KR870002646A - 에폭시 수지 조성물 및 그것을 이용한 수지 밀봉형 반도체 장치 - Google Patents
에폭시 수지 조성물 및 그것을 이용한 수지 밀봉형 반도체 장치 Download PDFInfo
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- KR870002646A KR870002646A KR1019860002934A KR860002934A KR870002646A KR 870002646 A KR870002646 A KR 870002646A KR 1019860002934 A KR1019860002934 A KR 1019860002934A KR 860002934 A KR860002934 A KR 860002934A KR 870002646 A KR870002646 A KR 870002646A
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- epoxy resin
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/544—Marks applied to semiconductor devices or parts, e.g. registration marks, alignment structures, wafer maps
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/02—Containers; Seals
-
- C—CHEMISTRY; METALLURGY
- C08—ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
- C08G—MACROMOLECULAR COMPOUNDS OBTAINED OTHERWISE THAN BY REACTIONS ONLY INVOLVING UNSATURATED CARBON-TO-CARBON BONDS
- C08G59/00—Polycondensates containing more than one epoxy group per molecule; Macromolecules obtained by polymerising compounds containing more than one epoxy group per molecule using curing agents or catalysts which react with the epoxy groups
- C08G59/18—Macromolecules obtained by polymerising compounds containing more than one epoxy group per molecule using curing agents or catalysts which react with the epoxy groups ; e.g. general methods of curing
- C08G59/40—Macromolecules obtained by polymerising compounds containing more than one epoxy group per molecule using curing agents or catalysts which react with the epoxy groups ; e.g. general methods of curing characterised by the curing agents used
- C08G59/62—Alcohols or phenols
- C08G59/621—Phenols
-
- C—CHEMISTRY; METALLURGY
- C08—ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
- C08G—MACROMOLECULAR COMPOUNDS OBTAINED OTHERWISE THAN BY REACTIONS ONLY INVOLVING UNSATURATED CARBON-TO-CARBON BONDS
- C08G59/00—Polycondensates containing more than one epoxy group per molecule; Macromolecules obtained by polymerising compounds containing more than one epoxy group per molecule using curing agents or catalysts which react with the epoxy groups
- C08G59/18—Macromolecules obtained by polymerising compounds containing more than one epoxy group per molecule using curing agents or catalysts which react with the epoxy groups ; e.g. general methods of curing
- C08G59/68—Macromolecules obtained by polymerising compounds containing more than one epoxy group per molecule using curing agents or catalysts which react with the epoxy groups ; e.g. general methods of curing characterised by the catalysts used
- C08G59/688—Macromolecules obtained by polymerising compounds containing more than one epoxy group per molecule using curing agents or catalysts which react with the epoxy groups ; e.g. general methods of curing characterised by the catalysts used containing phosphorus
-
- C—CHEMISTRY; METALLURGY
- C08—ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
- C08K—Use of inorganic or non-macromolecular organic substances as compounding ingredients
- C08K5/00—Use of organic ingredients
- C08K5/0008—Organic ingredients according to more than one of the "one dot" groups of C08K5/01 - C08K5/59
- C08K5/0041—Optical brightening agents, organic pigments
-
- C—CHEMISTRY; METALLURGY
- C08—ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
- C08K—Use of inorganic or non-macromolecular organic substances as compounding ingredients
- C08K5/00—Use of organic ingredients
- C08K5/49—Phosphorus-containing compounds
- C08K5/50—Phosphorus bound to carbon only
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/28—Encapsulations, e.g. encapsulating layers, coatings, e.g. for protection
