NL190742C - Uitgangsbufferschakeling voor een byte-breed geheugen. - Google Patents

Uitgangsbufferschakeling voor een byte-breed geheugen.

Info

Publication number
NL190742C
NL190742C NL8900795A NL8900795A NL190742C NL 190742 C NL190742 C NL 190742C NL 8900795 A NL8900795 A NL 8900795A NL 8900795 A NL8900795 A NL 8900795A NL 190742 C NL190742 C NL 190742C
Authority
NL
Netherlands
Prior art keywords
byte
output buffer
buffer circuit
wide memory
wide
Prior art date
Application number
NL8900795A
Other languages
English (en)
Other versions
NL8900795A (nl
NL190742B (nl
Original Assignee
Samsung Electronics Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Samsung Electronics Co Ltd filed Critical Samsung Electronics Co Ltd
Publication of NL8900795A publication Critical patent/NL8900795A/nl
Publication of NL190742B publication Critical patent/NL190742B/nl
Application granted granted Critical
Publication of NL190742C publication Critical patent/NL190742C/nl

Links

Classifications

    • HELECTRICITY
    • H03ELECTRONIC CIRCUITRY
    • H03FAMPLIFIERS
    • H03F3/00Amplifiers with only discharge tubes or only semiconductor devices as amplifying elements
    • H03F3/04Amplifiers with only discharge tubes or only semiconductor devices as amplifying elements with semiconductor devices only
    • HELECTRICITY
    • H03ELECTRONIC CIRCUITRY
    • H03KPULSE TECHNIQUE
    • H03K17/00Electronic switching or gating, i.e. not by contact-making and –breaking
    • H03K17/51Electronic switching or gating, i.e. not by contact-making and –breaking characterised by the components used
    • H03K17/56Electronic switching or gating, i.e. not by contact-making and –breaking characterised by the components used by the use, as active elements, of semiconductor devices
    • H03K17/687Electronic switching or gating, i.e. not by contact-making and –breaking characterised by the components used by the use, as active elements, of semiconductor devices the devices being field-effect transistors
    • H03K17/6871Electronic switching or gating, i.e. not by contact-making and –breaking characterised by the components used by the use, as active elements, of semiconductor devices the devices being field-effect transistors the output circuit comprising more than one controlled field-effect transistor
    • H03K17/6872Electronic switching or gating, i.e. not by contact-making and –breaking characterised by the components used by the use, as active elements, of semiconductor devices the devices being field-effect transistors the output circuit comprising more than one controlled field-effect transistor using complementary field-effect transistors
    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C11/00Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
    • G11C11/21Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements
    • G11C11/34Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices
    • G11C11/40Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors
    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C7/00Arrangements for writing information into, or reading information out from, a digital store
    • G11C7/10Input/output [I/O] data interface arrangements, e.g. I/O data control circuits, I/O data buffers
    • G11C7/1051Data output circuits, e.g. read-out amplifiers, data output buffers, data output registers, data output level conversion circuits
    • HELECTRICITY
    • H03ELECTRONIC CIRCUITRY
    • H03KPULSE TECHNIQUE
    • H03K17/00Electronic switching or gating, i.e. not by contact-making and –breaking
    • H03K17/16Modifications for eliminating interference voltages or currents
    • H03K17/161Modifications for eliminating interference voltages or currents in field-effect transistor switches
    • H03K17/162Modifications for eliminating interference voltages or currents in field-effect transistor switches without feedback from the output circuit to the control circuit
    • H03K17/163Soft switching

Landscapes

  • Engineering & Computer Science (AREA)
  • Power Engineering (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Computer Hardware Design (AREA)
  • Logic Circuits (AREA)
  • Static Random-Access Memory (AREA)
  • Dram (AREA)
  • Electronic Switches (AREA)
NL8900795A 1988-07-18 1989-03-31 Uitgangsbufferschakeling voor een byte-breed geheugen. NL190742C (nl)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
KR1019880008952A KR910004735B1 (ko) 1988-07-18 1988-07-18 데이타 출력용 버퍼회로
KR880008952 1988-07-18

Publications (3)

Publication Number Publication Date
NL8900795A NL8900795A (nl) 1990-02-16
NL190742B NL190742B (nl) 1994-02-16
NL190742C true NL190742C (nl) 1994-07-18

Family

ID=19276180

Family Applications (1)

Application Number Title Priority Date Filing Date
NL8900795A NL190742C (nl) 1988-07-18 1989-03-31 Uitgangsbufferschakeling voor een byte-breed geheugen.

Country Status (7)

Country Link
US (1) US4972100A (nl)
JP (1) JPH02161692A (nl)
KR (1) KR910004735B1 (nl)
DE (1) DE3910466C2 (nl)
FR (1) FR2634311B1 (nl)
GB (1) GB2221587B (nl)
NL (1) NL190742C (nl)

