KR20150040893A - 다중-메모리 다이를 포함하는 반도체 패키지와 관련된 방법 및 장치 - Google Patents
다중-메모리 다이를 포함하는 반도체 패키지와 관련된 방법 및 장치 Download PDFInfo
- Publication number
- KR20150040893A KR20150040893A KR1020157002720A KR20157002720A KR20150040893A KR 20150040893 A KR20150040893 A KR 20150040893A KR 1020157002720 A KR1020157002720 A KR 1020157002720A KR 20157002720 A KR20157002720 A KR 20157002720A KR 20150040893 A KR20150040893 A KR 20150040893A
- Authority
- KR
- South Korea
- Prior art keywords
- die
- substrate
- memory
- memory die
- semiconductor
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Ceased
Links
Images
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/34—Arrangements for cooling, heating, ventilating or temperature compensation ; Temperature sensing arrangements
- H01L23/36—Selection of materials, or shaping, to facilitate cooling or heating, e.g. heatsinks
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L24/00—Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
- H01L24/73—Means for bonding being of different types provided for in two or more of groups H01L24/10, H01L24/18, H01L24/26, H01L24/34, H01L24/42, H01L24/50, H01L24/63, H01L24/71
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L25/00—Assemblies consisting of a plurality of semiconductor or other solid state devices
- H01L25/03—Assemblies consisting of a plurality of semiconductor or other solid state devices all the devices being of a type provided for in a single subclass of subclasses H10B, H10D, H10F, H10H, H10K or H10N, e.g. assemblies of rectifier diodes
- H01L25/04—Assemblies consisting of a plurality of semiconductor or other solid state devices all the devices being of a type provided for in a single subclass of subclasses H10B, H10D, H10F, H10H, H10K or H10N, e.g. assemblies of rectifier diodes the devices not having separate containers
- H01L25/065—Assemblies consisting of a plurality of semiconductor or other solid state devices all the devices being of a type provided for in a single subclass of subclasses H10B, H10D, H10F, H10H, H10K or H10N, e.g. assemblies of rectifier diodes the devices not having separate containers the devices being of a type provided for in group H10D89/00
- H01L25/0652—Assemblies consisting of a plurality of semiconductor or other solid state devices all the devices being of a type provided for in a single subclass of subclasses H10B, H10D, H10F, H10H, H10K or H10N, e.g. assemblies of rectifier diodes the devices not having separate containers the devices being of a type provided for in group H10D89/00 the devices being arranged next and on each other, i.e. mixed assemblies
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L25/00—Assemblies consisting of a plurality of semiconductor or other solid state devices
- H01L25/03—Assemblies consisting of a plurality of semiconductor or other solid state devices all the devices being of a type provided for in a single subclass of subclasses H10B, H10D, H10F, H10H, H10K or H10N, e.g. assemblies of rectifier diodes
- H01L25/10—Assemblies consisting of a plurality of semiconductor or other solid state devices all the devices being of a type provided for in a single subclass of subclasses H10B, H10D, H10F, H10H, H10K or H10N, e.g. assemblies of rectifier diodes the devices having separate containers
- H01L25/105—Assemblies consisting of a plurality of semiconductor or other solid state devices all the devices being of a type provided for in a single subclass of subclasses H10B, H10D, H10F, H10H, H10K or H10N, e.g. assemblies of rectifier diodes the devices having separate containers the devices being integrated devices of class H10
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D84/00—Integrated devices formed in or on semiconductor substrates that comprise only semiconducting layers, e.g. on Si wafers or on GaAs-on-Si wafers
- H10D84/01—Manufacture or treatment
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/02—Bonding areas; Manufacturing methods related thereto
- H01L2224/04—Structure, shape, material or disposition of the bonding areas prior to the connecting process
- H01L2224/0401—Bonding areas specifically adapted for bump connectors, e.g. under bump metallisation [UBM]
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/02—Bonding areas; Manufacturing methods related thereto
- H01L2224/04—Structure, shape, material or disposition of the bonding areas prior to the connecting process
- H01L2224/04042—Bonding areas specifically adapted for wire connectors, e.g. wirebond pads
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/02—Bonding areas; Manufacturing methods related thereto
- H01L2224/04—Structure, shape, material or disposition of the bonding areas prior to the connecting process
- H01L2224/06—Structure, shape, material or disposition of the bonding areas prior to the connecting process of a plurality of bonding areas
- H01L2224/061—Disposition
- H01L2224/0612—Layout
