KR20240118188A - 광 검출 장치 - Google Patents

광 검출 장치 Download PDF

Info

Publication number
KR20240118188A
KR20240118188A KR1020247024604A KR20247024604A KR20240118188A KR 20240118188 A KR20240118188 A KR 20240118188A KR 1020247024604 A KR1020247024604 A KR 1020247024604A KR 20247024604 A KR20247024604 A KR 20247024604A KR 20240118188 A KR20240118188 A KR 20240118188A
Authority
KR
South Korea
Prior art keywords
fabry
interference filter
perot interference
light
adhesive member
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
KR1020247024604A
Other languages
English (en)
Korean (ko)
Inventor
마사키 히로세
가츠미 시바야마
다카시 가사하라
도시미츠 가와이
다케히코 야시로
미츠시 미네노
시게루 스즈키
Original Assignee
하마마츠 포토닉스 가부시키가이샤
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 하마마츠 포토닉스 가부시키가이샤 filed Critical 하마마츠 포토닉스 가부시키가이샤
Publication of KR20240118188A publication Critical patent/KR20240118188A/ko
Pending legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/12Generating the spectrum; Monochromators
    • G01J3/26Generating the spectrum; Monochromators using multiple reflection, e.g. Fabry-Perot interferometer, variable interference filters
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/02Details
    • G01J3/0286Constructional arrangements for compensating for fluctuations caused by temperature, humidity or pressure, or using cooling or temperature stabilization of parts of the device; Controlling the atmosphere inside a spectrometer, e.g. vacuum
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/02Details
    • G01J3/0291Housings; Spectrometer accessories; Spatial arrangement of elements, e.g. folded path arrangements
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J5/00Radiation pyrometry, e.g. infrared or optical thermometry
    • G01J5/02Constructional details
    • G01J5/0225Shape of the cavity itself or of elements contained in or suspended over the cavity
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J5/00Radiation pyrometry, e.g. infrared or optical thermometry
    • G01J5/02Constructional details
    • G01J5/0225Shape of the cavity itself or of elements contained in or suspended over the cavity
    • G01J5/024Special manufacturing steps or sacrificial layers or layer structures
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J5/00Radiation pyrometry, e.g. infrared or optical thermometry
    • G01J5/02Constructional details
    • G01J5/04Casings
    • G01J5/041Mountings in enclosures or in a particular environment
    • G01J5/045Sealings; Vacuum enclosures; Encapsulated packages; Wafer bonding structures; Getter arrangements
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J5/00Radiation pyrometry, e.g. infrared or optical thermometry
    • G01J5/02Constructional details
    • G01J5/04Casings
    • G01J5/046Materials; Selection of thermal materials
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J5/00Radiation pyrometry, e.g. infrared or optical thermometry
    • G01J5/02Constructional details
    • G01J5/06Arrangements for eliminating effects of disturbing radiation; Arrangements for compensating changes in sensitivity
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J5/00Radiation pyrometry, e.g. infrared or optical thermometry
    • G01J5/02Constructional details
    • G01J5/08Optical arrangements
    • G01J5/0801Means for wavelength selection or discrimination
    • G01J5/0802Optical filters
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J5/00Radiation pyrometry, e.g. infrared or optical thermometry
    • G01J5/10Radiation pyrometry, e.g. infrared or optical thermometry using electric radiation detectors
    • GPHYSICS
    • G02OPTICS
    • G02BOPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B26/00Optical devices or arrangements for the control of light using movable or deformable optical elements
    • G02B26/001Optical devices or arrangements for the control of light using movable or deformable optical elements based on interference in an adjustable optical cavity
    • GPHYSICS
    • G02OPTICS
    • G02BOPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B5/00Optical elements other than lenses
    • G02B5/20Filters
    • G02B5/28Interference filters
    • G02B5/284Interference filters of etalon type comprising a resonant cavity other than a thin solid film, e.g. gas, air, solid plates
    • GPHYSICS
    • G02OPTICS
    • G02BOPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B7/00Mountings, adjusting means, or light-tight connections, for optical elements
    • G02B7/008Mountings, adjusting means, or light-tight connections, for optical elements with means for compensating for changes in temperature or for controlling the temperature; thermal stabilisation
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J5/00Radiation pyrometry, e.g. infrared or optical thermometry
    • G01J5/02Constructional details
    • G01J5/06Arrangements for eliminating effects of disturbing radiation; Arrangements for compensating changes in sensitivity
    • G01J5/064Ambient temperature sensor; Housing temperature sensor; Constructional details thereof

