publication date |
---|---|
US4852064A (en) | 1989-07-25 |
NL192156C (nl) | 1997-02-04 |
JPS6452282A (en) | 1989-02-28 |
KR890001093A (ko) | 1989-03-18 |
NL8801634A (nl) | 1989-01-16 |
KR900004635B1 (ko) | 1990-06-30 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
A1A | A request for search or an international-type search has been filed | ||
CNR | Transfer of rights (patent application after its laying open for public inspection) |
Free format text: SAMSUNG ELECTRONICS CO., LTD. |
|
BB | A search report has been drawn up | ||
BC | A request for examination has been filed | ||
BK | Erratum |
Free format text: PAT.BUL.04/97,HEADING P,SECTION 2,PAGE 497:IN THE TITLE OF THE INVENTION THE WORD HALFGELEIDEGEHEUGENEENHEID SHOULD BE MODIFIED INTO: HALFGELEIDERGEHEUGENEENHEID |
|
V4 | Discontinued because of reaching the maximum lifetime of a patent |
Effective date: 20080627 |