KR20060097250A - 자동 광학 검사 시스템 및 방법 - Google Patents

자동 광학 검사 시스템 및 방법 Download PDF

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Publication number
KR20060097250A
KR20060097250A KR1020050018336A KR20050018336A KR20060097250A KR 20060097250 A KR20060097250 A KR 20060097250A KR 1020050018336 A KR1020050018336 A KR 1020050018336A KR 20050018336 A KR20050018336 A KR 20050018336A KR 20060097250 A KR20060097250 A KR 20060097250A
Authority
KR
South Korea
Prior art keywords
inspection
unit
inspection object
printed circuit
camera
Prior art date
Application number
KR1020050018336A
Other languages
English (en)
Korean (ko)
Inventor
최현호
유태명
Original Assignee
아주하이텍(주)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 아주하이텍(주) filed Critical 아주하이텍(주)
Priority to KR1020050018336A priority Critical patent/KR20060097250A/ko
Priority to CN2006100578159A priority patent/CN1828217B/zh
Priority to JP2006053482A priority patent/JP5203572B2/ja
Publication of KR20060097250A publication Critical patent/KR20060097250A/ko

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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8806—Specially adapted optical and illumination features
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B07—SEPARATING SOLIDS FROM SOLIDS; SORTING
    • B07C—POSTAL SORTING; SORTING INDIVIDUAL ARTICLES, OR BULK MATERIAL FIT TO BE SORTED PIECE-MEAL, e.g. BY PICKING
    • B07C5/00—Sorting according to a characteristic or feature of the articles or material being sorted, e.g. by control effected by devices which detect or measure such characteristic or feature; Sorting by manually actuated devices, e.g. switches
    • B07C5/34—Sorting according to other particular properties
    • B07C5/342—Sorting according to other particular properties according to optical properties, e.g. colour
    • B07C5/3422—Sorting according to other particular properties according to optical properties, e.g. colour using video scanning devices, e.g. TV-cameras
    • H—ELECTRICITY
    • H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K13/00—Apparatus or processes specially adapted for manufacturing or adjusting assemblages of electric components
    • H05K13/08—Monitoring manufacture of assemblages
    • H05K13/081—Integration of optical monitoring devices in assembly lines; Processes using optical monitoring devices specially adapted for controlling devices or machines in assembly lines
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/59—Transmissivity
    • G01N21/5907—Densitometers
    • G01N2021/5957—Densitometers using an image detector type detector, e.g. CCD

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  • Engineering & Computer Science (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Multimedia (AREA)
  • Operations Research (AREA)
  • Manufacturing & Machinery (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
KR1020050018336A 2005-03-04 2005-03-04 자동 광학 검사 시스템 및 방법 KR20060097250A (ko)

Priority Applications (3)

Application Number Priority Date Filing Date Title
KR1020050018336A KR20060097250A (ko) 2005-03-04 2005-03-04 자동 광학 검사 시스템 및 방법
CN2006100578159A CN1828217B (zh) 2005-03-04 2006-02-27 自动光学检测系统和方法
JP2006053482A JP5203572B2 (ja) 2005-03-04 2006-02-28 自動光学検査システム及び方法

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
KR1020050018336A KR20060097250A (ko) 2005-03-04 2005-03-04 자동 광학 검사 시스템 및 방법

Publications (1)

Publication Number Publication Date
KR20060097250A true KR20060097250A (ko) 2006-09-14

Family

ID=36946723

Family Applications (1)

Application Number Title Priority Date Filing Date
KR1020050018336A KR20060097250A (ko) 2005-03-04 2005-03-04 자동 광학 검사 시스템 및 방법

Country Status (3)

Country Link
JP (1) JP5203572B2 (ja)
KR (1) KR20060097250A (ja)
CN (1) CN1828217B (ja)

Cited By (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100772608B1 (ko) * 2006-05-29 2007-11-02 아주하이텍(주) 자동 광학 검사 시스템
KR100909944B1 (ko) * 2007-08-02 2009-07-29 이용원 실체 현미경을 이용한 렌즈 검사 시스템
KR100969283B1 (ko) * 2007-05-16 2010-07-09 아주하이텍(주) 광학 검사 장치
KR101012633B1 (ko) * 2008-10-09 2011-02-09 (주) 인텍플러스 듀얼 카메라 비전검사 장치
KR101031070B1 (ko) * 2008-07-23 2011-04-25 충북대학교 산학협력단 영상처리기법을 이용한 ｔｃｐ/ｃｏｆ의 불량 검출 방법 및그 시스템
KR101389502B1 (ko) * 2010-05-20 2014-04-28 가부시키가이샤 퓨렉스 천 조각 검사 장치 및 검사 방법
CN104568985A (zh) * 2014-12-30 2015-04-29 东莞市合易自动化科技有限公司 一种aoi光学检测设备
KR102217207B1 (ko) * 2019-12-06 2021-02-18 (주)청아굿푸드 식품 제조 공정 관리 장치
KR20230079712A (ko) * 2021-11-29 2023-06-07 (주) 시온텍 탈염 전극 제조 시스템

