KR950025976A - 입력 회로 - Google Patents

입력 회로 Download PDF

Info

Publication number
KR950025976A
KR950025976A KR1019950002111A KR19950002111A KR950025976A KR 950025976 A KR950025976 A KR 950025976A KR 1019950002111 A KR1019950002111 A KR 1019950002111A KR 19950002111 A KR19950002111 A KR 19950002111A KR 950025976 A KR950025976 A KR 950025976A
Authority
KR
South Korea
Prior art keywords
source
mos transistor
gate
drain
input
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Ceased
Application number
KR1019950002111A
Other languages
English (en)
Korean (ko)
Inventor
마사노리 기누가사
히로시 시게하라
Original Assignee
사또 후미오
가부시끼가이샤 도시바
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 사또 후미오, 가부시끼가이샤 도시바 filed Critical 사또 후미오
Publication of KR950025976A publication Critical patent/KR950025976A/ko
Ceased legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03K—PULSE TECHNIQUE
    • H03K19/00—Logic circuits, i.e. having at least two inputs acting on one output; Inverting circuits
    • H03K19/0175—Coupling arrangements; Interface arrangements
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03K—PULSE TECHNIQUE
    • H03K19/00—Logic circuits, i.e. having at least two inputs acting on one output; Inverting circuits
    • H03K19/003—Modifications for increasing the reliability for protection
    • H03K19/00346—Modifications for eliminating interference or parasitic voltages or currents
    • H03K19/00361—Modifications for eliminating interference or parasitic voltages or currents in field effect transistor circuits
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03K—PULSE TECHNIQUE
    • H03K19/00—Logic circuits, i.e. having at least two inputs acting on one output; Inverting circuits
    • H03K19/003—Modifications for increasing the reliability for protection
    • H03K19/00369—Modifications for compensating variations of temperature, supply voltage or other physical parameters
    • H03K19/00384—Modifications for compensating variations of temperature, supply voltage or other physical parameters in field effect transistor circuits

Landscapes

  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Physics & Mathematics (AREA)
  • Computing Systems (AREA)
  • General Engineering & Computer Science (AREA)
  • Mathematical Physics (AREA)
  • Logic Circuits (AREA)
  • Electronic Switches (AREA)
KR1019950002111A 1994-02-08 1995-02-07 입력 회로 Ceased KR950025976A (ko)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP94-014257 1994-02-08
JP6014257A JPH07221628A (ja) 1994-02-08 1994-02-08 入力回路

Publications (1)

Publication Number Publication Date
KR950025976A true KR950025976A (ko) 1995-09-18

Family

ID=11856046

Family Applications (1)

Application Number Title Priority Date Filing Date
KR1019950002111A Ceased KR950025976A (ko) 1994-02-08 1995-02-07 입력 회로

Country Status (4)

Country Link
EP (1) EP0666649A3 (OSRAM)
JP (1) JPH07221628A (OSRAM)
KR (1) KR950025976A (OSRAM)
TW (1) TW260841B (OSRAM)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI325583B (en) 2006-02-17 2010-06-01 Pegarton Corportation Disk player having noise reduction functionality

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS62230220A (ja) * 1986-03-31 1987-10-08 Toshiba Corp 相補性絶縁ゲ−ト型論理回路
JPH03253114A (ja) * 1990-03-02 1991-11-12 Nec Corp 半導体装置
DE69327125T2 (de) * 1992-03-12 2000-04-20 Sharp K.K. Halbleiterspeicher

Also Published As

Publication number Publication date
JPH07221628A (ja) 1995-08-18
TW260841B (OSRAM) 1995-10-21
EP0666649A3 (en) 1996-01-31
EP0666649A2 (en) 1995-08-09

Similar Documents

Publication Publication Date Title
KR950007292A (ko) 저소비 전류로 동작하는 파워-온 신호 발생 회로
KR970071829A (ko) 반도체집적회로
KR970013707A (ko) 레벨 시프트 반도체 장치
KR900002328A (ko) 감지회로
KR940018864A (ko) 반도체 장치
KR970051145A (ko) 전위 발생회로
KR890013862A (ko) 전압레벨 변환회로
KR900002566A (ko) 버퍼회로
KR970008836A (ko) 고속에서 저전류 소모로 저진폭 입력 신호의 증폭이 가능한 입력 버퍼 회로를 포함하는 반도체 소자
KR900011152A (ko) 전원전압 강하검파 및 초기화회로 재설정 회로
KR910002127A (ko) 전원절환회로
KR940024629A (ko) 통신회로시스템
KR970078002A (ko) 전류 스파이크 억제 회로를 갖는 차분 신호 발생 회로
KR960012859A (ko) 푸시풀 브리지 증폭기를 포함하는 전압 신호 선로 구동기
KR960025713A (ko) 링 발진기
KR950026101A (ko) 링 발진 회로
KR950025976A (ko) 입력 회로
KR940004833A (ko) 씨엠오에스(cmos)회로의 래치업 저감출력 드라이버 및 래치업 저감방법
KR920022298A (ko) 레벨 변환 출력 회로
KR930011274A (ko) 입력회로
KR960019978A (ko) 펄스 발생기
KR910010860A (ko) 출력회로
KR950029773A (ko) 전압 레벨 검출 회로 및 반도체 기억 장치
KR970051095A (ko) 챠지펌프 회로
KR970024600A (ko) 레벨시프트회로

Legal Events

Date Code Title Description
A201 Request for examination
PA0109 Patent application

St.27 status event code: A-0-1-A10-A12-nap-PA0109

PA0201 Request for examination

St.27 status event code: A-1-2-D10-D11-exm-PA0201

R17-X000 Change to representative recorded

St.27 status event code: A-3-3-R10-R17-oth-X000

PG1501 Laying open of application

St.27 status event code: A-1-1-Q10-Q12-nap-PG1501

E902 Notification of reason for refusal
PE0902 Notice of grounds for rejection

St.27 status event code: A-1-2-D10-D21-exm-PE0902

T11-X000 Administrative time limit extension requested

St.27 status event code: U-3-3-T10-T11-oth-X000

T11-X000 Administrative time limit extension requested

St.27 status event code: U-3-3-T10-T11-oth-X000

T11-X000 Administrative time limit extension requested

St.27 status event code: U-3-3-T10-T11-oth-X000

E601 Decision to refuse application
PE0601 Decision on rejection of patent

St.27 status event code: N-2-6-B10-B15-exm-PE0601

R18-X000 Changes to party contact information recorded

St.27 status event code: A-3-3-R10-R18-oth-X000

PN2301 Change of applicant

St.27 status event code: A-3-3-R10-R13-asn-PN2301

St.27 status event code: A-3-3-R10-R11-asn-PN2301

R18-X000 Changes to party contact information recorded

St.27 status event code: A-3-3-R10-R18-oth-X000

R18-X000 Changes to party contact information recorded

St.27 status event code: A-3-3-R10-R18-oth-X000

R18-X000 Changes to party contact information recorded

St.27 status event code: A-3-3-R10-R18-oth-X000

P22-X000 Classification modified

St.27 status event code: A-2-2-P10-P22-nap-X000

R18-X000 Changes to party contact information recorded

St.27 status event code: A-3-3-R10-R18-oth-X000