- H01L2224/0615—Mirror array, i.e. array having only a reflection symmetry, i.e. bilateral symmetry
- H01L2224/06154—Mirror array, i.e. array having only a reflection symmetry, i.e. bilateral symmetry covering only portions of the surface to be connected
- H01L2224/06155—Covering only the peripheral area of the surface to be connected, i.e. peripheral arrangements
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/10—Bump connectors; Manufacturing methods related thereto
- H01L2224/12—Structure, shape, material or disposition of the bump connectors prior to the connecting process
- H01L2224/13—Structure, shape, material or disposition of the bump connectors prior to the connecting process of an individual bump connector
- H01L2224/13001—Core members of the bump connector
- H01L2224/13099—Material
- H01L2224/131—Material with a principal constituent of the material being a metal or a metalloid, e.g. boron [B], silicon [Si], germanium [Ge], arsenic [As], antimony [Sb], tellurium [Te] and polonium [Po], and alloys thereof
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/10—Bump connectors; Manufacturing methods related thereto
- H01L2224/15—Structure, shape, material or disposition of the bump connectors after the connecting process
- H01L2224/16—Structure, shape, material or disposition of the bump connectors after the connecting process of an individual bump connector
- H01L2224/161—Disposition
- H01L2224/16135—Disposition the bump connector connecting between different semiconductor or solid-state bodies, i.e. chip-to-chip
- H01L2224/16145—Disposition the bump connector connecting between different semiconductor or solid-state bodies, i.e. chip-to-chip the bodies being stacked
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/10—Bump connectors; Manufacturing methods related thereto
- H01L2224/15—Structure, shape, material or disposition of the bump connectors after the connecting process
- H01L2224/16—Structure, shape, material or disposition of the bump connectors after the connecting process of an individual bump connector
- H01L2224/161—Disposition
- H01L2224/16151—Disposition the bump connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
- H01L2224/16221—Disposition the bump connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
- H01L2224/16225—Disposition the bump connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being non-metallic, e.g. insulating substrate with or without metallisation
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/26—Layer connectors, e.g. plate connectors, solder or adhesive layers; Manufacturing methods related thereto
- H01L2224/28—Structure, shape, material or disposition of the layer connectors prior to the connecting process
- H01L2224/29—Structure, shape, material or disposition of the layer connectors prior to the connecting process of an individual layer connector
- H01L2224/29001—Core members of the layer connector
- H01L2224/29099—Material
- H01L2224/2919—Material with a principal constituent of the material being a polymer, e.g. polyester, phenolic based polymer, epoxy
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/26—Layer connectors, e.g. plate connectors, solder or adhesive layers; Manufacturing methods related thereto
- H01L2224/31—Structure, shape, material or disposition of the layer connectors after the connecting process
- H01L2224/32—Structure, shape, material or disposition of the layer connectors after the connecting process of an individual layer connector
- H01L2224/321—Disposition
- H01L2224/32135—Disposition the layer connector connecting between different semiconductor or solid-state bodies, i.e. chip-to-chip
- H01L2224/32145—Disposition the layer connector connecting between different semiconductor or solid-state bodies, i.e. chip-to-chip the bodies being stacked
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/26—Layer connectors, e.g. plate connectors, solder or adhesive layers; Manufacturing methods related thereto
- H01L2224/31—Structure, shape, material or disposition of the layer connectors after the connecting process
- H01L2224/32—Structure, shape, material or disposition of the layer connectors after the connecting process of an individual layer connector
- H01L2224/321—Disposition
- H01L2224/32151—Disposition the layer connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
- H01L2224/32221—Disposition the layer connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
- H01L2224/32225—Disposition the layer connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being non-metallic, e.g. insulating substrate with or without metallisation
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/42—Wire connectors; Manufacturing methods related thereto
- H01L2224/47—Structure, shape, material or disposition of the wire connectors after the connecting process
- H01L2224/48—Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
- H01L2224/481—Disposition
