KR930009375A - 고체촬상장치 및 그 제조방법 - Google Patents
고체촬상장치 및 그 제조방법 Download PDFInfo
- Publication number
- KR930009375A KR930009375A KR1019920020012A KR920020012A KR930009375A KR 930009375 A KR930009375 A KR 930009375A KR 1019920020012 A KR1019920020012 A KR 1019920020012A KR 920020012 A KR920020012 A KR 920020012A KR 930009375 A KR930009375 A KR 930009375A
- Authority
- KR
- South Korea
- Prior art keywords
- color filter
- layer
- material layer
- imaging device
- forming
- Prior art date
Links
- 238000003384 imaging method Methods 0.000 title claims abstract description 10
- 238000004519 manufacturing process Methods 0.000 title claims abstract description 8
- 239000007787 solid Substances 0.000 title claims abstract description 7
- 239000012780 transparent material Substances 0.000 claims abstract 10
- 230000003595 spectral effect Effects 0.000 claims abstract 5
- 238000002834 transmittance Methods 0.000 claims abstract 5
- 238000000034 method Methods 0.000 claims abstract 3
- 239000010410 layer Substances 0.000 claims 18
- 239000000463 material Substances 0.000 claims 9
- 238000005530 etching Methods 0.000 claims 4
- 229920000620 organic polymer Polymers 0.000 claims 2
- 239000002356 single layer Substances 0.000 claims 2
- 239000000758 substrate Substances 0.000 claims 2
- 230000000873 masking effect Effects 0.000 claims 1
- 238000004040 coloring Methods 0.000 abstract 1
- 230000007547 defect Effects 0.000 abstract 1
- 230000018109 developmental process Effects 0.000 abstract 1
- 238000004043 dyeing Methods 0.000 abstract 1
- 230000007261 regionalization Effects 0.000 abstract 1
- 230000035939 shock Effects 0.000 abstract 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
- H01L27/14—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation
- H01L27/144—Devices controlled by radiation
- H01L27/146—Imager structures
- H01L27/14601—Structural or functional details thereof
- H01L27/1462—Coatings
- H01L27/14621—Colour filter arrangements
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
- H01L27/14—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
- H01L27/14—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation
- H01L27/144—Devices controlled by radiation
- H01L27/146—Imager structures
- H01L27/14683—Processes or apparatus peculiar to the manufacture or treatment of these devices or parts thereof
- H01L27/14685—Process for coatings or optical elements
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
- H01L27/14—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation
- H01L27/144—Devices controlled by radiation
- H01L27/146—Imager structures
- H01L27/14601—Structural or functional details thereof
- H01L27/14625—Optical elements or arrangements associated with the device
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
- H01L27/14—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation
- H01L27/144—Devices controlled by radiation
- H01L27/146—Imager structures
- H01L27/14601—Structural or functional details thereof
- H01L27/14625—Optical elements or arrangements associated with the device
- H01L27/14627—Microlenses
Landscapes
- Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Power Engineering (AREA)
- Electromagnetism (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Solid State Image Pick-Up Elements (AREA)
Abstract
본 발명에 관한 고체촬상장치는, 목적으로 하는 분광투과율 특성을 가진 착색투명재료에 의해 형성한 컬러필터를 구비하는 것이다. 그 컬러필터는 동일층 내에서 복수의 분광투과율 특성을 가지고 있다. 이 구조에 의해서, 컬러필터로부터 수광부까지의 거리가 크게 되지 않고, 플리커 등의 화상특성불량은 해소된다. 또 적층구조는 아니기 때문에, 열적충격에 의한 컬러필터에의 균열의 발생도 없어지고, 신뢰성이 향상한다.
또 제조방법에 있어서는, 착색투명재료에 대해서 드라이에 칭하므로서, 컬러필터를 구비한 고체촬상장치를 실현하고 있다. 이에 의해서 패턴형성에 수반하는 노광이나 현상 그리고 염색공정 없이 컬러필터의 형성이 가능하며, 효율이 좋은 제조방법을 실현하는 것을 특징으로 한다.
