MX2022008936A - Dispositivo de inspeccion de superficie, metodo de inspeccion de superficie, metodo de fabricacion de material de acero, metodo de gestion de calidad del material de acero, e instalacion de fabricacion para material de acero. - Google Patents

Dispositivo de inspeccion de superficie, metodo de inspeccion de superficie, metodo de fabricacion de material de acero, metodo de gestion de calidad del material de acero, e instalacion de fabricacion para material de acero.

Info

Publication number
MX2022008936A
MX2022008936A MX2022008936A MX2022008936A MX2022008936A MX 2022008936 A MX2022008936 A MX 2022008936A MX 2022008936 A MX2022008936 A MX 2022008936A MX 2022008936 A MX2022008936 A MX 2022008936A MX 2022008936 A MX2022008936 A MX 2022008936A
Authority
MX
Mexico
Prior art keywords
steel material
surface inspection
inspection device
oblique
manufacturing steel
Prior art date
Application number
MX2022008936A
Other languages
English (en)
Inventor
Hiroaki Ono
Keisuke Yoshida
Daisuke Tajiri
Original Assignee
Jfe Steel Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Jfe Steel Corp filed Critical Jfe Steel Corp
Publication of MX2022008936A publication Critical patent/MX2022008936A/es

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G01N21/892—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles characterised by the flaw, defect or object feature examined
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G01N21/8901—Optical details; Scanning details
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G01N21/892—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles characterised by the flaw, defect or object feature examined
    • G01N21/8921—Streaks
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
    • G01N2021/8854—Grading and classifying of flaws
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G01N21/8914—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles characterised by the material examined
    • G01N2021/8918—Metal
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
    • Y02P—CLIMATE CHANGE MITIGATION TECHNOLOGIES IN THE PRODUCTION OR PROCESSING OF GOODS
    • Y02P90/00—Enabling technologies with a potential contribution to greenhouse gas [GHG] emissions mitigation
    • Y02P90/30—Computing systems specially adapted for manufacturing

Landscapes

  • Engineering & Computer Science (AREA)
  • Textile Engineering (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Coating With Molten Metal (AREA)
  • Investigating And Analyzing Materials By Characteristic Methods (AREA)
  • Heat Treatment Of Steel (AREA)

Abstract

Un dispositivo de inspección de superficie de acuerdo con la presente invención incluye: dos o más fuentes de luz lineales oblicuas que emiten haces de luz de iluminación oblicua sobre una región objetivo de inspección de material de acero; uno o más sensores lineales que reciben cada uno de los haces de luz reflejada de los haces de luz de iluminación oblicua de las fuentes de luz lineales oblicuas respectivas, los haces de luz reflejada siendo de la región objetivo de inspección para cada fuente de luz lineal oblicua, y capturar imágenes; y una unidad de detección que detecta un defecto de superficie lineal en la región objetivo de inspección usando imágenes capturadas por uno o más sensores lineales. Las proyecciones ortográficas de al menos dos haces de luz de iluminación oblicua fuera de los haces de luz de iluminación oblicua desde las dos o más fuentes de luz lineales oblicuas sobre una superficie del material de acero son ortogonales entre sí en la región objetivo de inspección.
MX2022008936A 2020-01-20 2021-01-14 Dispositivo de inspeccion de superficie, metodo de inspeccion de superficie, metodo de fabricacion de material de acero, metodo de gestion de calidad del material de acero, e instalacion de fabricacion para material de acero. MX2022008936A (es)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2020006687 2020-01-20
PCT/JP2021/001089 WO2021149588A1 (ja) 2020-01-20 2021-01-14 表面検査装置、表面検査方法、鋼材の製造方法、鋼材の品質管理方法、及び鋼材の製造設備

Publications (1)

Publication Number Publication Date
MX2022008936A true MX2022008936A (es) 2022-08-11

Family

ID=76992736

Family Applications (1)

Application Number Title Priority Date Filing Date
MX2022008936A MX2022008936A (es) 2020-01-20 2021-01-14 Dispositivo de inspeccion de superficie, metodo de inspeccion de superficie, metodo de fabricacion de material de acero, metodo de gestion de calidad del material de acero, e instalacion de fabricacion para material de acero.

Country Status (8)

Country Link
US (1) US20230055315A1 (es)
EP (1) EP4095518A4 (es)
JP (1) JP7173319B2 (es)
KR (1) KR20220123304A (es)
CN (1) CN114981645A (es)
MX (1) MX2022008936A (es)
TW (1) TWI786522B (es)
WO (1) WO2021149588A1 (es)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2024048292A (ja) * 2022-09-27 2024-04-08 Ｊｆｅスチール株式会社 表面欠陥検出方法及び表面欠陥検出装置
TWI843654B (zh) * 2023-09-19 2024-05-21 東和鋼鐵企業股份有限公司 型鋼端部變形檢測系統

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JPH0640076B2 (ja) * 1988-10-20 1994-05-25 三菱レイヨン株式会社 ライン状光源を用いた欠陥検査装置
JPH04294204A (ja) * 1991-03-25 1992-10-19 Hitachi Ltd 物体表面の欠陥抽出装置
JPH07104131A (ja) * 1993-10-01 1995-04-21 Mitsubishi Rayon Co Ltd 光ファイバライン状ライトガイド
CA2225518A1 (fr) * 1994-04-29 1997-01-03 Unimetal Societe Francaise Des Aciers Longs Procede et dispositif de detection de defauts debouchant a la surface d'un produit metallurgique
ATE197503T1 (de) * 1997-08-22 2000-11-11 Fraunhofer Ges Forschung Verfahren und vorrichtung zur automatischen prüfung bewegter oberflächen
JP2004233189A (ja) * 2003-01-30 2004-08-19 Fujitsu Ltd 照明装置及び検査装置
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ES2942266T3 (es) * 2013-12-27 2023-05-31 Jfe Steel Corp Método de detección de defectos de superficie y dispositivo de detección de defectos de superficie
JP6040930B2 (ja) 2013-12-27 2016-12-07 Ｊｆｅスチール株式会社 表面欠陥検出方法及び表面欠陥検出装置
JP2016171200A (ja) * 2015-03-12 2016-09-23 日東電工株式会社 配線回路基板の製造方法および検査方法
JP6394514B2 (ja) 2015-06-25 2018-09-26 Ｊｆｅスチール株式会社 表面欠陥検出方法、表面欠陥検出装置、及び鋼材の製造方法
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CN106767537B (zh) * 2017-03-20 2019-03-01 重庆市光学机械研究所 一种单目多维度轮廓扫描装置
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KR102112053B1 (ko) * 2018-08-01 2020-05-18 주식회사 뷰온 이미지 센서를 이용한 표면결함 검사장치 및 검사방법
JP7070537B2 (ja) * 2019-02-27 2022-05-18 Ｊｆｅスチール株式会社 表面検査装置及び表面検査方法

Also Published As

Publication number Publication date
JPWO2021149588A1 (es) 2021-07-29
CN114981645A (zh) 2022-08-30
WO2021149588A1 (ja) 2021-07-29
TWI786522B (zh) 2022-12-11
KR20220123304A (ko) 2022-09-06
US20230055315A1 (en) 2023-02-23
EP4095518A4 (en) 2023-02-08
EP4095518A1 (en) 2022-11-30
TW202129266A (zh) 2021-08-01
JP7173319B2 (ja) 2022-11-16

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