KR20020088166A - 화학기상 증착장비 - Google Patents
화학기상 증착장비 Download PDFInfo
- Publication number
- KR20020088166A KR20020088166A KR1020010027128A KR20010027128A KR20020088166A KR 20020088166 A KR20020088166 A KR 20020088166A KR 1020010027128 A KR1020010027128 A KR 1020010027128A KR 20010027128 A KR20010027128 A KR 20010027128A KR 20020088166 A KR20020088166 A KR 20020088166A
- Authority
- KR
- South Korea
- Prior art keywords
- substrate
- center pin
- susceptor
- chemical vapor
- vapor deposition
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G02—OPTICS
- G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
- G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
- G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour
- G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour based on liquid crystals, e.g. single liquid crystal display cells
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
- C23C16/50—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating using electric discharges
- C23C16/505—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating using electric discharges using radio frequency discharges
- C23C16/509—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating using electric discharges using radio frequency discharges using internal electrodes
- C23C16/5096—Flat-bed apparatus
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
- C23C16/458—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating characterised by the method used for supporting substrates in the reaction chamber
- C23C16/4581—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating characterised by the method used for supporting substrates in the reaction chamber characterised by material of construction or surface finish of the means for supporting the substrate
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
- C23C16/458—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating characterised by the method used for supporting substrates in the reaction chamber
- C23C16/4582—Rigid and flat substrates, e.g. plates or discs
- C23C16/4583—Rigid and flat substrates, e.g. plates or discs the substrate being supported substantially horizontally
- C23C16/4586—Elements in the interior of the support, e.g. electrodes, heating or cooling devices
Landscapes
- Chemical & Material Sciences (AREA)
- Engineering & Computer Science (AREA)
- Metallurgy (AREA)
- Organic Chemistry (AREA)
- General Chemical & Material Sciences (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Materials Engineering (AREA)
- Mechanical Engineering (AREA)
- Physics & Mathematics (AREA)
- Plasma & Fusion (AREA)
- Nonlinear Science (AREA)
- Crystallography & Structural Chemistry (AREA)
- General Physics & Mathematics (AREA)
- Optics & Photonics (AREA)
- Chemical Vapour Deposition (AREA)
- Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
Abstract
Description
Claims (7)
- 접지전압이 공급되는 기저전압원과,기판이 놓여지는 서셉터와,상기 서셉터를 관통하여 상기 기판을 들어올리기 위한 센터 핀과,상기 센터 핀을 상기 기저전압원에 연결하여 접지시키기 위한 접지수단을 구비하는 것을 특징으로 하는 화학기상 증착장비.
- 제 1 항에 있어서,상기 센터 핀은상기 기판과 접촉되는 헤드부와,상기 헤드부를 지지하기 위한 헤드지지부를 추가로 구비하는 것을 특징으로 하는 화학기상 증착장비.
- 제 2 항에 있어서,상기 접지수단은상기 헤드부 및 상기 헤드지지부에 형성되는 것을 특징으로 하는 화학기상 증착장비.
- 제 2 항에 있어서,상기 접지수단은 상기 헤드지지부를 관통하는 것을 특징으로 하는 화학기상 증착장비.
- 제 2 항에 있어서,상기 접지수단은 상기 헤드지지부의 일측부에 형성되는 것을 특징으로 하는 화학기상 증착장비.
- 제 1 항에 있어서,상기 접지수단은 전기전도성 금속인 것을 특징으로 하는 화학기상 증착장비.
- 제 2 항에 있어서,상기 헤드부는 알루미늄인 것을 특징으로 하는 화학기상 증착장비.
Priority Applications (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR1020010027128A KR100765539B1 (ko) | 2001-05-18 | 2001-05-18 | 화학기상 증착장비 |
US10/144,806 US7081165B2 (en) | 2001-05-18 | 2002-05-15 | Chemical vapor deposition apparatus having a susceptor with a grounded lift pin |
US11/477,387 US7517562B2 (en) | 2001-05-18 | 2006-06-30 | Deposition method using a uniform electric field |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR1020010027128A KR100765539B1 (ko) | 2001-05-18 | 2001-05-18 | 화학기상 증착장비 |
Publications (2)
Publication Number | Publication Date |
---|---|
KR20020088166A true KR20020088166A (ko) | 2002-11-27 |
KR100765539B1 KR100765539B1 (ko) | 2007-10-10 |
Family
ID=19709611
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
KR1020010027128A KR100765539B1 (ko) | 2001-05-18 | 2001-05-18 | 화학기상 증착장비 |
Country Status (2)
Country | Link |
---|---|
US (2) | US7081165B2 (ko) |