- H01L2224/48135—Connecting between different semiconductor or solid-state bodies, i.e. chip-to-chip
- H01L2224/48145—Connecting between different semiconductor or solid-state bodies, i.e. chip-to-chip the bodies being stacked
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/42—Wire connectors; Manufacturing methods related thereto
- H01L2224/47—Structure, shape, material or disposition of the wire connectors after the connecting process
- H01L2224/48—Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
- H01L2224/481—Disposition
- H01L2224/48151—Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
- H01L2224/48221—Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
- H01L2224/48225—Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being non-metallic, e.g. insulating substrate with or without metallisation
- H01L2224/48227—Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being non-metallic, e.g. insulating substrate with or without metallisation connecting the wire to a bond pad of the item
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/42—Wire connectors; Manufacturing methods related thereto
- H01L2224/47—Structure, shape, material or disposition of the wire connectors after the connecting process
- H01L2224/48—Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
- H01L2224/481—Disposition
- H01L2224/48151—Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
- H01L2224/48221—Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
- H01L2224/48225—Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being non-metallic, e.g. insulating substrate with or without metallisation
- H01L2224/4824—Connecting between the body and an opposite side of the item with respect to the body
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/73—Means for bonding being of different types provided for in two or more of groups H01L2224/10, H01L2224/18, H01L2224/26, H01L2224/34, H01L2224/42, H01L2224/50, H01L2224/63, H01L2224/71
- H01L2224/732—Location after the connecting process
- H01L2224/73201—Location after the connecting process on the same surface
- H01L2224/73207—Bump and wire connectors
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/73—Means for bonding being of different types provided for in two or more of groups H01L2224/10, H01L2224/18, H01L2224/26, H01L2224/34, H01L2224/42, H01L2224/50, H01L2224/63, H01L2224/71
- H01L2224/732—Location after the connecting process
- H01L2224/73201—Location after the connecting process on the same surface
- H01L2224/73215—Layer and wire connectors
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/73—Means for bonding being of different types provided for in two or more of groups H01L2224/10, H01L2224/18, H01L2224/26, H01L2224/34, H01L2224/42, H01L2224/50, H01L2224/63, H01L2224/71
- H01L2224/732—Location after the connecting process
- H01L2224/73251—Location after the connecting process on different surfaces
- H01L2224/73253—Bump and layer connectors
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/73—Means for bonding being of different types provided for in two or more of groups H01L2224/10, H01L2224/18, H01L2224/26, H01L2224/34, H01L2224/42, H01L2224/50, H01L2224/63, H01L2224/71
- H01L2224/732—Location after the connecting process
- H01L2224/73251—Location after the connecting process on different surfaces
- H01L2224/73265—Layer and wire connectors
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2225/00—Details relating to assemblies covered by the group H01L25/00 but not provided for in its subgroups
- H01L2225/03—All the devices being of a type provided for in the same main group of the same subclass of class H10, e.g. assemblies of rectifier diodes
- H01L2225/04—All the devices being of a type provided for in the same main group of the same subclass of class H10, e.g. assemblies of rectifier diodes the devices not having separate containers
- H01L2225/065—All the devices being of a type provided for in the same main group of the same subclass of class H10
- H01L2225/06503—Stacked arrangements of devices
- H01L2225/06506—Wire or wire-like electrical connections between devices
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2225/00—Details relating to assemblies covered by the group H01L25/00 but not provided for in its subgroups
- H01L2225/03—All the devices being of a type provided for in the same main group of the same subclass of class H10, e.g. assemblies of rectifier diodes
- H01L2225/04—All the devices being of a type provided for in the same main group of the same subclass of class H10, e.g. assemblies of rectifier diodes the devices not having separate containers
- H01L2225/065—All the devices being of a type provided for in the same main group of the same subclass of class H10
- H01L2225/06503—Stacked arrangements of devices
- H01L2225/0651—Wire or wire-like electrical connections from device to substrate
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2225/00—Details relating to assemblies covered by the group H01L25/00 but not provided for in its subgroups