Description
본 내용은 요부공개 건이므로 전문내용을 수록하지 않았음
제1도는 본 발명의 제 1의 실시예에 있어서의 고체촬상장치의 구조를 표시한 부분확대 단면도,
제2도는 본 발명의 제 2의 실시예에 있어서의 고체촬상장치의 제조방법의 제1 공정을 표시한 부분확대 단면도,
제3도는 본 발명의 제 2의 실시예에 있어서의 고체촬상장치의 제조방법의 제2 공정을 표시한 부분확대 단면도.
Claims (5)
- 고체촬상장치기판 위에, 부분적으로 상위한 분광투과율 특성을 가진 단층의 컬러필터층과, 상기 단층의 컬러필터층 위에 형성된 표면이 평탄한 내에칭성재료층과, 상기 내에칭성재료층 위에 형성된 마이크로렌즈를 가진 것을 특징으로 하는 고체촬상장치.
- 제1항에 있어서, 단층의 컬러필터층이 유기계고분자착색투명재료로 이루어진 것을 특징으로 하는 고체촬상장치.
- 고체촬상장치기판 위에 착색투명재료층을 형성하는 공정과, 상기 착색투명재료층 위에 내에칭성재료층을 선택적으로 형성하는 공정과, 상기 내에칭성재료층을 마스크로 해서 상기 착색재료층을 에칭해서 컬러필터를 형성하는 공정과, 상기 내에칭성재료층 위에 마이크로렌즈를 형성하는 공정을 가진 것을 특징으로 하는 고체촬상장치의 제조방법.
- 제3항에 있어서, 컬러필터를 형성하는 공정이 착색투명재료층을 형성하는 공정과, 상기 착색투명재료층 위에 내에칭성재료층을 선택적으로 형성하는 공정과, 상기 내에칭성재료층을 마스크로 해서 상기 착색재료층을 에칭하는 공정을, 상기 착색투명재료의 분광투과율 특성을 바꾸어서 복수회 반복하여, 부분적으로 상위한 분광투과율 특성을 가진 단층의 컬러필터를 형성하는 공정인 것을 특징으로 하는 고체촬상장치의 제조방법.
- 제3항 또는 제 4항에 있어서, 착색투명재료층을 형성하는 공정이 유기계고분자착색투명재료층을 형성하는 공정인 것을 특징으로 하는 고체촬상장치의 제조방법.※ 참고사항 : 최초출원 내용에 의하여 공개하는 것임.
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP28591291 | 1991-10-31 | ||
JP91-285912 | 1991-10-31 |
Publications (2)
Publication Number | Publication Date |
---|---|
KR930009375A true KR930009375A (ko) | 1993-05-22 |
KR960016178B1 KR960016178B1 (ko) | 1996-12-04 |
Family
ID=17697630
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
KR1019920020012A KR960016178B1 (ko) | 1991-10-31 | 1992-10-29 | 고체촬상장치 및 그 제조방법 |
Country Status (4)
Country | Link |
---|---|
US (2) | US5321249A (ko) |
EP (1) | EP0539658B1 (ko) |
KR (1) | KR960016178B1 (ko) |
DE (1) | DE69224788T2 (ko) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR100934513B1 (ko) * | 2005-02-10 | 2009-12-29 | 도판 인사츠 가부시키가이샤 | 고체 촬상 소자 및 그 제조 방법 |
Families Citing this family (25)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP3067435B2 (ja) * | 1992-12-24 | 2000-07-17 | キヤノン株式会社 | 画像読取用光電変換装置及び該装置を有する画像処理装置 |
JPH09502836A (ja) * | 1993-09-17 | 1997-03-18 | ポラロイド コーポレイション | 固体イメージセンサー上のマイクロレンズの形成方法 |
US5708264A (en) | 1995-11-07 | 1998-01-13 | Eastman Kodak Company | Planar color filter array for CCDs from dyed and mordant layers |
US5677202A (en) * | 1995-11-20 | 1997-10-14 | Eastman Kodak Company | Method for making planar color filter array for image sensors with embedded color filter arrays |
US5734190A (en) * | 1996-03-11 | 1998-03-31 | Eastman Kodak Company | Imager having a plurality of cylindrical lenses |
US5824236A (en) * | 1996-03-11 | 1998-10-20 | Eastman Kodak Company | Method for forming inorganic lens array for solid state imager |
US6211916B1 (en) * | 1996-03-11 | 2001-04-03 | Eastman Kodak Company | Solid state imager with inorganic lens array |
US5711890A (en) * | 1996-03-11 | 1998-01-27 | Eastman Kodak Company | Method for forming cylindrical lens arrays for solid state imager |
US5756239A (en) * | 1996-12-12 | 1998-05-26 | Eastman Kodak Company | Method of forming a color filter array with improved resolution |
