KR940018947A - 웨이퍼 감지 및 클램핑 모니터 - Google Patents

웨이퍼 감지 및 클램핑 모니터 Download PDF

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Publication number
KR940018947A
KR940018947A KR1019940000410A KR19940000410A KR940018947A KR 940018947 A KR940018947 A KR 940018947A KR 1019940000410 A KR1019940000410 A KR 1019940000410A KR 19940000410 A KR19940000410 A KR 19940000410A KR 940018947 A KR940018947 A KR 940018947A
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South Korea
Prior art keywords
wafer
capacitance
support
electrodes
sensing
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KR1019940000410A
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KR100284663B1 (ko
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가스킬 블레이크 쥴리안
투 웨일린
케이트 스톤 데일
칼레톤 홀덴 스콧트
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프랑크 엠 사죠백
이턴 코오포레이숀
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    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/68—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for positioning, orientation or alignment
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/67005—Apparatus not specifically provided for elsewhere
    • H01L21/67242—Apparatus for monitoring, sorting or marking
    • H01L21/67259—Position monitoring, e.g. misposition detection or presence detection
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/683—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping
    • H01L21/6831—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using electrostatic chucks

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  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Manufacturing & Machinery (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
  • Measurement Of Resistance Or Impedance (AREA)
  • Jigs For Machine Tools (AREA)
  • Machine Tool Sensing Apparatuses (AREA)

Abstract

본 발명은 웨이퍼 위치 및 클램프 센서에 관한 것이다. 회로(114)는 웨이퍼 지지대(14),(16),(18),(20)안의 두개의 전극(22),(24)사이의 정전용량을 감지한다. 웨이퍼 (12)가 지지대에 없으면, 정전용량이 제1범위에 있게 되고, 웨이퍼가 지지대에 위치하지만 클램프가 되지 않은 경우 정전용량이 제2범위에 위치하며, 웨이퍼가 정전 흡입력에 의해 위치할때, 정전용량이 제3범위에 있게 된다. 감지된 정전용량은 주파수 다음 DC 전압레벨(164)로 변환하며, 이 DC 전압레벨은 웨이퍼 위치를 확인한 다음 웨이퍼 클램핑을 확인하기 위해 쉽게 감지되고 이용된다.

Description

웨이퍼 감지 및 클램핑 모니터
본 내용은 요부공개 건이므로 전문내용을 수록하지 않았음
제1도는 전원, 정전 클램프 장치 및 정전용량 측정회로를 도시한 개략도, 제2도는 이온주입기에 이용된 웨이퍼 지지대의 평면도.

Claims (9)