- H01L2225/03—All the devices being of a type provided for in the same main group of the same subclass of class H10, e.g. assemblies of rectifier diodes
- H01L2225/04—All the devices being of a type provided for in the same main group of the same subclass of class H10, e.g. assemblies of rectifier diodes the devices not having separate containers
- H01L2225/065—All the devices being of a type provided for in the same main group of the same subclass of class H10
- H01L2225/06503—Stacked arrangements of devices
- H01L2225/06555—Geometry of the stack, e.g. form of the devices, geometry to facilitate stacking
- H01L2225/06562—Geometry of the stack, e.g. form of the devices, geometry to facilitate stacking at least one device in the stack being rotated or offset
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2225/00—Details relating to assemblies covered by the group H01L25/00 but not provided for in its subgroups
- H01L2225/03—All the devices being of a type provided for in the same main group of the same subclass of class H10, e.g. assemblies of rectifier diodes
- H01L2225/04—All the devices being of a type provided for in the same main group of the same subclass of class H10, e.g. assemblies of rectifier diodes the devices not having separate containers
- H01L2225/065—All the devices being of a type provided for in the same main group of the same subclass of class H10
- H01L2225/06503—Stacked arrangements of devices
- H01L2225/06589—Thermal management, e.g. cooling
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2225/00—Details relating to assemblies covered by the group H01L25/00 but not provided for in its subgroups
- H01L2225/03—All the devices being of a type provided for in the same main group of the same subclass of class H10, e.g. assemblies of rectifier diodes
- H01L2225/10—All the devices being of a type provided for in the same main group of the same subclass of class H10, e.g. assemblies of rectifier diodes the devices having separate containers
- H01L2225/1005—All the devices being of a type provided for in the same main group of the same subclass of class H10, e.g. assemblies of rectifier diodes the devices having separate containers the devices being integrated devices of class H10
- H01L2225/1011—All the devices being of a type provided for in the same main group of the same subclass of class H10, e.g. assemblies of rectifier diodes the devices having separate containers the devices being integrated devices of class H10 the containers being in a stacked arrangement
- H01L2225/1017—All the devices being of a type provided for in the same main group of the same subclass of class H10, e.g. assemblies of rectifier diodes the devices having separate containers the devices being integrated devices of class H10 the containers being in a stacked arrangement the lowermost container comprising a device support
- H01L2225/1023—All the devices being of a type provided for in the same main group of the same subclass of class H10, e.g. assemblies of rectifier diodes the devices having separate containers the devices being integrated devices of class H10 the containers being in a stacked arrangement the lowermost container comprising a device support the support being an insulating substrate
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2225/00—Details relating to assemblies covered by the group H01L25/00 but not provided for in its subgroups
- H01L2225/03—All the devices being of a type provided for in the same main group of the same subclass of class H10, e.g. assemblies of rectifier diodes
- H01L2225/10—All the devices being of a type provided for in the same main group of the same subclass of class H10, e.g. assemblies of rectifier diodes the devices having separate containers
- H01L2225/1005—All the devices being of a type provided for in the same main group of the same subclass of class H10, e.g. assemblies of rectifier diodes the devices having separate containers the devices being integrated devices of class H10
- H01L2225/1011—All the devices being of a type provided for in the same main group of the same subclass of class H10, e.g. assemblies of rectifier diodes the devices having separate containers the devices being integrated devices of class H10 the containers being in a stacked arrangement
- H01L2225/1047—Details of electrical connections between containers
- H01L2225/1058—Bump or bump-like electrical connections, e.g. balls, pillars, posts
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L24/00—Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
- H01L24/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L24/10—Bump connectors ; Manufacturing methods related thereto
- H01L24/12—Structure, shape, material or disposition of the bump connectors prior to the connecting process
- H01L24/13—Structure, shape, material or disposition of the bump connectors prior to the connecting process of an individual bump connector