TW370727B (en) * | 1998-06-04 | 1999-09-21 | United Microelectronics Corp | Method for removing color filter films of CMOS sensor |
TW400657B (en) * | 1998-06-09 | 2000-08-01 | United Microelectronics Corp | The manufacture method of CMOS sensor device |
US6297071B1 (en) | 1998-07-22 | 2001-10-02 | Eastman Kodak Company | Method of making planar image sensor color filter arrays |
US6495813B1 (en) | 1999-10-12 | 2002-12-17 | Taiwan Semiconductor Manufacturing Company | Multi-microlens design for semiconductor imaging devices to increase light collection efficiency in the color filter process |
KR100382723B1 (ko) * | 2000-11-13 | 2003-05-09 | 삼성전자주식회사 | 고체촬상소자 및 그 제조방법 |
US20020084407A1 (en) * | 2000-12-28 | 2002-07-04 | Xerox Corporation | Systems and methods for fabricating an electro-optical device used for image sensing |
TW540157B (en) * | 2001-05-31 | 2003-07-01 | Konishiroku Photo Ind | CMOS image sensor |
FR2829876B1 (fr) * | 2001-09-18 | 2004-07-02 | St Microelectronics Sa | Cellule photosensible incorporant un guide de lumiere et matrice composee de telles cellules |
US6861280B2 (en) * | 2002-10-25 | 2005-03-01 | Omnivision International Holding Ltd | Image sensor having micro-lenses with integrated color filter and method of making |
KR100560309B1 (ko) * | 2003-12-31 | 2006-03-14 | 동부아남반도체 주식회사 | 씨모스 이미지 센서 및 그 광 칼라 감도 감지 방법 |
JP4882224B2 (ja) * | 2004-11-26 | 2012-02-22 | ソニー株式会社 | 固体撮像装置の製造方法 |
KR101304263B1 (ko) * | 2005-06-03 | 2013-09-05 | 후지필름 가부시키가이샤 | 안료함유 열경화성 조성물, 및, 컬러필터, 화상기록재료,및, 컬러필터의 제조방법 |
US7799491B2 (en) * | 2006-04-07 | 2010-09-21 | Aptina Imaging Corp. | Color filter array and imaging device containing such color filter array and method of fabrication |
KR100823031B1 (ko) * | 2006-12-21 | 2008-04-17 | 동부일렉트로닉스 주식회사 | 이미지 센서 제조방법 |
JP2008241744A (ja) * | 2007-03-23 | 2008-10-09 | Fujifilm Corp | カラーフィルタの製造方法 |
US9570491B2 (en) | 2014-10-08 | 2017-02-14 | Omnivision Technologies, Inc. | Dual-mode image sensor with a signal-separating color filter array, and method for same |
Family Cites Families (14)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4236098A (en) * | 1979-08-20 | 1980-11-25 | Eastman Kodak Company | Solid-state color imaging devices |
US4357415A (en) * | 1980-03-06 | 1982-11-02 | Eastman Kodak Company | Method of making a solid-state color imaging device having a color filter array using a photocrosslinkable barrier |
US4416961A (en) * | 1980-09-11 | 1983-11-22 | Eastman Kodak Company | Color imaging devices and color filter arrays using photo-bleachable dyes |
JPS58219748A (ja) * | 1982-06-15 | 1983-12-21 | Toshiba Corp | 半導体装置 |
US4827118A (en) * | 1986-07-10 | 1989-05-02 | Minolta Camera Kabushiki Kaisha | Light-sensitive device having color filter and manufacturing method thereof |
JPS63204486A (ja) * | 1987-02-20 | 1988-08-24 | Mitsubishi Electric Corp | 文字入力装置 |
JPS63250316A (ja) * | 1987-04-07 | 1988-10-18 | Nitto Koryo Kk | 浴用剤 |
JPS63290802A (ja) * | 1987-05-25 | 1988-11-28 | Dai Ichi Kogyo Seiyaku Co Ltd | 水系水中防汚剤 |