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/28—Encapsulations, e.g. encapsulating layers, coatings, e.g. for protection
- H01L23/29—Encapsulations, e.g. encapsulating layers, coatings, e.g. for protection characterised by the material, e.g. carbon
- H01L23/293—Organic, e.g. plastic
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/28—Encapsulations, e.g. encapsulating layers, coatings, e.g. for protection
- H01L23/29—Encapsulations, e.g. encapsulating layers, coatings, e.g. for protection characterised by the material, e.g. carbon
- H01L23/293—Organic, e.g. plastic
- H01L23/295—Organic, e.g. plastic containing a filler
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2223/00—Details relating to semiconductor or other solid state devices covered by the group H01L23/00
- H01L2223/544—Marks applied to semiconductor devices or parts
- H01L2223/54406—Marks applied to semiconductor devices or parts comprising alphanumeric information
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2223/00—Details relating to semiconductor or other solid state devices covered by the group H01L23/00
- H01L2223/544—Marks applied to semiconductor devices or parts
- H01L2223/54473—Marks applied to semiconductor devices or parts for use after dicing
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2223/00—Details relating to semiconductor or other solid state devices covered by the group H01L23/00
- H01L2223/544—Marks applied to semiconductor devices or parts
- H01L2223/54473—Marks applied to semiconductor devices or parts for use after dicing
- H01L2223/54486—Located on package parts, e.g. encapsulation, leads, package substrate
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/42—Wire connectors; Manufacturing methods related thereto
- H01L2224/47—Structure, shape, material or disposition of the wire connectors after the connecting process
- H01L2224/48—Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
- H01L2224/4805—Shape
- H01L2224/4809—Loop shape
- H01L2224/48091—Arched
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T428/00—Stock material or miscellaneous articles
- Y10T428/23—Sheet including cover or casing
- Y10T428/239—Complete cover or casing
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- Chemical & Material Sciences (AREA)
- Computer Hardware Design (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- General Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- Health & Medical Sciences (AREA)
- Medicinal Chemistry (AREA)
- Polymers & Plastics (AREA)
- Organic Chemistry (AREA)
- Structures Or Materials For Encapsulating Or Coating Semiconductor Devices Or Solid State Devices (AREA)
- Compositions Of Macromolecular Compounds (AREA)
- Epoxy Resins (AREA)
Abstract
내용 없음
Description
본 내용은 요부공개 건이므로 전문내용을 수록하지 않았음
제1도는 본 발명의 실시예를 나타낸 반도체 장치의 일부를 또다시 잘라낸 것을 나타낸 사시도.
제2도는 본 발명의 실시예에서 특성시험을 하였을때에 이용한 레이저 마 킹 방식을 나타낸 설명도.
* 도면의 주요부분에 대한 부호의 설명
10 : 반도체 장치 11 : 밀봉부
12 : 반도체 소자 13 : 리이드선
21 : 레이저 비임 22 : 마킹할 모양
23 : 마스크 24 : 렌즈
25 : 표면
Claims (12)
- 에폭시 수지, 1분자속에 적어도 2개의 페놀성 수산기가 있는 경화제, 유기 포스핀 화합물 및 금속착염 염료로 된 것을 특징으로 하는 에폭시 수지 조성물.
- 제1항에 있어서, 에폭시 수지가 에폭시 당량 170-300의 노볼락형 에폭시 수지인 것을 특징으로 하는 에폭시 수지 조성물.
- 제1항에 있어서, 1분자 속에 적어도 2개의 페놀성 수산기를 가지고 있는 경화제가 노볼락형 페놀 수지인 것을 특징으로 하는 에폭시 수지 조성물.
- 제1항에 있어서, 유기 포스핀 화합물이 조성물 속의 수지 성분 100중량부에 대해서 0.01-5중량부 함유되어 있는 것을 특징으로 하는 에폭시 수지 조성물.
- 제1항에 있어서, 금속착염 염료가 조성물 100중량부에 대해서 0.05-10중량부 함유되어 있는 것을 특징으로 하는 에폭시 수지 조성물.
- 제1항에 있어서, 전술한 조성물에 또다시 용융 실리카 및/또는 결정성 실리카를 첨가하는 것을 특징으로 하는 에폭시 수지 조성물.
- 반도체 소자(12)를 수지(11)로 밀봉한 수지 밀봉형 반도체 장치(10)에 있어서, 전술한 수지의 조성물을에폭시 수지,1분자 속에 적어도 2개의 페놀성 수산기를 가지고 있는 경화제,유기 포스핀 화합물 및 금속착염 염료로 된 에폭시 수지 조성물로 한 것을 특징으로 하는 수지 밀봉형 반도체 장치.
