KR20090086148A - 리드 프레임 및 그것을 이용한 회로 장치의 제조 방법 - Google Patents

리드 프레임 및 그것을 이용한 회로 장치의 제조 방법 Download PDF

Info

Publication number
KR20090086148A
KR20090086148A KR1020080127219A KR20080127219A KR20090086148A KR 20090086148 A KR20090086148 A KR 20090086148A KR 1020080127219 A KR1020080127219 A KR 1020080127219A KR 20080127219 A KR20080127219 A KR 20080127219A KR 20090086148 A KR20090086148 A KR 20090086148A
Authority
KR
South Korea
Prior art keywords
lead frame
groove
unit
support portion
support
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Ceased
Application number
KR1020080127219A
Other languages
English (en)
Korean (ko)
Inventor
데쯔야 후꾸시마
다까시 기따자와
Original Assignee
산요덴키가부시키가이샤
산요 세미컨덕터 컴퍼니 리미티드
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 산요덴키가부시키가이샤, 산요 세미컨덕터 컴퍼니 리미티드 filed Critical 산요덴키가부시키가이샤
Publication of KR20090086148A publication Critical patent/KR20090086148A/ko
Ceased legal-status Critical Current

Links

Images

Classifications

    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10WGENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W72/00Interconnections or connectors in packages
    • H10W72/01Manufacture or treatment
    • H10W72/0198Manufacture or treatment batch processes
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10WGENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W70/00Package substrates; Interposers; Redistribution layers [RDL]
    • H10W70/40Leadframes
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10WGENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W90/00Package configurations
    • H10W90/701Package configurations characterised by the relative positions of pads or connectors relative to package parts
    • H10W90/751Package configurations characterised by the relative positions of pads or connectors relative to package parts of bond wires
    • H10W90/756Package configurations characterised by the relative positions of pads or connectors relative to package parts of bond wires between a chip and a stacked lead frame, conducting package substrate or heat sink

Landscapes

  • Lead Frames For Integrated Circuits (AREA)
  • Encapsulation Of And Coatings For Semiconductor Or Solid State Devices (AREA)
KR1020080127219A 2008-02-06 2008-12-15 리드 프레임 및 그것을 이용한 회로 장치의 제조 방법 Ceased KR20090086148A (ko)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2008025930A JP5144294B2 (ja) 2008-02-06 2008-02-06 リードフレームおよびそれを用いた回路装置の製造方法
JPJP-P-2008-025930 2008-02-06

Publications (1)

Publication Number Publication Date
KR20090086148A true KR20090086148A (ko) 2009-08-11

Family

ID=41071116

Family Applications (1)

Application Number Title Priority Date Filing Date
KR1020080127219A Ceased KR20090086148A (ko) 2008-02-06 2008-12-15 리드 프레임 및 그것을 이용한 회로 장치의 제조 방법

Country Status (3)

Country Link
JP (1) JP5144294B2 (https=)
KR (1) KR20090086148A (https=)
TW (1) TW200939439A (https=)

Families Citing this family (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5215980B2 (ja) * 2009-10-30 2013-06-19 株式会社三井ハイテック 半導体装置の製造方法
JP5397195B2 (ja) * 2009-12-02 2014-01-22 日立化成株式会社 光半導体素子搭載用基板の製造方法、及び、光半導体装置の製造方法
JP5613463B2 (ja) * 2010-06-03 2014-10-22 ルネサスエレクトロニクス株式会社 半導体装置及びその製造方法
DE102015100025A1 (de) * 2015-01-05 2016-07-07 Osram Opto Semiconductors Gmbh Leiterrahmen
JP6695166B2 (ja) * 2016-02-23 2020-05-20 株式会社三井ハイテック リードフレーム、及び半導体パッケージの製造方法
JP6924411B2 (ja) * 2017-08-28 2021-08-25 大日本印刷株式会社 リードフレームおよび半導体装置の製造方法
JP7548871B2 (ja) * 2021-05-31 2024-09-10 Towa株式会社 成形型、樹脂成形装置及び樹脂成形品の製造方法
TWI882639B (zh) * 2024-01-08 2025-05-01 大陸商蘇州震坤科技有限公司 減少切單時刀損耗的導線架結構

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2001077235A (ja) * 1999-09-06 2001-03-23 Mitsui High Tec Inc 半導体素子搭載用基板
JP3634757B2 (ja) * 2001-02-02 2005-03-30 株式会社三井ハイテック リードフレーム
JP3628971B2 (ja) * 2001-02-15 2005-03-16 松下電器産業株式会社 リードフレーム及びそれを用いた樹脂封止型半導体装置の製造方法
JP2007294715A (ja) * 2006-04-26 2007-11-08 Renesas Technology Corp 半導体装置の製造方法