Landscapes

  • Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • General Physics & Mathematics (AREA)
  • Optics & Photonics (AREA)
  • Engineering & Computer Science (AREA)
  • Manufacturing & Machinery (AREA)
  • Mechanical Light Control Or Optical Switches (AREA)
  • Spectrometry And Color Measurement (AREA)
  • Optical Filters (AREA)
  • Photometry And Measurement Of Optical Pulse Characteristics (AREA)
  • Geophysics And Detection Of Objects (AREA)
  • Gyroscopes (AREA)
  • Measuring Pulse, Heart Rate, Blood Pressure Or Blood Flow (AREA)
KR1020247024604A 2015-04-28 2016-04-19 광 검출 장치 Pending KR20240118188A (ko)

Applications Claiming Priority (4)

Application Number Priority Date Filing Date Title
JPJP-P-2015-092360 2015-04-28
JP2015092360A JP6671860B2 (ja) 2015-04-28 2015-04-28 光検出装置
KR1020177026042A KR102708442B1 (ko) 2015-04-28 2016-04-19 광 검출 장치
PCT/JP2016/062414 WO2016175089A1 (ja) 2015-04-28 2016-04-19 光検出装置

Related Parent Applications (1)

Application Number Title Priority Date Filing Date
KR1020177026042A Division KR102708442B1 (ko) 2015-04-28 2016-04-19 광 검출 장치

Publications (1)

Publication Number Publication Date
KR20240118188A true KR20240118188A (ko) 2024-08-02

Family

ID=57198304

Family Applications (2)

Application Number Title Priority Date Filing Date
KR1020177026042A Active KR102708442B1 (ko) 2015-04-28 2016-04-19 광 검출 장치
KR1020247024604A Pending KR20240118188A (ko) 2015-04-28 2016-04-19 광 검출 장치

Family Applications Before (1)

Application Number Title Priority Date Filing Date
KR1020177026042A Active KR102708442B1 (ko) 2015-04-28 2016-04-19 광 검출 장치

Country Status (7)

Country Link
US (2) US11118972B2 (enExample)
EP (3) EP4467943A1 (enExample)
JP (1) JP6671860B2 (enExample)
KR (2) KR102708442B1 (enExample)
CN (2) CN107532941B (enExample)
TW (4) TWI840809B (enExample)
WO (1) WO2016175089A1 (enExample)

Families Citing this family (26)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR3050831B1 (fr) * 2016-04-29 2018-04-27 Silios Technologies Dispositif d'imagerie multispectrale
WO2018122148A1 (de) * 2016-12-30 2018-07-05 Heimann Sensor Gmbh Smd-fähiger thermopile infrarot sensor
JP2018137284A (ja) * 2017-02-20 2018-08-30 ソニーセミコンダクタソリューションズ株式会社 センサ、固体撮像装置及び電子装置
JP6862216B2 (ja) * 2017-02-28 2021-04-21 浜松ホトニクス株式会社 光検出装置
JP7155498B2 (ja) * 2017-03-29 2022-10-19 セイコーエプソン株式会社 光学フィルターデバイス
JP6517309B1 (ja) 2017-11-24 2019-05-22 浜松ホトニクス株式会社 異物除去方法、及び光検出装置の製造方法
JP6526771B1 (ja) 2017-11-24 2019-06-05 浜松ホトニクス株式会社 ウェハ
JP6902571B2 (ja) * 2017-11-24 2021-07-14 浜松ホトニクス株式会社 ウェハ
JP7313115B2 (ja) * 2017-11-24 2023-07-24 浜松ホトニクス株式会社 光検査装置及び光検査方法
JP7043885B2 (ja) * 2018-02-26 2022-03-30 セイコーエプソン株式会社 分光装置、温度特性導出装置、分光システム、分光方法、及び温度特性導出方法
US11101896B2 (en) * 2018-04-12 2021-08-24 Raytheon Company Integrated optical resonant detector
EP3776918B1 (en) 2018-04-12 2023-08-23 Raytheon Company Phase change detection in optical signals
JP7351610B2 (ja) * 2018-10-30 2023-09-27 浜松ホトニクス株式会社 光検出装置
JP7388815B2 (ja) * 2018-10-31 2023-11-29 浜松ホトニクス株式会社 分光ユニット及び分光モジュール
JP2020098258A (ja) * 2018-12-18 2020-06-25 セイコーエプソン株式会社 光学モジュール及び電子機器
JP7181784B2 (ja) 2018-12-18 2022-12-01 浜松ホトニクス株式会社 モニタ装置、光学フィルタシステム、モニタ方法、電流発生装置
JP7051746B2 (ja) * 2019-04-17 2022-04-11 浜松ホトニクス株式会社 光学装置の製造方法
JP7345404B2 (ja) * 2020-01-22 2023-09-15 京セラ株式会社 Mems装置
CN111474618A (zh) * 2020-05-20 2020-07-31 腾景科技股份有限公司 一种空气隙标准具结构的宽波段温度调谐滤波器
JP7114766B2 (ja) * 2021-02-19 2022-08-08 浜松ホトニクス株式会社 光検出装置
JP7647403B2 (ja) * 2021-07-12 2025-03-18 セイコーエプソン株式会社 分光デバイス、及び分光カメラ
CN113703119B (zh) * 2021-09-02 2022-06-07 中国科学院长春光学精密机械与物理研究所 一种光学探测器滤光片精密封装机构
JP2024080068A (ja) * 2022-12-01 2024-06-13 浜松ホトニクス株式会社 フィルタユニット
JP2024080070A (ja) * 2022-12-01 2024-06-13 浜松ホトニクス株式会社 フィルタユニット
JP2024080082A (ja) * 2022-12-01 2024-06-13 浜松ホトニクス株式会社 フィルタユニット
JP2024107867A (ja) * 2023-01-30 2024-08-09 浜松ホトニクス株式会社 蛍光計測装置