- 제7항에 있어서, 에폭시 수지가 에폭시 당량 170-300의 노볼락형 에폭시 수지인 것을 특징으로 하는 수지 밀봉형 반도체 장치.
- 제7항에 있어서, 1분자 속에 적어도 2개의 페놀성 수산기를 가지고 있는 경화제가 노볼락형 페놀 수지인 것을 특징으로 하는 수지 밀봉형 반도체 장치.
- 제7항에 있어서, 유기포스핀 화합물이 조성물 속의 수지 성분의 100중량비에 대해서 0.01-5중량부 함유되어 있는 것을 특징으로 하는 수지 밀봉형 반도체 장치.
- 제7항에 있어서, 금속 착염 염료가 조성물 100중량부에 대해서 0.05-10 중량부 함유되어 있는 것을 특징으로 하는 수지 밀봉형 반도체 장치.
- 제7항에 있어서, 전술한 조성물에 또다시 용융 실리카 및/또는 결정성 실리카를 첨가하는 것을 특징으로 하는 수지 밀봉형 반도체 장치.※ 참고사항 : 최초출원 내용에 의하여 공개하는 것임.
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP60172396A JPS6234920A (ja) | 1985-08-07 | 1985-08-07 | エポキシ樹脂組成物およびそれを用いた樹脂封止型半導体装置 |
JP60-172396 | 1985-08-07 |
Publications (2)
Publication Number | Publication Date |
---|---|
KR870002646A true KR870002646A (ko) | 1987-04-06 |
KR900001392B1 KR900001392B1 (ko) | 1990-03-09 |
Family
ID=15941158
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
KR1019860002934A KR900001392B1 (ko) | 1985-08-07 | 1986-04-16 | 에폭시 수지 조성물 및 그것을 이용한 수지 밀봉형 반도체 장치 |
Country Status (3)
Country | Link |
---|---|
US (1) | US4719502A (ko) |
JP (1) | JPS6234920A (ko) |
KR (1) | KR900001392B1 (ko) |
Families Citing this family (28)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS62169846A (ja) * | 1986-01-22 | 1987-07-27 | Matsushita Electric Works Ltd | 封止用樹脂組成物 |
NL8900989A (nl) * | 1989-04-20 | 1990-11-16 | Philips Nv | Halfgeleiderinrichting met een in een kunststof omhulling ingebed halfgeleiderlichaam. |
JPH03157448A (ja) * | 1989-11-15 | 1991-07-05 | Mitsubishi Electric Corp | 半導体封止用エポキシ樹脂組成物 |
EP0700947A3 (en) * | 1994-09-08 | 1996-05-01 | Sumitomo Chemical Co | Epoxy resin composition and plastic-coated semiconductor device |
JPH08111478A (ja) * | 1994-10-06 | 1996-04-30 | Toshiba Corp | 樹脂封止型半導体装置 |
US5838361A (en) * | 1996-01-11 | 1998-11-17 | Micron Technology, Inc. | Laser marking techniques |
JPH09235451A (ja) * | 1996-02-28 | 1997-09-09 | Yuka Shell Epoxy Kk | 半導体封止用エポキシ樹脂組成物 |
US6270193B1 (en) * | 1996-06-05 | 2001-08-07 | Brother Kogyo Kabushiki Kaisha | Ink-jet and ink jet recording apparatus having IC chip attached to head body by resin material |
US6200386B1 (en) | 1998-02-02 | 2001-03-13 | Micron Electronics, Inc. | Apparatus for additive de-marking of packaged integrated circuits |
US6121067A (en) * | 1998-02-02 | 2000-09-19 | Micron Electronics, Inc. | Method for additive de-marking of packaged integrated circuits and resulting packages |
SG77624A1 (en) * | 1998-02-06 | 2001-01-16 | Questech Solutions Ptee Ltd | Substrate marking process |
US6337122B1 (en) * | 2000-01-11 | 2002-01-08 | Micron Technology, Inc. | Stereolithographically marked semiconductors devices and methods |
SG106050A1 (en) * | 2000-03-13 | 2004-09-30 | Megic Corp | Method of manufacture and identification of semiconductor chip marked for identification with internal marking indicia and protection thereof by non-black layer and device produced thereby |