Also Published As

Publication number Publication date
JP2009188150A (ja) 2009-08-20
JP5144294B2 (ja) 2013-02-13
TW200939439A (en) 2009-09-16

Similar Documents

Publication Publication Date Title
US6927483B1 (en) Semiconductor package exhibiting efficient lead placement
KR100859624B1 (ko) 반도체 장치의 제조 방법
KR20090086148A (ko) 리드 프레임 및 그것을 이용한 회로 장치의 제조 방법
US20080061414A1 (en) Method of Producing a Semiconductor Package
US20020031867A1 (en) Semiconductor device and process of production of same
KR20130118781A (ko) 리드 프레임, 반도체 패키지, 및 그 제조 방법
TW201234504A (en) Semiconductor device package with electromagnetic shielding
JP2011077278A (ja) 半導体装置およびその製造方法
US8609467B2 (en) Lead frame and method for manufacturing circuit device using the same
US20170141014A1 (en) Semiconductor package with integrated heatsink
US20250183135A1 (en) Lead stabilization in semiconductor packages
CN103208431A (zh) 半导体封装结构及其制作方法
US8193643B2 (en) Semiconductor device and method for fabricating the same
JP2010087129A (ja) 回路装置およびその製造方法
KR100271657B1 (ko) 칼럼 리드형 반도체 패키지 및 그 제조방법
US8866296B2 (en) Semiconductor device comprising thin-film terminal with deformed portion
US8829685B2 (en) Circuit device having funnel shaped lead and method for manufacturing the same
KR100369202B1 (ko) 반도체 장치의 제조 방법
KR101132529B1 (ko) 회로 장치 및 그 제조 방법
KR20020073455A (ko) 반도체 장치의 제조 방법
JP2004335710A (ja) 半導体装置およびその製造方法
JP2011035142A (ja) 回路装置の製造方法
US7635642B2 (en) Integrated circuit package and method for producing it
JP2009188147A (ja) 回路装置の製造方法
JP2003046053A (ja) 半導体装置およびその製造方法

Legal Events

Date Code Title Description
A201 Request for examination
PA0109 Patent application

St.27 status event code: A-0-1-A10-A12-nap-PA0109

PA0201 Request for examination

St.27 status event code: A-1-2-D10-D11-exm-PA0201

PG1501 Laying open of application

St.27 status event code: A-1-1-Q10-Q12-nap-PG1501

D13-X000 Search requested

St.27 status event code: A-1-2-D10-D13-srh-X000

D14-X000 Search report completed

St.27 status event code: A-1-2-D10-D14-srh-X000

E902 Notification of reason for refusal
PE0902 Notice of grounds for rejection

St.27 status event code: A-1-2-D10-D21-exm-PE0902

AMND Amendment
P11-X000 Amendment of application requested

St.27 status event code: A-2-2-P10-P11-nap-X000

P13-X000 Application amended

St.27 status event code: A-2-2-P10-P13-nap-X000

E601 Decision to refuse application
PE0601 Decision on rejection of patent

St.27 status event code: N-2-6-B10-B15-exm-PE0601

J201 Request for trial against refusal decision
PJ0201 Trial against decision of rejection

St.27 status event code: A-3-3-V10-V11-apl-PJ0201

AMND Amendment
P11-X000 Amendment of application requested

St.27 status event code: A-2-2-P10-P11-nap-X000

P13-X000 Application amended

St.27 status event code: A-2-2-P10-P13-nap-X000

PB0901 Examination by re-examination before a trial

St.27 status event code: A-6-3-E10-E12-rex-PB0901

B601 Maintenance of original decision after re-examination before a trial
PB0601 Maintenance of original decision after re-examination before a trial

St.27 status event code: N-3-6-B10-B17-rex-PB0601

J301 Trial decision

Free format text: TRIAL DECISION FOR APPEAL AGAINST DECISION TO DECLINE REFUSAL REQUESTED 20110401

Effective date: 20120220

PJ1301 Trial decision

St.27 status event code: A-3-3-V10-V15-crt-PJ1301

Decision date: 20120220

Appeal event data comment text: Appeal Kind Category : Appeal against decision to decline refusal, Appeal Ground Text : 2008 0127219

Appeal request date: 20110401

Appellate body name: Patent Examination Board

Decision authority category: Office appeal board

Decision identifier: 2011101002633

R18-X000 Changes to party contact information recorded

St.27 status event code: A-3-3-R10-R18-oth-X000

R18-X000 Changes to party contact information recorded

St.27 status event code: A-3-3-R10-R18-oth-X000

P22-X000 Classification modified

St.27 status event code: A-2-2-P10-P22-nap-X000