KR900019221A - 온도검출수단을 갖는 반도체 집적회로 장치 - Google Patents
온도검출수단을 갖는 반도체 집적회로 장치 Download PDFInfo
- Publication number
- KR900019221A KR900019221A KR1019890007198A KR890007198A KR900019221A KR 900019221 A KR900019221 A KR 900019221A KR 1019890007198 A KR1019890007198 A KR 1019890007198A KR 890007198 A KR890007198 A KR 890007198A KR 900019221 A KR900019221 A KR 900019221A
- Authority
- KR
- South Korea
- Prior art keywords
- circuit
- voltage
- transistor
- temperature
- bias
- Prior art date
Links
- 239000004065 semiconductor Substances 0.000 title claims description 7
- 238000001514 detection method Methods 0.000 title claims 5
- 230000002159 abnormal effect Effects 0.000 claims 10
- 238000000034 method Methods 0.000 claims 3
- 230000008878 coupling Effects 0.000 claims 2
- 238000010168 coupling process Methods 0.000 claims 2
- 238000005859 coupling reaction Methods 0.000 claims 2
- 241000700605 Viruses Species 0.000 claims 1
- 239000013078 crystal Substances 0.000 claims 1
- 239000000758 substrate Substances 0.000 claims 1
- 238000010586 diagram Methods 0.000 description 3
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
- H01L27/02—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers
-
- H—ELECTRICITY
- H02—GENERATION; CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
- H02H—EMERGENCY PROTECTIVE CIRCUIT ARRANGEMENTS
- H02H7/00—Emergency protective circuit arrangements specially adapted for specific types of electric machines or apparatus or for sectionalised protection of cable or line systems, and effecting automatic switching in the event of an undesired change from normal working conditions
- H02H7/20—Emergency protective circuit arrangements specially adapted for specific types of electric machines or apparatus or for sectionalised protection of cable or line systems, and effecting automatic switching in the event of an undesired change from normal working conditions for electronic equipment
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
- H01L27/02—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers
- H01L27/04—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being a semiconductor body
-
- H—ELECTRICITY
- H02—GENERATION; CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
- H02H—EMERGENCY PROTECTIVE CIRCUIT ARRANGEMENTS
- H02H5/00—Emergency protective circuit arrangements for automatic disconnection directly responsive to an undesired change from normal non-electric working conditions with or without subsequent reconnection
- H02H5/04—Emergency protective circuit arrangements for automatic disconnection directly responsive to an undesired change from normal non-electric working conditions with or without subsequent reconnection responsive to abnormal temperature
- H02H5/044—Emergency protective circuit arrangements for automatic disconnection directly responsive to an undesired change from normal non-electric working conditions with or without subsequent reconnection responsive to abnormal temperature using a semiconductor device to sense the temperature
Landscapes
- Engineering & Computer Science (AREA)
- Power Engineering (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Semiconductor Integrated Circuits (AREA)
- Measuring Temperature Or Quantity Of Heat (AREA)
- Bipolar Integrated Circuits (AREA)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP63-133659 | 1988-05-31 | ||
JP63133659A JPH01302849A (ja) | 1988-05-31 | 1988-05-31 | 半導体集積回路装置 |
Publications (2)
Publication Number | Publication Date |
---|---|
KR900019221A true KR900019221A (ko) | 1990-12-24 |
KR920008421B1 KR920008421B1 (US07217764-20070515-C00002.png) | 1992-09-28 |
Family
ID=15109938
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
KR1019890007198A KR900019221A (ko) | 1988-05-31 | 1989-05-30 | 온도검출수단을 갖는 반도체 집적회로 장치 |
Country Status (3)
Country | Link |
---|---|
EP (1) | EP0344715A3 (US07217764-20070515-C00002.png) |
JP (1) | JPH01302849A (US07217764-20070515-C00002.png) |
KR (1) | KR900019221A (US07217764-20070515-C00002.png) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR100736403B1 (ko) * | 2005-08-19 | 2007-07-09 | 삼성전자주식회사 | 온도 검출기, 온도 검출방법, 및 상기 온도 검출기를구비하는 반도체 장치 |
Families Citing this family (10)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5461252A (en) * | 1992-10-06 | 1995-10-24 | Matsushita Electric Industrial Co., Ltd. | Semiconductor device comprising an over-temperature detection element for detecting excessive temperature of amplifiers |
JP3869815B2 (ja) | 2003-03-31 | 2007-01-17 | Necエレクトロニクス株式会社 | 半導体集積回路装置 |
JP3810411B2 (ja) | 2004-01-23 | 2006-08-16 | Necエレクトロニクス株式会社 | 集積回路装置 |
JP4541717B2 (ja) | 2004-02-09 | 2010-09-08 | ルネサスエレクトロニクス株式会社 | 集積回路装置及びその製造方法 |
JP4620962B2 (ja) | 2004-03-30 | 2011-01-26 | ルネサスエレクトロニクス株式会社 | 集積回路装置の製造方法及び酸化バナジウム膜の形成方法 |
JP4541742B2 (ja) | 2004-03-30 | 2010-09-08 | ルネサスエレクトロニクス株式会社 | 集積回路装置 |
JP4536408B2 (ja) | 2004-03-30 | 2010-09-01 | ルネサスエレクトロニクス株式会社 | 集積回路装置 |
JP4535367B2 (ja) | 2004-05-24 | 2010-09-01 | ルネサスエレクトロニクス株式会社 | 集積回路装置 |
CN100389308C (zh) * | 2004-05-26 | 2008-05-21 | 鸿富锦精密工业(深圳)有限公司 | 芯片温测装置及其温测方法 |
JP4524688B2 (ja) * | 2007-01-23 | 2010-08-18 | エルピーダメモリ株式会社 | 基準電圧発生回路及び半導体集積回路装置 |
Family Cites Families (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3916263A (en) * | 1971-12-13 | 1975-10-28 | Honeywell Inf Systems | Memory driver circuit with thermal protection |
DE3415764A1 (de) * | 1984-04-27 | 1985-10-31 | Siemens AG, 1000 Berlin und 8000 München | Schaltungsanordnung zur temperaturueberwachung integrierter schaltungen |
US4667265A (en) * | 1985-12-20 | 1987-05-19 | National Semiconductor Corporation | Adaptive thermal shutdown circuit |
JPS6315528A (ja) * | 1986-07-08 | 1988-01-22 | Nec Corp | 半導体装置 |
JPS63124618A (ja) * | 1986-11-14 | 1988-05-28 | Nec Corp | 論理ゲ−ト駆動制御回路 |
-
1988
- 1988-05-31 JP JP63133659A patent/JPH01302849A/ja active Pending
-
1989
- 1989-05-30 EP EP19890109740 patent/EP0344715A3/en not_active Withdrawn
- 1989-05-30 KR KR1019890007198A patent/KR900019221A/ko not_active IP Right Cessation
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR100736403B1 (ko) * | 2005-08-19 | 2007-07-09 | 삼성전자주식회사 | 온도 검출기, 온도 검출방법, 및 상기 온도 검출기를구비하는 반도체 장치 |
Also Published As
Publication number | Publication date |
---|---|
KR920008421B1 (US07217764-20070515-C00002.png) | 1992-09-28 |
EP0344715A3 (en) | 1991-03-27 |
JPH01302849A (ja) | 1989-12-06 |
EP0344715A2 (en) | 1989-12-06 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
A201 | Request for examination | ||
SUBM | Submission of document of abandonment before or after decision of registration |