KR20120099720A - 보호 다이오드 구조물을 갖는 박막 반도체 소자 그리고 박막 반도체 소자를 제조하기 위한 방법 - Google Patents

보호 다이오드 구조물을 갖는 박막 반도체 소자 그리고 박막 반도체 소자를 제조하기 위한 방법 Download PDF

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KR20120099720A
KR20120099720A KR1020127015287A KR20127015287A KR20120099720A KR 20120099720 A KR20120099720 A KR 20120099720A KR 1020127015287 A KR1020127015287 A KR 1020127015287A KR 20127015287 A KR20127015287 A KR 20127015287A KR 20120099720 A KR20120099720 A KR 20120099720A
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semiconductor
support
semiconductor device
thin film
contact
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Korean (ko)
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만프레드 쇼이베크
지크프리트 헤르만
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오스람 옵토 세미컨덕터스 게엠베하
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    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L25/00—Assemblies consisting of a plurality of semiconductor or other solid state devices
    • H01L25/16—Assemblies consisting of a plurality of semiconductor or other solid state devices the devices being of types provided for in two or more different subclasses of H10B, H10D, H10F, H10H, H10K or H10N, e.g. forming hybrid circuits
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L25/00—Assemblies consisting of a plurality of semiconductor or other solid state devices
    • H01L25/16—Assemblies consisting of a plurality of semiconductor or other solid state devices the devices being of types provided for in two or more different subclasses of H10B, H10D, H10F, H10H, H10K or H10N, e.g. forming hybrid circuits
    • H01L25/167—Assemblies consisting of a plurality of semiconductor or other solid state devices the devices being of types provided for in two or more different subclasses of H10B, H10D, H10F, H10H, H10K or H10N, e.g. forming hybrid circuits comprising optoelectronic devices, e.g. LED, photodiodes
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/0001—Technical content checked by a classifier
    • H01L2924/0002—Not covered by any one of groups H01L24/00, H01L24/00 and H01L2224/00
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10H—INORGANIC LIGHT-EMITTING SEMICONDUCTOR DEVICES HAVING POTENTIAL BARRIERS
    • H10H20/00—Individual inorganic light-emitting semiconductor devices having potential barriers, e.g. light-emitting diodes [LED]
    • H10H20/01—Manufacture or treatment
    • H10H20/011—Manufacture or treatment of bodies, e.g. forming semiconductor layers
    • H10H20/018—Bonding of wafers
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10H—INORGANIC LIGHT-EMITTING SEMICONDUCTOR DEVICES HAVING POTENTIAL BARRIERS
    • H10H20/00—Individual inorganic light-emitting semiconductor devices having potential barriers, e.g. light-emitting diodes [LED]
    • H10H20/80—Constructional details
    • H10H20/83—Electrodes
    • H10H20/831—Electrodes characterised by their shape
    • H10H20/8312—Electrodes characterised by their shape extending at least partially through the bodies

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  • Engineering & Computer Science (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Power Engineering (AREA)
  • Semiconductor Integrated Circuits (AREA)
  • Led Device Packages (AREA)
KR1020127015287A 2009-11-13 2010-11-11 보호 다이오드 구조물을 갖는 박막 반도체 소자 그리고 박막 반도체 소자를 제조하기 위한 방법 Withdrawn KR20120099720A (ko)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
DE102009053064.9 2009-11-13
DE102009053064A DE102009053064A1 (de) 2009-11-13 2009-11-13 Dünnfilm-Halbleiterbauelement mit Schutzdiodenstruktur und Verfahren zur Herstellung eines Dünnfilm-Halbleiterbauelements

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Publication Number Publication Date
KR20120099720A true KR20120099720A (ko) 2012-09-11

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KR1020127015287A Withdrawn KR20120099720A (ko) 2009-11-13 2010-11-11 보호 다이오드 구조물을 갖는 박막 반도체 소자 그리고 박막 반도체 소자를 제조하기 위한 방법

Country Status (7)

Country Link
US (1) US20120223416A1 (OSRAM)
EP (1) EP2499668B9 (OSRAM)
JP (1) JP2013511142A (OSRAM)
KR (1) KR20120099720A (OSRAM)
CN (1) CN102687271B (OSRAM)
DE (1) DE102009053064A1 (OSRAM)
WO (1) WO2011058094A1 (OSRAM)