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2012173347A (ja) 2011-02-17 2012-09-10 Seiko Epson Corp 光モジュールおよび電子機器

Family Cites Families (35)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4822998A (en) 1986-05-15 1989-04-18 Minolta Camera Kabushiki Kaisha Spectral sensor with interference filter
JPS6348424A (ja) 1986-08-18 1988-03-01 Horiba Ltd 光学的検出器における窓材の取り付け方法
JP3047379B2 (ja) 1992-12-30 2000-05-29 株式会社堀場製作所 赤外線検出器
JPH06201454A (ja) 1992-12-30 1994-07-19 Horiba Ltd 赤外線検出器
US5559358A (en) * 1993-05-25 1996-09-24 Honeywell Inc. Opto-electro-mechanical device or filter, process for making, and sensors made therefrom
JP3210795B2 (ja) 1993-12-11 2001-09-17 株式会社堀場製作所 赤外線検出器
US5550373A (en) 1994-12-30 1996-08-27 Honeywell Inc. Fabry-Perot micro filter-detector
US6043492A (en) 1997-10-27 2000-03-28 Industrial Technology Research Institute Non-invasive blood glucose meter
CA2348381A1 (en) * 1998-11-04 2000-05-11 National Research Council Of Canada Laser-ultrasonic measurement of elastic properties of a thin sheet and of tension applied thereon
JP2000298063A (ja) 1999-04-14 2000-10-24 Tdk Corp 赤外線検出器
JP3700467B2 (ja) 1999-05-20 2005-09-28 松下電工株式会社 赤外線式人体検知器
US6304383B1 (en) 1999-09-17 2001-10-16 Corning Incorporated Controlled stress thermal compensation for filters
JP3835525B2 (ja) * 2001-03-19 2006-10-18 ホーチキ株式会社 波長可変フィルタ制御装置
JP2002286934A (ja) * 2001-03-28 2002-10-03 Kyocera Corp 光学フィルタとこれを用いた撮像装置およびこれを用いた撮像機器
CN1323980A (zh) 2001-07-03 2001-11-28 大连理工大学 一种基于楔形法布里-珀罗干涉滤光片的光波长测量技术
JP4222059B2 (ja) 2002-09-24 2009-02-12 日亜化学工業株式会社 発光装置
JP4292383B2 (ja) 2003-05-19 2009-07-08 セイコーエプソン株式会社 光デバイスの製造方法
JP2007043063A (ja) 2005-06-28 2007-02-15 Kyocera Corp 固体撮像素子収納用パッケージおよび固体撮像素子搭載用基板ならびに固体撮像装置
JP2007142044A (ja) 2005-11-16 2007-06-07 Stanley Electric Co Ltd 半導体発光装置及びそれを用いた面光源
WO2010028319A2 (en) * 2008-09-05 2010-03-11 Board Of Regents, The University Of Texas System Optical fiber based polymer core sensor
JP2010238821A (ja) 2009-03-30 2010-10-21 Sony Corp 多層配線基板、スタック構造センサパッケージおよびその製造方法
JP2011169943A (ja) 2010-02-16 2011-09-01 Seiko Epson Corp 波長可変干渉フィルター、光センサーおよび分析機器
JP5531832B2 (ja) * 2010-07-06 2014-06-25 セイコーエプソン株式会社 光フィルター、光フィルターモジュール、分光測定器および光機器
JP5878723B2 (ja) * 2011-10-04 2016-03-08 浜松ホトニクス株式会社 分光センサ
JP5875936B2 (ja) * 2012-05-18 2016-03-02 浜松ホトニクス株式会社 分光センサ
JP5465288B2 (ja) 2012-08-08 2014-04-09 Necトーキン株式会社 赤外線センサ
JP6003605B2 (ja) 2012-12-12 2016-10-05 Tdk株式会社 赤外線検知装置
TWI840688B (zh) * 2013-01-29 2024-05-01 美商唯亞威方案公司 光學濾波器
JP2014164018A (ja) * 2013-02-22 2014-09-08 Seiko Epson Corp 波長可変干渉フィルター、光学フィルターデバイス、光学モジュール、及び電子機器
JP6255685B2 (ja) * 2013-03-25 2018-01-10 セイコーエプソン株式会社 光学フィルターデバイス、光学モジュール、及び電子機器
JP6211833B2 (ja) * 2013-07-02 2017-10-11 浜松ホトニクス株式会社 ファブリペロー干渉フィルタ
JP6201484B2 (ja) 2013-07-26 2017-09-27 セイコーエプソン株式会社 光学フィルターデバイス、光学モジュール、電子機器、及びmemsデバイス
JP2015052629A (ja) 2013-09-05 2015-03-19 セイコーエプソン株式会社 光学デバイス、光学モジュール、電子機器、光学筐体、及び光学筐体の製造方法
JP2015068887A (ja) 2013-09-27 2015-04-13 セイコーエプソン株式会社 光学フィルターデバイス、光学モジュール、電子機器、及びmemsデバイス
JP2015068885A (ja) * 2013-09-27 2015-04-13 セイコーエプソン株式会社 干渉フィルター、光学フィルターデバイス、光学モジュール、及び電子機器