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L24/00—Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
- H01L24/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L24/10—Bump connectors ; Manufacturing methods related thereto
- H01L24/15—Structure, shape, material or disposition of the bump connectors after the connecting process
- H01L24/16—Structure, shape, material or disposition of the bump connectors after the connecting process of an individual bump connector
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L24/00—Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
- H01L24/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L24/26—Layer connectors, e.g. plate connectors, solder or adhesive layers; Manufacturing methods related thereto
- H01L24/28—Structure, shape, material or disposition of the layer connectors prior to the connecting process
- H01L24/29—Structure, shape, material or disposition of the layer connectors prior to the connecting process of an individual layer connector
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L24/00—Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
- H01L24/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L24/26—Layer connectors, e.g. plate connectors, solder or adhesive layers; Manufacturing methods related thereto
- H01L24/31—Structure, shape, material or disposition of the layer connectors after the connecting process
- H01L24/32—Structure, shape, material or disposition of the layer connectors after the connecting process of an individual layer connector
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L24/00—Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
- H01L24/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L24/42—Wire connectors; Manufacturing methods related thereto
- H01L24/47—Structure, shape, material or disposition of the wire connectors after the connecting process
- H01L24/48—Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/0001—Technical content checked by a classifier
- H01L2924/00014—Technical content checked by a classifier the subject-matter covered by the group, the symbol of which is combined with the symbol of this group, being disclosed without further technical details
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/10—Details of semiconductor or other solid state devices to be connected
- H01L2924/11—Device type
- H01L2924/12—Passive devices, e.g. 2 terminal devices
- H01L2924/1204—Optical Diode
- H01L2924/12042—LASER
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/10—Details of semiconductor or other solid state devices to be connected
- H01L2924/11—Device type
- H01L2924/14—Integrated circuits
- H01L2924/143—Digital devices
- H01L2924/1434—Memory
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/10—Details of semiconductor or other solid state devices to be connected
- H01L2924/11—Device type
- H01L2924/14—Integrated circuits
- H01L2924/143—Digital devices
- H01L2924/1434—Memory
- H01L2924/1435—Random access memory [RAM]
- H01L2924/1436—Dynamic random-access memory [DRAM]
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/15—Details of package parts other than the semiconductor or other solid state devices to be connected
- H01L2924/151—Die mounting substrate
- H01L2924/153—Connection portion
- H01L2924/1531—Connection portion the connection portion being formed only on the surface of the substrate opposite to the die mounting surface
- H01L2924/15311—Connection portion the connection portion being formed only on the surface of the substrate opposite to the die mounting surface being a ball array, e.g. BGA
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/15—Details of package parts other than the semiconductor or other solid state devices to be connected
- H01L2924/151—Die mounting substrate
- H01L2924/153—Connection portion
- H01L2924/1532—Connection portion the connection portion being formed on the die mounting surface of the substrate
- H01L2924/1533—Connection portion the connection portion being formed on the die mounting surface of the substrate the connection portion being formed both on the die mounting surface of the substrate and outside the die mounting surface of the substrate
- H01L2924/15331—Connection portion the connection portion being formed on the die mounting surface of the substrate the connection portion being formed both on the die mounting surface of the substrate and outside the die mounting surface of the substrate being a ball array, e.g. BGA
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/19—Details of hybrid assemblies other than the semiconductor or other solid state devices to be connected
- H01L2924/191—Disposition
- H01L2924/19101—Disposition of discrete passive components
- H01L2924/19107—Disposition of discrete passive components off-chip wires
Landscapes
- Engineering & Computer Science (AREA)