Families Citing this family (19)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN101966627B (zh) * 2010-08-16 2012-08-22 东莞市亿铖达焊锡制造有限公司 有芯焊丝生产中连续检测助焊剂的方法和设备
CN103108153B (zh) * 2011-11-11 2017-08-01 赛恩倍吉科技顾问（深圳）有限公司 局部分割拍照处理方法及系统
KR102023581B1 (ko) * 2012-11-23 2019-09-24 해성디에스 주식회사 릴-투-릴 검사장치 및 릴-투-릴 검사방법
CN103475812B (zh) * 2013-07-30 2016-05-25 宁波迪吉特电子科技发展有限公司 一种摄像机阵列
TW201514473A (zh) * 2013-10-15 2015-04-16 Utechzone Co Ltd 檢測混合類型物件的方法
CN104551301A (zh) * 2014-12-30 2015-04-29 东莞市合易自动化科技有限公司 一种智能化焊接全自动生产线
CN105136121B (zh) * 2015-09-15 2018-06-15 歌尔股份有限公司 确定工装状态的影像检测方法及系统
JP6829946B2 (ja) * 2016-04-28 2021-02-17 川崎重工業株式会社 部品検査装置および方法
CN106290384B (zh) * 2016-10-21 2018-11-23 江苏理工学院 无刷直流电机控制线路板在线检测识别方法
CN106524928A (zh) * 2016-11-10 2017-03-22 佛山市坦斯盯科技有限公司 一种光源组件具有隔光功能的线路板检测装置
CN106500610A (zh) * 2016-11-10 2017-03-15 佛山市坦斯盯科技有限公司 一种具有辊筒压紧模组的线路板检测装置
CN106645192A (zh) * 2016-11-10 2017-05-10 佛山市坦斯盯科技有限公司 一种具有对正送料装置的线路板检测装置
CN107014823A (zh) * 2016-11-10 2017-08-04 佛山市坦斯盯科技有限公司 一种相机模组具有升降功能的线路板检测装置
CN106546607A (zh) * 2016-11-10 2017-03-29 佛山市坦斯盯科技有限公司 一种光源组件具有遮光结构的线路板检测装置
CN106706518A (zh) * 2016-12-30 2017-05-24 佛山市坦斯盯科技有限公司 一种模组化电路板检测机
CN108956628B (zh) * 2018-07-27 2024-04-05 高视科技(苏州)股份有限公司 塑料盖板缺陷成像检测系统
CN110044921A (zh) * 2019-04-28 2019-07-23 江苏理工学院 锂电池外观缺陷检测系统和方法
CN112284442B (zh) * 2020-12-29 2021-03-26 苏州天准科技股份有限公司 一种柔性电路板自动视觉检测装置
CN114895666B (zh) * 2022-04-11 2024-04-19 广州镭晨智能装备科技有限公司 摄像组件的路径规划方法、装置及计算机可读存储介质

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3419118B2 (ja) * 1994-11-29 2003-06-23 松下電器産業株式会社 外観検査装置
JPH0992692A (ja) * 1995-07-13 1997-04-04 Toray Ind Inc Ｔａｂテープの検査装置および検査方法ならびに実装ｔａｂテープの製造方法および製造装置
KR100367222B1 (ko) * 1998-07-28 2003-01-09 마츠시다 덴코 가부시키가이샤 가요성 소재의 연속 기판시트 상에 형성된 개별배선패턴을 검사하는 검사시스템
JP2001272356A (ja) * 2000-03-24 2001-10-05 Olympus Optical Co Ltd ワーク外観検査装置
US7075565B1 (en) * 2000-06-14 2006-07-11 Landrex Technologies Co., Ltd. Optical inspection system
JP2005003645A (ja) * 2003-06-16 2005-01-06 Inspeck Kk パターン検査装置

Cited By (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100772608B1 (ko) * 2006-05-29 2007-11-02 아주하이텍(주) 자동 광학 검사 시스템
KR100969283B1 (ko) * 2007-05-16 2010-07-09 아주하이텍(주) 광학 검사 장치
KR100909944B1 (ko) * 2007-08-02 2009-07-29 이용원 실체 현미경을 이용한 렌즈 검사 시스템
KR101031070B1 (ko) * 2008-07-23 2011-04-25 충북대학교 산학협력단 영상처리기법을 이용한 ｔｃｐ/ｃｏｆ의 불량 검출 방법 및그 시스템
KR101012633B1 (ko) * 2008-10-09 2011-02-09 (주) 인텍플러스 듀얼 카메라 비전검사 장치
KR101389502B1 (ko) * 2010-05-20 2014-04-28 가부시키가이샤 퓨렉스 천 조각 검사 장치 및 검사 방법
CN104568985A (zh) * 2014-12-30 2015-04-29 东莞市合易自动化科技有限公司 一种aoi光学检测设备
KR102217207B1 (ko) * 2019-12-06 2021-02-18 (주)청아굿푸드 식품 제조 공정 관리 장치
KR20230079712A (ko) * 2021-11-29 2023-06-07 (주) 시온텍 탈염 전극 제조 시스템

Also Published As

Publication number Publication date
JP2006242953A (ja) 2006-09-14
JP5203572B2 (ja) 2013-06-05
CN1828217B (zh) 2012-05-30
CN1828217A (zh) 2006-09-06

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