Families Citing this family (30)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH03185921A (ja) * 1989-12-14 1991-08-13 Toshiba Corp 半導体集積回路
JP2567153B2 (ja) * 1991-01-14 1996-12-25 株式会社東芝 Cmos出力バッファ回路
JP3079515B2 (ja) * 1991-01-29 2000-08-21 株式会社東芝 ゲ−トアレイ装置及び入力回路及び出力回路及び降圧回路
US5120999A (en) * 1991-02-08 1992-06-09 Texas Instruments Incorporated Output-buffer noise-control circuit
KR930008656B1 (ko) * 1991-07-19 1993-09-11 삼성전자 주식회사 노이즈가 억제되는 데이타 출력 버퍼
JPH05243939A (ja) * 1991-11-20 1993-09-21 Nec Corp 半導体集積回路装置
US5300828A (en) * 1992-08-31 1994-04-05 Sgs-Thomson Microelectronics, Inc. Slew rate limited output buffer with bypass circuitry
EP0586207B1 (en) * 1992-08-31 1997-03-26 STMicroelectronics, Inc. Integrated circuit output driver
JP2968653B2 (ja) * 1992-09-03 1999-10-25 日本電気株式会社 出力回路
US5300837A (en) * 1992-09-17 1994-04-05 At&T Bell Laboratories Delay compensation technique for buffers
US5576640A (en) * 1992-09-25 1996-11-19 At&T Global Information Solutions Company CMOS driver for fast single-ended bus
US5477166A (en) * 1993-04-22 1995-12-19 Benchmarq Microelectronics Programmable output device with integrated circuit
US5367206A (en) * 1993-06-17 1994-11-22 Advanced Micro Devices, Inc. Output buffer circuit for a low voltage EPROM
US5682116A (en) * 1994-06-07 1997-10-28 International Business Machines Corporation Off chip driver having slew rate control and differential voltage protection circuitry
JP3537500B2 (ja) * 1994-08-16 2004-06-14 バー−ブラウン・コーポレーション インバータ装置
JPH0977184A (ja) * 1995-09-19 1997-03-25 Sato Sangyo Kk 粒体排出装置付袋を内側に嵌装したコンテナ
KR100206604B1 (ko) * 1996-06-29 1999-07-01 김영환 반도체 메모리 장치
EP0920028A4 (en) * 1996-08-16 1999-11-17 Mitsubishi Electric Corp INTEGRATED SEMICONDUCTOR CIRCUIT ARRANGEMENT
JPH1125678A (ja) 1997-06-27 1999-01-29 Samsung Electron Co Ltd 出力ドライバ及び半導体メモリ装置
US5949259A (en) * 1997-11-19 1999-09-07 Atmel Corporation Zero-delay slew-rate controlled output buffer
KR100300052B1 (ko) * 1998-09-19 2001-09-06 김영환 출력버퍼회로
US6362665B1 (en) * 1999-11-19 2002-03-26 Intersil Americas Inc. Backwards drivable MOS output driver
US6570405B1 (en) * 2001-12-20 2003-05-27 Integrated Device Technology, Inc. Integrated output driver circuits having current sourcing and current sinking characteristics that inhibit power bounce and ground bounce
US6894529B1 (en) 2003-07-09 2005-05-17 Integrated Device Technology, Inc. Impedance-matched output driver circuits having linear characteristics and enhanced coarse and fine tuning control
US6967501B1 (en) 2003-12-18 2005-11-22 Integrated Device Technology, Inc. Impedance-matched output driver circuits having enhanced predriver control
KR100670672B1 (ko) 2004-11-02 2007-01-17 주식회사 하이닉스반도체 반도체메모리소자
CN101814842A (zh) * 2009-02-24 2010-08-25 飞思卡尔半导体公司 具有可调整驱动电流的高频电源开关电路
US8456939B2 (en) * 2009-12-11 2013-06-04 Arm Limited Voltage regulation circuitry
KR101326777B1 (ko) * 2012-04-12 2013-11-08 한국조폐공사 다층 보안 용지
US10879899B2 (en) * 2017-08-15 2020-12-29 Realtek Semiconductor Corp. Clock buffer and method thereof

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5268304A (en) * 1975-12-05 1977-06-07 Fujitsu Ltd Transistor circuit
US4274014A (en) * 1978-12-01 1981-06-16 Rca Corporation Switched current source for current limiting complementary symmetry inverter
JPS5772429A (en) * 1980-10-22 1982-05-06 Toshiba Corp Semiconductor integrated circuit device
KR890004212B1 (en) * 1983-07-08 1989-10-27 Fujitsu Ltd Complementary logic circuit
JPS60115092A (ja) * 1983-11-28 1985-06-21 Nec Corp 半導体記憶回路
JPS61267413A (ja) * 1985-05-22 1986-11-27 Fujitsu Ltd 入力バツフア回路
JPS62159917A (ja) * 1986-01-08 1987-07-15 Toshiba Corp 集積回路におけるインバ−タ回路
JPS62248310A (ja) * 1986-04-21 1987-10-29 Seiko Epson Corp 半導体記憶装置
US4749882A (en) * 1986-07-25 1988-06-07 Digital Equipment Corporation Apparatus and method for applying rapid transient signals to components on a printed circuit board

Also Published As

Publication number Publication date
GB2221587A (en) 1990-02-07
KR910004735B1 (ko) 1991-07-10
FR2634311B1 (fr) 1993-02-05
KR900002542A (ko) 1990-02-28
JPH02161692A (ja) 1990-06-21
US4972100A (en) 1990-11-20
GB8907333D0 (en) 1989-05-17
JPH0529995B2 (nl) 1993-05-06
NL8900795A (nl) 1990-02-16
NL190742B (nl) 1994-02-16
DE3910466A1 (de) 1990-01-25
GB2221587B (en) 1992-04-15
FR2634311A1 (fr) 1990-01-19
DE3910466C2 (de) 1993-10-21

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Legal Events

Date Code Title Description
A1A A request for search or an international-type search has been filed
BB A search report has been drawn up
BC A request for examination has been filed
V4 Discontinued because of reaching the maximum lifetime of a patent

Effective date: 20090331