KR20110090753A - 기판 반송 장치 및 기판 반송 방법과 기억 매체 - Google Patents
기판 반송 장치 및 기판 반송 방법과 기억 매체 Download PDFInfo
- Publication number
- KR20110090753A KR20110090753A KR1020100125400A KR20100125400A KR20110090753A KR 20110090753 A KR20110090753 A KR 20110090753A KR 1020100125400 A KR1020100125400 A KR 1020100125400A KR 20100125400 A KR20100125400 A KR 20100125400A KR 20110090753 A KR20110090753 A KR 20110090753A
- Authority
- KR
- South Korea
- Prior art keywords
- substrate
- wafer
- holding
- board
- deformation
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Withdrawn
Links
Images
Classifications
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P72/00—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
- H10P72/06—Apparatus for monitoring, sorting, marking, testing or measuring
- H10P72/0606—Position monitoring, e.g. misposition detection or presence detection
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B25—HAND TOOLS; PORTABLE POWER-DRIVEN TOOLS; MANIPULATORS
- B25J—MANIPULATORS; CHAMBERS PROVIDED WITH MANIPULATION DEVICES
- B25J9/00—Program-controlled manipulators
- B25J9/16—Program controls
- B25J9/1628—Program controls characterised by the control loop
- B25J9/1633—Program controls characterised by the control loop compliant, force, torque control, e.g. combined with position control
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B25—HAND TOOLS; PORTABLE POWER-DRIVEN TOOLS; MANIPULATORS
- B25J—MANIPULATORS; CHAMBERS PROVIDED WITH MANIPULATION DEVICES
- B25J9/00—Program-controlled manipulators
- B25J9/16—Program controls
- B25J9/1656—Program controls characterised by programming, planning systems for manipulators
- B25J9/1664—Program controls characterised by programming, planning systems for manipulators characterised by motion, path, trajectory planning
-
- G—PHYSICS
- G06—COMPUTING OR CALCULATING; COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F7/00—Methods or arrangements for processing data by operating upon the order or content of the data handled
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P72/00—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
- H10P72/06—Apparatus for monitoring, sorting, marking, testing or measuring
- H10P72/0606—Position monitoring, e.g. misposition detection or presence detection
- H10P72/0608—Position monitoring, e.g. misposition detection or presence detection of substrates stored in a container, a magazine, a carrier, a boat or the like
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P72/00—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
- H10P72/06—Apparatus for monitoring, sorting, marking, testing or measuring
- H10P72/0616—Monitoring of warpages, curvatures, damages, defects or the like
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P72/00—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
- H10P72/10—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof using carriers specially adapted therefor, e.g. front opening unified pods [FOUP]
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P72/00—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
- H10P72/30—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for conveying, e.g. between different workstations
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P72/00—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
- H10P72/30—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for conveying, e.g. between different workstations
- H10P72/33—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for conveying, e.g. between different workstations into and out of processing chamber
- H10P72/3302—Mechanical parts of transfer devices
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P72/00—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