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WO2013021305A1 (en) * 2011-08-10 2013-02-14 Koninklijke Philips Electronics N.V. Wafer level processing of leds using carrier wafer
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DE102012104494A1 (de) * 2012-05-24 2013-11-28 Epcos Ag Leuchtdiodenvorrichtung
DE102012108627B4 (de) * 2012-09-14 2021-06-10 OSRAM Opto Semiconductors Gesellschaft mit beschränkter Haftung Optoelektronische Halbleitervorrichtung und Trägerverbund
DE102012217533A1 (de) * 2012-09-27 2014-03-27 Osram Opto Semiconductors Gmbh Verfahren zur Herstellung eines optoelektronischen Bauelements
US9418972B2 (en) 2012-09-27 2016-08-16 Osram Opto Semiconductors Gmbh Optoelectronic component with protective circuit
DE102012217932B4 (de) * 2012-10-01 2019-11-14 Osram Opto Semiconductors Gmbh Optoelektronisches Bauelement mit Schutzschaltung
DE102012112988A1 (de) * 2012-12-21 2014-07-10 Osram Opto Semiconductors Gmbh Optoelektronisches Bauelement, Verfahren zur Herstellung eines optoelektronischen Bauelements und Scheinwerfer
JP6396419B2 (ja) * 2013-03-29 2018-09-26 フィリップス ライティング ホールディング ビー ヴィ 波長変換素子を有する発光装置
DE102013105631A1 (de) * 2013-05-31 2014-12-04 Osram Opto Semiconductors Gmbh Träger für einen optoelektronischen Halbleiterchip und optoelektronisches Bauteil
FR3011383B1 (fr) * 2013-09-30 2017-05-26 Commissariat Energie Atomique Procede de fabrication de dispositifs optoelectroniques a diodes electroluminescentes
DE102013110853B4 (de) * 2013-10-01 2020-12-24 OSRAM Opto Semiconductors Gesellschaft mit beschränkter Haftung Strahlungsemittierender Halbleiterchip und Verfahren zur Herstellung von strahlungsemittierenden Halbleiterchips
DE102013221788B4 (de) 2013-10-28 2021-05-27 OSRAM Opto Semiconductors Gesellschaft mit beschränkter Haftung Verfahren zum Herstellen eines Kontaktelements und eines optoelektronischen Bauelements
KR102171221B1 (ko) * 2014-03-12 2020-10-28 삼성전자주식회사 수직형 불휘발성 메모리 장치 및 그 제조 방법
DE102014103828A1 (de) 2014-03-20 2015-09-24 Osram Opto Semiconductors Gmbh Optoelektronisches Bauelement und Verfahren zur Herstellung von optoelektronischen Halbleiterbauelementen
KR102181404B1 (ko) * 2014-06-11 2020-11-23 엘지이노텍 주식회사 발광소자 및 조명시스템
KR102227769B1 (ko) * 2014-11-06 2021-03-16 삼성전자주식회사 반도체 발광소자 및 이를 이용한 반도체 발광소자 패키지
KR102221112B1 (ko) * 2014-12-24 2021-02-26 엘지이노텍 주식회사 발광소자 및 조명시스템
DE102015104185A1 (de) * 2015-03-20 2016-09-22 Osram Opto Semiconductors Gmbh Optoelektronisches Bauelement und Verfahren zu seiner Herstellung
DE102015111485A1 (de) * 2015-07-15 2017-01-19 Osram Opto Semiconductors Gmbh Optoelektronisches Halbleiterbauelement
DE102015111487A1 (de) 2015-07-15 2017-01-19 Osram Opto Semiconductors Gmbh Verfahren zur Herstellung eines optoelektronischen Halbleiterchips und optoelektronischer Halbleiterchip
DE102018119688B4 (de) * 2018-08-14 2024-06-27 OSRAM Opto Semiconductors Gesellschaft mit beschränkter Haftung Optoelektronisches Halbleiterbauelement mit einem ersten Kontaktelement, welches einen ersten und einen zweiten Abschnitt aufweist sowie Verfahren zur Herstellung des optoelektronischen Halbleiterbauelements
FR3102298B1 (fr) * 2019-10-16 2022-07-29 Aledia Procede de protection d'un dispositif optoelectronique contre les decharges electrostatiques
CN115188332A (zh) * 2020-07-30 2022-10-14 华为技术有限公司 一种显示模组、电子设备

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Also Published As

Publication number Publication date
EP2499668A1 (de) 2012-09-19
US20120223416A1 (en) 2012-09-06
CN102687271A (zh) 2012-09-19
EP2499668B9 (de) 2018-04-18
JP2013511142A (ja) 2013-03-28
WO2011058094A1 (de) 2011-05-19
EP2499668B1 (de) 2018-01-03
CN102687271B (zh) 2016-01-20
DE102009053064A1 (de) 2011-05-19

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PA0105 International application

Patent event date: 20120613

Patent event code: PA01051R01D

Comment text: International Patent Application

PG1501 Laying open of application
PC1203 Withdrawal of no request for examination
WITN Application deemed withdrawn, e.g. because no request for examination was filed or no examination fee was paid