- Power Engineering (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Computer Hardware Design (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Chemical & Material Sciences (AREA)
- Materials Engineering (AREA)
- Semiconductor Memories (AREA)
- Wire Bonding (AREA)
Applications Claiming Priority (7)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US201261674703P | 2012-07-23 | 2012-07-23 | |
| US61/674,703 | 2012-07-23 | ||
| US201261675626P | 2012-07-25 | 2012-07-25 | |
| US61/675,626 | 2012-07-25 | ||
| US13/947,936 US9117790B2 (en) | 2012-06-25 | 2013-07-22 | Methods and arrangements relating to semiconductor packages including multi-memory dies |
| US13/947,936 | 2013-07-22 | ||
| PCT/US2013/051694 WO2014018538A1 (en) | 2012-07-23 | 2013-07-23 | Methods and arrangements relating to semiconductor packages including multi-memory dies |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| KR20150040893A true KR20150040893A (ko) | 2015-04-15 |
Family
ID=49945870
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| KR1020157002720A Ceased KR20150040893A (ko) | 2012-07-23 | 2013-07-23 | 다중-메모리 다이를 포함하는 반도체 패키지와 관련된 방법 및 장치 |
Country Status (5)
| Country | Link |
|---|---|
| US (1) | US9117790B2 (enExample) |
| JP (1) | JP2015527736A (enExample) |
| KR (1) | KR20150040893A (enExample) |
| CN (1) | CN104769709A (enExample) |
| WO (1) | WO2014018538A1 (enExample) |
Families Citing this family (64)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US8674483B2 (en) | 2011-06-27 | 2014-03-18 | Marvell World Trade Ltd. | Methods and arrangements relating to semiconductor packages including multi-memory dies |
| US9497861B2 (en) * | 2012-12-06 | 2016-11-15 | Taiwan Semiconductor Manufacturing Company, Ltd. | Methods and apparatus for package with interposers |
| US9589927B2 (en) | 2014-09-19 | 2017-03-07 | Nxp Usa, Inc. | Packaged RF amplifier devices with grounded isolation structures and methods of manufacture thereof |
| US9337774B2 (en) | 2014-09-19 | 2016-05-10 | Freescale Semiconductor, Inc. | Packaged RF amplifier devices and methods of manufacture thereof |
| US11178818B2 (en) | 2018-10-26 | 2021-11-23 | Deere & Company | Harvesting machine control system with fill level processing based on yield data |
| US11653588B2 (en) | 2018-10-26 | 2023-05-23 | Deere & Company | Yield map generation and control system |
| US11240961B2 (en) | 2018-10-26 | 2022-02-08 | Deere & Company | Controlling a harvesting machine based on a geo-spatial representation indicating where the harvesting machine is likely to reach capacity |
| US11079725B2 (en) | 2019-04-10 | 2021-08-03 | Deere & Company | Machine control using real-time model |
| US11467605B2 (en) | 2019-04-10 | 2022-10-11 | Deere & Company | Zonal machine control |
| US11589509B2 (en) | 2018-10-26 | 2023-02-28 | Deere & Company | Predictive machine characteristic map generation and control system |
| US11672203B2 (en) | 2018-10-26 | 2023-06-13 | Deere & Company | Predictive map generation and control |
| US11641800B2 (en) | 2020-02-06 | 2023-05-09 | Deere & Company | Agricultural harvesting machine with pre-emergence weed detection and mitigation system |
| US11957072B2 (en) | 2020-02-06 | 2024-04-16 | Deere & Company | Pre-emergence weed detection and mitigation system |
| US11024617B2 (en) * | 2018-10-26 | 2021-06-01 | Micron Technology, Inc. | Semiconductor packages having photon integrated circuit (PIC) chips |
| US10928585B2 (en) | 2018-10-26 | 2021-02-23 | Micron Technology, Inc. | Semiconductor devices having electro-optical substrates |
| US12069978B2 (en) | 2018-10-26 | 2024-08-27 | Deere & Company | Predictive environmental characteristic map generation and control system |
| US11778945B2 (en) | 2019-04-10 | 2023-10-10 | Deere & Company | Machine control using real-time model |
| US11234366B2 (en) | 2019-04-10 | 2022-02-01 | Deere & Company | Image selection for machine control |
| US12329148B2 (en) | 2020-02-06 | 2025-06-17 | Deere & Company | Predictive weed map and material application machine control |
| US12035648B2 (en) | 2020-02-06 | 2024-07-16 | Deere & Company | Predictive weed map generation and control system |
| US12225846B2 (en) | 2020-02-06 | 2025-02-18 | Deere & Company | Machine control using a predictive map |
| US11477940B2 (en) | 2020-03-26 | 2022-10-25 | Deere & Company | Mobile work machine control based on zone parameter modification |
| US11410949B2 (en) * | 2020-07-27 | 2022-08-09 | Micron Technology, Inc. | Memory devices with backside bond pads under a memory array |
| US11946747B2 (en) | 2020-10-09 | 2024-04-02 | Deere & Company | Crop constituent map generation and control system |
| US11711995B2 (en) | 2020-10-09 | 2023-08-01 | Deere & Company | Machine control using a predictive map |
| US11983009B2 (en) | 2020-10-09 | 2024-05-14 | Deere & Company | Map generation and control system |
| US11849672B2 (en) | 2020-10-09 | 2023-12-26 | Deere & Company | Machine control using a predictive map |