KR (1) | KR100765539B1 (ko) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR100962427B1 (ko) * | 2003-08-14 | 2010-06-15 | 주성엔지니어링(주) | 액정표시장치의 기판 리프팅 바 |
Families Citing this family (14)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR100505056B1 (ko) * | 2003-01-02 | 2005-07-29 | 삼성전자주식회사 | 반도체 장치의 복합막 형성 방법과, 이를 이용한 커패시터및 게이트 절연막 형성 방법 |
WO2007077765A1 (ja) * | 2005-12-28 | 2007-07-12 | Sharp Kabushiki Kaisha | ステージ装置及びプラズマ処理装置 |
US20080314319A1 (en) * | 2007-06-19 | 2008-12-25 | Memc Electronic Materials, Inc. | Susceptor for improving throughput and reducing wafer damage |
US8404049B2 (en) * | 2007-12-27 | 2013-03-26 | Memc Electronic Materials, Inc. | Epitaxial barrel susceptor having improved thickness uniformity |
CN102150237A (zh) * | 2008-07-14 | 2011-08-10 | 联合太阳能奥沃尼克有限责任公司 | 用于提高在基底上所加工材料均匀性的沉积装置和使用该装置的方法 |
US20100098519A1 (en) * | 2008-10-17 | 2010-04-22 | Memc Electronic Materials, Inc. | Support for a semiconductor wafer in a high temperature environment |
WO2011017226A2 (en) * | 2009-08-07 | 2011-02-10 | Applied Materials, Inc. | Compound lift pin tip with temperature compensated attachment feature |
US9371584B2 (en) * | 2011-03-09 | 2016-06-21 | Applied Materials, Inc. | Processing chamber and method for centering a substrate therein |
TWI624903B (zh) * | 2013-03-15 | 2018-05-21 | 應用材料股份有限公司 | 在雜訊環境中之現場溫度測量 |
US9595464B2 (en) * | 2014-07-19 | 2017-03-14 | Applied Materials, Inc. | Apparatus and method for reducing substrate sliding in process chambers |
JP7130359B2 (ja) * | 2016-12-05 | 2022-09-05 | 東京エレクトロン株式会社 | プラズマ処理装置 |
CN106607320B (zh) * | 2016-12-22 | 2019-10-01 | 武汉华星光电技术有限公司 | 适用于柔性基板的热真空干燥装置 |
US20180218905A1 (en) * | 2017-02-02 | 2018-08-02 | Applied Materials, Inc. | Applying equalized plasma coupling design for mura free susceptor |
US20210343577A1 (en) * | 2017-11-21 | 2021-11-04 | Ulvac, Inc. | Lift pin and vacuum processing apparatus |
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US4741801A (en) * | 1981-07-17 | 1988-05-03 | Plasma Physics Corp. | Glow discharge method and apparatus and photoreceptor devices made therewith |
JPH05243364A (ja) * | 1992-03-02 | 1993-09-21 | Hitachi Ltd | 半導体ウェハの除電方法およびそれを用いた半導体集積回路製造装置 |
US5286297A (en) * | 1992-06-24 | 1994-02-15 | Texas Instruments Incorporated | Multi-electrode plasma processing apparatus |
JPH06112303A (ja) * | 1992-09-29 | 1994-04-22 | Sony Corp | ウエハ処理装置及びウエハ処理方法 |
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JP3315197B2 (ja) * | 1993-05-17 | 2002-08-19 | 東京エレクトロン株式会社 | プラズマ処理方法 |
US5557215A (en) * | 1993-05-12 | 1996-09-17 | Tokyo Electron Limited | Self-bias measuring method, apparatus thereof and electrostatic chucking apparatus |
JPH06338463A (ja) * | 1993-05-28 | 1994-12-06 | Toshiba Corp | 半導体製造装置 |
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JP3824675B2 (ja) * | 1995-03-03 | 2006-09-20 | 有限会社デジタル・ウェーブ | 結晶製造装置 |
US5900062A (en) * | 1995-12-28 | 1999-05-04 | Applied Materials, Inc. | Lift pin for dechucking substrates |
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JPH1090640A (ja) * | 1996-09-13 | 1998-04-10 | Toshiba Corp | 薄膜の製造方法及びその製造装置 |
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JPH11340309A (ja) * | 1998-05-29 | 1999-12-10 | Kyocera Corp | 導電体内蔵型セラミック製リフトピンとそれを用いた静電チャック |
US6342755B1 (en) * | 1999-08-11 | 2002-01-29 | Sony Corporation | Field emission cathodes having an emitting layer comprised of electron emitting particles and insulating particles |
JP4647843B2 (ja) * | 2001-06-28 | 2011-03-09 | 株式会社日立製作所 | 液晶表示装置 |
JP4140685B2 (ja) * | 2001-12-14 | 2008-08-27 | 株式会社日立製作所 | プラズマディスプレイパネル |
US6902658B2 (en) * | 2001-12-18 | 2005-06-07 | Motorola, Inc. | FED cathode structure using electrophoretic deposition and method of fabrication |
-
2001
- 2001-05-18 KR KR1020010027128A patent/KR100765539B1/ko active IP Right Grant
-
2002
- 2002-05-15 US US10/144,806 patent/US7081165B2/en not_active Expired - Lifetime
-
2006
- 2006-06-30 US US11/477,387 patent/US7517562B2/en not_active Expired - Lifetime
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR100962427B1 (ko) * | 2003-08-14 | 2010-06-15 | 주성엔지니어링(주) | 액정표시장치의 기판 리프팅 바 |
Also Published As
Publication number | Publication date |
---|---|
US7081165B2 (en) | 2006-07-25 |
US20070014932A1 (en) | 2007-01-18 |
KR100765539B1 (ko) | 2007-10-10 |
US7517562B2 (en) | 2009-04-14 |
US20020170498A1 (en) | 2002-11-21 |
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