KR20180031082A - 리소그라피 시스템에서 기판을 전달하기 위한 장치 - Google Patents
리소그라피 시스템에서 기판을 전달하기 위한 장치 Download PDFInfo
- Publication number
- KR20180031082A KR20180031082A KR1020187007800A KR20187007800A KR20180031082A KR 20180031082 A KR20180031082 A KR 20180031082A KR 1020187007800 A KR1020187007800 A KR 1020187007800A KR 20187007800 A KR20187007800 A KR 20187007800A KR 20180031082 A KR20180031082 A KR 20180031082A
- Authority
- KR
- South Korea
- Prior art keywords
- substrate
- passageway
- load lock
- clamped
- robot
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Ceased
Links
Images
Classifications
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- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/70691—Handling of masks or workpieces
- G03F7/70733—Handling masks and workpieces, e.g. exchange of workpiece or mask, transport of workpiece or mask
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- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/70691—Handling of masks or workpieces
- G03F7/70733—Handling masks and workpieces, e.g. exchange of workpiece or mask, transport of workpiece or mask
- G03F7/7075—Handling workpieces outside exposure position, e.g. SMIF box
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- H01L21/67178—
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- H01L21/67225—
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- H01L21/67745—
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- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P72/00—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
- H10P72/04—Apparatus for manufacture or treatment
- H10P72/0451—Apparatus for manufacturing or treating in a plurality of work-stations
- H10P72/0452—Apparatus for manufacturing or treating in a plurality of work-stations characterised by the layout of the process chambers
- H10P72/0458—Apparatus for manufacturing or treating in a plurality of work-stations characterised by the layout of the process chambers vertical arrangement
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P72/00—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
- H10P72/04—Apparatus for manufacture or treatment
- H10P72/0451—Apparatus for manufacturing or treating in a plurality of work-stations
- H10P72/0468—Apparatus for manufacturing or treating in a plurality of work-stations comprising a chamber adapted to a particular process
- H10P72/0474—Apparatus for manufacturing or treating in a plurality of work-stations comprising a chamber adapted to a particular process comprising at least one lithography chamber
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P72/00—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
- H10P72/30—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for conveying, e.g. between different workstations
- H10P72/33—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for conveying, e.g. between different workstations into and out of processing chamber
- H10P72/3304—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for conveying, e.g. between different workstations into and out of processing chamber characterised by movements or sequence of movements of transfer devices
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
- Electron Beam Exposure (AREA)
- Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
- Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US201161480163P | 2011-04-28 | 2011-04-28 | |
| US61/480,163 | 2011-04-28 | ||
| PCT/EP2012/057959 WO2012146789A1 (en) | 2011-04-28 | 2012-05-01 | Apparatus for transferring a substrate in a lithography system |
Related Parent Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| KR1020167009917A Division KR101892460B1 (ko) | 2011-04-28 | 2012-05-01 | 리소그라피 시스템에서 기판을 전달하기 위한 장치 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| KR20180031082A true KR20180031082A (ko) | 2018-03-27 |
Family
ID=46017897
Family Applications (4)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| KR1020187007800A Ceased KR20180031082A (ko) | 2011-04-28 | 2012-05-01 | 리소그라피 시스템에서 기판을 전달하기 위한 장치 |
| KR1020167009917A Active KR101892460B1 (ko) | 2011-04-28 | 2012-05-01 | 리소그라피 시스템에서 기판을 전달하기 위한 장치 |
| KR1020137031510A Active KR101614475B1 (ko) | 2011-04-28 | 2012-05-01 | 리소그라피 시스템에서 기판을 전달하기 위한 장치 |
| KR1020137031509A Expired - Fee Related KR101607618B1 (ko) | 2011-04-28 | 2012-05-01 | 리소그라피 시스템에서 기판을 프로세싱하는 방법 |