US6524881B1 (en) * | 2000-08-25 | 2003-02-25 | Micron Technology, Inc. | Method and apparatus for marking a bare semiconductor die |
SG115443A1 (en) * | 2002-01-19 | 2005-10-28 | Sumitomo Bakelite Singapore Pt | Epoxy resin composition |
US7169685B2 (en) | 2002-02-25 | 2007-01-30 | Micron Technology, Inc. | Wafer back side coating to balance stress from passivation layer on front of wafer and be used as die attach adhesive |
WO2007061981A2 (en) * | 2005-11-21 | 2007-05-31 | Lumera Corporation | Surface plasmon resonance spectrometer with an actuator-driven angle scanning mechanism |
US7463358B2 (en) * | 2005-12-06 | 2008-12-09 | Lumera Corporation | Highly stable surface plasmon resonance plates, microarrays, and methods |
MY148064A (en) * | 2006-10-30 | 2013-02-28 | Sumitomo Bakelite Co | Liquid resin composition, semiconductor wafer having adhesive layer, semiconductor element having adhesive layer, semiconductor package , process for manufacturing semiconductor element and process for manufacturing semiconductor package. |
US20090060786A1 (en) * | 2007-08-29 | 2009-03-05 | Gibum Kim | Microfluidic apparatus for wide area microarrays |
US8004669B1 (en) | 2007-12-18 | 2011-08-23 | Plexera Llc | SPR apparatus with a high performance fluid delivery system |
JP5263578B2 (ja) * | 2008-04-01 | 2013-08-14 | 日立化成株式会社 | 封止用エポキシ樹脂成形材料及び電子部品装置 |
JP5240297B2 (ja) * | 2008-12-26 | 2013-07-17 | 富士通株式会社 | パターンの形成方法及び半導体装置の製造方法、並びにレジストパターンの被覆層の形成材料 |
JP5349087B2 (ja) * | 2009-03-09 | 2013-11-20 | 日東電工株式会社 | 光半導体受光素子封止用エポキシ樹脂組成物およびその製造方法、ならびに光半導体装置 |
CN101817969A (zh) * | 2010-04-08 | 2010-09-01 | 长兴华强电子有限公司 | 节能灯用电容器浸渍料 |
JP5679701B2 (ja) * | 2010-06-07 | 2015-03-04 | 日東電工株式会社 | 光学用エポキシ樹脂組成物およびそれを用いた光学部品、ならびにそれを用いて得られる光半導体装置 |
JP2012117055A (ja) * | 2010-11-08 | 2012-06-21 | Hitachi Chemical Co Ltd | 絶縁体インク樹脂組成物、レジストパターン及びレジストパターン形成方法 |
CN104576553B (zh) * | 2013-10-28 | 2017-08-29 | 日月光半导体制造股份有限公司 | 半导体封装件、封装树脂、封胶与其制造方法 |
Family Cites Families (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4572853A (en) * | 1980-06-05 | 1986-02-25 | Tokyo Shibaura Denki Kabushiki Kaisha | Resin encapsulation type semiconductor device |
FR2488471B1 (fr) * | 1980-08-08 | 1986-01-31 | Thomson Brandt | Circuit integre d'interface entre un recepteur de television et sa prise de peritelevision |
JPS5933125A (ja) * | 1982-08-19 | 1984-02-22 | Toyo Rubber Chem Ind Co Ltd | クツシヨン体の製造方法 |
JPS60119760A (ja) * | 1983-11-30 | 1985-06-27 | Nitto Electric Ind Co Ltd | 樹脂封止半導体装置 |
-
1985
- 1985-08-07 JP JP60172396A patent/JPS6234920A/ja active Granted
-
1986
- 1986-04-16 KR KR1019860002934A patent/KR900001392B1/ko not_active IP Right Cessation
- 1986-08-04 US US06/892,436 patent/US4719502A/en not_active Expired - Lifetime
Also Published As
Publication number | Publication date |
---|---|
US4719502A (en) | 1988-01-12 |
JPS6234920A (ja) | 1987-02-14 |
JPS6360543B2 (ko) | 1988-11-24 |
KR900001392B1 (ko) | 1990-03-09 |
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