JPS63304675A (ja) * | 1987-06-04 | 1988-12-12 | Mitsubishi Electric Corp | 半導体素子装置 |
JPH0296372A (ja) * | 1988-09-30 | 1990-04-09 | Fujitsu Ltd | カラー固体撮像素子の製造方法 |
US5124543A (en) * | 1989-08-09 | 1992-06-23 | Ricoh Company, Ltd. | Light emitting element, image sensor and light receiving element with linearly varying waveguide index |
US5239412A (en) * | 1990-02-05 | 1993-08-24 | Sharp Kabushiki Kaisha | Solid image pickup device having microlenses |
JPH0485960A (ja) * | 1990-07-30 | 1992-03-18 | Toshiba Corp | 固体撮像装置及びその製造方法 |
JPH05167054A (ja) * | 1991-12-19 | 1993-07-02 | Toshiba Corp | 固体撮像装置の製造方法 |
-
1992
- 1992-06-01 US US07/891,827 patent/US5321249A/en not_active Expired - Fee Related
- 1992-06-30 DE DE69224788T patent/DE69224788T2/de not_active Expired - Fee Related
- 1992-06-30 EP EP92111031A patent/EP0539658B1/en not_active Expired - Lifetime
- 1992-10-29 KR KR1019920020012A patent/KR960016178B1/ko not_active IP Right Cessation
-
1993
- 1993-05-24 US US08/065,770 patent/US5336367A/en not_active Expired - Lifetime
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR100934513B1 (ko) * | 2005-02-10 | 2009-12-29 | 도판 인사츠 가부시키가이샤 | 고체 촬상 소자 및 그 제조 방법 |
Also Published As
Publication number | Publication date |
---|---|
EP0539658A1 (en) | 1993-05-05 |
DE69224788T2 (de) | 1998-07-09 |
US5336367A (en) | 1994-08-09 |
US5321249A (en) | 1994-06-14 |
DE69224788D1 (de) | 1998-04-23 |
EP0539658B1 (en) | 1998-03-18 |
KR960016178B1 (ko) | 1996-12-04 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
KR930009375A (ko) | 고체촬상장치 및 그 제조방법 | |
KR920013734A (ko) | 칼라필터의 제조방법 | |
KR880014410A (ko) | 컬러필터 및 그 제조방법 | |
KR970048643A (ko) | 엘시디(lcd)용 칼라필터 및 그의 제조방법 | |
KR910012757A (ko) | 칼라필터 및 그 제조방법 | |
KR830006826A (ko) | 컬러고체촬상소자(固體撮像素子)의 제조방법 | |
KR960019443A (ko) | 고체촬상장치 및 그 제조방법 | |
KR930004776A (ko) | 컬러필터상의 마이크로 렌즈 제조방법 | |
JPS6214103A (ja) | カラ−フイルタの製造方法 | |
KR920013785A (ko) | 칼라필터 및 그 제조방법 | |
JPS5691203A (en) | Production of color filter | |
KR960012541A (ko) | 이미지 센서 및 그 제조방법 | |
KR920013002A (ko) | 칼라필터의 제조방법 | |
KR930023741A (ko) | 칼라필터 및 그 제조방법 | |
KR930013793A (ko) | 칼라필터 제조방법 | |
JPH10144895A (ja) | 固体撮像素子 | |
KR920018842A (ko) | 칼라필터의 제조방법 | |
KR920013001A (ko) | 칼라필터의 제조방법 | |
KR970016794A (ko) | 하프톤 위상 반전 마스크의 제조 방법 | |
JPS60114807A (ja) | 微細色フイルタ−作製法 | |
KR970016789A (ko) | 위상반전 마스크 및 그 제조방법 | |
JPH02244101A (ja) | カラー固体撮像装置の製造方法 | |
KR930004795A (ko) | 컬러 필터층 형성방법 | |
JPS62257104A (ja) | カラ−フイルタ | |
JPS57172304A (en) | Manufacture of colored filter |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
A201 | Request for examination | ||
E902 | Notification of reason for refusal | ||
G160 | Decision to publish patent application | ||
E701 | Decision to grant or registration of patent right | ||
GRNT | Written decision to grant | ||
FPAY | Annual fee payment |
Payment date: 20011128 Year of fee payment: 6 |
|
LAPS | Lapse due to unpaid annual fee |