Family Applications After (3)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| KR1020167009917A Active KR101892460B1 (ko) | 2011-04-28 | 2012-05-01 | 리소그라피 시스템에서 기판을 전달하기 위한 장치 |
| KR1020137031510A Active KR101614475B1 (ko) | 2011-04-28 | 2012-05-01 | 리소그라피 시스템에서 기판을 전달하기 위한 장치 |
| KR1020137031509A Expired - Fee Related KR101607618B1 (ko) | 2011-04-28 | 2012-05-01 | 리소그라피 시스템에서 기판을 프로세싱하는 방법 |
Country Status (7)
| Country | Link |
|---|---|
| US (4) | US9176397B2 (enExample) |
| EP (1) | EP2702452B1 (enExample) |
| JP (2) | JP5787331B2 (enExample) |
| KR (4) | KR20180031082A (enExample) |
| CN (3) | CN103649837B (enExample) |
| TW (2) | TWI486723B (enExample) |
| WO (2) | WO2012146789A1 (enExample) |
Families Citing this family (15)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR101907433B1 (ko) * | 2010-12-14 | 2018-10-12 | 마퍼 리쏘그라피 아이피 비.브이. | 리소그라피 시스템 및 이러한 리소그라피 시스템에서 기판을 프로세싱하는 방법 |
| JP6049367B2 (ja) | 2012-09-13 | 2016-12-21 | 株式会社Screenセミコンダクターソリューションズ | 基板処理装置および基板処理システム |
| NL2010624C2 (en) | 2013-04-08 | 2014-10-09 | Mapper Lithography Ip Bv | Cabinet for electronic equipment. |
| CN106462084B (zh) * | 2014-05-07 | 2018-10-19 | 迈普尔平版印刷Ip有限公司 | 用于目标处理机械的封闭件 |
| KR101681185B1 (ko) * | 2014-11-04 | 2016-12-02 | 세메스 주식회사 | 인터페이스 모듈 및 이를 포함하는 기판 처리 장치 및 방법 |
| EP3218926A2 (en) | 2014-11-14 | 2017-09-20 | Mapper Lithography IP B.V. | Load lock system and method for transferring substrates in a lithography system |
| NL2015784B1 (en) * | 2015-11-13 | 2017-06-02 | Mapper Lithography Ip Bv | Load lock system and method for transferring substrates in a lithography system. |
| US10153282B1 (en) * | 2017-08-11 | 2018-12-11 | Lam Research Corporation | Ultra-high vacuum transport and storage |
| CN108287454A (zh) * | 2018-01-29 | 2018-07-17 | 信利(惠州)智能显示有限公司 | 掩膜板装载系统 |
| WO2020094371A1 (en) | 2018-11-06 | 2020-05-14 | Asml Netherlands B.V. | Systems and methods for thermally conditioning a wafer in a charged particle beam apparatus |
| KR101977100B1 (ko) * | 2018-11-15 | 2019-05-10 | 이지메카시스템(주) | 렌즈 어셈블리 어닐링 시스템 |
| US10910239B1 (en) * | 2019-07-10 | 2021-02-02 | Mikro Mesa Technology Co., Ltd. | Method of transferring micro devices and device transfer system |
| JP2021086889A (ja) * | 2019-11-27 | 2021-06-03 | 株式会社日立ハイテク | 荷電粒子線装置 |
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| JP6510423B2 (ja) | 2013-01-22 | 2019-05-08 | ブルックス オートメーション インコーポレイテッド | 基板搬送部 |
| US10168208B2 (en) | 2015-04-03 | 2019-01-01 | Hitachi High-Technologies Corporation | Light amount detection device, immune analyzing apparatus and charged particle beam apparatus that each use the light amount detection device |
-
2012
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- 2012-04-30 US US13/460,239 patent/US9176397B2/en active Active
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- 2012-05-01 EP EP12719354.8A patent/EP2702452B1/en not_active Not-in-force
- 2012-05-01 KR KR1020187007800A patent/KR20180031082A/ko not_active Ceased
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- 2012-05-01 KR KR1020167009917A patent/KR101892460B1/ko active Active
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Also Published As
| Publication number | Publication date |
|---|---|
| WO2012146789A1 (en) | 2012-11-01 |
| KR101892460B1 (ko) | 2018-08-28 |
| EP2702452A1 (en) | 2014-03-05 |
| JP5805851B2 (ja) | 2015-11-10 |
| US20130034421A1 (en) | 2013-02-07 |
| CN106919006B (zh) | 2020-03-13 |
| EP2702452B1 (en) | 2016-08-03 |
| CN106919006A (zh) | 2017-07-04 |
| KR20160047590A (ko) | 2016-05-02 |
| JP2014514769A (ja) | 2014-06-19 |
| USRE48903E1 (en) | 2022-01-25 |
| KR101607618B1 (ko) | 2016-04-11 |
| TW201250403A (en) | 2012-12-16 |
| US20160004173A1 (en) | 2016-01-07 |
| TWI514089B (zh) | 2015-12-21 |
| KR101614475B1 (ko) | 2016-04-21 |
| CN103649837B (zh) | 2017-04-12 |
| US9575418B2 (en) | 2017-02-21 |
| JP5787331B2 (ja) | 2015-09-30 |
| US8936994B2 (en) | 2015-01-20 |
| CN106896650A (zh) | 2017-06-27 |
| TWI486723B (zh) | 2015-06-01 |
| CN103649837A (zh) | 2014-03-19 |
| TW201250402A (en) | 2012-12-16 |
| US9176397B2 (en) | 2015-11-03 |
| US20130044305A1 (en) | 2013-02-21 |
| KR20140025495A (ko) | 2014-03-04 |
| KR20140041501A (ko) | 2014-04-04 |
| JP2014513429A (ja) | 2014-05-29 |
| WO2012146788A1 (en) | 2012-11-01 |
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