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2012173347A (ja) 2011-02-17 2012-09-10 Seiko Epson Corp 光モジュールおよび電子機器

Also Published As

Publication number Publication date
EP4212836A1 (en) 2023-07-19
US11118972B2 (en) 2021-09-14
CN107532941A (zh) 2018-01-02
US11555741B2 (en) 2023-01-17
EP3290880A1 (en) 2018-03-07
KR20170140170A (ko) 2017-12-20
EP3290880A4 (en) 2018-12-19
US20180113024A1 (en) 2018-04-26
TWI769594B (zh) 2022-07-01
KR102708442B1 (ko) 2024-09-24
WO2016175089A1 (ja) 2016-11-03
TW201643390A (zh) 2016-12-16
TWI840809B (zh) 2024-05-01
CN113049100B (zh) 2023-11-28
TWI714577B (zh) 2021-01-01
EP4467943A1 (en) 2024-11-27
EP3290880B1 (en) 2023-04-12
CN113049100A (zh) 2021-06-29
US20210372854A1 (en) 2021-12-02
TW202433020A (zh) 2024-08-16
JP2016211860A (ja) 2016-12-15
TW202111295A (zh) 2021-03-16
TW202234030A (zh) 2022-09-01
CN107532941B (zh) 2021-05-25
TWI885832B (zh) 2025-06-01
JP6671860B2 (ja) 2020-03-25

Similar Documents

Publication Publication Date Title
KR102708442B1 (ko) 광 검출 장치
US10895501B2 (en) Light-detecting device
US12467787B2 (en) Light detection device
KR102255742B1 (ko) 광검출 장치
JP6632647B2 (ja) 光検出装置
JP6713589B1 (ja) 光検出装置
JP7049296B2 (ja) 光検出装置
JP7015285B2 (ja) 光検出装置
JP6913709B2 (ja) 光検出装置

Legal Events

Date Code Title Description
A107 Divisional application of patent
PA0104 Divisional application for international application

Comment text: Divisional Application for International Patent

Patent event code: PA01041R01D

Patent event date: 20240722

Application number text: 1020177026042

Filing date: 20170915

PA0201 Request for examination
PG1501 Laying open of application