- H10P72/30—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for conveying, e.g. between different workstations
- H10P72/34—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for conveying, e.g. between different workstations the wafers being stored in a carrier, involving loading and unloading
- H10P72/3402—Mechanical parts of transfer devices
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P72/00—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
- H10P72/70—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for supporting or gripping
- H10P72/76—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for supporting or gripping using mechanical means, e.g. clamps or pinches
- H10P72/7602—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for supporting or gripping using mechanical means, e.g. clamps or pinches the wafers being placed on a robot blade or gripped by a gripper for conveyance
Landscapes
- Engineering & Computer Science (AREA)
- Theoretical Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Engineering & Computer Science (AREA)
- General Physics & Mathematics (AREA)
- Robotics (AREA)
- Mechanical Engineering (AREA)
- Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
- Manipulator (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2010023502A JP5083339B2 (ja) | 2010-02-04 | 2010-02-04 | 基板搬送装置及び基板搬送方法並びに記憶媒体 |
| JPJP-P-2010-023502 | 2010-02-04 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| KR20110090753A true KR20110090753A (ko) | 2011-08-10 |
Family
ID=44342330
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| KR1020100125400A Withdrawn KR20110090753A (ko) | 2010-02-04 | 2010-12-09 | 기판 반송 장치 및 기판 반송 방법과 기억 매체 |
Country Status (5)
| Country | Link |
|---|---|
| US (1) | US20110190927A1 (https=) |
| JP (1) | JP5083339B2 (https=) |
| KR (1) | KR20110090753A (https=) |
| CN (1) | CN102163571A (https=) |
| TW (1) | TW201133687A (https=) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR20140091366A (ko) * | 2013-01-11 | 2014-07-21 | 삼성디스플레이 주식회사 | 기판 이송 장치 및 그 구동 방법 |
Families Citing this family (25)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP5566669B2 (ja) * | 2009-11-19 | 2014-08-06 | 昭和電工株式会社 | インライン式成膜装置及び磁気記録媒体の製造方法 |
| JP5609856B2 (ja) * | 2011-12-20 | 2014-10-22 | 株式会社安川電機 | 搬送ロボット |
| CN102569142B (zh) * | 2012-02-03 | 2017-04-26 | 上海华虹宏力半导体制造有限公司 | 硅片转移装置、转移托环、半导体工艺反应设备 |
| JP5884624B2 (ja) * | 2012-05-02 | 2016-03-15 | 東京エレクトロン株式会社 | 基板処理装置、調整方法及び記憶媒体 |
| WO2014165406A1 (en) * | 2013-04-01 | 2014-10-09 | Brewer Science Inc. | Apparatus and method for thin wafer transfer |
| JP6190692B2 (ja) * | 2013-10-22 | 2017-08-30 | 日本電産サンキョー株式会社 | 産業用ロボット |
| KR102050149B1 (ko) * | 2015-02-13 | 2019-11-28 | 가와사끼 쥬고교 가부시끼 가이샤 | 기판 반송 로봇 및 그것의 운전 방법 |
| WO2016167706A1 (en) * | 2015-04-13 | 2016-10-20 | Brunkeberg Systems Ab | A lifting jig for lifting elements along the fagade of a building |
| KR102093825B1 (ko) * | 2015-12-30 | 2020-03-27 | 맷슨 테크놀로지, 인크. | 밀리세컨드 어닐 시스템 내의 기판 지지체 |
| JP6671993B2 (ja) | 2016-02-01 | 2020-03-25 | 東京エレクトロン株式会社 | 基板受け渡し位置の教示方法及び基板処理システム |
| CN108780770B (zh) * | 2016-03-04 | 2022-12-06 | 川崎重工业株式会社 | 基板搬送装置及基板搬送机器人的示教方法 |
| JP2017183665A (ja) * | 2016-03-31 | 2017-10-05 | 芝浦メカトロニクス株式会社 | 基板搬送装置、基板処理装置及び基板処理方法 |
| US10115687B2 (en) * | 2017-02-03 | 2018-10-30 | Applied Materials, Inc. | Method of pattern placement correction |
| JP6440757B2 (ja) * | 2017-03-16 | 2018-12-19 | キヤノン株式会社 | 基板搬送システム、リソグラフィ装置、および物品の製造方法 |
| CN106826927B (zh) * | 2017-03-28 | 2019-09-13 | 芯导精密(北京)设备有限公司 | 一种半导体机械手机架 |
| CN110462809B (zh) * | 2017-04-06 | 2023-07-25 | 东京毅力科创株式会社 | 基片处理装置和基片输送方法 |
| TWI622777B (zh) * | 2017-07-07 | 2018-05-01 | Electronic component picking test classification equipment | |
| CN109273391B (zh) * | 2017-07-17 | 2021-10-26 | 台湾积体电路制造股份有限公司 | 晶圆传递模块及传递晶圆的方法 |