| US11635765B2 (en) | 2020-10-09 | 2023-04-25 | Deere & Company | Crop state map generation and control system |
| US11727680B2 (en) | 2020-10-09 | 2023-08-15 | Deere & Company | Predictive map generation based on seeding characteristics and control |
| US11871697B2 (en) | 2020-10-09 | 2024-01-16 | Deere & Company | Crop moisture map generation and control system |
| US11650587B2 (en) | 2020-10-09 | 2023-05-16 | Deere & Company | Predictive power map generation and control system |
| US12069986B2 (en) | 2020-10-09 | 2024-08-27 | Deere & Company | Map generation and control system |
| US11845449B2 (en) | 2020-10-09 | 2023-12-19 | Deere & Company | Map generation and control system |
| US11927459B2 (en) | 2020-10-09 | 2024-03-12 | Deere & Company | Machine control using a predictive map |
| US12422847B2 (en) | 2020-10-09 | 2025-09-23 | Deere & Company | Predictive agricultural model and map generation |
| US11849671B2 (en) | 2020-10-09 | 2023-12-26 | Deere & Company | Crop state map generation and control system |
| US11592822B2 (en) | 2020-10-09 | 2023-02-28 | Deere & Company | Machine control using a predictive map |
| US11844311B2 (en) | 2020-10-09 | 2023-12-19 | Deere & Company | Machine control using a predictive map |
| US11474523B2 (en) | 2020-10-09 | 2022-10-18 | Deere & Company | Machine control using a predictive speed map |
| US12013245B2 (en) | 2020-10-09 | 2024-06-18 | Deere & Company | Predictive map generation and control system |
| US11825768B2 (en) | 2020-10-09 | 2023-11-28 | Deere & Company | Machine control using a predictive map |
| US11874669B2 (en) | 2020-10-09 | 2024-01-16 | Deere & Company | Map generation and control system |
| US11895948B2 (en) | 2020-10-09 | 2024-02-13 | Deere & Company | Predictive map generation and control based on soil properties |
| US12419220B2 (en) | 2020-10-09 | 2025-09-23 | Deere & Company | Predictive map generation and control system |
| US11889788B2 (en) | 2020-10-09 | 2024-02-06 | Deere & Company | Predictive biomass map generation and control |
| US12178158B2 (en) | 2020-10-09 | 2024-12-31 | Deere & Company | Predictive map generation and control system for an agricultural work machine |
| US12386354B2 (en) | 2020-10-09 | 2025-08-12 | Deere & Company | Predictive power map generation and control system |
| US11864483B2 (en) | 2020-10-09 | 2024-01-09 | Deere & Company | Predictive map generation and control system |
| US11675354B2 (en) | 2020-10-09 | 2023-06-13 | Deere & Company | Machine control using a predictive map |
| US12250905B2 (en) | 2020-10-09 | 2025-03-18 | Deere & Company | Machine control using a predictive map |
| US11889787B2 (en) | 2020-10-09 | 2024-02-06 | Deere & Company | Predictive speed map generation and control system |
| US12127500B2 (en) | 2021-01-27 | 2024-10-29 | Deere & Company | Machine control using a map with regime zones |
| CN117044424A (zh) * | 2021-04-08 | 2023-11-10 | 超极存储器股份有限公司 | 模块及其制造方法 |
| US12229886B2 (en) | 2021-10-01 | 2025-02-18 | Deere & Company | Historical crop state model, predictive crop state map generation and control system |
| US12310286B2 (en) | 2021-12-14 | 2025-05-27 | Deere & Company | Crop constituent sensing |
| US12302791B2 (en) | 2021-12-20 | 2025-05-20 | Deere & Company | Crop constituents, predictive mapping, and agricultural harvester control |
| US12245549B2 (en) | 2022-01-11 | 2025-03-11 | Deere & Company | Predictive response map generation and control system |
| US12082531B2 (en) | 2022-01-26 | 2024-09-10 | Deere & Company | Systems and methods for predicting material dynamics |
| CN114242669B (zh) * | 2022-02-28 | 2022-07-08 | 甬矽电子(宁波)股份有限公司 | 堆叠封装结构和堆叠结构封装方法 |
| US12295288B2 (en) | 2022-04-05 | 2025-05-13 | Deere &Company | Predictive machine setting map generation and control system |
| US12284934B2 (en) | 2022-04-08 | 2025-04-29 | Deere & Company | Systems and methods for predictive tractive characteristics and control |
| US12058951B2 (en) | 2022-04-08 | 2024-08-13 | Deere & Company | Predictive nutrient map and control |
| US12358493B2 (en) | 2022-04-08 | 2025-07-15 | Deere & Company | Systems and methods for predictive power requirements and control |
| US12298767B2 (en) | 2022-04-08 | 2025-05-13 | Deere & Company | Predictive material consumption map and control |
Family Cites Families (24)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH01235264A (ja) * | 1988-03-15 | 1989-09-20 | Toshiba Corp | 半導体集積回路装置 |
| JP2001257307A (ja) * | 2000-03-09 | 2001-09-21 | Sharp Corp | 半導体装置 |
| US6638789B1 (en) * | 2000-09-26 | 2003-10-28 | Amkor Technology, Inc. | Micromachine stacked wirebonded package fabrication method |
| WO2002082540A1 (en) * | 2001-03-30 | 2002-10-17 | Fujitsu Limited | Semiconductor device, method of manufacture thereof, and semiconductor substrate |
| KR100868419B1 (ko) | 2001-06-07 | 2008-11-11 | 가부시끼가이샤 르네사스 테크놀로지 | 반도체장치 및 그 제조방법 |
| JP2003023135A (ja) * | 2001-07-06 | 2003-01-24 | Sharp Corp | 半導体集積回路装置 |