  1. (가) 지지대에 부착된 두 전극(22),(24)사이의 정전용량을 측정하므로서 웨이퍼 지지대(14),(16),(18),(20) 위에 반도체 웨이퍼 (12)의 존재를 감지하는 단계와, (나) 두 전극 (22),(24)사이의 측정된 정전용량이 지지대(14),(16),(18),(20)에 위치하였던 웨이퍼(12)를 나타내는 값에 도달할때, 웨이퍼와 지지대 사이에 정전 흡입력을 발생시켜 웨이퍼를 지지대에 고정시키는 단계와; (다) 정전 흡입력이 정전 흡입력에 의해 지지대에 고정되었던 웨이퍼(12)를 지지하기 위해 발생할때, 두 전극(22),(24)사이의 정전용량 변화를 감지하는 단계를 특징으로 하는 반도체 웨이퍼(12)를 웨이퍼 지지대(14),(16),(18),(20)에 고정시키는 방법.
  2. 제1항에 있어서, 웨이퍼를 고정시키는 단계는 직류전류전압(44)를 두 전극(22),(24)사이에 인가하는 것을 특징으로 하는 반도체 웨이퍼를 웨이퍼 지지대에 고정시키는 방법.
  3. 제1항에 있어서, 감지단계는 웨이퍼의 적당한 클램핑이 감지되지 않으면, 웨이퍼 지지대의 경고 메세지와 정지운동을 주입위치에 발생시키는 부속단계를 특징으로 하는 반도체 웨이퍼를 웨이퍼 지지대에 고정시키는 방법.
  4. 정전 흡입력에 의해 웨이퍼를 웨이퍼 지지대에 흡입하는 두개의 전극을 포함하는 반도체 웨이퍼(12)를 웨이퍼 지지대(14),(16),(18),(20)에 고정시키는 장치는 (가) 전극(22),(24)에 연결되고, 두 전극 사이의 정전용량을 감지하는 정전용량 감지회로(114)와;(나) 두 전극(22),(24)을 통전시키는 동력원(250)과; (다) 동력원으로 부터의 통전신호를 두 전극에 가하므로서, 웨이퍼가 웨이퍼 지지대에 위치할때, 웨이퍼를 웨이퍼 지지대에 흡입하는 제어기(250)와; (라) 웨이퍼 지지대 위에 웨이퍼가 있다는 것을 나타내는 감지된 정전용량에 해당하는 정전 용량 감지회로로 부터의 출력에 연결된 입력을 포함하는 상기 제어기를 특징으로 하는 반도체 웨이퍼를 웨이퍼 지지대에 고정하는 장치.
  5. 제4항에 있어서, 전원전압이 전극에 인가될때, 전극 사이의 감지된 정전 용량에 따라 전원이 만든 흡입력을 감지하는 수단을 특징으로 하는 반도체 웨이퍼를 웨이퍼 지지대에 고정시키는 장치.
  6. 제5항에 있어서, 제어기(250)에 연결된 로버트수단(254)은 웨이퍼 지지대를 회전시키고, 상기 웨이퍼를 이온 주입 방위에 이동시키며, 만일 제어기가 감지된 정전용량에 따라, 웨이퍼와 웨이퍼 지지대 사이에서 부적당한 정전용량을 감지하면, 상기 제어기는 이 로버트 수단을 작동시키지 않는 수단을 포함하는 것을 특징으로 하는 반도체 웨이퍼를 웨이퍼 지지대에 고정시키는 장치.
  7. 제4항에 있어서, 웨이퍼가 제1유전체층과 접촉함에 따라 상기 정전용량의 변화를 감지하고, 웨이퍼가 정전 흡입력에 의해 제1유전층에 의해 유지될때, 상기 정전용량의 변화를 더 감지하는 수단을 특징으로 하는 반도체 웨이퍼를 웨이퍼 지지대에 고정시키는 장치.
  8. 제7항에 있어서, 정전용량 감지회로(114)는 상기 제1전극과 제2전극 사이의 정전용량이 변함에 따라 변하는 주파수를 지닌 오실레이터 회로(120)를 특징으로 하는 반도체 웨이퍼를 웨이퍼 지지대에 고정하는 장치.
  9. 제8항에 있어서, 감지수단은 주파수 신호를 전압레벨로 전환하는 오실레이터 회로에 연결된 집적회로(154)를 특징으로 하는 반도체 웨이퍼를 웨이퍼 지지대에 고정시키는 장치.
    ※ 참고사항 : 최초출원 내용에 의하여 공개하는 것임.
KR1019940000410A 1993-01-15 1994-01-12 웨이퍼 감지 및 클램핑 모니터 KR100284663B1 (ko)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US005,030 1993-01-15
US08/005,030 US5436790A (en) 1993-01-15 1993-01-15 Wafer sensing and clamping monitor

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KR940018947A true KR940018947A (ko) 1994-08-19
KR100284663B1 KR100284663B1 (ko) 2001-04-02

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US (1) US5436790A (ko)
EP (1) EP0607043B1 (ko)
JP (1) JP3341221B2 (ko)
KR (1) KR100284663B1 (ko)
CA (1) CA2113290C (ko)
DE (1) DE69400113T2 (ko)
TW (1) TW231366B (ko)

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CA2113290C (en) 1999-11-30
JP3341221B2 (ja) 2002-11-05
EP0607043A1 (en) 1994-07-20
JPH077073A (ja) 1995-01-10
DE69400113T2 (de) 1996-10-24
CA2113290A1 (en) 1994-07-16
US5436790A (en) 1995-07-25
TW231366B (ko) 1994-10-01
DE69400113D1 (de) 1996-05-02
EP0607043B1 (en) 1996-03-27
KR100284663B1 (ko) 2001-04-02

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