| JP7064885B2 (ja) * | 2018-01-05 | 2022-05-11 | 東京エレクトロン株式会社 | 基板把持機構、基板搬送装置及び基板処理システム |
| CN113169090B (zh) * | 2018-12-03 | 2025-06-03 | 朗姆研究公司 | 销升降器测试衬底 |
| CN114446843B (zh) * | 2020-11-02 | 2025-05-27 | 上海华力集成电路制造有限公司 | 晶圆传送模块及其传送预传送的晶圆的方法 |
| JP7607395B2 (ja) * | 2020-12-09 | 2024-12-27 | 川崎重工業株式会社 | 基板搬送ロボット |
| KR102721980B1 (ko) | 2022-02-24 | 2024-10-25 | 삼성전자주식회사 | 기판 정렬 장치 및 이를 이용한 기판 정렬 방법 |
| JP2024035688A (ja) * | 2022-09-02 | 2024-03-14 | 東京エレクトロン株式会社 | 基板処理装置、基板形状特定方法、搬送装置、及びエンドエフェクタ |
| KR102767876B1 (ko) * | 2022-10-27 | 2025-02-19 | 세메스 주식회사 | 티칭 방법, 티칭 방법을 실행하는 매체에 저장된 프로그램 및 반송 시스템 |
Family Cites Families (16)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS60153788U (ja) * | 1984-03-21 | 1985-10-14 | シャープ株式会社 | 位置検知センサ付ロボツトハンド |
| JP2920454B2 (ja) * | 1993-06-10 | 1999-07-19 | 東京エレクトロン株式会社 | 処理装置 |
| US6330052B1 (en) * | 1997-06-13 | 2001-12-11 | Canon Kabushiki Kaisha | Exposure apparatus and its control method, stage apparatus, and device manufacturing method |
| TW432580B (en) * | 1998-09-29 | 2001-05-01 | Applied Materials Inc | Piezoelectric method and apparatus for semiconductor wafer detection |
| US6546307B1 (en) * | 1999-08-20 | 2003-04-08 | Taiwan Semiconductor Manufacturing Co., Ltd. | Method and apparatus for detecting proper orientation of a semiconductor wafer in a wafer transfer system |
| US6753498B2 (en) * | 2000-07-20 | 2004-06-22 | Tokyo Electron Limited | Automated electrode replacement apparatus for a plasma processing system |
| JP4055200B2 (ja) * | 2002-03-15 | 2008-03-05 | 株式会社安川電機 | 基板搬送用フォーク |
| KR101015778B1 (ko) * | 2003-06-03 | 2011-02-22 | 도쿄엘렉트론가부시키가이샤 | 기판 처리장치 및 기판 수수 위치의 조정 방법 |
| JP4403841B2 (ja) * | 2004-03-19 | 2010-01-27 | 株式会社安川電機 | ウェハ有無検出装置およびこれを用いた搬送ロボット装置 |
| JP4809594B2 (ja) * | 2004-08-02 | 2011-11-09 | 東京エレクトロン株式会社 | 検査装置 |
| US7680559B2 (en) * | 2005-02-08 | 2010-03-16 | Lam Research Corporation | Wafer movement control macros |
| JP4535499B2 (ja) * | 2005-04-19 | 2010-09-01 | 東京エレクトロン株式会社 | 加熱装置、塗布、現像装置及び加熱方法 |
| US7766566B2 (en) * | 2005-08-03 | 2010-08-03 | Tokyo Electron Limited | Developing treatment apparatus and developing treatment method |
| JP4684805B2 (ja) * | 2005-08-25 | 2011-05-18 | 東京エレクトロン株式会社 | プローブ装置及び被検査体とプローブとの接触圧の調整方法 |
| US8057153B2 (en) * | 2006-09-05 | 2011-11-15 | Tokyo Electron Limited | Substrate transfer device, substrate processing apparatus and substrate transfer method |
| JP5003315B2 (ja) * | 2007-07-03 | 2012-08-15 | 東京エレクトロン株式会社 | 基板処理装置及び基板処理方法並びに記憶媒体 |
-
2010
- 2010-02-04 JP JP2010023502A patent/JP5083339B2/ja not_active Expired - Fee Related
- 2010-12-08 TW TW099142821A patent/TW201133687A/zh unknown
- 2010-12-09 KR KR1020100125400A patent/KR20110090753A/ko not_active Withdrawn
-
2011
- 2011-01-26 US US13/014,143 patent/US20110190927A1/en not_active Abandoned
- 2011-01-31 CN CN201110035364XA patent/CN102163571A/zh active Pending
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR20140091366A (ko) * | 2013-01-11 | 2014-07-21 | 삼성디스플레이 주식회사 | 기판 이송 장치 및 그 구동 방법 |
Also Published As
| Publication number | Publication date |
|---|---|
| CN102163571A (zh) | 2011-08-24 |
| US20110190927A1 (en) | 2011-08-04 |
| JP5083339B2 (ja) | 2012-11-28 |
| JP2011161521A (ja) | 2011-08-25 |
| TW201133687A (en) | 2011-10-01 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| PA0109 | Patent application |
St.27 status event code: A-0-1-A10-A12-nap-PA0109 |
|
| PG1501 | Laying open of application |
St.27 status event code: A-1-1-Q10-Q12-nap-PG1501 |
|
| PC1203 | Withdrawal of no request for examination |
St.27 status event code: N-1-6-B10-B12-nap-PC1203 |
|
| WITN | Application deemed withdrawn, e.g. because no request for examination was filed or no examination fee was paid | ||
| P22-X000 | Classification modified |
St.27 status event code: A-2-2-P10-P22-nap-X000 |