| JP2003023138A (ja) | 2001-07-10 | 2003-01-24 | Toshiba Corp | メモリチップ及びこれを用いたcocデバイス、並びに、これらの製造方法 |
| US6476506B1 (en) * | 2001-09-28 | 2002-11-05 | Motorola, Inc. | Packaged semiconductor with multiple rows of bond pads and method therefor |
| TW588446B (en) * | 2003-03-21 | 2004-05-21 | Advanced Semiconductor Eng | Multi-chips stacked package |
| US7095103B1 (en) * | 2003-05-01 | 2006-08-22 | Amkor Technology, Inc. | Leadframe based memory card |
| KR100621547B1 (ko) * | 2004-01-13 | 2006-09-14 | 삼성전자주식회사 | 멀티칩 패키지 |
| JP2005317830A (ja) * | 2004-04-30 | 2005-11-10 | Elpida Memory Inc | 半導体装置、マルチチップパッケージ、およびワイヤボンディング方法 |
| US20080087999A1 (en) * | 2006-10-16 | 2008-04-17 | Powertech Technology Inc. | Micro BGA package having multi-chip stack |
| US7560304B2 (en) * | 2006-12-28 | 2009-07-14 | Sandisk Corporation | Method of making a semiconductor device having multiple die redistribution layer |
| JP5131812B2 (ja) * | 2007-02-07 | 2013-01-30 | ルネサスエレクトロニクス株式会社 | 半導体装置 |
| KR101185886B1 (ko) * | 2007-07-23 | 2012-09-25 | 삼성전자주식회사 | 유니버설 배선 라인들을 포함하는 반도체 칩, 반도체패키지, 카드 및 시스템 |
| US8704379B2 (en) * | 2007-09-10 | 2014-04-22 | Invensas Corporation | Semiconductor die mount by conformal die coating |
| US7872483B2 (en) * | 2007-12-12 | 2011-01-18 | Samsung Electronics Co., Ltd. | Circuit board having bypass pad |
| US20090302483A1 (en) * | 2008-06-04 | 2009-12-10 | Himax Technologies Limited | Stacked die package |
| CN101404279A (zh) * | 2008-11-11 | 2009-04-08 | 华亚微电子(上海)有限公司 | 一种多芯片3d堆叠封装结构 |
| KR20110041301A (ko) * | 2009-10-15 | 2011-04-21 | 삼성전자주식회사 | 반도체 패키지 및 반도체 패키지의 제조 방법 |
| US8421242B2 (en) * | 2009-12-31 | 2013-04-16 | Advanced Semiconductor Engineering, Inc. | Semiconductor package |
| US8674483B2 (en) * | 2011-06-27 | 2014-03-18 | Marvell World Trade Ltd. | Methods and arrangements relating to semiconductor packages including multi-memory dies |
| TWI565026B (zh) * | 2012-01-05 | 2017-01-01 | 威盛電子股份有限公司 | 晶片封裝結構 |
-
2013
- 2013-07-22 US US13/947,936 patent/US9117790B2/en active Active
- 2013-07-23 CN CN201380046324.2A patent/CN104769709A/zh active Pending
- 2013-07-23 JP JP2015524392A patent/JP2015527736A/ja active Pending
- 2013-07-23 KR KR1020157002720A patent/KR20150040893A/ko not_active Ceased
- 2013-07-23 WO PCT/US2013/051694 patent/WO2014018538A1/en not_active Ceased
Also Published As
| Publication number | Publication date |
|---|---|
| CN104769709A (zh) | 2015-07-08 |
| JP2015527736A (ja) | 2015-09-17 |
| US20140021598A1 (en) | 2014-01-23 |
| US9117790B2 (en) | 2015-08-25 |
| WO2014018538A1 (en) | 2014-01-30 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| KR20150040893A (ko) | 다중-메모리 다이를 포함하는 반도체 패키지와 관련된 방법 및 장치 | |
| KR20200109244A (ko) | 기판 패치 재구성 옵션들 | |
| KR101132918B1 (ko) | 패키지 어셈블리를 위한 웨이퍼 레벨 몰드 구조 | |
| US20130040423A1 (en) | Method of Multi-Chip Wafer Level Packaging | |
| US20140131854A1 (en) | Multi-chip module connection by way of bridging blocks | |
| KR101723003B1 (ko) | 적층된 전자 컴포넌트를 포함하는 전자 어셈블리 | |
| US20100314730A1 (en) | Stacked hybrid interposer through silicon via (TSV) package | |
| US9105610B2 (en) | Methods and arrangements relating to semiconductor packages including multi-memory dies | |
| TWI419270B (zh) | 封裝堆疊結構 | |
| CN107534041A (zh) | 包括集成电路器件封装之间的焊料连接的层叠封装(PoP)器件 | |
| US7838336B2 (en) | Method and structure for dispensing chip underfill through an opening in the chip | |
| CN104851863B (zh) | 一种集成电路、引线键合封装芯片及倒装封装芯片 | |
| CN207993845U (zh) | 一种智能传感模块结构 | |
| KR20120096754A (ko) | 인터포저를 이용한 웨이퍼 칩의 3차원 스택 구조 | |
| CN202394957U (zh) | 半导体晶圆及封装构造 | |
| CN101226929B (zh) | 半导体封装结构及其制造方法 | |
| KR20150120362A (ko) | 패키지 온 패키지 구조들 | |
| US9362212B1 (en) | Integrated circuit package having side and bottom contact pads | |
| WO2006010903A3 (en) | Multiple chip semiconductor device | |
| US20170047305A1 (en) | Packaging arrangements including a serializing dram interface die | |
| CN100373614C (zh) | 多晶片的封装结构 | |
| TWI734779B (zh) | 薄型化雙晶片之疊接封裝結構 | |
| CN106102340A (zh) | 利用印刷电路板的多裸片堆叠方法及利用其的半导体封装件 | |
| TWM549956U (zh) | 薄型化雙晶片之疊接封裝結構 | |
| CN108878408A (zh) | 薄型化双芯片的叠接封装结构 |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| PA0105 | International application |
Patent event date: 20150130 Patent event code: PA01051R01D Comment text: International Patent Application |
|
| PG1501 | Laying open of application | ||
| PA0201 | Request for examination |
Patent event code: PA02012R01D Patent event date: 20180529 Comment text: Request for Examination of Application |
|
| E902 | Notification of reason for refusal | ||
| PE0902 | Notice of grounds for rejection |
Comment text: Notification of reason for refusal Patent event date: 20190617 Patent event code: PE09021S01D |
|
| E601 | Decision to refuse application | ||
| PE0601 | Decision on rejection of patent |
Patent event date: 20190927 Comment text: Decision to Refuse Application Patent event code: PE06012S01D Patent event date: 20190617 Comment text: Notification of reason for refusal Patent event code: PE06011S01I |